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Relevant bibliographies by topics / Transmission electron microscopy – Analysis

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Academic literature on the topic 'Transmission electron microscopy – Analysis'

Author: Grafiati

Published: 4 June 2021

Last updated: 2 February 2022

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Journal articles on the topic "Transmission electron microscopy – Analysis"

1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

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Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as su

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Mandal, Anil K. "Analysis of Urinary Sediment by Transmission Electron Microscopy." Clinics in Laboratory Medicine 8, no. 3 (1988): 463–81. http://dx.doi.org/10.1016/s0272-2712(18)30668-1.

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KIMOTO, Koji. "Crystal Structure Analysis Using Scanning Transmission Electron Microscopy." Nihon Kessho Gakkaishi 61, no. 1 (2019): 15–22. http://dx.doi.org/10.5940/jcrsj.61.15.

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Crozier, Peter A. "Analysis of Nanostructures with Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 9, S02 (2003): 304–5. http://dx.doi.org/10.1017/s1431927603441524.

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Dhere, R. G., M. M. Al-Jassim, Y. Yan, et al. "CdS/CdTe interface analysis by transmission electron microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 18, no. 4 (2000): 1604–8. http://dx.doi.org/10.1116/1.582393.

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Yuzuriha, N., H. Sosiati, S. Hata, et al. "Transmission electron microscopy analysis of C4H4S-doped MgB2tapes." Journal of Physics: Conference Series 97 (February 1, 2008): 012277. http://dx.doi.org/10.1088/1742-6596/97/1/012277.

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Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele

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Kremer, James R., Paul S. Furcinitti, Eileen O’Toole, and J. Richard McIntosh. "Analysis of photographic emulsions for High-Voltage Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 452–53. http://dx.doi.org/10.1017/s0424820100148095.

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Characteristics of electron microscope film emulsions, such as the speed, the modulation transfer function, and the exposure dependence of the noise power spectrum, have been studied for electron energies (80-100keV) used in conventional transmission microscopy. However, limited information is available for electron energies in the intermediate to high voltage range, 300-1000keV. Furthermore, emulsion characteristics, such as optical density versus exposure, for new or improved emulsions are usually only quoted by film manufacturers for 80keV electrons. The need for further film emulsion studi

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Ferreira, P. J., K. Mitsuishi, and E. A. Stach. "In Situ Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (2008): 83–90. http://dx.doi.org/10.1557/mrs2008.20.

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AbstractThe articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes.

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Dissertations / Theses on the topic "Transmission electron microscopy – Analysis"

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Jones, Lewys. "Applications of focal-series data in scanning-transmission electron microscopy." Thesis, University of Oxford, 2013. http://ora.ox.ac.uk/objects/uuid:a6f2a4d5-e77a-47a5-b2d7-aab4b7069ce2.

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Since its development, the scanning transmission electron microscope has rapidly found uses right across the material sciences. Its use of a finely focussed electron probe rastered across samples offers the microscopist a variety of imaging and spectroscopy signals in parallel. These signals are individually intuitive to interpret, and collectively immensely powerful as a research tool. Unsurprisingly then, much attention is concentrated on the optical quality of the electron probes used. The introduction of multi-pole hardware to correct optical distortions has yielded a step-change in imagin

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Haibo, E. "Quantitative analysis of core-shell nanoparticle catalysts by scanning transmission electron microscopy." Thesis, University of Oxford, 2013. http://ora.ox.ac.uk/objects/uuid:19c3b989-0ffb-487f-8cb3-f6e9dea83e63.

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This thesis concerns the application of aberration corrected scanning transmission electron microscopy (STEM) to the quantitative analysis of industrial Pd-Pt core-shell catalyst nanoparticles. High angle annular dark field imaging (HAADF), an incoherent imaging mode, is used to determine particle size distribution and particle morphology of various particle designs with differing amounts of Pt coverage. The limitations to imaging, discrete tomography and spectral analysis imposed by the sample’s sensitivity to the beam are also explored. Since scattered intensity in HAADF is strongly dependen

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Härmark, Johan. "Structural studies of microbubbles and molecular chaperones using transmission electron microscopy." Doctoral thesis, KTH, Strukturell bioteknik, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-186882.

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Ultrasound contrast agents (CAs) are typically used in clinic for perfusion studies (blood flow through a specific region) and border delineating (differentiate borders between tissue structures) during cardiac imaging. The CAs used during ultrasound imaging usually consist of gas filled microbubbles (MBs) (diameter 1-5 μm) that are injected intravenously into the circulatory system. This thesis partially involves a novel polymer-shelled ultrasound CA that consists of air filled MBs stabilized by a polyvinyl alcohol (PVA) shell. These MBs could be coupled with superparamagnetic iron oxide nano

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Akhtar, Sultan. "Transmission Electron Microscopy of Graphene and Hydrated Biomaterial Nanostructures : Novel Techniques and Analysis." Doctoral thesis, Uppsala universitet, Tillämpad materialvetenskap, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-171991.

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Transmission Electron Microscopy (TEM) on light element materials and soft matters is problematic due to electron irradiation damage and low contrast. In this doctoral thesis techniques were developed to address some of those issues and successfully characterize these materials at high resolution. These techniques were demonstrated on graphene flakes, DNA/magnetic beads and a number of water containing biomaterials. The details of these studies are given below. A TEM based method was presented for thickness characterization of graphene flakes. For the thickness characterization, the dynamical

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Liu, Jian. "Atomic structure and chemical analysis of metal nanoparticles by scanning transmission electron microscopy." Thesis, University of Birmingham, 2017. http://etheses.bham.ac.uk//id/eprint/7653/.

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This thesis explores the use of aberration-corrected Scanning Transmission Electron Microscope (ac-STEM) to characterise the size, atomic structure and chemical composition of different types of nanoparticles, including Ag clusters produced in a matrix assemblym cluster source (MACS), chemically-synthesised monolayer protected Au clusters, metal oxide nanoparticles and bimetallic nanoparticles. The size and density of clusters produced in the MACS with different experimental parameters are characterised by STEM High-Angle Annular Dark Field (HAADF) imaging, shedding light on the capabilities o

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Bowers, Cynthia Thomason. "Transmission Electron Microscopy Analysis of Silicon-Doped Beta-Gallium Oxide Films Grown by Pulsed Laser Deposition." Wright State University / OhioLINK, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=wright1580120635333744.

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Lavrik, Ilya A. "Novel wavelet-based statistical methods with applications in classification, shrinkage, and nano-scale image analysis." Available online, Georgia Institute of Technology, 2006, 2006. http://etd.gatech.edu/theses/available/etd-11162005-131744/.

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Thesis (Ph. D.)--Industrial and Systems Engineering, Georgia Institute of Technology, 2006.<br>Huo, Xiaoming, Committee Member ; Heil, Chris, Committee Member ; Wang, Yang, Committee Member ; Hayter, Anthony, Committee Member ; Vidakovic, Brani, Committee Chair.

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Ukyo, Y., K. Horibuchi, H. Oka, et al. "Degradation analysis of a Ni-based layered positive-electrode active material cycled at elevated temperatures studied by scanning transmission electron microscopy and electron energy-loss spectroscopy." Elsevier, 2011. http://hdl.handle.net/2237/20821.

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Severs, John. "Microstructural characterisation of novel nitride nanostructures using electron microscopy." Thesis, University of Oxford, 2014. http://ora.ox.ac.uk/objects/uuid:6229b51e-70e7-4431-985e-6bcb63bd99d1.

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Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth conditions and optical properties. This thesis investigates three such novel materials: (1) GaN/InGaN core/shell nanowires, (2) n-GaN/InGaN/p-GaN core/multi-shell microrods and (3) Zn<sub>3</sub>N<sub>2</sub> nanoparticles, all of which were grown at Sharp Laboratories of Europe. GaN nanowires were grown by

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Vermelho, Paulo Moreira 1967. "Sistemas adesivos universais = resistência de união ao esmalte e dentina, padrão de fratura e análise ultramorfológica = Universal adhesive systems: bond strength to enamel and dentin, failure pattern and ultramorphology analysis." [s.n.], 2015. http://repositorio.unicamp.br/jspui/handle/REPOSIP/287800.

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Orientador: Marcelo Giannini<br>Tese (doutorado) - Universidade Estadual de Campinas, Faculdade de Odontologia de Piracicaba<br>Made available in DSpace on 2018-08-27T18:34:59Z (GMT). No. of bitstreams: 1 Vermelho_PauloMoreira_D.pdf: 2479320 bytes, checksum: 0d9cc50e5276a8b6e9a933c7dcd3239c (MD5) Previous issue date: 2015<br>Resumo: Os objetivos deste estudo foram analisar as características ultramorfológicas da interface de união dente-resina, a resistência de união ao esmalte e dentina pelo método da microtração e os padrões de fratura dos espécimes testados. Dois adesivos "universais ou m

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Books on the topic "Transmission electron microscopy – Analysis"

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Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer Science+Business Media, LLC, 2011.

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James, Howe, and SpringerLink (Online service), eds. Transmission Electron Microscopy and Diffractometry of Materials. 4th ed. Springer Berlin Heidelberg, 2013.

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1943-, Goodhew Peter J., and Royal Microscopical Society, eds. Light-element analysis in the transmission electron microscope. Oxford University Press (for) Royal Microscopical Society, 1988.

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Rosenauer, Andreas. Transmission Electron Microscopy of Semiconductor Nanostructures: Analysis of Composition and Strain State. Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/3-540-36407-2.

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Structure analysis of advanced nanomaterials: Nanoworld by high-resolution electron microscopy. De Gruyter, 2014.

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Budd, P. M. Light-element analysis in the transmission electron microscope, WEDX and EELS. Oxford University Press, 1988.

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7

Garratt-Reed, A. J. Energy-dispersive X-ray analysis in the electron microscope. BIOS, 2003.

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8

Walters, Jon D. Microchemical analysis of non-metallic inclusions in C-MN steel shielded metal arc welds by analytical transmission electron microscopy. Naval Postgraduate School, 1998.

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9

Reimer, Ludwig. Transmission Electron Microscopy. Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.

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Reimer, Ludwig. Transmission Electron Microscopy. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.

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Book chapters on the topic "Transmission electron microscopy – Analysis"

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Williams, David B., and C. Barry Carter. "Quantitative X-ray Analysis." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_35.

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Williams, David B., and C. Barry Carter. "Qualitative X-ray Analysis." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_34.

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Williams, David B., and C. Barry Carter. "Qualitative X-ray Analysis and Imaging." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_34.

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Reimer, Ludwig. "Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy." In Transmission Electron Microscopy. Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_10.

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Oshima, Yoshifumi. "Electrochemical Transmission Electron Microscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_19.

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Kawasaki, Tadahiro. "Environmental Transmission Electron Microscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_29.

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Kimoto, Koji. "Scanning Transmission Electron Microscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_95.

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Klomparens, Karen L., and John W. Heckman. "Transmission Electron Microscopy and Scanning Probe Microscopy." In Methods of Biochemical Analysis. John Wiley & Sons, Inc., 2006. http://dx.doi.org/10.1002/9780470110584.ch2.

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Echlin, Patrick. "Low-Temperature Transmission Electron Microscopy." In Low-Temperature Microscopy and Analysis. Springer US, 1992. http://dx.doi.org/10.1007/978-1-4899-2302-8_9.

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Ponce, Arturo, José Luis Reyes-Rodríguez, Eduardo Ortega, Prakash Parajuli, M. Mozammel Hoque, and Azdiar A. Gazder. "Large Dataset Electron Diffraction Patterns for the Structural Analysis of Metallic Nanostructures." In Scanning Transmission Electron Microscopy. CRC Press, 2020. http://dx.doi.org/10.1201/9780429243011-5.

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Conference papers on the topic "Transmission electron microscopy – Analysis"

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Galand, R., L. Clément, P. Waltz, and Y. Wouters. "Microstructure and texture analysis of advanced copper using electron backscattered diffraction and scanning transmission electron microscopy." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.852908.

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Vanderlinde, William E. "STEM (Scanning Transmission Electron Microscopy) in a SEM (Scanning Electron Microscope) for Failure Analysis and Metrology." In ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0077.

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Abstract Recent developments in transmission electron microscopy (TEM) sample preparation have greatly reduced the time and cost for preparing thin samples. In this paper, a method is demonstrated for viewing thin samples in transmission in an unmodified scanning electron microscope (SEM) using an easily constructed sample holder. Although not a substitute for true TEM analysis, this method allows for spatial resolution that is superior to typical SEM imaging and provides image contrast from material structure that is typical of TEM images. Furthermore, the method can produce extremely high re

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Megret, Remi, Shinjae Yoo, Dmitri Zakharov, and Eric Stach. "Analysis of nanoparticle growth in environmental transmission electron microscopy." In 2016 New York Scientific Data Summit (NYSDS). IEEE, 2016. http://dx.doi.org/10.1109/nysds.2016.7747825.

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DaPonte, J., T. Sadowski, C. C. Broadbridge, et al. "Application of particle analysis to transmission electron microscopy (TEM)." In Defense and Security Symposium, edited by Zia-ur Rahman, Stephen E. Reichenbach, and Mark A. Neifeld. SPIE, 2007. http://dx.doi.org/10.1117/12.714749.

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Takeda, Seiji, Hideto Yoshida, and Yasufumi Kuwauchi. "Structure analysis of nanoparticle catalysts by environmental transmission electron microscopy." In 2011 International Meeting for Future of Electron Devices, Kansai (IMFEDK). IEEE, 2011. http://dx.doi.org/10.1109/imfedk.2011.5944822.

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Hata, Y., H. Nanatsue, Y. Hidaka, Y. Harada, and M. Inoue. "Microstructure analysis technique for aluminum metallzations by transmission electron microscopy." In AIP Conference Proceedings Volume 263. AIP, 1992. http://dx.doi.org/10.1063/1.42688.

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Demarest, James J., and Hong-Ying Zhai. "Highly Automated Transmission Electron Microscopy Tomography for Defect Understanding." In ISTFA 2011. ASM International, 2011. http://dx.doi.org/10.31399/asm.cp.istfa2011p0137.

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Abstract Imaging tomography by transmission electron microscopy (TEM) is a technique which has been growing in popularity in recent years, yet it has not been widely applied to semiconductor defect studies and root cause determination [1- 3]. In part this is due to the complex equipment, computing needs, and microscope time required to generate the various images which ultimately compose the data set. However, the latest generation of TEMs—with their high level of stability and automation—are greatly reducing the resource needs to create high quality and informative movies of defects rotating

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Li, Y., S. Tan, H. Kuan, K. Tan, and L. Duan. "CMOS Gate Oxide Integrity Failure Structure Analysis Using Transmission Electron Microscopy." In 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings. IEEE, 2006. http://dx.doi.org/10.1109/icsict.2006.306677.

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Liu, P., K. Li, Y. Li, C. Q. Chen, E. Er, and J. Teong. "Study on SRAM soft failure using planar-view transmission electron microscopy techniques." In 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IEEE, 2008. http://dx.doi.org/10.1109/ipfa.2008.4588194.

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Bender, H. J., and R. A. Donaton. "Focused Ion Beam Analysis of Low-K Dielectrics." In ISTFA 2000. ASM International, 2000. http://dx.doi.org/10.31399/asm.cp.istfa2000p0397.

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Abstract The characteristics of an organic low-k dielectric during investigation by focused ion beam (FIB) are discussed for the different FIB application modes: cross-section imaging, specimen preparation for transmission electron microscopy, and via milling for device modification. It is shown that the material is more stable under the ion beam than under the electron beam in the scanning electron microscope (SEM) or in the transmission electron microscope (TEM). The milling of the material by H2O vapor assistance is strongly enhanced. Also by applying XeF2 etching an enhanced milling rate c

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Reports on the topic "Transmission electron microscopy – Analysis"

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Dietz, N. L. Transmission electron microscopy analysis of corroded metal waste forms. Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/861616.

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Duff, M. C. Transmission Electron Microscopy Analysis of Strontium and Actinide-Bearing Monosodium Titanate and Permanganate Treatment Solids. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/806925.

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Hanwell, Marcus. Open Source Visualization and Analysis Platform for 3D Reconstructions of Materials by Transmission Electron Microscopy. Final Report for SBIR Phase IIB Award (Topic 5, Subtopic A). Office of Scientific and Technical Information (OSTI), 2020. http://dx.doi.org/10.2172/1631155.

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Pennycook, S. J., and A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2008. http://dx.doi.org/10.2172/939888.

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Reed, B., M. Armstrong, K. Blobaum, et al. Time Resolved Phase Transitions via Dynamic Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2007. http://dx.doi.org/10.2172/902321.

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Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/10170120.

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Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/6282616.

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Isaacs, H. S., Y. Zhu, R. L. Sabatini, and M. P. Ryan. Transmission electron microscopy of undermined passive films on stainless steel. Office of Scientific and Technical Information (OSTI), 1999. http://dx.doi.org/10.2172/353181.

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TOSTEN, MICHAEL. Transmission Electron Microscopy Study of Helium-Bearing Fusion Welds(U). Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/882713.

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Scott, Keana C., and Lucille A. Giannuzzi. Strategies for transmission electron microscopy specimen preparation of polymer composites. National Institute of Standards and Technology, 2015. http://dx.doi.org/10.6028/nist.sp.1200-16.

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