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Journal articles on the topic 'Testability'

Author: Grafiati

Published: 4 June 2021

Last updated: 4 May 2024

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1

Wang, Yi Chen, and Feng Xie. "Research on Software Testability Requirement Analysis Method." Advanced Materials Research 760-762 (September 2013): 1084–88. http://dx.doi.org/10.4028/www.scientific.net/amr.760-762.1084.

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Software testability parameter system was constructed by parameters that extracted from software testability influence factors. It established relationships between these parameters and software testability through a target layer which may reflect software inner attributes. In order to carry out the design of software testability in engineering ways, principles of software testability requirements and software testability requirement factor were presented in this article, as well as analysis method for software testability requirement. This method considered software characteristics and software test types as selection criteria to specify the target layer, and then tried to acquire software testability requirement factors with the help of software testability parameter architecture built before. Next, software testability requirement could be obtained by following the steps of software requirement engineering.

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2

Sober, Elliott. "Testability." Proceedings and Addresses of the American Philosophical Association 73, no. 2 (November 1999): 47. http://dx.doi.org/10.2307/3131087.

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3

Liu, Ye, and Yi Chen Wang. "The Study of the Requirement of Software Testability Based on Causal Analysis." Applied Mechanics and Materials 513-517 (February 2014): 1944–50. http://dx.doi.org/10.4028/www.scientific.net/amm.513-517.1944.

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Requirements for software testability is an important basis of design for software design of testability. During the software-testability-design work, a series of software design for testability measures must be taken to make software testing stage less detours, and formulation and implementation of requirements for software testing is an important element. This paper introduces a kind of develop-method of requirements for software testability. According as causal analysis, basing on manifestations of software testability, the method develops appropriate requirements for software testability for software system. Preface The software testability is referred to as a kind of attribute that aims to facilitate the application test and improve the location and correction of software error [. To a certain extent, the software testability can solve some problems facing the software test, such as helping the designer to develop the software that is easier to test, so as to reduce the test difficulty, save more test time and optimize the resource allocation. Therefore, the software testability has stood out as quite an important factor that has a great effect on the cost, time and labor allocation of software test, which are also closely related to the quality of software engineering [. Since the 1990s, the software testability has been widely concerned by the scholars both at home and abroad. According to the relevant literatures collected, the general research direction has been toward the measurement and analysis of the software testability [. It should be noted that a well developed scheme of the requirement of software testability can not only enhance the testability of the target software, but also serve as the evaluation criterion of the testability, which means that it will have special reference to the improvement on the software test [. Based on the casual analysis, this paper has sought to provide a whole set of the requirement of software testability and come up with a real case so as to approach the design issues of the software testability [. 1 The requirement of software testability

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4

Ting-Hua Chen and M. A. Breuer. "Automatic Design for Testability Via Testability Measures." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 4, no. 1 (January 1985): 3–11. http://dx.doi.org/10.1109/tcad.1985.1270093.

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5

Lv, Jian Wei, Zong Ren Xie, and Yi Fan Xu. "A Weighted Optimization Allocation Based on Interval Distribution of Equipment Testability Indicators." Applied Mechanics and Materials 741 (March 2015): 795–800. http://dx.doi.org/10.4028/www.scientific.net/amm.741.795.

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On the basis of conception, the characteristics of current testability indicators allocation methods are analyzed. Due to their shortages, we establish a weighted allocation method based on upper and lower limitation to equipment testability indicators and present the initial value of unit’s testability indicators, upper and lower limitation, adjust means to initial value and whole calculation steps. The illustrated example shows that, by this allocation method, dependence to one’s experience can be decrease to the lowest limitation, control to unit testability indicators’ range is perfect, and we can assign the lowest unit testability indicators’ and their combination to realize system’s testability indicators.

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6

Khan, Mohammad, M. A. Khanam, and M. H. Khan. "Requirement Based Testability Estimation Model of Object Oriented Software." Oriental journal of computer science and technology 10, no. 04 (October 17, 2017): 793–801. http://dx.doi.org/10.13005/ojcst/10.04.14.

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To measure testability before the actual development starts will play a crucial role to the developer, designers and end users as well. Early measurement of testability, especially in early requirement stage to assist the developer for the further development process, and will also assures us to produce and deliver the high quality requirement that can surely reduce the overall cost and improves the quality of development process. Taking view of this fact, this paper identifies testability estimation factors namely understandability and modifiability and establishes the correlation among testability, understandability and modifiability. Further, a model is developed to quantify software testability in requirement phase and named as Requirement Testability Model of Object Oriented Software-RTMOOS. Furthermore, the correlation of Testability with these factors has been tested and justified with the help of statistical measures.

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7

Wang, Chao, Jing Qiu, Guan-jun Liu, and Yong Zhang. "Testability demonstration with component level data from virtual and physical tests." Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science 229, no. 2 (May 8, 2014): 265–72. http://dx.doi.org/10.1177/0954406214532909.

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Testability demonstration plays an important role in assuring the testability capability, which can decrease the fault diagnosis time and accelerate the maintenance actions. However, testability demonstration test with classical planning method has the problems of large fault sample size, high test cost, and long test period. A new testability demonstration planning method is proposed, which takes the component level data from both virtual and physical demonstration tests as prior information. Owing to the limitations of the testability modeling technology and relevant programming tools, the virtual testability prototype of the system level cannot be established and the virtual testability test data is not totally credible. So a data conversion method based on the information entropy theory is proposed to convert the component level virtual and physical test data into equivalent system test data, in which the data credibility is taken into consideration. The equivalent system test data is then used to get the prior probability density function of the testability indexes with an empirical Bayesian method. Then, a testability demonstration planning method of Bayesian posterior risk criteria is presented. Finally, the fault detection rate demonstration tests of a flight control system and a heating controller are taken as examples to verify the proposed method. The results show that the introduction of prior test data can effectively decrease the sample size and the credibility of the virtual testability test data can affect the test plan.

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8

Di, Peng, Xuan Wang, Tong Chen, and Bin Hu. "Multisensor Data Fusion in Testability Evaluation of Equipment." Mathematical Problems in Engineering 2020 (November 30, 2020): 1–16. http://dx.doi.org/10.1155/2020/7821070.

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The multisensor data fusion method has been extensively utilized in many practical applications involving testability evaluation. Due to the flexibility and effectiveness of Dempster–Shafer evidence theory in modeling and processing uncertain information, this theory has been widely used in various fields of multisensor data fusion method. However, it may lead to wrong results when fusing conflicting multisensor data. In order to deal with this problem, a testability evaluation method of equipment based on multisensor data fusion method is proposed. First, a novel multisensor data fusion method, based on the improvement of Dempster–Shafer evidence theory via the Lance distance and the belief entropy, is proposed. Next, based on the analysis of testability multisensor data, such as testability virtual test data, testability test data of replaceable unit, and testability growth test data, the corresponding prior distribution conversion schemes of testability multisensor data are formulated according to their different characteristics. Finally, the testability evaluation method of equipment based on the multisensor data fusion method is proposed. The result of experiment illustrated that the proposed method is feasible and effective in handling the conflicting evidence; besides, the accuracy of fusion of the proposed method is higher and the result of evaluation is more reliable than other testability evaluation methods, which shows that the basic probability assignment of the true target is 94.71%.

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9

Harman, M., Lin Hu, R. Hierons, J. Wegener, H. Sthamer, A. Baresel, and M. Roper. "Testability transformation." IEEE Transactions on Software Engineering 30, no. 1 (January 2004): 3–16. http://dx.doi.org/10.1109/tse.2004.1265732.

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10

Nagle, H. T., R. R. Fritzemeier, J. E. Van Well, and M. G. McNamer. "Microprocessor testability." IEEE Transactions on Industrial Electronics 36, no. 2 (May 1989): 151–63. http://dx.doi.org/10.1109/41.19064.

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11

Voas, J., J. Payne, R. Mills, and J. McManus. "Software testability." ACM SIGSOFT Software Engineering Notes 20, SI (August 1995): 247–55. http://dx.doi.org/10.1145/223427.211854.

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12

Iwama, Kazuo, and Yuichi Yoshida. "Parameterized Testability." ACM Transactions on Computation Theory 9, no. 4 (January 12, 2018): 1–16. http://dx.doi.org/10.1145/3155294.

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13

Henderson, David K. "On the Testability of Psychological Generalizations (Psychological Testability)." Philosophy of Science 58, no. 4 (December 1991): 586–606. http://dx.doi.org/10.1086/289642.

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14

Wang, Xiu Fang, Bin Chen, Jin Ye Peng, and Wei Qi. "Research on Modeling and Analysis of Testability for Complex Electronic System." Applied Mechanics and Materials 701-702 (December 2014): 236–40. http://dx.doi.org/10.4028/www.scientific.net/amm.701-702.236.

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Due to the lack of effective modeling and analysis methods for testability of complex electronic system, a testability index model is established to resolve this problem. First of all, the existing testability demonstration test and evaluation method are analyzed. On this basis, testability indexes statistical models based on the binomial distribution, or Beta distribution and F distribution are established. What’s more, the relationship and principle between the fault detection or isolation data and the confidence level are analyzed in these models. Finally, the result of simulation shows that these models are practical and effective, which provides a new way of effectively analyzing and evaluating testability indexes of complex electronic system.

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15

Zhao, Jing, Wen Jun Zhao, and Qiang Zhang. "Design and Realization of an Avionics Equipment Testability Model Based on TADS." Applied Mechanics and Materials 644-650 (September 2014): 964–67. http://dx.doi.org/10.4028/www.scientific.net/amm.644-650.964.

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The testability design becomes one of important works to do during a design process of a system and en equipment. Whereas, the testability labor of current avionics equipments are performed after design and most of its testability results are acquired by manual statistic. In this article, taking an aviation radio’s power supply model for example, a testability model is designed based on TADS and the scientificity and practicability of this model is testified by realizing fault separation by GPTS.

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16

Zhou, Ping, and Dong Feng Liu. "Research on Design for Testability of Marine Diesel Engine." Applied Mechanics and Materials 110-116 (October 2011): 4234–39. http://dx.doi.org/10.4028/www.scientific.net/amm.110-116.4234.

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The rapid development of manufacturing industry making the pursuit of equipment performance increasingly demanding. Proceeded from design, considering testing and diagnosis problems from whole system and life cycle is an effective way to avoid major accidents and reduce the cost of maintenance, therefore, testability is widespread concerned. In this paper, taken marine diesel engine as research object, analyzed its necessity and feasibility of design for testability (DFT), through fully study of marine diesel engine’s testability characteristics, introduced multi-signal model to analysis marine diesel engine’s lubrication system testability, then advanced improvements for its testability, it can detect and isolate all faults of lubrication system, which provided a reference guide to marine diesel engine’s manufacturing.

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17

Li, Tian-Mei, Cong-Qi Xu, Jing Qiu, Guan-Jun Liu, and Qi Zhang. "The Assessment and Foundation of Bell-Shaped Testability Growth Effort Functions Dependent System Testability Growth Models Based on NHPP." Mathematical Problems in Engineering 2015 (2015): 1–17. http://dx.doi.org/10.1155/2015/613170.

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This paper investigates a type of STGM (system testability growth model) based on the nonhomogeneous Poisson process which incorporates TGEF (testability growth effort function). First, we analyze the process of TGT (testability growth test) for equipment, which shows that the TGT can be divided into two committed steps: make the unit under test be in broken condition to identify TDL (testability design limitation) and remove the TDL. We consider that the amount of TGF (testability growth effort) spent on identifying TDL is a crucial issue which decides the shape of testability growth curve and that the TGF increases firstly and then decreases at different rates in the whole life cycle. Furthermore, we incorporate five TGEFs: an Exponential curve, a Rayleigh curve, a logistic curve, a delayed S-shape curve or an inflected S-shaped curve which are collectively referred to as Bell-shaped TGEFs into STGM. Results from applications to a real data set of a stable tracking platform are analyzed and evaluated in testability prediction capability and show that the Bell-shaped function can be expressed as a TGF curve and that the logistic TGEF dependent STGM gives better predictions based on the real data set.

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18

Flottes, M. L., B. Rouzeyre, and L. Volpe. "Improving Datapath Testability by Modifying Controller Specification." VLSI Design 15, no. 2 (January 1, 2002): 491–98. http://dx.doi.org/10.1080/1065514021000012101.

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A digital circuit includes two main parts: a controller and a datapath. After connection of these two parts, both are subject to a sharp fall in testability due to the lack of controllability and observability at the interface. In this paper, we propose a method for specifying the control part in order to restore the testability of the datapath to a level close to the initial one, in other words its testability before connection. This testability driven specification affects the next state logic as well as the decoder part of the controller but does not make use of any scan-based element. Based on the finite automata theory and on results of a testability analysis performed on the datapath, the proposed method entails very little area penalty.

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19

Farhat, H., and S. From. "A Quadratic Programming Approach to Estimating the Testability and Random or Deterministic Coverage of a VLSl Circuit." VLSI Design 2, no. 3 (January 1, 1994): 223–31. http://dx.doi.org/10.1155/1994/75615.

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The testability distribution of a VLSI circuit is modeled as a series of step functions over the interval [0, 1]. The model generalizes previous related work on testability. Unlike previous work, however, we include estimates of testability by random vectors. Quadratic programming methods are used to estimate the parameters of the testability distribution from fault coverage data (random and deterministic) on a sample of faults. The estimated testability is then used to predict the random and deterministic fault coverage distributions without the need to employ test generation or fault simulations. The prediction of fault coverage distribution can answer important questions about the “goodness” of a design from a testing point of view. Experimental results are given on the large ISCAS-85 and ISCAS-89 circuits.

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20

Zhu, Jiabi, Mostafa Abd-El-Barr, and Carl McCrosky. "A New Theory for Testability-Preserving Optimization of Combinational Circuits." VLSI Design 5, no. 1 (January 1, 1996): 59–75. http://dx.doi.org/10.1155/1996/19043.

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Testability should be considered as early as possible in VLSI synthesis and optimization. In most CAD tools, testability preservation is achieved as a by-product of finding a less redundant implementation. Unfortunately, this approach is not supported by theory. It is essential to have an optimization scheme that systematically preserves testability. A complete theory covering testability-preserving optimization of combinational circuits is yet to be developed.In this paper, a new testability-preserving theory is established. This theory covers most optimization cases in the synthesis of irredundant circuits. Optimization of redundant circuits is also considered. Algorithms based on this theory are proposed. Experiments to verify the theory and algorithms are reported. The developed theory and algorithms are more general than previous results.

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21

Zhang, Xi Shan, Kao Li Huang, Peng Cheng Yan, and Guang Yao Lian. "Complex System Testability Analysis Based on Bayesian Networks under Small Sample." Applied Mechanics and Materials 602-605 (August 2014): 1772–77. http://dx.doi.org/10.4028/www.scientific.net/amm.602-605.1772.

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A lot of prior information in complex system test has been accumulated. To use the prior information for complex system testability quantitative analysis, a new complex system testability modeling and analyze method based on Bayesian network is presented. First, the complex system’s testability model is built using various kind of prior information by Bayesian network learning algorithm. Then, the way of assessing the testability of complex system is provided using the inference algorithm of Bayesian network. Finally, some proper examples are provided to prove the method’s validity.

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22

TRAHTMAN, A. N. "A POLYNOMIAL TIME ALGORITHM FOR LOCAL TESTABILITY AND ITS LEVEL." International Journal of Algebra and Computation 09, no. 01 (February 1999): 31–39. http://dx.doi.org/10.1142/s0218196799000035.

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A locally testable semigroup S is a semigroup with the property that for some non-negative integer k, called the order or level of local testability, two words u and v in some set of generators for S are equal in the semigroup if (1) the prefix and suffix of the words of length k coincide, and (2) the set of intermediate substrings of length k of the words coincide. The local testability problem for semigroups is, given a finite semigroup, to decide, if the semigroup is locally testable or not. Recently, we introduced a polynomial time algorithm for the local testability problem and to find the level of local testability for semigroups based on our previous description of identities of k-testable semigroups and the structure of locally testable semigroups. The first part of the algorithm we introduce solves the local testability problem. The second part of the algorithm finds the order of local testability of a semigroup. The algorithm is of order n2, where n is the order of the semigroup.

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23

Stȩpniak, Czesław. "Towards a notion of testability." Applications of Mathematics 37, no. 4 (1992): 249–55. http://dx.doi.org/10.21136/am.1992.104507.

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Liu, Gang, and Fang Li. "A New Testability Optimization Allocation Approach." Applied Mechanics and Materials 328 (June 2013): 444–49. http://dx.doi.org/10.4028/www.scientific.net/amm.328.444.

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This paper describes a methodology based on improved genetic algorithms (GA) and experiments plan to optimize the testability allocation. Test resources were reasonably configured for testability optimization allocation, in order to meet the testability allocation requirements and resource constraints. The optimal solution was not easy to solve of general genetic algorithm, and the initial parameter value was not easy to set up and other defects. So in order to more efficiently test and optimize the allocation, migration technology was introduced in the traditional genetic algorithm to optimize the iterative process, and initial parameters of algorithm could be adjusted by using AHP approach, consequently testability optimization allocation approach based on improved genetic algorithm was proposed. A numerical example is used to assess the method. and the examples show that this approach can quickly and efficiently to seek the optimal solution of testability optimization allocation problem.

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25

Mei, Wenjuan, Zhen Liu, Lei Tang, and Yuanzhang Su. "Test Strategy Optimization Based on Soft Sensing and Ensemble Belief Measurement." Sensors 22, no. 6 (March 10, 2022): 2138. http://dx.doi.org/10.3390/s22062138.

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Resulting from the short production cycle and rapid design technology development, traditional prognostic and health management (PHM) approaches become impractical and fail to match the requirement of systems with structural and functional complexity. Among all PHM designs, testability design and maintainability design face critical difficulties. First, testability design requires much labor and knowledge preparation, and wastes the sensor recording information. Second, maintainability design suffers bad influences by improper testability design. We proposed a test strategy optimization based on soft-sensing and ensemble belief measurements to overcome these problems. Instead of serial PHM design, the proposed method constructs a closed loop between testability and maintenance to generate an adaptive fault diagnostic tree with soft-sensor nodes. The diagnostic tree generated ensures high efficiency and flexibility, taking advantage of extreme learning machine (ELM) and affinity propagation (AP). The experiment results show that our method receives the highest performance with state-of-art methods. Additionally, the proposed method enlarges the diagnostic flexibility and saves much human labor on testability design.

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26

Nikfard, Pourya, Suhaimi Bin Ibrahim, Babak Darvish Rohani, Harihodin Bin Selamat, and Mohd Nazri Mahrin. "A Comparative Evaluation of approaches for Model Testability." INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY 9, no. 1 (July 15, 2013): 948–55. http://dx.doi.org/10.24297/ijct.v9i1.4157.

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Design for testability is a very importantissue in software engineering. It becomes crucial in the case of Model Based Testing where models are generally not tested before using as input of Model Based Testing. The quality of design models (e.g.; UML models), has received less attention, which are main artifacts of any software design. Testability tends to make the validation phase more efficient in exposing faults during testing, and consequently to increase quality of the end-product to meet required specifications. Testability modeling has been researched for many years. Unfortunately, the modeling of a design for testability is often performed after the design is complete. This limits the functional use of the testability model to determining what level of test coverage is available in the design. This information may be useful to help assess whether a product meets the target requirement to achieve a desired level of test coverage, but has little pro-active effect on making the design more testable.

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Nikfard, Pourya, Suhaimi Bin Ibrahim, Babak Darvish Rohani, Harihodin Bin Selamat, and Mohd Nazri Mahrin. "An Evaluation for Model Testability approaches." INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY 9, no. 1 (June 30, 2013): 938–47. http://dx.doi.org/10.24297/ijct.v9i1.4159.

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Design for testability is a very important issue in software engineering. It becomes crucial in the case of Model Based Testing where models are generally not tested before using as input of Model Based Testing. The quality of design models (e.g.; UML models), has received less attention, which are main artifacts of any software design. Testability tends to make the validation phase more efficient in exposing faults during testing, and consequently to increase quality of the end-product to meet required specifications. Testability modeling has been researched for many years. Unfortunately, the modeling of a design for testability is often performed after the design is complete. This limits the functional use of the testability model to determining what level of test coverage is available in the design. This information may be useful to help assess whether a product meets the target requirement to achieve a desired level of test coverage, but has little proactive effect on making the design more testable.

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28

Chen, Chien-In Henry, and Mahesh Wagh. "Testability Synthesis for Jumping Carry Adders." VLSI Design 14, no. 2 (January 1, 2002): 155–69. http://dx.doi.org/10.1080/10655140290010079.

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Synthesis for testability ensures that the synthesized circuit is testable by exploring the fundamental relationship between don't care and redundancy. With the exploration of the relationship, redundancy removal can be applied to improve the testability, reduce the area and improve the speed of a synthesized circuit. The test generation problems have been adequately solved, therefore an innovative testability synthesis strategy is necessary for achieving the maximum fault coverage and area reduction for maximum speed. This paper presents a testability synthesis methodology applicable to a top–down design method based on the identification and removal of redundant faults. Emphasis has been placed on the testability synthesis of a high-speed binary jumping carry adder. A synthesized 32-bit testable adder implemented by a 1.2 μm CMOS technology performs addition in 4.09 ns. Comparing with the original synthesized circuit, redundancy removal yields a 100% testable design with a 15% improvement in speed and a 25% reduction in area.

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29

Luo, Jin, Qi Bin Deng, and Chen Zhang. "Testability Modeling and Prediction Method with Unreliable Test." Advanced Materials Research 756-759 (September 2013): 665–68. http://dx.doi.org/10.4028/www.scientific.net/amr.756-759.665.

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For the problem of being lack of consideration of uncertain information during the process of current testability modeling and prediction, the testability modeling and prediction method based on uncertain information is researched from both aspects of uncertain test and uncertain relationship between failure modes and functions. A kind of model called hybrid diagnostic Bayesian networks is designed which is proven to be highly accurate the confidence of the testability prediction results.

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30

Xing, Xiao Qi, Bin Liu, and Dong Yi Ling. "Research on Testability Analysis Methods of Complex Embedded Software." Applied Mechanics and Materials 543-547 (March 2014): 3356–59. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.3356.

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Embedded software gradually tends to be more integrated, modular and complex. The architecture of integrated avionics system software is the typical example. Method for measurement testability of traditional testability analysis model DRR (Domain Range Ratio), due to its reliance on internal information, it is difficult to measure testability for complex embedded software such as IMA. So this article on the basis of the DRR model, it is proposed a model that described internal information of embedded software complex in development phase, Base-Line-Flow Graph, at the same time, we can measure testability index of software through this model. An example of IMA task proved that this method is effective and feasible.

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31

Barthélémy, Jean-Hugues. "Is testability falsifiability?" Kairos. Journal of Philosophy & Science 24, no. 1 (December 1, 2020): 74–90. http://dx.doi.org/10.2478/kjps-2020-0012.

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32

Ellis, G. "Theories Beyond Testability?" Science 342, no. 6161 (November 21, 2013): 934. http://dx.doi.org/10.1126/science.1246302.

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33

Moritz, P. S., and L. M. Thorsen. "CMOS circuit testability." IEEE Journal of Solid-State Circuits 21, no. 2 (April 1986): 306–9. http://dx.doi.org/10.1109/jssc.1986.1052520.

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34

Roberts, D. H., J. A. Elmore, R. Balcombe, R. B. Bennett, and J. M. Hodge. "Design for testability." IEE Proceedings A Physical Science, Measurement and Instrumentation, Management and Education, Reviews 132, no. 4 (1985): 241. http://dx.doi.org/10.1049/ip-a-1.1985.0054.

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35

Spencer and Savir. "Layout Influences Testability." IEEE Transactions on Computers C-34, no. 3 (March 1985): 287–90. http://dx.doi.org/10.1109/tc.1985.1676573.

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36

Maunder, Colin M., and Rodham E. Tulloss. "Testability on TAP." Microprocessors and Microsystems 17, no. 5 (June 1993): 259–65. http://dx.doi.org/10.1016/0141-9331(93)90002-o.

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37

Nazir, Mohd, Dr Raees A. Khan, and Dr K. Mustafa. "Testability Estimation Framework." International Journal of Computer Applications 2, no. 5 (June 10, 2010): 9–14. http://dx.doi.org/10.5120/668-937.

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38

Bennetts, R. G., and M. A. Jack. "Design for testability." IEE Proceedings G (Electronic Circuits and Systems) 132, no. 3 (1985): 73. http://dx.doi.org/10.1049/ip-g-1.1985.0017.

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39

Maunder, C. M., and R. E. Tulloss. "Testability on TAP." IEEE Spectrum 29, no. 2 (February 1992): 34–37. http://dx.doi.org/10.1109/6.119610.

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40

Roush, Sherrilyn. "Testability and Candor." Synthese 145, no. 2 (June 2005): 233–75. http://dx.doi.org/10.1007/s11229-005-3748-1.

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41

Dssouli, R., K. Karoui, K. Saleh, and O. Cherkaoui. "Communications software design for testability: specification transformations and testability measures." Information and Software Technology 41, no. 11-12 (September 1999): 729–43. http://dx.doi.org/10.1016/s0950-5849(99)00033-6.

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Liu, Guanjun, Chenxu Zhao, Jing Qiu, and Yong Zhang. "Testability integrated evaluation method based on testability virtual test data." Chinese Journal of Aeronautics 27, no. 1 (February 2014): 85–92. http://dx.doi.org/10.1016/j.cja.2013.12.012.

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Ooi, Chia Yee, and Hideo Fujiwara. "A New Design-for-Testability Method Based on Thru-Testability." Journal of Electronic Testing 27, no. 5 (September 1, 2011): 583–98. http://dx.doi.org/10.1007/s10836-011-5241-8.

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Cupertino, César Medeiros, and Paulo Roberto Barbosa Lustosa. "Ohlson Model Testability: Empirical Tests Findings." Brazilian Business Review 1, no. 2 (June 30, 2004): 141–55. http://dx.doi.org/10.15728/bbr.2004.1.2.5.

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Ni, Tianming, Xiaoqing Wen, Hussam Amrouch, Cheng Zhuo, and Peilin Song. "Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware." ACM Transactions on Design Automation of Electronic Systems 29, no. 1 (December 18, 2023): 1–3. http://dx.doi.org/10.1145/3631476.

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The research on design for testability and reliability of security-aware hardware has been important in both academia and industry. With ever-growing globalization, commercial hardware design, manufacturing, transportation, and supply now involve many different countries, resulting in aggravated vulnerability from hardware design to manufacturing. Hardware with malicious purposes implanted from the third-party manufacturing process may control the operation of a circuit and tamper its functions, causing serious security issues. However, hardware includes not only devices and circuits but also systems. An important fact is that testability, reliability, and security technologies come from different design layers, but the impact evaluation is conducted at the system level. In other words, the testability, reliability, and security design of different layers can be carried out in a holistic manner to achieve optimization for the whole system. In addition, the testability, reliability, and security design technologies of each design layer can be collaboratively conducted to achieve better performance. The testability, reliability, and security tradeoff has garnered attention from academia and industry, particularly in the Post-Moore Era, due to the complexities and opportunities arising from new architectures and technologies.

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Jamoussi, M., B. Kaminska, and D. Mukhedkar. "Testability of one-dimensional iterative arrays using a variable testability measure." IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 41, no. 1 (1994): 82–86. http://dx.doi.org/10.1109/81.260230.

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Ravikumar, C. P., and H. Joshi. "SCOAP-based Testability Analysis from Hierarchical Netlists." VLSI Design 7, no. 2 (January 1, 1998): 131–41. http://dx.doi.org/10.1155/1998/32654.

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Circuits of VLSI complexity are designed using modules such as adders, multipliers, register files, memories, multiplexers, and busses. During the high-level design of such a circuit, it is important to be able to consider several alternative designs and compare them on counts of area, performance, and testability. While tools exist for area and delay estimation of module-level circuits, most of the testability analysis tools work on gate-level descriptions of the circuit. Thus an expensive operation of flattening the circuit becomes necessary to carry out testability analysis. In this paper, we describe a time and space-efficient technique for evaluating the well known SCOAP testability measure of a circuit from its hierarchical description with two or more levels of hierarchy. We introduce the notion of SCOAP Expression Diagrams for functional modules, which can be precomputed and stored as part of the module data base. Our hierarchical testability analysis program, HISCOAP, reads the SCOAP expression diagrams for the modules used in the circuit, and evaluates the SCOAP measure in a systematic manner. The program has been implemented on a Sun/SPARC workstation, and we present results on several benchmark circuits, both combinational and sequential. We show that our algorithm also has a straightforward parallel realization.

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Sun, Jian, Qin Lei Sun, Kao Li Huang, Ying Xie, and Hong Ru Li. "Study on Method for Test Points Selection under Uncertainty Based on MBQPSO." Applied Mechanics and Materials 239-240 (December 2012): 730–34. http://dx.doi.org/10.4028/www.scientific.net/amm.239-240.730.

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Test points choosing are the beginning of optimization of design for testability. With the consideration of uncertain influences on the tests of electronic equipment, the model for design for testability was proposed based on hybrid diagnosis modified by Bayesian network. Based on the new model, the algorithm of MBQPSO was proposed, which could take use of multi-dimension searching mechanism to choose test points according to uncertain correlation matrix between failure modes and tests. With the experiment, the result of this proposed method is closer to the reality and can provide better guidance for future design for testability.

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Zhu, Chun Sheng, Qi Zhang, Fan Tun Su, and Hong Liang Ran. "Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination." Applied Mechanics and Materials 121-126 (October 2011): 2223–27. http://dx.doi.org/10.4028/www.scientific.net/amm.121-126.2223.

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By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability，the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system-level BIT testability indexes is established. The multi-objective optimization model is solved using Non-dominated Sorting Genetic Algorithm II, and the validity of the multi-objective optimization model is proved through an example.

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Chang, Shih-Chieh, Kwen-Yo Chen, Ching-Hwa Cheng, Wen-Ben Jone, and Sunil R. Das. "Random Pattern Testability Enhancement by Circuit Rewiring." VLSI Design 12, no. 4 (January 1, 2001): 537–49. http://dx.doi.org/10.1155/2001/87048.

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Generally, there exist random-pattern resistant faults that result in the poor fault coverage in Build-In Self-Testing (BIST) scheme. In this paper, we propose a method to enhance the random pattern testability by a circuit restructuring technique, called circuit rewiring. The basic idea of rewiring is to replace a wire by another wire with the circuit functionality remaining unchanged. For two types of rewiring, fanin rewiring and fanout rewiring, we first analyze the testability change for each type of wire replacement. Based on the analysis, an efficient algorithm is given to enhance circuit testability. For a poor observability node, we try to increase its observability by adding an additional fanout to the node and removing an alternative wire whose source node has relatively good observability. The technique does not introduce any hardware overhead and performance degradation since a wire addition is followed immediately by another wire removal. Thus, it is basically cost-free when compared to other testability enhancement techniques.

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