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Journal articles on the topic 'Thin film interference'

Author: Grafiati
Published: 4 June 2021
Last updated: 10 February 2022

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1

Cong, Hailin, and Weixiao Cao. "Thin Film Interference of Colloidal Thin Films." Langmuir 20, no. 19 (September 2004): 8049–53. http://dx.doi.org/10.1021/la049118+.

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2

Wheeler, C. R., R. D. Ramsier, and P. N. Henriksen. "Observing thin-film interference effects." Physics Education 38, no. 6 (November 1, 2003): 495–96. http://dx.doi.org/10.1088/0031-9120/38/6/f12.

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3

Kosyachkov, A., L. Wang, J. Anzellotti, R. Hallock, and C. Hodgson. "Thin Film Materials for Optical Interference Filters." Key Engineering Materials 538 (January 2013): 345–48. http://dx.doi.org/10.4028/www.scientific.net/kem.538.345.

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Abstract. Microstructural, optical and mechanical properties of oxide and fluoride films are examined. Superior optical quality, durability and environmental stability are achieved for oxides deposited by ion assist reactive ion beam sputtering and thermal evaporation. The materials and deposition techniques are discussed with regards to manufacturing of optical interference filters for near-UV – mid-IR wavelengths. High performance of thin film materials and optical filters is demonstrated.
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4

Kats, Mikhail A., Romain Blanchard, Shriram Ramanathan, and Federico Capasso. "Thin-Film Interference in Lossy, Ultra-Thin Layers." Optics and Photonics News 25, no. 1 (January 1, 2014): 40. http://dx.doi.org/10.1364/opn.25.1.000040.

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5

Beckerlee, Honey Biba. "A study of thin film interference." Philosophy of Photography 9, no. 2 (October 1, 2018): 157–63. http://dx.doi.org/10.1386/pop.9.2.157_7.

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6

Wheeler, C. R., P. N. Henriksen, and R. D. Ramsier. "Visibility of thin-film interference fringes." American Journal of Physics 72, no. 2 (February 2004): 279–81. http://dx.doi.org/10.1119/1.1611480.

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7

Hung, Fei Shuo, Fei Yi Hung, Che Ming Chiang, and Truan Sheng Lui. "Innovation and Annealed Effect of Sn-Al and Sn-Cu Composite Thin Films on the Electromagnetic Interference Shielding for the Green Materials." Advanced Materials Research 347-353 (October 2011): 547–54. http://dx.doi.org/10.4028/www.scientific.net/amr.347-353.547.

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Sn, Al and Cu not only possess electromagnetic interference shield efficiency, but also have the acceptable costs. In this study, sputtered Sn-Al thin films and Sn-Cu thin film were used to investigate the effect of the crystallization mechanism and film thickness on the electromagnetic interference (EMI) characteristics. In addition, the annealed microstructure, electrical conductivity and EMI of the Sn-xAl films and the Sn-xCu films were compared. The results show that Sn-Al film increased the electromagnetic interference (EMI) shielding after annealed. Sn-Cu films with higher Cu atomic concentration, the low frequency EMI shielding could not be improved. After annealing, the Sn-Cu thin film with lower Cu content possessed excellent EMI shielding at lower frequencies, but had an inverse tendency at higher frequencies.
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8

Hao, Ran, Linlin Zhu, Zexiao Li, Fengzhou Fang, and Xiaodong Zhang. "A Miniaturized and Fast System for Thin Film Thickness Measurement." Applied Sciences 10, no. 20 (October 18, 2020): 7284. http://dx.doi.org/10.3390/app10207284.

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Transparent films are significant industrial components that are widely used in modern optics, microelectronics, optical engineering, and other related fields. There is an urgent need for the fast and stable thickness measurement of industrial films at the micron-grade. This paper built a miniaturized and low-cost film thickness measurement system based on confocal spectral imaging and the principle of thin-film spectral interference. The reflection interference spectrum was analyzed to extract the phase term introduced by the film thickness from the full spectrum information, where local spectral noise can be better corrected. An efficient and robust film thickness calculation algorithm was realized without any calibrating sample. The micron-grade thickness measurement system had an industrial property with a measurement range of up to 75 μm with a measurement uncertainty of 0.1 μm, presenting a good performance in single-layer film thickness measurement with high efficiency.
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9

Chen, G., and C. L. Tien. "Thermally Induced Optical Nonlinearity During Transient Heating of Thin Films." Journal of Heat Transfer 116, no. 2 (May 1, 1994): 311–16. http://dx.doi.org/10.1115/1.2911401.

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This work studies the temperature field and the optical response of weakly absorbing thin films with thermally induced optical nonlinearity during picosecond to nanosecond pulsed-laser heating. A one-dimensional model is presented that examines the effects of the temperature dependent optical constants and the nonuniform absorption caused by interference. The energy equation is solved numerically, coupled with the matrix method in optical multilayer theory. Both cadmium sulfide (CdS) thin films and a zinc selenide (ZnSe) interference filter are considered. The computational results compare favorably with available experimental data on the ZnSe interference filter. This study shows that the transient temperature distributions in the films are highly nonuniform. Such nonuniformity yields Airy’s formulae for calculating the thin-film reflectance and transmittance inapplicable. Applications of the work include optical bistability, localized change of the film structure, and measurement of the thermal diffusivity of thin films.
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10

Wig, A., A. Passian, E. Arakawa, T. L. Ferrell, and T. Thundat. "Optical thin-film interference effects in microcantilevers." Journal of Applied Physics 95, no. 3 (February 2004): 1162–65. http://dx.doi.org/10.1063/1.1638616.

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11

Ockenfuss, Georg J., and Robert E. Klinger. "Ultra-low-stress thin-film interference filters." Applied Optics 45, no. 7 (March 1, 2006): 1364. http://dx.doi.org/10.1364/ao.45.001364.

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12

KNOTTS, MICHAEL E. "Get green: Fun with thin film interference." Optics and Photonics News 8, no. 7 (July 1, 1997): 50. http://dx.doi.org/10.1364/opn.8.7.000050.

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13

Newburgh, Ronald, and Douglass Goodale. "Student Difficulties in Analyzing Thin-Film Interference." Physics Teacher 47, no. 4 (April 2009): 227–30. http://dx.doi.org/10.1119/1.3098209.

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14

Roeder, Ryan K., and Elliott B. Slamovich. "Measuring the critical thickness of thin metalorganic precursor films." Journal of Materials Research 14, no. 6 (June 1999): 2364–68. http://dx.doi.org/10.1557/jmr.1999.0315.

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Successful application of sol-gel, metalorganic decomposition, or hydrothermal routes to ceramic thin films depends on the mechanical integrity of the precursor film. Above a critical thickness, a precursor film will crack or decohere from the substrate during drying. The cracking and thickness of thin metalorganic precursor films were simultaneously observed during drying using a standard optical microscope. Isochromatic color fringes produced by interference of reflected white light were used to monitor film thickness. The critical film thickness was determined by the color fringe corresponding to the thickness at which propagating cracks terminated. As a demonstration of the technique, the critical thickness of titanium di(isopropoxide) bis(ethyl acetoacetate) films was measured, showing increased critical thickness with the addition of small amounts of an elastomeric polymer.
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15

Cantor, R., J. A. Hall, P. Blumenfeld, and S. T. P. Boyd. "Miniature Thin-Film Superconducting Quantum Interference Device Susceptometer." IEEE Transactions on Applied Superconductivity 17, no. 2 (June 2007): 738–41. http://dx.doi.org/10.1109/tasc.2007.898538.

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16

Goossens, Thomas, and Chris Van Hoof. "Thin-film interference filters illuminated by tilted apertures." Applied Optics 59, no. 5 (December 18, 2019): A112. http://dx.doi.org/10.1364/ao.59.00a112.

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17

Sahlén, Olof. "Optical bistability in thin-film CdSe interference filters." Journal of the Optical Society of America B 5, no. 1 (January 1, 1988): 82. http://dx.doi.org/10.1364/josab.5.000082.

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18

Atkins, Leslie J., and Richard C. Elliott. "Investigating thin film interference with a digital camera." American Journal of Physics 78, no. 12 (December 2010): 1248–53. http://dx.doi.org/10.1119/1.3490011.

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19

Taijing, Lu, Tomoya Ogawa, Koichi Toyoda, and Zhenguo Wang. "Effect of surface structures upon ultrathin film interference fringes." Journal of Materials Research 8, no. 9 (September 1993): 2315–18. http://dx.doi.org/10.1557/jmr.1993.2315.

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Effect of surface structures upon ultrathin film interference fringes generated from extremely thin films or epitaxial layers grown on semiconductor wafers has been studied. Since dark regions of fringes correspond to the places where the thin films are destroyed or absent, the fringes are investigated to detect uneven surfaces with undesired structures. Therefore, surface microstructures can be detected and characterized effectively by the modification of the fringes.
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20

Sakurai, Kenji, and Atsuo Iida. "Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection." Advances in X-ray Analysis 39 (1995): 695–700. http://dx.doi.org/10.1154/s0376030800023132.

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It has been proposed that the interference effect in grazing incidence/exit X-ray fluorescence can be used as an analytical tool. Though these total reflection related measurements have been widely used because of their inherent high sensitivity to the surface of materials, the interference in case of thin films is most likely to be considered difficult to analyze. The present paper describes the use of the interference effect to provide additional capability to enhance information on a specific interface of a thin film. Detailed interpretation of the angular resolved fluorescence tells us at which interface an element of interest is localized. It can be applied to the thin film of only a few layers or non-periodic multilayers where a regular standing wave is not generated.
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21

Li, Hao Ran, Jun Hong Su, Ai Ming Ge, and Li Hong Yang. "Research on Intelligentized Recognition Technology for Double Wavelength Laser Measurement of Thin Film Thickness." Advanced Materials Research 301-303 (July 2011): 1760–64. http://dx.doi.org/10.4028/www.scientific.net/amr.301-303.1760.

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Interference image processing is the key technology of optical interference measurement. This paper introduced the problems on automatic interference fringe processing in absolutely measurement based on laser interference, digital image processing technology. The image acquisition of the SiO2 film and the pre-processing of interferogram was performed.Decimal part of the interference fringes is obtained. Using high-resolution image acquisition system and computer reads and processes the interference image, replaces the traditional work of skilled workers of high intensity for a long time and improves the film thickness measurement accuracy.
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22

Raveesha, K. H., Vijaykumar H. Doddamani, and B. K. Prasad. "On a Method to Employ Newton’s Rings Concept to Determine Thickness of Thin Films." International Letters of Chemistry, Physics and Astronomy 22 (November 2013): 1–7. http://dx.doi.org/10.18052/www.scipress.com/ilcpa.22.1.

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Newton’s Rings experiment is traditionally utilized to find radius curvature of a lens. We propose a method in which this same set up can be used to find the thickness of thin films. The working principle is interference. It is based on the fact that, the formation of bright and dark interference fringes is a measure of the thickness of the air film at that point. We present the experimental data. The results from the experiment are in agreement with results obtained through geometry. Further, a method to improvise conventional interference at air wedge experiment which is generally used to determine the thickness of thin films is suggested.
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23

Tominaga, R., M. Sivakumar, Masayoshi Tanaka, and Takatoshi Kinoshita. "Inorganic-Organic Thin-Layers which Transform Bio-Molecule Binding into Visible Color Change." Advanced Materials Research 11-12 (February 2006): 631–34. http://dx.doi.org/10.4028/www.scientific.net/amr.11-12.631.

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SiO2 thin-films were prepared by thermal oxidation method. It showed uniform color based on the thin-film interference of visible light. Then we made biotin antenna on the top of SiO2 thin-film. Biotin is one of the vitamins and it has high association constant with protein avidin. After immersed the substrate into avidin solution, certain color changes based on the self-assembling of avidin on its surface were observed. By the immersing these substrates into mono-dispersed polystyrene particle solution, a polystyrene particle layer was formed onto avidin SAMs and it brought dynamic interference color change. As a result, this substrate could sense the avidin molecules over 1.0×10-8M of its concentration by naked eyes.
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24

Graf, R. T., J. L. Koenig, and H. Ishida. "Optical Constant Determination of Thin Polymer Films in the Infrared." Applied Spectroscopy 39, no. 3 (May 1985): 405–8. http://dx.doi.org/10.1366/0003702854248539.

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Thin films of poly(vinyl chloride), poly(methyl methacrylate), and poly(styrene) were analyzed by Fourier transform infrared spectroscopy. The interference fringes present in the transmission spectra of these samples were used to determine film thickness and average refractive index. Subsequent Kramers-Kronig analysis of these transmission spectra provided the dispersion of the refractive index and the absorption index across the entire mid-infrared region. Interference fringes were absent in the optical constant spectra, and good agreement was obtained between our optical constant spectra and those of other authors.
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25

Journal, Baghdad Science. "Java Applet Technology for Design Interference Optical Coating." Baghdad Science Journal 8, no. 2 (June 12, 2011): 495–502. http://dx.doi.org/10.21123/bsj.8.2.495-502.

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Java is a high-level , third generation programming language were introduced Javaoptics Open Source Physics (OSP) as a new simulation for design one of the most important interference optical coating called antireflection coating. It is recent developments in deign thin-film coatings. (OSP) shows multiple beam interferences from a parallel dielectric thin film and the evolution of reflection factors. It is simple to use and efficiently also can serve educational purposes. The obtained results have been compared with needle method
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26

Drake, Dereth J., Christiana G. Epperson, and Savanna L. Burks. "A Thin Film Interference Laboratory Experiment for Introductory Physics." Physics Teacher 58, no. 4 (April 2020): 272–75. http://dx.doi.org/10.1119/1.5145477.

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27

Atkins, Leslie J. "Thin‐film interference using a computer's screen and camera." Physics Teacher 49, no. 1 (January 2011): 62. http://dx.doi.org/10.1119/1.3527766.

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28

Wang, Yafeng, Qian Yang, and Bin Su. "Spatially resolved electrochemistry enabled by thin-film optical interference." Chemical Communications 56, no. 82 (2020): 12359–62. http://dx.doi.org/10.1039/d0cc05265e.

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29

Amato, G., G. Benedetto, and R. Spagnolo. "Elimination of interference fringes from thin film photothermal spectra." Materials Letters 9, no. 4 (February 1990): 173–76. http://dx.doi.org/10.1016/0167-577x(90)90149-g.

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30

Rezvani Jalal, Masoud, and Farzad Vaziri Alamdarlo. "Simulation of light interference by a biaxial thin film." Optik 130 (February 2017): 393–97. http://dx.doi.org/10.1016/j.ijleo.2016.10.096.

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31

Su, Jun Hong, Ying Shi, and Jin Man Ge. "Study on Measurement of Thin Film Thickness with Lateral Shearing Interferometry." Advanced Materials Research 718-720 (July 2013): 848–52. http://dx.doi.org/10.4028/www.scientific.net/amr.718-720.848.

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The film thickness is an important technical indicator of film devices, and its accuracy directly affects various performances of optical components. In fabrication process of film device, fast and accurate measurement of film thickness has positive significance on product quality control. In this paper, measure film thickness with lateral shearing interferometry. Collect interferograms through structured lateral shearing interference platform, process interferogram with Fast Fourier Transform method to extract phase, unwrap the wrapped phase to achieve phase value. Finally, calculate film thickness based on lateral shearing interference principle. The thickness of sample is 119.6800nm measured by this method, basically the same with the result 120.6036nm that measured by ZYGO interferometer. This experiment shows that lateral shearing interferometry not only suit to measurement of film thickness, but also abundant high-precision method of measuring film thickness, and has high practical value.
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32

Emile, Janine, Olivier Emile, and Pierre Gaudriault. "Resonant vibration of a thin polymer film under optical excitation." Soft Matter 17, no. 14 (2021): 3923–28. http://dx.doi.org/10.1039/d1sm00016k.

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The breathing mode vibration of a thermoplastic polymer film under optical radiation pressure force resonant excitation leads to a mean thinning of the film, measured by an optical interference technique.
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33

Joost, Urmas, Andris Šutka, Meeri Visnapuu, Aile Tamm, Meeri Lembinen, Mikk Antsov, Kathriin Utt, Krisjanis Smits, Ergo Nõmmiste, and Vambola Kisand. "Colorimetric gas detection by the varying thickness of a thin film of ultrasmall PTSA-coated TiO2 nanoparticles on a Si substrate." Beilstein Journal of Nanotechnology 8 (January 24, 2017): 229–36. http://dx.doi.org/10.3762/bjnano.8.25.

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Colorimetric gas sensing is demonstrated by thin films based on ultrasmall TiO2 nanoparticles (NPs) on Si substrates. The NPs are bound into the film by p-toluenesulfonic acid (PTSA) and the film is made to absorb volatile organic compounds (VOCs). Since the color of the sensing element depends on the interference of reflected light from the surface of the film and from the film/silicon substrate interface, colorimetric detection is possible by the varying thickness of the NP-based film. Indeed, VOC absorption causes significant swelling of the film. Thus, the optical path length is increased, interference wavelengths are shifted and the refractive index of the film is decreased. This causes a change of color of the sensor element visible by the naked eye. The color response is rapid and changes reversibly within seconds of exposure. The sensing element is extremely simple and cheap, and can be fabricated by common coating processes.
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34

Sakamoto, K., R. Arafune, and S. Ushioda. "Incident Angle Dependence of the Infrared Absorbance of Thin Rubbed Polyimide Films on CaF2 and Si Substrates." Applied Spectroscopy 51, no. 4 (April 1997): 541–44. http://dx.doi.org/10.1366/0003702971940549.

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We have measured the incident angle dependence of the infrared (IR) absorption of thin rubbed polyimide films on CaF2 and Si substrates. The molecular orientation of the films was determined by fitting the experimental result with a theoretical calculation. The incident angle dependence for the rubbed film on CaF2 was very different from that for the rubbed film on Si. On the other hand, the actual molecular orientation determined by the fitting procedure is similar in both samples. Thus this result clearly shows that the incident angle dependence is strongly dependent on the substrate. This effect arises from the interference between the forward and backward propagating light in the film. This experiment demonstrates that the interference effect must be taken into account in determining the molecular orientation of thin films on solid substrates. We have also calculated the incident angle dependence for rubbed films with different inclination angles of polyimide chains on CaF2 and Si substrates. We found that CaF2 is a more suitable substrate than Si for determining the molecular orientation of rubbed films with a relatively high inclination angle of polyimide chains.
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35

TAKEUCHI, AKITOSHI, SEIICHI TERADA, and SO TODA. "MEASUREMENT OF THIN OIL FILM THICKNESS USING ULTRASONIC TECHNIQUE." Modern Physics Letters B 22, no. 11 (May 10, 2008): 1081–85. http://dx.doi.org/10.1142/s0217984908015875.

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An application of ultrasonic technique is attempted for the purpose of measuring thin oil film thickness between two surfaces. The amplitude of the wave reflected from the boundary is vary depending on film thickness, because the ultrasonic wave emitted to the interface between two surfaces does multiple reflection and interference in oil film. Quantitative measurement of oil film thickness then can be possible. For instance, it is possible to measure the submicron film thickness which exists near the point contact formed by convex glass and plate with high frequency probe. And it is confirmed that the oil film thickness estimated from the echo height agrees with the film thickness decided by the curvature of the lens or obtained by the optical interference method, even if it is 100 nm. On the other hand, the thickness of oil film between cylinder and piston ring can be easily measured by setting the small ultrasonic probe on the back of piston ring. For example, the influence of the second ring and oil ring for the behavior of an oil film formed on a top ring is able to evaluate quantitatively. As mentioned above, it is cleared that quantitative evaluation of thin film thickness is possible with investigating the echo height obtained by ultrasonic wave pulse reflection method.
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36

Zhu, Li Yan, Wei Dong Xu, An Wan, Zhao Yang Zeng, and Yao Ma. "Feasibility Investigation for Visible-Laser Compatible Camouflage Thin Film." Advanced Materials Research 989-994 (July 2014): 2882–85. http://dx.doi.org/10.4028/www.scientific.net/amr.989-994.2882.

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Based on multi-layer film interference theory and optimization calculation, a film structure that can satisfy both visible and 1064nm laser camouflage requirements were put forward. The light transmission property of the structure was analyzed systematically and the thickness and refractivity of different layers were obtained.
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37

Chen, G. "Phonon Wave Heat Conduction in Thin Films and Superlattices." Journal of Heat Transfer 121, no. 4 (November 1, 1999): 945–53. http://dx.doi.org/10.1115/1.2826085.

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Heat conduction in thin films and superlattices is important for many engineering applications such as thin-film based microelectronic, photonic, thermoelectric, and thermionic devices. Past modeling efforts on the thermal conductivity of thin films were based on solving the Boltzmann transport equation that treats phonons as particles. The effects of phonon interference and tunneling on the heat conduction and the thermal conductivity of thin films and superlattices remain to be explored. In this work, the wave effects on the heat conduction in thin films and superlattices are studied based on the consideration of the acoustic wave propagation in thin film structures and neglecting the internal scattering. A transfer matrix method is used to calculate the phonon transmission and heat conduction through these structures. The effects considered in this work include the phonon interference, tunneling, and confinement. The phonon dispersion is considered by introducing frequency-dependent Lamb constants. A ray-tracing method that treats phonons as particles is also developed for comparison. Sample calculations are performed on double heterojunction structures resembling Ge/Si/Ge and n-period superlattices similar to Ge/Si/n(Si/Ge)/Ge, It is found that phonon confinements caused by the phonon spectra mismatch and by the total internal reflection create a dramatic decrease of the overall thermal conductance of thin films. The phonon interference in a single layer does not have a strong effect on its thermal conductance but for superlattice structures, the stop bands created by the interference effects can further reduce the thermal conductance. Tunneling of phonon waves occurs when the constituent layers are 1–3 monolayer thick and causes a slight recovery in the thermal conductance when compared to thicker layers. The thermal conductance obtained from the ray tracing and the wave methods approaches the same results for a single layer. For superlattices, however, the wave method leads to a finite thermal conductance even for infinitely thick superlattices while the ray tracing method gives a thermal conductance that decreases with increasing number of layers. Implications of these results on explaining the recent thermal conductivity data of superlattices are explored.
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38

Sim, H. S., K. G. Kang, Seong Hyuk Lee, Jong Min Kim, and Young Eui Shin. "A Numerical Study on Nonequilibrium Heat Transfer and Crater Formation in Thin Metal Films Irradiated by Femtosecond Pulse Laser." Materials Science Forum 580-582 (June 2008): 143–46. http://dx.doi.org/10.4028/www.scientific.net/msf.580-582.143.

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The ultimate goals of this study are to investigate numerically nonequilibrium energy transfer between electrons and phonons, and to predict the crater formation shapes of gold thin film structures irradiated by femtosecond pulse lasers. In particular, the present article expands the onedimensional two-temperature model (1DTTM) to the two-dimensional model (2DTTM) considering wave interference, and it involves the quantum effect to predict thermal and optical properties. The predictions by using 2DTTM are extensively compared with those of 1DTTM, and the influence of film thickness on radiation heat transfer and optical characteristics are also examined. From the results, it is found that the predictions of 2DTTM are in good agreement with those of 1DTTM. As the gold film thickness decreases, the reflectivity decreases dramatically and the absorbed laser intensities at the top surface increases substantially because of wave interference in thin films.
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39

Kilchoer, Cédric, Ullrich Steiner, and Bodo D. Wilts. "Thin-film structural coloration from simple fused scales in moths." Interface Focus 9, no. 1 (December 14, 2018): 20180044. http://dx.doi.org/10.1098/rsfs.2018.0044.

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The metallic coloration of insects often originates from diverse nanostructures ranging from simple thin films to complex three-dimensional photonic crystals. In Lepidoptera, structural coloration is widely present and seems to be abundant in extant species. However, even some basal moths exhibit metallic coloration. Here, we have investigated the origin of the vivid metallic colours of the wing scales of the basal moth Micropterix aureatella by spectrophotometry and scanning electron microscopy. The metallic gold-, bronze- and purple-coloured scales share a similar anatomy formed of a fused lower and upper lamina resulting in a single thin film. The optical response of this thin-film scale can be attributed to thin-film interference of the incident light, resulting in the colour variations that correlate with film thickness. Subtle variations in the wing scale thickness result in large visible colour changes that give Micropterix moths their colourful wing patterns. This simple coloration mechanism could provide a hint to understand the evolution of structural coloration in Lepidoptera.
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40

Muller, Rolf H., and Michael L. Sand. "Optimum angle of incidence for observing thin-film interference colors." Applied Optics 26, no. 24 (December 15, 1987): 5211. http://dx.doi.org/10.1364/ao.26.005211.

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41

Azuma, T. "Thin film interference effects in an off-axis illumination system." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 15, no. 2 (March 1997): 198. http://dx.doi.org/10.1116/1.589264.

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42

D'Anna, Michele, and Tommaso Corridoni. "Thin Film Interference: An Experiment with Microwaves and Paraffin Oil." Physics Teacher 53, no. 8 (November 2015): 475–77. http://dx.doi.org/10.1119/1.4933149.

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43

DePino, Andrew. "Trick of the trade: Making permanent thin‐film interference patterns." Physics Teacher 33, no. 4 (April 1995): 228. http://dx.doi.org/10.1119/1.2344203.

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44

Bernard, Douglas A., and H. Paul Urbach. "Thin-film interference effects in photolithography for finite numerical apertures." Journal of the Optical Society of America A 8, no. 1 (January 1, 1991): 123. http://dx.doi.org/10.1364/josaa.8.000123.

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45

Poelman, D., R. L. Van Meirhaeghe, W. H. Laflere, and F. Cardon. "Spectral shifts in thin film electroluminescent devices: an interference effect." Journal of Physics D: Applied Physics 25, no. 6 (June 14, 1992): 1010–13. http://dx.doi.org/10.1088/0022-3727/25/6/019.

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Nagata, Hitoshi, Atsumi Yamaguchi, and Akira Kawai. "Characterization of Thin-Film Interference Effect due to Surface Roughness." Japanese Journal of Applied Physics 34, Part 1, No. 7A (July 15, 1995): 3754–58. http://dx.doi.org/10.1143/jjap.34.3754.

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Chigrin, D. N., and C. M. Sotomayor Torres. "Periodic thin-film interference filters as one-dimensional photonic crystals." Optics and Spectroscopy 91, no. 3 (September 2001): 484–89. http://dx.doi.org/10.1134/1.1405232.

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Surdutovich, G. I., J. Kolenda, J. F. Fragalli, L. Misoguti, R. Vitlina, and V. Baranauskas. "An interference method for the determination of thin film anisotropy." Thin Solid Films 279, no. 1-2 (June 1996): 119–23. http://dx.doi.org/10.1016/0040-6090(95)08165-8.

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Bolger, J., A. K. Kar, and B. S. Wherrett. "Refractive optical nonlinearities in a thin film ZnSe interference filter." Optical Materials 1, no. 2 (April 1992): 71–74. http://dx.doi.org/10.1016/0925-3467(92)90003-6.

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Shin, Hyunkwon, Hyeonggeun Yoo, and Myeongkyu Lee. "Fabrication of Au thin film gratings by pulsed laser interference." Applied Surface Science 256, no. 9 (February 2010): 2944–47. http://dx.doi.org/10.1016/j.apsusc.2009.11.055.

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