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Books on the topic 'Transmission electron microscopy (TEM)'

Author: Grafiati
Published: 4 June 2021
Last updated: 18 May 2024

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1

United States. National Aeronautics and Space Administration., ed. Soot precursor material: Visualization via simultaneous LIF-LII and characterization via TEM. [Washington, D.C: National Aeronautics and Space Administration, 1996.

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2

Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.

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3

Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.

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4

Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1.

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5

Williams, David B., and C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3.

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6

Carter, C. Barry, and David B. Williams, eds. Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0.

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7

Williams, David B., and C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3.

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8

Zuo, Jian Min, and John C. H. Spence. Advanced Transmission Electron Microscopy. New York, NY: Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6607-3.

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9

Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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10

Deepak, Francis Leonard, Alvaro Mayoral, and Raul Arenal, eds. Advanced Transmission Electron Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9.

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11

Thomas, Jürgen, and Thomas Gemming. Analytical Transmission Electron Microscopy. Dordrecht: Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-8601-0.

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12

Reimer, Ludwig, ed. Energy-Filtering Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1995. http://dx.doi.org/10.1007/978-3-540-48995-5.

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13

Hansen, Thomas Willum, and Jakob Birkedal Wagner, eds. Controlled Atmosphere Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-22988-1.

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14

Sun, Litao, Tao Xu, and Ze Zhang, eds. In-Situ Transmission Electron Microscopy. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-19-6845-7.

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15

1963-, Zhang Xiao-Feng, and Zhang Ze 1953-, eds. Progress in transmission electron microscopy. Berlin: Springer, 2001.

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16

Hayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.

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17

Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1986.

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18

J, Keyse Robert, and Royal Microscopial Society, eds. Introduction to scanning transmission electron microscopy. Singapore: Bio scientific/Springer, 1998.

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19

Kumar, Challa S. S. R., ed. Transmission Electron Microscopy Characterization of Nanomaterials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-38934-4.

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20

Zhang, Xiao-Feng, and Ze Zhang, eds. Progress in Transmission Electron Microscopy 1. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-09518-8.

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21

Claverie, Alain, and Mireille Mouis, eds. Transmission Electron Microscopy in Micro-Nanoelectronics. Hoboken, NJ USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118579022.

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22

Brydson, Rik, ed. Aberration-Corrected Analytical Transmission Electron Microscopy. Chichester, UK: John Wiley & Sons, Ltd, 2011. http://dx.doi.org/10.1002/9781119978848.

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23

Brydson, Rik. Aberration-corrected analytical transmission electron microscopy. Hoboken, N.J: Wiley, 2011.

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24

J, Keyse Robert, and Royal Microscopical Society (Great Britain), eds. Introduction to scanning transmission electron microscopy. Oxford: BIOS Scientific Publishers, 1998.

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25

Physical principles of electron microscopy: An introduction to TEM, SEM, and AEM. New York: Springer Science+Business Media, 2005.

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26

William, Heckman John, and Klomparens Karen L, eds. Scanning and transmission electron microscopy: An introduction. New York: Oxford University Press, 1995.

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27

William, Heckman John, and Klomparens Karen L, eds. Scanning and transmission electron microscopy: An introduction. New York: W.H. Freeman, 1993.

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28

Barry, Carter C., ed. Transmission electron microscopy: A textbook for materials science : Imaging. 2nd ed. New York [u.a.]: Plenum Press, 2009.

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29

Inc, ebrary, ed. High-resolution electron microscopy. New York: Oxford University Press, 2009.

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30

Ayache, Jeanne, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, and Danièle Laub. Sample Preparation Handbook for Transmission Electron Microscopy. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-0-387-98182-6.

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31

Fultz, Brent, and James Howe. Transmission Electron Microscopy and Diffractometry of Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-29761-8.

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32

Fultz, Brent, and James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-04516-9.

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33

Ayache, Jeanne, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, and Danièle Laub. Sample Preparation Handbook for Transmission Electron Microscopy. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-1-4419-5975-1.

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34

Fultz, Brent, and James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-662-04901-3.

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35

McLaren, Alex C. Transmission electron microscopy of minerals and rocks. Cambridge: Cambridge University Press, 1991.

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36

Hugo, Richard Charles. In-situ TEM observations of gallium penetration into aluminum grain boundaries. 1993.

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37

Transmission Electron Microscopy. New York, NY: Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-40093-8.

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38

Bruma, Alina. Scanning Transmission Electron Microscopy. Taylor & Francis Group, 2020.

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39

Kleebe, Hans-Joachim, Leopoldo Molina-Luna, and Ute Kolb. Applied Transmission Electron Microscopy. de Gruyter GmbH, Walter, 2099.

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40

Energy-filtering transmission electron microscopy. Berlin: Springer, 1995.

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41

Thomas, Gareth, and M. J. Goringe. Transmission Electron Microscopy of Materials. John Wiley & Sons Inc, 1987.

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42

Energy-Filtering Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1995.

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43

Transmission Electron Microscopy of Materials. Techbooks, 1990.

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44

Zhang, Xiao-Feng. Progress in Transmission Electron Microscopy. Wuhan Univ Pr, 2001.

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45

Transmission Electron Microscopy In Micronanoelectronics. Wiley-Iste, 2012.

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46

Hawkes, P. W., R. F. Egerton, Ludwig Reimer, and C. Deininger. Energy-Filtering Transmission Electron Microscopy. Springer Berlin / Heidelberg, 2013.

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47

Sun, Litao, Tao Xu, and Ze Zhang. In-Situ Transmission Electron Microscopy. Springer, 2023.

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48

Transmission Electron Microcopy. Springer-Verlag, 2006.

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49

Claverie, Alain. Transmission Electron Microscopy in Micro-Nanoelectronics. Wiley & Sons, Incorporated, John, 2012.

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50

Claverie, Alain. Transmission Electron Microscopy in Micro-Nanoelectronics. Wiley & Sons, Incorporated, John, 2013.

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