Relevant bibliographies by topics / TFT-LCD

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers

Academic literature on the topic 'TFT-LCD'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "TFT-LCD"

1

Katayama, M. "TFT-LCD technology." Thin Solid Films 341, no. 1-2 (March 1999): 140–47. http://dx.doi.org/10.1016/s0040-6090(98)01519-3.

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Jian, Chuan Xia, Jian Gao, and Xin Chen. "A Review of TFT-LCD Panel Defect Detection Methods." Advanced Materials Research 734-737 (August 2013): 2898–902. http://dx.doi.org/10.4028/www.scientific.net/amr.734-737.2898.

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TFT-LCD panel defect detection has been one of the difficulties in this field because of fuzzy defect boundary, low contrast between defects and background, and low detection speed. The structure of TFT-LCD panels and classification are introduced. Through the analysis of panel defect features, current detection methods for the TFT-LCD panel defects are reviewed. The key technologies of feature extraction and defect classification are analyzed in the defect image recognition of TFT-LCD panel. Meanwhile the methods of fuzzy boundary defect segmentation, image subtraction and image filtering are also discussed. Finally, the characteristics and advantages of these detection methods are concluded, and several key issues for the TFT-LCD defect detection have been proposed for future development.
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3

Leu, Yungho, and Chia-Ming Lin. "Optimizing Optical Film Lamination to Enhance the Luminance of TFT-LCD Displays Using the Taguchi-NNGA Method." Materials 14, no. 16 (August 10, 2021): 4481. http://dx.doi.org/10.3390/ma14164481.

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Luminance is an essential quality of a TFT-LCD display. Manufacturers have attempted to improve the soft-to-hard lamination stage to enhance the luminance of their TFT-LCD displays. In addition, many customers have complained about the insufficient luminance of the TFT-LCD displays of the case company. While product engineers have kept tuning the control factors in the soft-to-hard lamination stage through the trial and error method, the improvement of the luminance was not good enough. This study aims to assist the product engineers to fine-tune the settings of the control factors using a new method composed of the Taguchi method, a neural network, and a genetic algorithm. The confirmation experiments showed that the proposed method had increased the average luminance of the TFT-LCD displays from 17.03 to 25.15, which was higher than the required luminance value of 25. As a result, the number of complaints on the TFT-LCD displays had been significantly reduced.
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Lee, Zon-Yau, and Chung-Che Pai. "Applying Improved DEA & VIKOR Methods to Evaluate the Operation Performance for World's Major TFT–LCD Manufacturers." Asia-Pacific Journal of Operational Research 32, no. 03 (June 2015): 1550020. http://dx.doi.org/10.1142/s0217595915500207.

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The whole panel industry has been impacted profoundly by global recession from 2007 to 2009, and the TFT–LCD industry is not an exception. Currently, the major TFT–LCD manufacturers cluster in South Korea, Taiwan and Japan, which totally contribute more than 80% sales in global market. All these TFT–LCD manufacturers face the five industry characteristics, including intensive capital, intensive technology, short product life cycle and fast technology advancement, fluctuating prices easily influenced by market demand/supply and business cycle, and international collaboration. In view of rapid growth of global demand, TFT–LCD manufacturers face a tremendous competition environment. Therefore, how to configure the best resource allocation and create more profits tend to be an essential issue for the managers of TFT–LCD industry. This paper employs improved DEA and VIKOR to evaluate the dynamic operation performances for TFT–LCD manufacturers in Taiwan, South Korea and Japan from 2002 to 2009. Research results show that South Korean firms have relatively better stable operation performances, while the performance of the firms in Taiwan and Japan are relatively worse and varied over time. After referring to the disclosure statements and industrial experts' opinions, this paper also portraits the reason of Sony with great performance in 2007 was resulted from the sales boost of high-level touch panels which leads to 50% high gross profit ratio and rapidly increasing pre-tax profit in 2007. As a result, how to develop high-level or multi-function panels might be an essential issue for the TFT–LCD manufacturers in Taiwan.
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./YJYXS. "TFT character of Al electrode in TFT-LCD." Chinese Journal of Liquid Crystals and Displays 32, no. 6 (2017): 433–37. http://dx.doi.org/10.3788/yjyxs20173206.0433.

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Lin, Chun-Cheng, Jia-Rong Kang, and Shu-Hsing Chung. "Modeling the Material Allocation System for TFT-LCD Module Factories Based on Make-to-Stock Production." Asia-Pacific Journal of Operational Research 31, no. 06 (December 2014): 1450047. http://dx.doi.org/10.1142/s021759591450047x.

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The thin flim transistor liquid crystal display (TFT-LCD) module factories are in charge of the last process of the TFT-LCD supply chain, i.e., assembling LCD panels (produced from the former process in the supply chain) as well as electronic components into TFT-LCD panels or the finished products using TFT-LCD panels. Since the variation of machine processes and production techniques at the former process of the supply chain results in a variety of qualities of LCD panels, the finished products assembled with those LCD panels of different qualities are also of different qualities, according to which they are classified into different grades. This paper models the material allocation system for a TFT-LCD module factory based on the make-to-stock (MTS) production, in which one of the main designs is to allow the flexibility that the finished products of higher grades are able to be downgraded to respond to the drastic variation of customer requirements for each grade of finished products. The system is modelled in detail by an integer programming approach that takes into account not only downgraded products but also the customer requirements for the quality qualification rate and the lower bound of non-dot-defect rate of products, to maximize the total profit of the product portfolio. The model is evaluated by conducting an experimental study for a numerical example, which turns out that the proposed system looks promising as it determines a feasible product portfolio that decreases both the inventory of LCD panels and the volume of unqualified products while maintaining a high profit.
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Chen, Po-Lun, and Ming-Kwan Niu. "Making a Greener TFT-LCD." Information Display 26, no. 11-12 (November 2010): 16–21. http://dx.doi.org/10.1002/j.2637-496x.2010.tb00324.x.

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Guo, Bo, Guo Qing Hu, and Guang Yong Yang. "TFT-LCD Spot-Type Defect Detection in Module Process." Advanced Materials Research 971-973 (June 2014): 1368–71. http://dx.doi.org/10.4028/www.scientific.net/amr.971-973.1368.

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In this paper we present a global approach for the automatic inspection of spot-type defects in TFT-LCD module process. The proposed method is based on a global image reconstruction scheme using the Fourier transform. Since TFT-LCD surface has the statistical and periodic texture, the isotropic spread of frequency components in the power spectrum space forms the shape approximate to a circle. By computing the convolution between the Fourier transform result and a ideal low pass filter (ILPF) , we can remove the TFT-LCD periodic and repetitive patterns using the inverse Fourier transform. In the restored image, the global structurally textured background is eliminated and the spot-type defects are preserved. This converts the difficult defect detection in TFT-LCD images into a simple segmentation problem. The spot-type defects are classified into general point defects and spot Mura defects .The experimental results from point defects and spot Mura defects have shown the efficacy of the proposed method.
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Tsai, Jung-Fa, Chin-Po Wang, Ming-Hua Lin, and Shih-Wei Huang. "Analysis of Key Factors for Supplier Selection in Taiwan’s Thin-Film Transistor Liquid-Crystal Displays Industry." Mathematics 9, no. 4 (February 17, 2021): 396. http://dx.doi.org/10.3390/math9040396.

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With the advent of science and technology, smart devices have become ubiquitous; since the display unit is a vital component in many smart devices, the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD) industry has been one of the most rapidly growing industries. Taiwanese manufacturers play a critical role in this industry. This study investigates key factors for supplier selection in Taiwan’s TFT-LCD industry. TFT-LCD is a technology-intensive industry. However, few studies in the past considered the technological abilities dimension in supplier selection. Therefore, this study discusses the factors related to the technological abilities dimension in supplier selection. Most research considered supplier selection based on the traditional criteria such as cost and quality. This study discusses the importance of the resilience criteria such as agility and flexibility. A method combining DEMATEL (Decision Making Trial and Evaluation Laboratory) and ANP (Analytic Network Process) is applied to analyze key factors for supplier selection in Taiwan’s TFT-LCD industry. The analytical results indicate that the technological abilities dimension and resilience criteria are at the forefront of the ranking in prominence. The influential weights of criteria and the causal diagram among all criteria derived from this study can offer guidance for suppliers on improving various factors to become desirable partners in the TFT-LCD industry supply chain.
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Kim, Byung Sun, Dock Jin Lee, Ja Choon Koo, Jae Boong Choi, Young Jin Kim, Jong Nam Lee, and Young Bee Chu. "Evaluation of Shockproofness of Small Form Factor Mobile TFT-LCD." Key Engineering Materials 321-323 (October 2006): 1679–82. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1679.

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As the TFT-LCDs are getting more attention for the next generation display device, specifications of the mechanical functionalities of the device is to be more tighter as well as the electrical user specifications. Due to its brittle characteristics of TFT-LCD panels, maintaining mechanical integrity under an impact loading situation is the one of the key design concerns. Furthermore, as the TFT-LCDs are popularly adopted for various mobile equipments such as cellular phones and digital cameras, shock failure of the display should be prohibitive for the design engineers. A major incident being monitored during the shock loading is of course the local material failure of the TFT-LCD panel that might happen at its maximum deformation. The present work delivers a systematic approach for the shockproof design of mobile TFT-LCD. A specially designed shock test setup evaluated by a set of rigorous FEM analyses is shown and comments for the shockproof method is to be also delineated.
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Dissertations / Theses on the topic "TFT-LCD"

1

Chu, Tao-Peng, and 朱道鵬. "TFT-LCD Panel Life Study." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/08109101854354127492.

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碩士
國立臺灣科技大學
工業管理系
97
The calculation of MTBF (mean time between failures) is very important in reliability life data analysis. For different distributions, the values of mean time between failures are always different. This paper uses two different approaches to obtain the TFT-LCD panel life, one is the accelerated demonstration life testing which is performed at the reliability lab during the panel development stage, the other approach is to collect the filed return data from the repair center. In this paper, we collect both of the accelerated demonstration life testing data and filed return data through the repair center for one 14.1” TFT-LCD panel. The least square method is used for the linear regression to get the correlation coefficient from the different distributions, including the Weibull distribution, normal distribution, lognormal distribution and exponential distribution. The distribution of the maximum correlation coefficient is chosen for the optimum TFT-LCD panel life distribution. We also use the max likelihood estimates to get the parameters of the distribution and calculate the panel life value. The deviation of the life value between the accelerated demonstration life testing and field return data is also discussed in this paper.
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Yang, Chih-Chung, and 楊志忠. "TFT-LCD Lithography Overlay Analysis." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/84289641895952253190.

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碩士
中原大學
機械工程研究所
96
In liquid crystal display, the circuit diagrams of TFT devices are printed from reticle onto the glass substrate by optical lithography. In this process, the accurate overlay in every structure level must have a serious rule because it affects the quality of lithography. Hence, not only the environmental factors but exposure machine, even the fabrication of reticle, the bending of glass substrate or the measurement error must be controlled. Since each exposure machine possesses its own overlay characteristics, the overlay analysis and compensation is an important assignment in lithography technology. In this research, the first step is to collect the coordinates of measurement positions and the vectors of overlay errors. Then, their geometrical vectors are divided into intrafield and interfield types in order to analyze the cause of each error coefficient. If the compensation is made to any single overlay error coefficient based on the geometrical vectors, over-compensation and divergence may happen. Therefore, a parameter compensation method is proposed in this thesis. Firstly, the best permutation among various parameter combinations is obtained from the experiments. Then, this method is implemented to the sequential glass substrates in the same exposure machine and we observe the variation of overlay errors. The results show that the overlay error of each substrate is continuously reduced and reaches a steady state. Finally, the data is applied to the practical examples in order to improve the yield and promote the efficiency of equipment. In the first-stage experiments, the total error has obviously dwindled by 13% and the error between two sets of data is within 0.015 μm. Moreover, the total error has reduced 8% more in the second-stage experiments. The average of total errors is within (11.1705  1.0685) μm. The result is stable.
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Kuo, Yi-Chih, and 郭奕志. "TFT LCD power saving architecture." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/68011289835583470239.

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碩士
崑山科技大學
電子工程研究所
99
This paper proposes a way of reducing current consumption of the TFT LCD method. TFT LCD power consumption of the factors used in the TFT LCD source driver of the OP amplifier architecture and panel loading. So the past a rail to rail type OP amplifier to drive a panel of the channel, replaced by a PN type OP amplifier to drive panel of two channels, this approach re-use a specific pattern when, PN type OP amplifier up than rail to rail type OP amplifier to 50% of the province, the current consumption. And then with the original switch used to control the liquid crystal state of the dot inversion switch column inversion of the way, when the two mix and match to compare the differences. Finally, the paper to experiment with different pattern found to white pattern to do the comparison, PN type OP amplifier architecture with column inversion than rail to rail type OP amplifier architecture with dot inversion province to 90 percent of consumption current. To verify the feasibility of the proposed method in this paper.
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武冠宏. "TFT-LCD Array Mask Decision Model." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/48900006080208503170.

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碩士
國立交通大學
管理學院碩士在職專班工業工程與管理組
97
The production environment in a traditional 4.5” TFT-LCD factory has changed dramatically over the last five years. Due to new generation factories arising, the traditional 4.5” TFT-LCD factories are forced to accept orders to produce various small size display products instead of make-to-stock products. A large number of products are produced concurrently in a production line. In general, the photo machine is the bottle-neck machine in TFT-LCD array manufacturing process. There are variety types of photo machines existed in a production line. Mask is the main fixture of photo machine. The price of mask is very expensive. There are five photo operations in each product routing. Each operation for each product needs a mask as fixture of the photo machine. The type of mask must match with the type of photo machine. A large numbers of mask types and numbers must be decided. The performance of this decision is the outputs. In this study, we deal with the uncertain demand problem that the uncertain demand is represented by the probability distribution of product mixed. A linear programming model is formulated to decide the type and number of mask for each product to maximize the profit under the constraints of machine capacity. A real case is given to illustrate the decision model. And we also do sensitivity analysis.
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Tu, Chih-Wei, and 涂志偉. "Analysis of Mura in TFT-LCD." Thesis, 2005. http://ndltd.ncl.edu.tw/handle/07030730677212511632.

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碩士
國立中央大學
電機工程研究所
93
In recent years, the TFT-LCD gradually becomes a mainstream of FPDs (Flat Panel Displays), and the request of image quality for a TFT-LCD becomes more and more severe. There are many items such as luminance, chromaticity, contrast, flicker, crosstalk and response time, etc. have to be evaluated for the image quality of display devices. But several of the other items have difficulties during evaluation of image quality, e.g. mura and image sticking. Mura is the most popular defect in producing TFT-LCD, in most cases, and is not easily identified so that those persons identifying mura in the industry need the experienced skill based on the related knowledge. It is thus obvious for manually identifying process by human beings to be costly and inconsistent. To overcome such hardship, an automated process for mura analysis has been considered. In this study, we have investigated, analyzed and quantified the mura phenomena in the image quality of a TFT-LCD and hopefully try to set-up an optical evaluation system for mura. We found that the Cjnd (Just-Noticeable-Difference Contrast) value of the mura with abrupt boundary will be influenced by background luminance, mura size, and mura shape. As the background luminance increased, the Cjnd value decreased. However, when the background luminance was increased to above a threshold value around 172 cd/m2, there was no significant difference in Cjnd to human visual perception for a given mura size. Obviously, the relationship between Cjnd and background luminance was non-linear. Furthermore, the Cjnd value of mura with a smaller size was higher, and the Cjnd value of line type mura was higher than those of the other muras which with the same size but different shape. Besides, the threshold value for human visual perception of mura could be estimated with a graded mura. Comparing the results of Muras with abrupt boundary and graded ones, we also found that any type of mura detectable by human eyes could be estimated by the index of Just Noticeable Difference contrast. Based on the analysis of our results, we modified the Cjnd equation which proposed by SEMI (Semiconductor Equipment and Materials International), and re-named as MCjnd which was more correlated to human visual inspection. Then, replacing the Cjnd with MCjnd, a new definition of mura level was obtained and called MSEMU, in contrast to SEMU proposed by SEMI. After comparing the analysis results of MSEMU and SEMU, it could be concluded that the MSEMU definition was reasonable and more correlated to human visual inspection for the mura analysis.
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Kung, Ta-Yuan, and 龔達淵. "The Design of TFT-LCD Driver." Thesis, 2001. http://ndltd.ncl.edu.tw/handle/29993973403832519840.

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碩士
大同大學
電機工程研究所
89
The purpose of this thesis is to design the TFT-LCD column driver. This driver contains 6-bit resolution for one sub-pixel, 218 colors and the outputs for 12 sub-pixels. In the scheme of the DAC design, we use two different structures. One is the R-string DAC, and the other is the SC-DAC. The transistors in the whole circuit use the UMC 0.5um processing model to realize. And we use the HSPICE tool to simulate the driver with the input clock frequency being 60 MHz.
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Huang, Yao-Chiu, and 黃瑤秋. "A Study of TFT LCD Crosstalk." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/51156557448639250609.

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碩士
中華大學
電機工程學系(所)
97
LCD has evolved different driver technologies based on its applications. From the signal-interface point of view、there are two main categories: digital and analog. The digital interface is replacing the analog one for its superiority in picture quality、and has unanimously adopted 「dot inversion」 technique to address the problems of crosstalk and flicker in LCD displays. This paper attempts to investigate the root cause of crosstalk in LCD displays operating under dot inversion mode. The investigation involves the following procedures: first of all、starting with circuit deduction to find out the coupling path of parasitic capacitance; secondly、analyzing the impact of parasitic capacitance on liquid crystal as well as storage capacitance; thirdly、using optical instrument to measure spectrum of different display patterns under dot inversion mode; and lastly、calculating the variance of crosstalk based on spectrum data. Through the procedure stated above we can get information about the crosstalk information between the neighboring cells. Crosstalk measurement results show that the crosstalk between neighboring cells is not symmetric.
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HSIAO, SHU-HUI, and 蕭淑惠. "Research Of TFT-LCD Panel Process." Thesis, 2017. http://ndltd.ncl.edu.tw/handle/2yfs45.

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碩士
南開科技大學
電子工程研究所
105
Nowadays, panel technology has been a trend all over the world, no matter where you are. This technology can be applied in a wide range, such as: solar panels, mobile phones, television and computers. Obviously, the commercial products resulted from panel technology become an important part of human life. The innovation in panel technology, gives us a new world to daily life. Meanwhile, the enjoyment of visual quality is also improved. At present, TFT-LCD as the representative of the flat panel display industry is devel-oping rapidly. In the next few years, the global outcome from panel industry will ex-ceed the integrated circuit industry. Therefore, in face of its challenges, the develop-ment of TFT-LCD products is urgent.
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Liu, Chang-Chi, and 劉昌旗. "Improving Electrostatic Discharge of TFT –LCD." Thesis, 2018. http://ndltd.ncl.edu.tw/handle/vvb7ps.

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碩士
國立臺北科技大學
管理學院EMBA華南專班
106
This study mainly discusses how to improve the electrostatic discharge caused by the Thin Film Transistor Liquid Crystal Display (TFT-LCD) production equipment, so as to reduce the bad rate of product production by reducing the damage caused by TFT-LCD. The process of panel manufacturing is an automatic operating machine. During the process, the automatic transmission system of contact separation between the glass substrate and the granite platform is coated. When contact and friction are produced, the electrostatic discharge will directly affect the pixels in the panel display area and the abnormal reduction of the products yield. So to date, the ESD prevention is prevented. Care has an effect that can not be ignored. Electrostatic grounding, electrostatic discharge / dissipation, conductive / dissipative contact and ionization are embodied. The methods and measures of electrostatic protection are studied and some ideas are discussed to reduce the occurrence of electrostatic damage through Laser laser technology to produce high quality and high quality products.
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Hung, Hsiang-Jen, and 洪祥仁. "Route Improvement in TFT-LCD Process." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/39484831683414691682.

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碩士
國立高雄應用科技大學
電機工程系
97
In factory automation, optimization of the material logistics system is an important factor in the improvement of a manufacture process. In the automatic warehousing system of the panel monitory industry, high utility of cranes and excessive waiting for material supply usually occur. This study investigated how to utilize effective information to forecast demands of production lines and provide optimum delivery timing and paths. Finally, through a comparison between the original system and the optimized system, it was found that the optimized system could effectively enhance efficiency and reduce consumption of resources.
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Books on the topic "TFT-LCD"

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Aoki, Hitoshi. Dynamic characterization of a-Si TFT-LCD pixels. Palo Alto, CA: Hewlett-Packard Laboratories, Technical Publications Department, 1996.

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Tsukada, Toshihisa. TFT/LCD: Liquid-crystal displays addressed by thin-film transistors. Amsterdam: Gordon and Breach, 1996.

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Tsukada, Toshihisa. TFT/LCD: Liquid-crystal displays addressed by thin-film transistors. Amsterdam: Gordon and Breach, 1996.

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International Workshop on Active Matrix Liquid Crystal Displays (1999 Tokyo, Japan). AM-LCD 99: Digest of technical papers :1999 International Workshop on Active Matrix Liquid Crystal Displays, TFT technologies and related materials, July 14-16, 1999, Kogakuin University, Tokyo, Japan. [Kobe, Japan]: Japan Society of Applied Physics, 1999.

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International Workshop on Active Matrix Liquid Crystal Displays (2001 Tokyo, Japan). AM-LCD 01: Digest of technical papers : 2001 International Workshop on Active Matrix Liquid Crystal Displays, TFT technologies and related materials, July 11-13, 2001, Kogakuin University, Tokyo, Japan. [Kobe, Japan]: Japan Society of Applied Physics, 2001.

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ying ji wai shang qiang lie jing zheng xia de Zhongguo guang dian chan ye: TFT-LCD , EVD , shu wei xiang ji shi chang fa zhan qu shi pou xi. Taibei Shi: Tuo pu ke ji gu fen you xian gong si, 2005.

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Tsukada, Toshihisa. TFT/LCD: Liquid-Crystal Displays Addressed by Thin-Film Transistors (Japanese Technology Reviews). CRC Press, 1996.

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Parker, Philip M. The 2007-2012 World Outlook for Thin Film Transistor-Liquid Crystal Display (TFT-LCD). ICON Group International, Inc., 2006.

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Book chapters on the topic "TFT-LCD"

1

Chun Chang, Hung. "TFT-LCD Module and Package Process." In Flat Panel Display Manufacturing, 73–86. Chichester, UK: John Wiley & Sons Ltd, 2018. http://dx.doi.org/10.1002/9781119161387.ch5.

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Kuo, Yue. "Poly-Si TFT for non-LCD Applications." In Thin Film Transistors, 989–1021. Boston, MA: Springer US, 2004. http://dx.doi.org/10.1007/978-1-4615-0397-2_24.

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Sohn, Sang-Wook, Dae-Young Lee, Hun Choi, Jae-Won Suh, and Hyeon-Deok Bae. "Detection of Various Defects in TFT-LCD Polarizing Film." In Adaptive and Natural Computing Algorithms, 534–43. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-71629-7_60.

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Kim, Byung Sun, Dock Jin Lee, Ja Choon Koo, Jae Boong Choi, Young Jin Kim, Jong Nam Lee, and Young Bee Chu. "Evaluation of Shockproofness of Small Form Factor Mobile TFT-LCD." In Advanced Nondestructive Evaluation I, 1679–82. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-412-x.1679.

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Bi, Xin, and Han Ding. "Detection of Local Mura Defects in TFT-LCD Using Machine Vision." In Intelligent Robotics and Applications, 707–15. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-88513-9_76.

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Song, Young-Chul, Doo-Hyun Choi, and Kil-Houm Park. "Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection." In Lecture Notes in Computer Science, 862–68. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-540-30134-9_114.

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Hsu, Bi-Min, Thanh-Lam Nguyen, Ming-Hung Shu, and Ying-Fang Huang. "Using MaxGWMA Control Chart to Monitor the Quality of TFT-LCD." In Lecture Notes in Computer Science, 380–90. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-39640-3_28.

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Tzeng, Gwo-Hshiung. "Improving the Performance of Green Suppliers in the TFT-LCD Industry." In New Concepts and Trends of Hybrid Multiple Criteria Decision Making, 133–49. New York : CRC Press, 2017.: CRC Press, 2017. http://dx.doi.org/10.1201/9781315166650-10.

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Chen, Kangping, and Eryun Liu. "Conductive Particles Detection in the TFT-LCD Manufacturing Process with U-ResNet." In Pattern Recognition and Computer Vision, 162–73. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-030-03341-5_14.

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Chen, Liang Chia, Chia Cheng Kuo, and Ping Ang Yen. "Automatic Optical Inspection on TFT-LCD Mura Defects Using Background Image Reconstruction." In Optics Design and Precision Manufacturing Technologies, 400–403. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-458-8.400.

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Conference papers on the topic "TFT-LCD"

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Ishibashi, O., M. Iriguchi, K. Kimura, J. Ishii, D. Sasaki, H. Imai, H. Tsuchi, and H. Hayama. "Panel-Sized TFT-LCD Column Driver." In 2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. IEEE, 2006. http://dx.doi.org/10.1109/isscc.2006.1696099.

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Ting, Dai-Liang, Chieh-Li Chen, Chen-Lung Kuo, Chung-Kuang Wei, Chung-Yuan Liu, Yong-Hong Lu, Hsueh-Feng Shih, Chia-Wei Hao, and Shin-Tson Wu. "Full-color reflective-type TFT-LCD." In Asia Pacific Symposium on Optoelectronics '98, edited by Fang-Chen Luo, Shin-Tson Wu, and Shunsuke Kobayashi. SPIE, 1998. http://dx.doi.org/10.1117/12.311051.

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Howell, Robert S., Mark J. Stewart, Greg Sarcona, and Miltiadis K. Hatalis. "Silicides for polysilicon TFT-LCD applications." In Electronic Imaging '97, edited by Tolis Voutsas and Tsu-Jae King. SPIE, 1997. http://dx.doi.org/10.1117/12.270289.

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Sung-Pil Choi, Jae Wook Kwon, Kye Eon Chang, Jin Tae Kim, and Min Koo Han. "EMI analysis of TFT-LCD driver IC." In 17th International Zurich Symposium on Electromagnetic Compatibility. IEEE, 2006. http://dx.doi.org/10.1109/emczur.2006.215007.

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Putman, Peter H. "An Overview of TFT LCD Display Technology." In SMPTE Technical Conference. IEEE, 2005. http://dx.doi.org/10.5594/m00410.

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Sugiura, Hiroaki, Shuichi Kagawa, Hideyuki Kaneko, Masahiko Ozawa, and Kenichi Niki. "TFT-LCD module realizing plural color modes." In Electronic Imaging 2003, edited by Liang-Chy Chien. SPIE, 2003. http://dx.doi.org/10.1117/12.476155.

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Suzuki, Kenkichi, Masaaki Matsuda, Toshio Ogino, Nobuaki Hayashi, Takao Terabayashi, and Kyouko Amemiya. "Excimer ablation lithography (EAL) for TFT-LCD." In Photonics West '97, edited by Harry Shields and Peter E. Dyer. SPIE, 1997. http://dx.doi.org/10.1117/12.270087.

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Choi, Kyu N., Jae Y. Lee, and Suk I. Yoo. "Area-mura detection in TFT-LCD panel." In Electronic Imaging 2004, edited by Longin Jan Latecki, David M. Mount, and Angela Y. Wu. SPIE, 2004. http://dx.doi.org/10.1117/12.525557.

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Sheng, Bi-Qi, and Tian-Hong Pan. "Virtual metrology algorithm for TFT-LCD manufacutring process." In 2011 Eighth International Conference on Fuzzy Systems and Knowledge Discovery (FSKD 2011). IEEE, 2011. http://dx.doi.org/10.1109/fskd.2011.6019961.

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Xu Boyuan and Li Zhengxiang. "Design of the TFT-LCD controller with CPLD." In 2014 IEEE Workshop on Electronics, Computer and Applications (IWECA). IEEE, 2014. http://dx.doi.org/10.1109/iweca.2014.6845716.

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