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Books on the topic 'Testing of Digital Circuits'

Author: Grafiati

Published: 4 June 2025

Last updated: 23 June 2025

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1

Jha, Niraj K. Testing of digital systems. Cambridge University Press, 2003.

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2

René, David. Random testing of digital circuits: Theory & application. Marcel Dekker, 1998.

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3

Hurst, S. L. VLSI testing: Digital and mixed analogue/digital techniques. Institution of Electrical Engineers, 1998.

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4

Miczo, Alexander. Digital logic testing and simulation. John Wiley & Sons, 1986.

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5

Lavagno, Luciano. Algorithms for synthesis and testing of asynchronous circuits. Kluwer Academic, 1993.

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6

Weyerer, Manfred. Testability of electronic circuits. Carl Hanser Verlag, 1992.

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7

Weyerer, Manfred. Testability of electronic circuits. C. Hanser, 1991.

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8

Abramovici, Miron. Digital systems testing and testable design. IEEE Press, 1990.

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9

Chattopadhyay, Santanu. Thermal-Aware Testing of Digital VLSI Circuits and Systems. CRC Press, 2018. http://dx.doi.org/10.1201/9781351227780.

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10

Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Springer US, 1999. http://dx.doi.org/10.1007/978-1-4757-4926-7.

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11

Lala, Parag K. Practical digital logic design and testing. Prentice Hall, 1996.

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12

R, Hnatek Eugene. Digital integrated circuit testing from a quality perspective. Van Nostrand Reinhold, 1993.

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13

Wang, Francis C. Digital circuit testing: A guide to DFT and other techniques. Academic Press, 1991.

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14

Chakravarty, Sreejit. Introduction to ID̳D̳Q̳ testing. Kluwer Academic Publishers, 1997.

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15

Wojtkowiak, Hans. Test und Testbarkeit digitaler Schaltungen. B.G. Teubner, 1988.

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16

Matthes, Wolfgang. Fault-finding in computers and digital circuits: Measurement and testing. Elektor Electronics (Pub.), 1998.

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17

Parker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. Kluwer Academic Publishers, 1998.

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18

Molitor, Paul. Equivalence checking of digital circuits: Fundamentals, principles, methods. Kluwer Academic Publishers, 2004.

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19

López, Roberto Téllez-Girón. Testability analysis: A survey on methods and applications. Verlag TÜV Rheinland, 1987.

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20

Marhöfer, Michael. Fehlerdiagnose für Schaltnetze aus Modulen mit partiell injektiven Pfadfunktionen. Springer-Verlag, 1987.

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21

Yang, Zhao. Design and Testing of Digital Microfluidic Biochips. Springer New York, 2013.

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22

Lee, Mike Tien-Chien. High-level test synthesis of digital VLSI circuits. Artech House, 1997.

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23

International, Test Conference (1997 Washington D. C. ). Proceedings. The Conference, 1997.

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24

C), International Test Conference (25th 1994 Washington D. Proceedings: International Test Conference, 1994. The Conference, 1994.

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25

C), International Test Conference (25th 1994 Washington D. Proceedings. The Conference, 1994.

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26

Butler, Kenneth M. Assessing fault model and test quality. Kluwer Academic, 1992.

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27

Bushnell, Michael L., and Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Springer US, 2002. http://dx.doi.org/10.1007/b117406.

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28

1943-, Agrawal Vishwani D., ed. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Kluwer Academic, 2000.

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29

Raik, Jaan. Hierarchical test generation for digital circuits represented by decision diagrams. Tallinn Technical University, 2001.

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30

Parker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. Kluwer Academic, 2002.

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31

Asian Test Symposium (15th 2006 Fukuoka, Japan). Proceedings of the 15th Asian Test Symposium: 20-23 November 2006, Fukuoka, Japan. IEEE Computer Society, 2006.

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32

Hubert, Werkmann, ed. An engineer's guide to automated testing of high-speed interfaces. Artech House, 2010.

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33

Sivaraman, Mukund. A Unified Approach for Timing Verification and Delay Fault Testing. Springer US, 1998.

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34

International Test Conference (1996 Washington D.C). Proceedings. The Conference, 1996.

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35

Wunderlich, Hans-Joachim. Probabilistische Verfahren für den Test hochintegrierter Schaltungen. Springer-Verlag, 1987.

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36

Sivaraman, Mukund. A unified approach for timing verification and delay fault testing. Kluwer Academic, 1998.

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37

International, Test Conference (1988 Washington D. C. ). New frontiers in testing: September 12, 13, 14, 1988 Sheraton Washington Hotel, Washington, DC. IEEE Computer Society Press, 1988.

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38

Parker, Kenneth P. The Boundary-Scan handbook. Kluwer Academic Publishers, 1992.

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39

Wunderlich, Hans-Joachim. Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault. Springer Science+Business Media B.V., 2010.

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40

Asian, Test Symposium (19th 2010 Shanghai China). Proceedings: 2010 19th IEEE Asian Test Symposium : ATS 2010 : 1-4 December 2010, Shanghai, China. IEEE Computer Society, 2010.

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41

International, Test Conference (35th 2004 Charlotte N. C. ). International Test Conference 2004: Proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA. International Test Conference, 2004.

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42

Asian, Test Symposium (9th 2000 Taipei Taiwan). Proceedings of the ninth Asian Test Symposium: (ATS 2000) : December 4-6, 2000 Taipei, Taiwan. IEEE Computer Society, 2000.

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43

International, Test Conference (32nd 2001 Baltimore Maryland). ITC: International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA. International Test Conference, 2001.

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44

Singapore), Asian Test Symposium (7th 1998. Proceedings, Seventh Asian Test Symposium: (ATS'98) : December 2-4, 1998, Singapore. IEEE Computer Society Press, 1998.

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45

Clara, Calif ). International Test Conference (37th 2006 Santa. 2006 IEEE International Test Conference: Santa Clara, CA : 22-27 October 2006. Institute of Electrical and Electronics Engineers (IEEE), 2006.

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46

IEEE Computer Society. Test Technology Technical Committee., Asian Test Symposium. Tenth Anniversary Committee., and Asian Test Symposium, eds. 10th anniversary compendium of papers from Asian Test Symposium: Proceedings : 1992-2001. IEEE Computer Society, 2001.

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47

Asian Test Symposium (8th 1999 Shanghai, China). Proceedings: Eighth Asian Test Symposium : (ATS'99) : November 16-18, 1999, Shanghai, China. IEEE Computer Society, 1999.

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48

Asian Test Symposium (10th 2001 Kyoto, Japan). 10th Asian Test Symposium: Proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, 2001.

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49

International Test Conference (31st 2000 Atlantic City, N.J.). ITC: International Test Conference 2000 : proceedings International Test Conference 2000 : [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]. International Test Conference, 2000.

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50

International Test Conference (33rd 2002 Baltimore, Maryland). Proceedings International Test Conference 2002. International Test Conference, 2002.

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