Academic literature on the topic 'Tomography, electron beam tomography, x-ray tomography'
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Journal articles on the topic "Tomography, electron beam tomography, x-ray tomography"
Fischer, F., D. Hoppe, E. Schleicher, G. Mattausch, H. Flaske, R. Bartel, and U. Hampel. "An ultra fast electron beam x-ray tomography scanner." Measurement Science and Technology 19, no. 9 (July 24, 2008): 094002. http://dx.doi.org/10.1088/0957-0233/19/9/094002.
Full textBieberle, M., E. Schleicher, F. Fischer, D. Koch, H. J. Menz, H. G. Mayer, and U. Hampel. "Dual-plane ultrafast limited-angle electron beam x-ray tomography." Flow Measurement and Instrumentation 21, no. 3 (September 2010): 233–39. http://dx.doi.org/10.1016/j.flowmeasinst.2009.12.001.
Full textStewart, Andrew. "Combing electron diffraction techniques for structure solution." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C369. http://dx.doi.org/10.1107/s2053273314096302.
Full textEggl, Elena, Simone Schleede, Martin Bech, Klaus Achterhold, Roderick Loewen, Ronald D. Ruth, and Franz Pfeiffer. "X-ray phase-contrast tomography with a compact laser-driven synchrotron source." Proceedings of the National Academy of Sciences 112, no. 18 (April 20, 2015): 5567–72. http://dx.doi.org/10.1073/pnas.1500938112.
Full textRusso, Paolo, Giovanni Mettivier, Adele Lauria, and Maria Cristina Montesi. "X-ray Cone-Beam Breast Computed Tomography: Phantom Studies." IEEE Transactions on Nuclear Science 57, no. 1 (February 2010): 160–72. http://dx.doi.org/10.1109/tns.2009.2034373.
Full textYao, Zhenwei, Tianzhen Shen, and Xingrong Chen. "Simulate bronchoscope with electron beam computed tomography." Academic Radiology 6 (February 1999): S152. http://dx.doi.org/10.1016/s1076-6332(99)80542-x.
Full textBieberle, André, Dominic Windisch, Kerolos Iskander, Martina Bieberle, and Uwe Hampel. "A Smart Multi-Plane Detector Design for Ultrafast Electron Beam X-ray Computed Tomography." Sensors 20, no. 18 (September 10, 2020): 5174. http://dx.doi.org/10.3390/s20185174.
Full textHernández-Nava, Everth, Samuel Tammas-Williams, Christopher Smith, Fabien Leonard, Philip Withers, Iain Todd, and Russell Goodall. "X-ray Tomography Characterisation of Lattice Structures Processed by Selective Electron Beam Melting." Metals 7, no. 8 (August 5, 2017): 300. http://dx.doi.org/10.3390/met7080300.
Full textFischer, F., and U. Hampel. "Ultra fast electron beam X-ray computed tomography for two-phase flow measurement." Nuclear Engineering and Design 240, no. 9 (September 2010): 2254–59. http://dx.doi.org/10.1016/j.nucengdes.2009.11.016.
Full textJanssen, C. H. C., P. M. van Ooijen, and M. Oudkerk. "Noninvasive Coronary Imaging Using Electron Beam Computed Tomography." Imaging Decisions MRI 7, no. 2 (July 2003): 15–22. http://dx.doi.org/10.1046/j.1617-0830.2003.70204.x.
Full textDissertations / Theses on the topic "Tomography, electron beam tomography, x-ray tomography"
Bärtling, Yves, Dietrich Hoppe, and Uwe Hampel. "Preliminary investigations on high energy electron beam tomography." Forschungszentrum Dresden, 2011. http://nbn-resolving.de/urn:nbn:de:bsz:d120-qucosa-64330.
Full textBärtling, Yves, Dietrich Hoppe, and Uwe Hampel. "Preliminary investigations on high energy electron beam tomography." Forschungszentrum Dresden-Rossendorf, 2010. https://hzdr.qucosa.de/id/qucosa%3A22134.
Full textSuard, Mathieu. "Characterization and optimization of lattice structures made by Electron Beam Melting." Thesis, Université Grenoble Alpes (ComUE), 2015. http://www.theses.fr/2015GREAI055/document.
Full textThe recent development of Additive Manufacturing for the fabrication of metallic parts allows structures to be directly manufactured from 3D models. In particular, the "Electron Beam Melting" (EBM) technology is a suitable process which selectively melts a powder bed layer by layer. It can build very complex geometries but brings new limitations that have to be quantified.This work focuses on the structural and mechanical characterization of lattice structures produced by such technology. The structural characterization mainly rely on X-ray tomography whereas mechanical properties are assessed by uni-axial compression. The geometry and related properties of the fabricated structures are compared with the designed ones. For small strut size, the difference between the designed structure and the produced one is large enough to impact the desired mechanical properties. The concept of mechanical efficient volume is introduced. For the purpose of simulation, this concept is taken into account by replacing the struts by a cylinder with a textit{mechanical equivalent diameter}. After validation, it has been used into "realistic" simulation and optimization procedures, thus taking into account the process constraints.Post-treatments (Chemical Etching and Electro-Chemical Polishing) were applied on lattice structures to get rid of the inefficient matter by decreasing the surface roughness. The control of the size of the fabricated struts was improved by tuning the process strategies and parameters
Tammas-Williams, Samuel. "XCT analysis of the defect distribution and its effect on the static and dynamic mechanical properties in Ti-6Al-4V components manufactured by electron beam additive manufacture." Thesis, University of Manchester, 2016. https://www.research.manchester.ac.uk/portal/en/theses/xct-analysis-of-the-defect-distribution-and-its-effect-on-the-static-and-dynamic-mechanical-properties-in-ti6al4v-components-manufactured-by-electron-beam-additive-manufacture(cb034391-b61f-4e16-91cd-7ad3c9ec6312).html.
Full textGlasser, Francis. "Méthodes de détection de rayonnement X pulsé pour la tomographie par transmission avec accélérateur linéaire." Grenoble 1, 1988. http://www.theses.fr/1988GRE10081.
Full textPEREIRA, LILIAN N. "Uso de diodos epitaxiais de Si em dosimetria de fótons." reponame:Repositório Institucional do IPEN, 2013. http://repositorio.ipen.br:8080/xmlui/handle/123456789/10581.
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Dissertação (Mestrado)
IPEN/D
Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
Lepinay, Kevin. "Développement et applications de la tomographie chimique par spectroscopie EDX." Thesis, Lyon, INSA, 2013. http://www.theses.fr/2013ISAL0124/document.
Full textThis thesis focuses on the evaluation of the STEM EDX chemical tomography technique: development of experimental procedures, data processing and volumes reconstruction, quality analysis of the results and evaluation of the overall complexity. Until now, STEM EDX analysis performances were very limited, so only few studies about this technique have been realized. However, very significant progress procured by the new SDD detectors as well as by the high brightness electronic sources (X-FEG), making the STEM EDX 2D analysis very fast, have revived the possibility of the chemical tomography, although the technique has to be developed and evaluated (performance and complexity). We have worked on a Tecnai Osiris which acquires EDX chemical mapping of hundreds of thousands of pixels with resolution of one nanometer and in a few minutes. We chose to prepare the rod-shaped samples by FIB and use a sample holder allowing an angle of exploration of 180° without shadowing effects. Then, using model samples (SiO2 balls in resin), we evaluated the sample deformation due to the electron beam irradiation. This allowed us to propose a method to reduce this effect by depositing a 20 nm chromium layer. Images simulations were used to evaluate the software and the reconstruction methods. The methodology of each step of the STEM EDX tomography analysis is then explained and the technique interest is demonstrated by comparing the 2D and the 3D analysis of a transistor 28 nm FDSOI. The quality of the reconstructions (signal-to-noise ratio, spatial resolution) was evaluated, in function of experimental parameters, using simulations and experiments. A resolution of 4 nm is demonstrated through the analysis of a test pattern and a "gate all around” transistor. For the same transistor, the possibility and the interest of a failure analysis at the nanoscale is proven. Analyses of a SRAM gate fail or of the holes in a copper pillar explain the benefits of a combination between a HAADF volume (morphology and resolution < 4 nm) and an EDX volume (chemical information). To conclude, this technique, which still needs to be improved in terms of simplicity, is already showing its usefulness for the analysis and the development of advanced technologies (20nm node and beyond)
Gong, Hao. "A Scheme for Ultra-Fast Computed Tomography Based on Stationary Multi-Beam X-ray Sources." Diss., Virginia Tech, 2017. http://hdl.handle.net/10919/75054.
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Lifton, Joseph J. "The influence of scatter and beam hardening in X-ray computed tomography for dimensional metrology." Thesis, University of Southampton, 2015. https://eprints.soton.ac.uk/378342/.
Full textBhatia, Navnina. "Scattering correction in cone beam tomography using continuously thickness-adapted kernels." Thesis, Lyon, 2016. http://www.theses.fr/2016LYSEI092.
Full textAdvanced Cone Beam Computed Tomography (CBCT) typically uses a divergent conebeam source and a large area detector. As a result, there an inevitable increase in the size area of illumination causing an increase in the intensity of X-ray scatter signal, both from the object and the detector. This leads to the violation of prime assumption of reconstruction process which is based on straight line integrals path followed by the photons. Consequently scatter artifacts appear in the reconstruction images as steaks, cupping effect and thus produce wrong reconstruction values. Due to the severity of the reconstruction artifact caused by scatter, many scatter corrections methods have been adopted in literature. The first part of this study, reviews most of the existing scatter correction methods. The effect of scattering becomes more prominent and challenging in case of X-ray source of high energy which is used in industrial Non Destructive Testing (NDT), due to higher scatter to primary ratio (SPR). Therefore, in this study, we propose a continuously thickness-adapted deconvolution approach based on improvements in the Scatter Kernel Superposition (SKS) method. In this method, the scatter kernels are analytically parameterized over the whole thickness range of the object under study to better sample the amplitude and shape of kernels with respect to the thickness. The method is tested for both homogeneous and heterogeneous objects as well as simulated and experimental data. Another important aspect of this study is the comprehensive evaluation of contribution of the detector scatter performed using continuous method by separating the contribution of scatter due to the object and the detector. This is performed by modeling the scatter kernels using a four-Gaussian model. In the first approach, we performed this evaluation based on simulation of kernels from Monte Carlo simulations and the corrections are performed on typical industrial experimental data. The results obtained prove that the scatter correction only due to the object is not sufficient to obtain reconstruction image, free from artifacts, as the detector also scatters considerably. In order to prove this point experimentally and to have a better modeling of the detector, we describe a method based on combination of experiments and simulations to calculate the scatter kernels. The results obtained also prove, the contribution of the detector scattering becomes important and the PSF of the detector is not constant as considered in the studies so far, but it varies to a great extend with the energy spectrum
Books on the topic "Tomography, electron beam tomography, x-ray tomography"
Computed tomography: From photon statistics to modern cone-beam CT. Berlin: Springer, 2008.
Find full textCassidy, Jim, Donald Bissett, Roy A. J. Spence OBE, Miranda Payne, and Gareth Morris-Stiff. Principles of chemotherapy. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780199689842.003.0005.
Full textGraham, Sean Alexander. Modulation of x-ray fluence patterns in cone-beam computed tomography. 2006.
Find full textWang, Sigen, Otto Zhou, and Sha Chang. Carbon-nanotube field emission electron and X-ray technology for medical research and clinical applications. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533060.013.19.
Full textBook chapters on the topic "Tomography, electron beam tomography, x-ray tomography"
Knapp, R., I. Bangerl, and D. zur Nedden. "Electron beam computed tomography (EBCT)." In Advances in X-Ray Contrast, 67–80. Dordrecht: Springer Netherlands, 1998. http://dx.doi.org/10.1007/978-94-011-3959-5_10.
Full textDinda, Soumitra Kumar, Prakash Srirangam, and Gour Gopal Roy. "Defects Comparison Between Single- and Double-Sided Electron Beam Welded Dissimilar DP600 Steel to 5754 Al Alloy Joints: X-Ray Tomography Study." In TMS 2020 149th Annual Meeting & Exhibition Supplemental Proceedings, 1107–16. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-36296-6_103.
Full textCierniak, Robert. "Reconstruction from Parallel-beam Projections." In X-Ray Computed Tomography in Biomedical Engineering, 83–125. London: Springer London, 2011. http://dx.doi.org/10.1007/978-0-85729-027-4_5.
Full textCierniak, Robert. "Reconstruction from Fan-beam Projections." In X-Ray Computed Tomography in Biomedical Engineering, 127–47. London: Springer London, 2011. http://dx.doi.org/10.1007/978-0-85729-027-4_6.
Full textČiva, Lejla M., Adnan Beganović, Mahira Redžić, Ivan Lasić, Maja Gazdić-Šantić, Amra Skopljak-Beganović, Rahima Jašić, and Sandra Vegar-Zubović. "Evaluation of Computed Tomography X-Ray Beam Dose Profiles." In IFMBE Proceedings, 137–41. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-17971-7_21.
Full textRizo, Philippe, Pierre Grangeat, Pascal Sire, Patrick Le Masson, and Solange Delagenière. "X-Ray Cone Beam Tomography with Two Tilted Circular Trajectories." In Review of Progress in Quantitative Nondestructive Evaluation, 379–86. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3344-3_47.
Full textEkman, Axel, Jian-Hua Chen, Venera Weinhardt, Myan Do, Gerry McDermott, Mark A. Le Gros, and Carolyn A. Larabell. "Putting Molecules in the Picture: Using Correlated Light Microscopy and Soft X-Ray Tomography to Study Cells." In Synchrotron Light Sources and Free-Electron Lasers, 1613–44. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-23201-6_43.
Full textLeGros, Mark A., Jian-Hua Chen, Myan Do, Gerry McDermott, and Carolyn A. Larabell. "Putting Molecules in the Picture: Using Correlated Light Microscopy and Soft X-Ray Tomography to Study Cells." In Synchrotron Light Sources and Free-Electron Lasers, 1367–91. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-14394-1_43.
Full textGros, Mark A. Le, Jian-Hua Chen, ∎. MyanDo, ∎. GerryMcDermott, and Carolyn A.Larabell. "Putting Molecules in the Picture: Using Correlated Light Microscopy and Soft X-ray Tomography to Study Cells." In Synchrotron Light Sources and Free-Electron Lasers, 1–22. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-04507-8_43-1.
Full textEkman, Axel, Jian-Hua Chen, Venera Weinhardt, Myan Do, Gerry McDermott, Mark A. Le Gros, and Carolyn A. Larabell. "Putting Molecules in the Picture: Using Correlated Light Microscopy and Soft X-Ray Tomography to Study Cells." In Synchrotron Light Sources and Free-Electron Lasers, 1–32. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-319-04507-8_43-2.
Full textConference papers on the topic "Tomography, electron beam tomography, x-ray tomography"
Hampel, Uwe, Frank Fischer, Eckhard Schleicher, Dietrich Hoppe, and Prabhat Munshi. "Ultra Fast Scanned Electron Beam X-Ray CT for Two-Phase Flow Measurement." In CT2008: TOMOGRAPHY CONFLUENCE: An International Conference on the Applications of Computerized Tomography. AIP, 2008. http://dx.doi.org/10.1063/1.2999982.
Full textHampel, Uwe, Frank Barthel, Martina Bieberle, Markus Schubert, and Eckhard Schleicher. "Multiphase flow investigations with ultrafast electron beam x-ray tomography." In THE 7TH INTERNATIONAL SYMPOSIUM ON MEASUREMENT TECHNIQUES FOR MULTIPHASE FLOWS. AIP, 2012. http://dx.doi.org/10.1063/1.3694703.
Full textHampel, Uwe, and Frank Fischer. "Application of CdTe and CZT detectors in ultra fast electron beam X-ray tomography." In 2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC). IEEE, 2008. http://dx.doi.org/10.1109/nssmic.2008.4775132.
Full textHampel, Uwe, and Frank Fischer. "Ultra fast electron beam X-ray tomography and its application to multiphase flow measurement." In 2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC). IEEE, 2008. http://dx.doi.org/10.1109/nssmic.2008.4775238.
Full textBieberle, M., F. Barthel, D. Hoppe, M. Banowski, M. Wagner, D. Lucas, T. Sturzel, and U. Hampel. "Ultrafast electron beam X-ray computed tomography for 2D and 3D two-phase flow imaging." In 2012 IEEE International Conference on Imaging Systems and Techniques (IST). IEEE, 2012. http://dx.doi.org/10.1109/ist.2012.6295548.
Full textSturzel, T., M. Bieberle, and U. Hampel. "A device for ultrafast three-dimensional x-ray computed tomography with a scanned electron beam." In 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (2011 NSS/MIC). IEEE, 2011. http://dx.doi.org/10.1109/nssmic.2011.6154317.
Full textWijaya, Andi, Jördis Rosc, Bernhard Sartory, Roland Brunner, Barbara Eichinger, and Martin Mischitz. "Development of a Characterization Workflow for Reliable Porous Copper Films using SEM-FIB Tomography and Advanced Image Analysis." In ISTFA 2019. ASM International, 2019. http://dx.doi.org/10.31399/asm.cp.istfa2019p0277.
Full textJaypuria, Sanjib, Debalay Chakrabarti, D. K. Pratihar, and M. N. Jha. "Effect of Beam Oscillations on Formation of Defects in Electron Beam Welding of Copper Plate." In ASME 2019 14th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/msec2019-2943.
Full textTsuritani, Hiroyuki, Toshihiko Sayama, Yoshiyuki Okamoto, Takeshi Takayanagi, Kentaro Uesugi, Masato Hoshino, and Takao Mori. "Application of Synchrotron Radiation X-Ray Laminography to Nondestructive Evaluation of the Fatigue Crack Propagation Process in Flip Chip Solder Joints." In ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems. American Society of Mechanical Engineers, 2013. http://dx.doi.org/10.1115/ipack2013-73091.
Full textCong, Wenxiang, and Ge Wang. "X-ray fan-beam luminescence tomography." In 2014 IEEE 11th International Symposium on Biomedical Imaging (ISBI 2014). IEEE, 2014. http://dx.doi.org/10.1109/isbi.2014.6868082.
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