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Relevant bibliographies by topics / Tip-sample-substrate interaction

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Journal articles
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Academic literature on the topic 'Tip-sample-substrate interaction'

Author: Grafiati

Published: 14 March 2023

Last updated: 31 July 2025

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Journal articles on the topic "Tip-sample-substrate interaction"

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Jaafar, Miriam, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, and Agustina Asenjo. "Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination." Beilstein Journal of Nanotechnology 2 (September 7, 2011): 552–60. http://dx.doi.org/10.3762/bjnano.2.59.

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The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topography and the magnetic signal by scanning at a lift distance of 25–50 nm such that the long range tip–sample interactions dominate. Nowadays, MFM is becoming a valuable technique to detect weak magnetic fie

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Chan, Nicholas, Carrie Lin, Tevis Jacobs, Robert W. Carpick, and Philip Egberts. "Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy." Beilstein Journal of Nanotechnology 11 (May 6, 2020): 729–39. http://dx.doi.org/10.3762/bjnano.11.60.

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The interaction potential between two surfaces determines the adhesive and repulsive forces between them. It also determines interfacial properties, such as adhesion and friction, and is a key input into mechanics models and atomistic simulations of contacts. We have developed a novel methodology to experimentally determine interaction potential parameters, given a particular potential form, using frequency-modulated atomic force microscopy (AFM). Furthermore, this technique can be extended to the experimental verification of potential forms for any given material pair. Specifically, interacti

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Gilliss, Shelley R., Jeffrey K. Fairer, N. Ravishankar, Mark G. Schwabel, and C. Barry Carter. "Microanalysis of AFM Tips Coated with Cerium Oxide." Microscopy and Microanalysis 7, S2 (2001): 1236–37. http://dx.doi.org/10.1017/s1431927600032256.

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Cerium oxide is widely used for chemomechanical polishing (CMP) of silicate glasses. Uses include finishing of optical elements and planarizing dielectrics in the semiconductor industry. This study is designed to investigate the fundamentals of the cerium oxide/silica CMP process by measuring the interaction force between silicate glasses and cerium oxide. Surface forces involved in the polishing of glass by a cerium oxide abrasive can be studied in a controlled manner by measuring sample-tip interactions between a glass substrate and a cerium oxide tip in an atomic force microscope (AFM). Com

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Yamanishi, Junsuke, Hidemasa Yamane, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara. "Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy." Applied Physics Letters 120, no. 16 (2022): 161601. http://dx.doi.org/10.1063/5.0088634.

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Analysis of environmentally sensitive materials is essential for developing and optimizing nanostructured photochemical materials and devices. Photoinduced force microscopy (PiFM) is a promising local spectroscopic technique to visualize nanoscale local optical responses by measuring the optical forces between the scanning tip and sample. In this study, we examined isolated single quantum dots (QDs) with ligands on a gold substrate via PiFM under ultra-high vacuum to characterize the QD adsorption state on the basis of the optical force. The strong self-consistent optical interaction through t

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Keivanidis, Panagiotis E., Andrea di Donato, Davide Mencarelli, et al. "Determining the Efficiency of Fast Ultrahigh-density Writing of Low-Conductivity Patterns on Semiconducting Polymers." MRS Proceedings 1729 (2015): 125–30. http://dx.doi.org/10.1557/opl.2015.81.

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ABSTRACTWe present a nano-patterning process for semiconducting polymeric composites that could potentially be utilized for the development of polymer-based data storage devices. Nano-patterning (writing) operates on the basis of the mechanical interaction between the electrically unbiased tip of an atomic force microscope and the surface of polymeric composite films. Via friction forces, the tip/sample interaction produces a local increase of molecular disorder in the polymer matrix, inducing a localized lowering in the conductivity of the organic semiconductor. Herein we suggest a figure of

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Kheirodin, Mohsen, Hossein Nejat Pishkenari, Ali Moosavi, and Ali Meghdari. "Study of Biomolecules Imaging Using Molecular Dynamics Simulations." Nano 10, no. 07 (2015): 1550096. http://dx.doi.org/10.1142/s1793292015500964.

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The process of imaging a biomolecule by atomic force microscope (AFM) is modeled using molecular dynamics (MD) simulations. Since the large normal force exerted by the tip on the biosample in contact and tapping modes may damage the sample structure and produce irreversible deformation, the noncontact mode of AFM (NC-AFM) is employed as the operating mode. The biosample is scanned using a carbon nanotube (CNT) as the AFM probe. CNTs because of their small diameter, high aspect ratio and high mechanical resistance attract many attentions for imaging purposes. The tip–sample interaction is simul

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CZAJKA, R., A. KASUYA, A. WAWRO, N. HORIGUCHI, and Y. NISHINA. "FORMATION AND MODIFICATION OF MESOSCOPIC STRUCTURES ON GRAPHITE (HOPG) AND SILICON SURFACES BY MEANS OF SCANNING TUNNELING MICROSCOPY." Surface Review and Letters 03, no. 01 (1996): 961–67. http://dx.doi.org/10.1142/s0218625x96001728.

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This paper presents results of our experimental investigations of the adsorption and interaction of microclusters on some crystalline surfaces to form regular arrangements. Microclusters were produced and deposited up to a monolayer coverage on the c-plane of graphite (HOPG) or Si(111) substrates by thermal evaporation, laser ablation, or deposition from STM tip. A rectangular lattice arrangement of Se n(n=5–8) ring cluster has been fabricated for the first time on the HOPG. Also, arrays of Au clusters with a well-controlled diameter, desired periodicity, and size have been obtained by applyin

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Leite, F. L., E. C. Ziemath, O. N. Oliveira Jr., and P. S. P. Herrmann. "Adhesion Forces for Mica and Silicon Oxide Surfaces Studied by Atomic Force Spectroscopy (AFS)." Microscopy and Microanalysis 11, S03 (2005): 130–33. http://dx.doi.org/10.1017/s1431927605051068.

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The possibility of analyzing surfaces at the nanoscale provided by atomic force microscopy [1] (AFM) has been explored for various materials, including polymers [2], biological materials [3] and clays [4]. Further uses of AFMs involved nanomanipulation [5] and measurements of interaction forces, where the latter has been referred to as atomic force spectroscopy (AFS) [6]. Measurements of surface-surface interactions at the nanoscale are important because many materials have their properties changed at this range [7]. For samples in air, the interactions with the tip are a superimposition of va

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Meyer, G., and K. H. Rieder. "Lateral Manipulation of Single Adsorbates and Substrate Atoms With the Scanning Tunneling Microscope." MRS Bulletin 23, no. 1 (1998): 28–32. http://dx.doi.org/10.1557/s0883769400031432.

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The stability and precision of modern scanning-tunneling-microscope (STM) systems allow positioning of the tip on a subnanometer scale. This advancement has stimulated diverse efforts on surface modifications in the nanometer and even atomic range, as recently reviewed by Avouris. The lateral movement of individual adatoms and molecules in a controlled manner on solid surfaces and the construction of structures on a nanoscale were first demonstrated by Eigler and collaborators at 4 K. The reason for operating the STM at low temperatures (apart from increased stability and sensitivity of the ST

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Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, et al. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach." Beilstein Journal of Nanotechnology 11 (May 4, 2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.

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In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to

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Dissertations / Theses on the topic "Tip-sample-substrate interaction"

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RIBOTTA, LUIGI. "Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy." Doctoral thesis, Politecnico di Torino, 2022. https://hdl.handle.net/11583/2972877.

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Conference papers on the topic "Tip-sample-substrate interaction"

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Landolsi, Fakhreddine, Fathi H. Ghorbel, and James B. Dabney. "An AFM-Based Nanomanipulation Model Describing the Atomic Two Dimensional Stick-Slip Behavior." In ASME 2007 International Mechanical Engineering Congress and Exposition. ASMEDC, 2007. http://dx.doi.org/10.1115/imece2007-42529.

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A new AFM-based nanomanipulation model describing the relevant physics and dynamics at the nanoscale is presented. The nanomanipulation scheme consists of integrated subsystems that are identified in a modular approach. The model subsystems define the AFM cantilever-sample dynamics, the AFM tip-sample interactions, the contact mechanics and the friction between the sample and the substrate. The coupling between these different subsystems is emphasized. The main contribution of the proposed nanomanipulation model is the use of a new 2D dynamic friction model based on a generalized bristle inter

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Lee, Sang M., M. Abdelmaksoud, and J. Krim. "Nano-Scale Tribology Study of Organic Adlayer-Metal Interface Using Quartz Crystal Microbalance Combined With Scanning Tunneling Microscopy." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63732.

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A quartz crystal microbalance combined with scanning tunneling microscopy (STM-QCM) was used to investigate the interactions between organic adlayers (C6H6 and C6H5I) on Cu surfaces and a metallic STM tip. STM images of C6H6 covered Cu surface improved when the QCM was simultaneously oscillated during the imaging. In contrast, STM images of C6H5I covered surfaces became noisy when the sample was oscillated. The two systems moreover exhibited frequency changes of opposite signs in response to STM tip contact, indicative of different physical phenomena at the surface. The dependence of the STM i

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Schwarz, Udo D., Claudia Ritter, Markus Heyde, and Klaus Rademann. "Adhesion and Friction on the Nanometer Scale: Energy Dissipation During Sliding of Antimony Islands on Graphite and MoS2." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63898.

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Antimony nanoparticles grown on highly oriented pyrolytic graphite and molybdenum disulfide were used as a model system to investigate the contact area dependence of frictional forces. Controlled translation of the antimony nanoparticles was induced by the action of the oscillating tip in a dynamic force microscope. During manipulation, the power dissipated due to tip-sample interactions was recorded. We found that the threshold value of the power dissipation needed for translation depends linearly on the contact area between the antimony particles and the substrate. Assuming a linear relation

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