Journal articles: 'Transmission electron microscopy (TEM)'

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Winey, Mark, Janet B. Meehl, Eileen T. O'Toole, and Thomas H. Giddings. "Conventional transmission electron microscopy." Molecular Biology of the Cell 25, no. 3 (February 2014): 319–23. http://dx.doi.org/10.1091/mbc.e12-12-0863.

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Researchers have used transmission electron microscopy (TEM) to make contributions to cell biology for well over 50 years, and TEM continues to be an important technology in our field. We briefly present for the neophyte the components of a TEM-based study, beginning with sample preparation through imaging of the samples. We point out the limitations of TEM and issues to be considered during experimental design. Advanced electron microscopy techniques are listed as well. Finally, we point potential new users of TEM to resources to help launch their project.

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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (August 2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-controlled image capturing devices. Nowadays, the required controls for the currents through lenses and coils of the optical column can be accessed by computer software. The second layer of development is aimed toward further automation of instrument operation. For specific microscope applications, dedicated automated microscope-control procedures are carried out. in this paper, we will discuss our ongoing efforts on this second level towards fully automated electron tomography. The third layer of development concerns virtual- or telemicroscopy. Most telemicroscopy applications duplicate the computer-screen (with accessory controls) at the microscope-site to a computer-screen at another site. This approach allows sharing of equipment, monitoring of instruments by supervisors, as well as collaboration between experts at remote locations.Electron tomography is a three-dimensional (3D) imaging method with transmission electron microscopy (TEM) that provides high-resolution 3D images of structural arrangements. with electron tomography a series of images is acquired of a sample that is tilted over a large angular range (±70°) with small angular tilt increments.

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Ferreira, P. J., K. Mitsuishi, and E. A. Stach. "In Situ Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (February 2008): 83–90. http://dx.doi.org/10.1557/mrs2008.20.

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AbstractThe articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes. They can validate static TEM experiments and inspire new experimental approaches and new theories.

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Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (March 28, 2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.

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Thomas, Edwin L. "Transmission electron microscopy of polymers." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 422–25. http://dx.doi.org/10.1017/s0424820100126901.

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Transmission electron microscopy continues to play a major role in micro-structural characterization of polymers. Additionally, as evidenced by the special symposium on electron crystallography at this EMSA meeting, electron diffraction, as applied to polymer crystals, is also a vigorous area of research. Because many of the interesting morphological features of polymer systems are at and below the micron scale, TEM is a most fruitful technique. Applications range from simple assessment of dispersed phase particle size in blends to HREM molecular imaging of defects in crystals. Thus polymer scientists probe structures over about 4 orders of magnitude in size, and the versatility of the TEM in such endeavors is evident from its essentially ubiquitous appearance in all modern physical sciences laboratories.While there are a host of standard and advanced texts on the application of TEM to metals and to biology, there are only a few review papers on polymer microscopy and one just-published book.

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Hulskamp, M., B. Schwab, P. Grini, and H. Schwarz. "Transmission Electron Microscopy (TEM) of Plant Tissues." Cold Spring Harbor Protocols 2010, no. 7 (July 1, 2010): pdb.prot4958. http://dx.doi.org/10.1101/pdb.prot4958.

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Lee, M. R. "Transmission electron microscopy (TEM) of Earth and planetary materials: A review." Mineralogical Magazine 74, no. 1 (February 2010): 1–27. http://dx.doi.org/10.1180/minmag.2010.074.1.1.

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AbstractUsing high intensity beams of fast electrons, the transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) enable comprehensive characterization of rocks and minerals at micrometre to sub-nanometre scales. This review outlines the ways in which samples of Earth and planetary materials can be rendered sufficiently thin for TEM and STEM work, and highlights the significant advances in site-specific preparation enabled by the focused ion beam (FIB) technique. Descriptions of the various modes of TEM and STEM imaging, electron diffraction and X-ray and electron spectroscopy are outlined, with an emphasis on new technologies that are of particular relevance to geoscientists. These include atomic-resolution Z-contrast imaging by high-angle annular dark-field STEM, electron crystallography by precession electron diffraction, spectrum mapping using X-rays and electrons, chemical imaging by energy-filtered TEM and true atomic-resolution imaging with the new generation of aberration-corrected microscopes. Despite the sophistication of modern instruments, the spatial resolution of imaging, diffraction and X-ray and electron spectroscopy work on many natural materials is likely to remain limited by structural and chemical damage to the thin samples during TEM and STEM.

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Saka, Hiroyasu, Takeo Kamino, Shigeo Ara, and Katsuhiro Sasaki. "In Situ Heating Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (February 2008): 93–100. http://dx.doi.org/10.1557/mrs2008.21.

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AbstractTemperature is one of the most important factors affecting the state and behavior of materials. In situ heating transmission electron microscopy (TEM) is a powerful tool for understanding such temperature effects, and recently in situ heating TEM has made significant progress in terms of temperature available and resolution attained. This article briefly describes newly developed specimen-heating holders, which are useful in carrying out in situ heating TEM experiments. It then focuses on three main applications of these specimen holders: solid–solid reactions, solid–liquid reactions (including highresolution observation of a solid–liquid interface, size dependence of the melting temperatures of one-, two- and three-dimensionally reduced systems, size dependence of the contact angle of fine metal liquid, and wetting of Si with liquid Au or Al) and solid–gas reactions. These results illustrate the benefit of in situ heating TEM for providing fundamental information on temperature effects on materials.

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Kuokkala, V. T., and T. K. Lepistö. "TEMTUTOR - a Teaching Multimedia Program for TEM." Microscopy and Microanalysis 3, S2 (August 1997): 1161–62. http://dx.doi.org/10.1017/s1431927600012691.

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Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simulation of transmission electron micrographs and related diffraction patterns can help the student better understand the image formation processes. Adding text, audio and video help capabilities to the program, it can be made an efficient supplemental teaching tool.TemTutor for Windows is based on microScope for Windows, which is a BF/DF TEM micrograph simulation program for dislocations and stacking faults.

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Dumančić, Ena, Lea Vojta, and Hrvoje Fulgosi. "Beginners guide to sample preparation techniques for transmission electron microscopy." Periodicum Biologorum 125, no. 1-2 (October 25, 2023): 123–31. http://dx.doi.org/10.18054/pb.v125i1-2.25293.

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Background purpose: The revolution in microscopy came in 1930 with the invention of electron microscope. Since then, we can study specimens on ultrastructural and even atomic level. Besides transmission electron microscopy (TEM), for which specimen preparation techniques will be described in this article, there are also other types of electron microscopes that are not discussed in this review. Materials and methods: Here, we have described basic procedures for TEM sample preparation, which include tissue sample preparation, chemical fixation of tissue with fixatives, cryo-fixation performed by quick freezing, dehydration with ethanol, infiltration with transitional solvents, resin embedding and polymerization, processing of embedded specimens, sectioning of samples with ultramicrotome, positive and negative contrasting of samples, immunolabeling, and imaging. Conclusion: Such collection of methods can be useful for novices in transmission electron microscopy.

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Smith, David J., M. Gajdardziska-Josifovska, and M. R. McCartney. "Surface studies with a UHV-TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 326–27. http://dx.doi.org/10.1017/s0424820100122034.

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The provision of ultrahigh vacuum capabilities, as well as in situ specimen treatment and annealing facilities, makes the transmission electron microscope into a potentially powerful instrument for the characterization of surfaces. Several operating modes are available, including surface profile imaging, reflection electron microscopy (REM), and reflection high energy electron diffraction (RHEED), as well as conventional transmission imaging and diffraction. All of these techniques have been utilized in our recent studies of surface structures and reactions for various metals, oxides and semiconductors with our modified Philips-Gatan 430ST high-resolution electron microscope.

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TAKAYANAGI, KUNIO, YOSHITAKA NAITOH, YOSHIFUMI OSHIMA, and MASANORI MITOME. "SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION." Surface Review and Letters 04, no. 04 (August 1997): 687–94. http://dx.doi.org/10.1142/s0218625x97000687.

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Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (scanning tunneling microscope) system.

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling spectroscopy (STS), atom force microscopy and magnetic force microscopy)[4]. These methods can be classified roughly into two; in one group image contrast is mainly determined by surface atomic structure and in the other it is determined by surface electronic structure. Information obtained by two groups of surface microscopy is complementary with each other. A combination of the two methods may give images of surface crystallography and surface electronic structure. STM-STS[4] and LEEM-PEEM [3] so far developed are typical examples.In the present work a combination of REM(TEM) and PEEM (Fig. 1) was planned with use of a UHV CTEM. Several new designs were made for the new microscope.

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Geiger, Dorin, Hannes Lichte, Martin Linck, and Michael Lehmann. "Electron Holography with aCs-Corrected Transmission Electron Microscope." Microscopy and Microanalysis 14, no. 1 (December 21, 2007): 68–81. http://dx.doi.org/10.1017/s143192760808001x.

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Cscorrectors have revolutionized transmission electron microscopy (TEM) in that they substantially improve point resolution and information limit. The object information is found sharply localized within 0.1 nm, and the intensity image can therefore be interpreted reliably on an atomic scale. However, for a conventional intensity image, the object exit wave can still not be detected completely in that the phase, and hence indispensable object information is missing. Therefore, for example, atomic electric-field distributions or magnetic domain structures cannot be accessed. Off-axis electron holography offers unique possibilities to recover completely the aberration-corrected object wave with uncorrected microscopes and hence we would not need aCs-corrected microscope for improved lateral resolution. However, the performance of holography is affected by aberrations of the recording TEM in that the signal/noise properties (“phase detection limit”) of the reconstructed wave are degraded. Therefore, we have realized off-axis electron holography with aCs-corrected TEM. The phase detection limit improves by a factor of four. A further advantage is the possibility of fine-tuning the residual aberrations bya posterioricorrection. Therefore, a combination of both methods, that is,Cscorrection and off-axis electron holography, opens new perspectives for complete TEM analysis on an atomic scale.

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KIM, Gyeung-Ho. "Overview of Transmission Electron Microscopy and Analytical Techniques." Physics and High Technology 32, no. 7/8 (August 31, 2023): 18–23. http://dx.doi.org/10.3938/phit.32.019.

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Transmission electron microscopy (TEM) and related analytical techniques play crucial role in advancing nanotechnology by providing atomic scale images with simultaneous structural and chemical information originating from multitude of interactions between high energy electrons and atoms of interest. In this short review, various aspects of TEM are explained, from instrumentation, operating principles, typical application examples to recent developments in resolution improvements and performances.

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Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (June 1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM and SEM, they are direct imaging techniques, using magnifying lenses. Both use an aperture to select a particular diffracted beam, which determines the nature of the contrast. If the direct beam is selected (no parallel momentum transfer), a bright field image is formed, and contrast arises primarily from differences in the scattering factor. A dark field image is formed with any other beam in the diffraction pattern, allowing contrast due to differences in symmetry. In LEEM, phase contrast is the third important mechanism by which surface and interface features such as atomic steps and dislocations may be imaged. One major difference between TEM and LEEM is the electron energy: 100 keV and above in TEM, 100 eV and below in LEEM. In LEEM, the imaging electrons are reflected from the sample surface, unlike TEM where the electrons zip right through the sample, encountering top surface, bulk, and bottom surface. STM and TEM are capable of ~2 Å resolution, while LEEM and SEM can observe surface features (including atomic steps) with -100 Å resolution.

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Duan, J. Z., B. Thomas, A. Sidhwa, and S. Chopra. "Transmission Electron Microscopy of polysilicon microresistor." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 864–65. http://dx.doi.org/10.1017/s042482010017205x.

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The electrical properties of electronic materials are greatly affected by their microstructure, which in turn is determined by the processes used for fabrication. Transmission Electron Microscopy (TEM) is one of the most powerful analytical techniques to provide localized information about microstructure as it relates to process control parameters. This information is used for process development and failure diagnoses as well as QA/QC control. In this study, the microstructures within the devicesof polysilicon microresistors were analyzed using TEM to understand different resistances.The TEM samples were prepared from the devices to be analyzed by the mechanical polishing method using the tripod polisherTM. The selected area polishing technique was used to find the area of interest within one micron range. Figure 1 shows the specimen preparation process. The low and high magnification optical micrographs in Figures 1a and 1b indicate the region of interest within the die. Figure 1c is the optical image of the cross section along the line A-A in Figure lb.

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Kucheriavyi, Y. P. "TRANSMISSION ELECTRON MICROSCOPY FOR THE DIRECT ANALYSIS OF FIBRIN CLOT STRUCTURE." Biotechnologia Acta 16, no. 2 (April 28, 2023): 30–31. http://dx.doi.org/10.15407/biotech16.02.030.

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The aim of our study was to compare the structure of clots formed as a result of thrombin-induced fibrin polymerization in the presence or absence of monoclonal fibrin-specific antibodies fragments as factors that change the clot structure. We concentrated on the final stage of fibrin clot formation at maximal turbidity point for every sample. Methods. Fibrin polymerization was studied by transmission electron microscopy (TEM) of negatively contrasted samples on H-600 Transmission Electron Microscope (“Hitachi”,Japan); 1% water solution of uranyl acetate (“Merck”, Germany) was used as a negative contrast. For sample preparation, in sterile glass tubes were sequentially added 0.32 mg/mL human fibrinogen, 0.025 M CaCl2 in 0.05 M ammonium formiate buffer (pH 7.9), and a total sample volume was 0.22 mL. The polymerization of fibrin was initiated by the introduction of thrombin at a final concentration of 0.25 NIH/mL. After 180 s, aliquots were taken from the polymerization medium. Each aliquot was diluted to a final fibrinogen concentration of 0.07 mg/mL; 0.01 mL probes of fibrinogen solution were transferred to a carbon lattice, which was treated with a 1% uranyl acetate solution after 2 minutes. Investigations were per-formed using an H-600 electron microscope at 75 kV. Electron microscopic images were obtained at magnification of 20,000 -50,000. Results. Two monoclonal antibodies fragments were obtained towards the mixture of separated Aα-, Bβ- and γ-chains of fibrinogen. Antibodies fragments that were marked as III-1D and I-4A, had different epitopes within fragment Аα105-206 of D-region of fibrinogen. It was shown that addition of antibody fragment I-4A lead to formation of abnormal fibrils that were thinner than in the control sample and were organized in the dense network (Figure). Control sample exhibited the thick fibrils with well-structured classically organized network. The difference between control and I-4A samples demonstrated that antibody I-4A disrupted the structure of polymerized fibrin. In the same time the fibrils obtained in the presence of antibody fragment III-1D were closer to the control ones. Conclusions. TEM is an informative method for the study of the fibrin network formation. Its application allows to estimate the disruption in fi brin formation directly. In a combination with turbidity study and other functional tests TEM can provide important information about molecular mechanisms of clot formation.

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Mata, M. P., D. R. Peacor, and M. D. Gallart-Marti. "Transmission electron microscopy (TEM) applied to ancient pottery." Archaeometry 44, no. 2 (May 2002): 155–76. http://dx.doi.org/10.1111/1475-4754.t01-1-00050.

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (August 1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.

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Brown, J. M. "Transmission electron microscopy of semiconductor devices." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 722–23. http://dx.doi.org/10.1017/s042482010014498x.

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The search for further miniaturization in the semiconductor industry has resulted in the reduction in the dimensions of devices to a size which can no longer be effectively seen by the conventional methods of light microscopy. The use of both transmission and scanning electron microscopy in the field of silicon device characterization has now become an essential ingredient of the design and manufacture of new technologies. It is often the only way in which a device designer can know for certain whether the manufacturing process is producing the required structure. Cross-sectional TEM has therefore become an integral part of both quality control and development.One of the most important areas which resulted in the increased importance of TEM in the semiconductor device field was the development of sample preparation techniques which enable cross-sections through layers of widely differing compositions that are found in the devices structures.

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Pu, Shengda, Chen Gong, and Alex W. Robertson. "Liquid cell transmission electron microscopy and its applications." Royal Society Open Science 7, no. 1 (January 2020): 191204. http://dx.doi.org/10.1098/rsos.191204.

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Transmission electron microscopy (TEM) has long been an essential tool for understanding the structure of materials. Over the past couple of decades, this venerable technique has undergone a number of revolutions, such as the development of aberration correction for atomic level imaging, the realization of cryogenic TEM for imaging biological specimens, and new instrumentation permitting the observation of dynamic systems in situ . Research in the latter has rapidly accelerated in recent years, based on a silicon-chip architecture that permits a versatile array of experiments to be performed under the high vacuum of the TEM. Of particular interest is using these silicon chips to enclose fluids safely inside the TEM, allowing us to observe liquid dynamics at the nanoscale. In situ imaging of liquid phase reactions under TEM can greatly enhance our understanding of fundamental processes in fields from electrochemistry to cell biology. Here, we review how in situ TEM experiments of liquids can be performed, with a particular focus on microchip-encapsulated liquid cell TEM. We will cover the basics of the technique, and its strengths and weaknesses with respect to related in situ TEM methods for characterizing liquid systems. We will show how this technique has provided unique insights into nanomaterial synthesis and manipulation, battery science and biological cells. A discussion on the main challenges of the technique, and potential means to mitigate and overcome them, will also be presented.

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de Jonge, Niels, Elisabeth A. Ring, Wilbur C. Bigelow, and Gabriel M. Veith. "Low-Cost, Atmospheric-Pressure Scanning Transmission Electron Microscopy." Microscopy Today 19, no. 3 (April 28, 2011): 16–20. http://dx.doi.org/10.1017/s1551929511000228.

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Solid materials in subambient gaseous environments have been imaged using in situ transmission electron microscopy (TEM), for example to study dynamic effects: carbon nanotube growth, nanoparticle changes during redox reactions, and phase transitions in nanoscale systems. In these studies the vacuum level in the specimen region of the electron microscope was increased to pressures of up to 10 mbar using pump-limiting apertures that separated the specimen region from the rest of the high-vacuum electron column, but it has not been possible to achieve the higher pressures that are desirable for catalysis research. TEM imaging at atmospheric pressure and at elevated temperature was achieved with 0.2-nm resolution by enclosing a gaseous environment several micrometers thick between ultra-thin, electron transparent silicon nitride windows. Although Ångström-level resolution in situ TEM has been demonstrated with aberration-corrected systems, the key difficulty with TEM imaging is its dependence on phase contrast, which requires ultra-thin specimens, limiting the choice of experiments.

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John Mardinly, A. "Electron Tomography and Three-Dimensional Aspects of Transmission Electron Microscopy." EDFA Technical Articles 7, no. 3 (August 1, 2005): 6–12. http://dx.doi.org/10.31399/asm.edfa.2005-3.p006.

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Abstract Transmission electron microscopy (TEM) plays an important role semiconductor process development, defect identification, yield improvement, and root-cause failure analysis. At the same time, however, certain artifacts of specimen preparation and imaging present barriers for linear scaling of TEM techniques. This article assesses these challenges and explains how electron tomography is being used to overcome them.

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Fraundorf, Phil. "Few Remarkable TEM Facts." Microscopy Today 4, no. 2 (March 1996): 10–11. http://dx.doi.org/10.1017/s155192950006750x.

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What follows is a list of some physical perspectives on the electrons used routinely for transmission electron microscopy. Without knowing it, you may on a daily basis be putting to practical use things, like the wave nature of electrons, that were inconceivable in the early part of this century. In fact, some of the properties of these electrons may be only marginally conceivable today!

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Carmichael, Stephen W., and Jon Charlesworth. "Correlating Fluorescence Microscopy with Electron Microscopy." Microscopy Today 12, no. 1 (January 2004): 3–7. http://dx.doi.org/10.1017/s1551929500051749.

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The use of fluorescent probes is becoming more and more common in cell biology. It would be useful if we were able to correlate a fluorescent structure with an electron microscopic image. The ability to definitively identify a fluorescent organelle would be very valuable. Recently, Ying Ren, Michael Kruhlak, and David Bazett-Jones devised a clever technique to correlate a structure visualized in the light microscope, even a fluorescing cell, with transmission electron microscopy (TEM).Two keys to the technique of Ren et al are the use of grids (as used in the TEM) with widely spaced grid bars and the use of Quetol as the embedding resin. The grids allow for cells to be identified between the grid bars, and in turn the bars are used to keep the cell of interest in register throughout the processing for TEM. Quetol resin was used for embedding because of its low auto fluorescence and sectioning properties. The resin also becomes soft and can be cut and easily peeled from glass coverslips when heated to 70°C.

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O’Keefe, M. A., E. C. Nelson, J. H. Turner, and A. Thust. "Sub-Ångstrom Transmission Electron Microscopy at 300keV." Microscopy and Microanalysis 7, S2 (August 2001): 898–99. http://dx.doi.org/10.1017/s1431927600030567.

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Sub-Ångstrom TEM to a resolution of 0.78Å has been demonstrated by the one-Ångstrom microscope (OÅM) project at the National Center for Electron Microscopy. The OÅM combines a modified CM300FEG-UT with computer software able to generate sub-Angstrom images from experimental image series.Sub-Ångstrom HREM is gaining in importance as researchers design and build artificially-structured nanomaterials such as semiconductor devices, ceramic coatings, and nanomachines. Commonly, such nanostructures include atoms with bond lengths shorter in projection than the point resolution of a mid-voltage HREM. in addition, image simulations have shown that structure determinations of defects such as dislocation cores require sub-Angstrom resolution, as will hold true for grain boundaries and other interfaces.Sub-Ångstrom microscopy with a transmission electron microscope requires meticulous attention to detail. As resolution is improved, resolution-limiting parameters need to be reduced. in particular, aberrations must be minimized, power supplies must be stabilized, and the microscope environment optimized to reduce acoustic and electromagnetic noise in addition to vibration.

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Mekhantseva, Tamara, Oleg Voitenko, Ilya Smirnov, Evgeny Pustovalov, Vladimir Plotnikov, Boris Grudin, and Alexey Kirillov. "TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System." Advanced Materials Research 590 (November 2012): 9–12. http://dx.doi.org/10.4028/www.scientific.net/amr.590.9.

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This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently grow when producing high resolution images and using chemical analysis, such as X-Ray energy-dispersive microanalysis and electron energy loss spectroscopy (EELS).

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Martinez, L., J. M. Briceño-Valero, S. A. López-Rivera, K. Moore, and J. T. Thorthon. "Micropattern analysis of ZnIn2S4 using AFM and TEM." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 476–77. http://dx.doi.org/10.1017/s0424820100138750.

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Semiconductor ZnIn2S4 is the only member of the II-III2-IV4 family with layer structure. The crystal structure of this semiconductor reported by Lappe et. al. is based upon closed packing of sulfur atoms with octahedral and tetrahedral indium atoms and tetrahedral zinc atoms. Previous studies on this material with high resolution transmission electron microscopy and Ramman spectroscopy demonstrate the existence of challenging problems to be resolved related to its intrinsic nature. There is great interest in this material for possible non-linear optical applications. In the present study Atomic Force Microscopy (AFM) and Transmission Electron Microscopy (TEM) have been utilized to reveal crystallographic aspects of this material.Yellowish, plate-shaped, single crystals of ZnIn2S4 were prepared with the chemical transport method using iodine as a transporting agent. Specimens suitable for electron microscope analysis in the growth direction were prepared by peeling off layers with a piece of tape. For AFM analysis, freshly cleaved surfaces were used.

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Baschek, Gabriele, and Emil Eberhard. "Structural and chemical investigation of peristerites by transmission electron microscopy (TEM) and X-ray diffraction." European Journal of Mineralogy 7, no. 2 (March 29, 1995): 309–18. http://dx.doi.org/10.1127/ejm/7/2/0309.

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Probst, W., and V. E. Bayer. "The energy filtering TEM (EFTEM) in modern biological transmisson Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 668–69. http://dx.doi.org/10.1017/s0424820100139718.

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Modern biological electron microscopy can no longer be a static tool merely describing morphology. In addition to ultrastructural information, insights into the molecular and chemical composition of a sample are needed so that new findings stemming from molecular biological and biochemical analyses can be given meaning in an ultrastructural context. Biological electron microscopy will be an essential tool for future discoveries involving the ultrastructural localization of molecules and chemical elements, and it will provide a means to identify the ultrastructural basis for a variety of reaction mechanisms. Many messenger compounds are currently known which can produce dynamic changes of either a subtle or dramatic nature at the ultrastructural level, but only the most basic of these can be examined using a conventional transmission electron microscope (CTEM). CTEMs provide limited information because they perform conventional imaging and do not employ all the signals available for analysis. Unlike a CTEM, an EFTEM permits the selection of a defined energy (wavelength) of electrons which are then used for imaging.

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McDowall, A. W., J. M. Smith, and J. Dubochet. "Thin sectioning for cryo transmission electron microscopy (cryo TEM)." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 102–3. http://dx.doi.org/10.1017/s0424820100142153.

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Processing whole cells and tissues for conventional TEM is known to cause structural alterations. Much effort has been devoted, therefore, to developing techniques which avoid specimen preparation artefacts. Recently, research using a cryo-electron microscope has shown that biological suspensions embedded in vitreous ice retain their structural integrity, and when compared with conventionally prepared TEM specimens, are free from many of the classical artefacts. In order to extend the advantage of cryo TEM to whole cells and tissues, we have developed a method of thin sectioning vitrified material.

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Fan, G. Y., and M. H. Ellisman. "Current State of the Art of Digital Imaging in TEM." Microscopy and Microanalysis 3, S2 (August 1997): 1087–88. http://dx.doi.org/10.1017/s1431927600012320.

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The increasingly wide use of digital computers, the world-wide-web and electronic publishing has had a fundamental impact on the way scientists conduct research in every discipline of science. Electron microscopy is no exception. A considerable amount of effort has been devoted to the development of digital imaging acquisition systems for transmission electron microscopy (TEM). Digital image acquisition systems for TEM, including complete systems, have been produced by several companies, including: Advanced Microscopy Techniques (Rowley, MA), JEOL (Peabody, MA), Gatan (Warrendale, PA), Princeton Instruments (Trenton, NJ) and Tietz-Video (Herbststrasse, Gauting, Germany). While most systems are CCD-based, JEOL has also offered a system which is based on the Imaging Plate technology.The Imaging Plate has the same size as, and is compatible with the camera system for, the 8.09 cm × 99.6 cm electron microscope film. As with film, a latent image is formed on the plate when exposed to electrons. A stack of exposed imaging plates are then taken out of the microscope and scanned by a laser beam in a readout device which converts the latent image to a digital form.

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Tsuno, K., J. Ohyama, M. Kato, J. Kimura, M. Kai, K. Nakanishi, T. Terauchi, and M. Tanaka. "A Wien Filter Electron Energy Loss Spectrometer for Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 32–33. http://dx.doi.org/10.1017/s0424820100133758.

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A retarding Wien filter has been installed in the transmission electron microscope (TEM) JEM-1200EX. The filter is immersed in a high potential (-Ht + Uo ) nearly equal to the accelerating potential (-Ht) to get high energy resolution. The Wien filter consists of crossed electric (E) and magnetic (B) fields perpendicular to the optical axis. Electrons with a particular velocity v have a straight optical axis if the balancing condition between electric and magnetic forces (Wien condition: E=vB) is satisfied. Electrons with different velocity are deflected.Fig. 1 shows a schematic outline of the present instrument. It consists of (1) TEM, (2) an analyzer made of the Wien filter, deflectors and post filter lenses, and (3) a TV camera imaging system and serial detection system. The analyzer and a serial detection system are controlled by a personal computer PC-9801VX (PC). Table 1 shows currents and voltages of the filter, lenses and deflectors (upper) and those for TEM (lower).

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Weigel, D., and J. Glazebrook. "Transmission Electron Microscopy (TEM) Freeze Substitution of Plant Tissues." Cold Spring Harbor Protocols 2010, no. 7 (July 1, 2010): pdb.prot4959. http://dx.doi.org/10.1101/pdb.prot4959.

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Braidy, Nadi, Aude Béchu, Júlio C. Souza Terra, and Gregory S. Patience. "Experimental methods in chemical engineering: Transmission electron microscopy—TEM." Canadian Journal of Chemical Engineering 98, no. 3 (January 20, 2020): 628–41. http://dx.doi.org/10.1002/cjce.23692.

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Engel, A., A. Stemmer, and U. Aebi. "Scanning Tunneling Microscopy (STM) and Transmission Electron Microscopy (TEM) of biological structures." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 12–13. http://dx.doi.org/10.1017/s0424820100152033.

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STM and TEM have both demonstrated their capability to achieve atomic resolution. They provide complementary information of accute interest in structural biology: STM topographs are expected to give high resolution information on the surface structure of biomacromolecules whereas their three-dimensional mass distribution can be obtained from projections recorded by TEM. However, two kinds of limitations appear to be common to STM and TEM. Firstly, the interaction between image forming probe and sample can introduce significant structural rearrangements. In the STM this could be a disruption of the sample by the tip scanning too closely to the surface as well as a damage due to the high current density (1 nA at 1 V bias deposits 0.13* 106 W/cm2 on the sample via a 1 nm tunneling probe; this corresponds to a dose of 8*106 electrons/nm2 if one pixel of 1 nm diameter is recorded within 1 ms). In the TEM the high energy electrons (100 keV) generate beam damage at a dose of 102 to 103 electrons/nm2.

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Bihr, J., G. Benner, D. Krahl, A. Rilk, and E. Weimer. "Design of an analytical TEM with integrated imaging ω spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 354–55. http://dx.doi.org/10.1017/s0424820100086076.

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Conventional transmission electron microscopy (CTEM) can be used for high resolution imaging of specimens and for the analysis of minute specimen areas. The capabilities of such an instrument are strongly improved by the integration of an imaging electron energy loss spectrometer. All imaging and diffraction techmques are provided in such an energy filtered transmission electron microscope (EFTEM).In addition to the well-known objective lens for Koehler illumination, the new Zeiss EFTEM features a projective lens system which integrates a new imaging ω-spectrometer comprising four individual magnets and one hexapole corrector Fig.l and Fig. 3 show the design of this microscope.

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (July 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing industrial supported catalysts: 1) scanning electron microscope (SEM), 2) scanning transmission electron microscope (STEM), and 3) transmission electron microscope (TEM). Each type of microscope has its unique capabilities. However, the integration of all electron microscopic techniques has proved invaluable for extracting useful information about the structure and the performance of industrial catalysts.Commercial catalysts usually have a high surface area with complex geometric structures to enable reacting gases or fluids to access as much of the active surface of the catalyst as possible.

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Burrows, Nathan D., and R. Lee Penn. "Cryogenic Transmission Electron Microscopy: Aqueous Suspensions of Nanoscale Objects." Microscopy and Microanalysis 19, no. 6 (September 4, 2013): 1542–53. http://dx.doi.org/10.1017/s1431927613013354.

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AbstractDirect imaging of nanoscale objects suspended in liquid media can be accomplished using cryogenic transmission electron microscopy (cryo-TEM). Cryo-TEM has been used with particular success in microbiology and other biological fields. Samples are prepared by plunging a thin film of sample into an appropriate cryogen, which essentially produces a snapshot of the suspended objects in their liquid medium. With successful sample preparation, cryo-TEM images can facilitate elucidation of aggregation and self-assembly, as well as provide detailed information about cells and viruses. This work provides an explanation of sample preparation, detailed examples of the many artifacts found in cryo-TEM of aqueous samples, and other key considerations for successful cryo-TEM imaging.

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Voyles, Paul M. "The Electron Microscopy Database: an Online Resource for Teaching and Learning Quantitative Transmission Electron Microscopy." Microscopy Today 17, no. 1 (January 2009): 26–27. http://dx.doi.org/10.1017/s1551929500054973.

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Every spring, I teach a one-semester, graduate-level course on materials transmission electron microscopy (TEM). Thanks to the explosion of interest in nanotechnology, what was once a course primarily for metallurgists on imaging crystallographic defects and x-ray microanalysis now attracts a much broader audience. I have had students in the course from almost all the engineering departments at UW Madison (materials, chemical, mechanical, electrical, civil), from the basic sciences (physics, chemistry, geology), and from other departments (including one from Food Science!). The enrollment in the concurrent laboratory class on TEM operation is similar.This diverse student body has two consequences. First, the students' background knowledge varies widely. Some have already taken a materials characterization course that included some TEM, but others barely know what a crystal structure is.

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Sarikaya, Mehmet, and James M. Howe. "Image resolution in conventional transmission electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 468–69. http://dx.doi.org/10.1017/s0424820100086647.

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The image resolution in bright-field (BF) and dark-field (DF) conventional transmission electron microscopy (TEM) is given by: r = 0.66 CS¼¾¾, where Cs and ¾ are the spherical aberration coefficient of the objective lens and electron wavelength, respectively. Based on this formula, it should be possible to resolve single atoms or clusters of atoms by phase contrast imaging with a highly coherent electron beam and a properly defocused objective lens; this has been demonstrated for both BF and DF imaging. However, for most situations encountered in conventional TEM, the type of information that can be obtained about the specimen is the most important, rather than the instrumental resolution. Atomicresolution microscopy of crystalline specimens relies on phase contrast produced when two or more beams interfere to form an image and this is discussed elsewhere in this symposium. This paper discusses the contrast and resolution when either a single beam or diffuse scattering is used to form an image.

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Pande, C. S. "Transmission Electron Microscopy of Superconducting A15 Compounds." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 192–95. http://dx.doi.org/10.1017/s0424820100117923.

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Unlike many other branches of materials science, there have been relatively few applications of electron microscopy in the study and development of superconducting materials, the principal application being in the study of microstructure in ductile-superconductors such as Nb-Ti and Nb-Zr. However, in recent years this trend has changed, and TEM is now being applied to technologically important high transition temperature compounds with the A15 structure, e.g., Nb3Sn, Nb3Ge, V3Ga, V3Si. Main areas of study are the role of grain boundary structure and segregation on critical currents, nature of the radiation damage, and the possibility of directly imaging the flux line lattice. Analytical scanning transmission electron microscopy (STEM) is now increasingly being used to investigate the first two areas mentioned above. However, a direct imaging of flux line lattice remains the biggest challenge in this field. In this paper the author's studies of superconducting compounds using TEM are briefly reviewed.

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Priya, Anjali, Abhishek Singh, and Nikhil Anand Srivastava. "ELECTRON MICROSCOPY – AN OVERVIEW." International Journal of Students' Research in Technology & Management 5, no. 4 (November 30, 2017): 81–87. http://dx.doi.org/10.18510/ijsrtm.2017.5411.

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The electron microscope (EM) is one of the most widely used instruments in research laboratories and is central based to micro-structural analysis and therefore important to any investigation related to the processing. The SEM/TEM provides information relating to topographical features, morphology, phase distribution, compositional differences, crystal structure, crystal orientation, and the presence and location of various defects. The strength of the SEM lies in its inherent versatility due to the multiple signals generated, simple image formation process, wide magnification range, and excellent depth of field. Later The SEM has more than 300 times the depth of field of the light microscope. The higher magnifications of the SEM are rivaled only by the transmission electron microscope (TEM) which requires the electrons to penetrate through the entire thickness of the sample. TEM images allow researchers to view the samples on a molecular level, making it possible to analyze structures and texture clearer and resolute which is useful in the study of crystals and metals and also has industrial applications. As a result, sample preparation of bulk materials through TEM is tedious and time-consuming compared to the ease of SEM sample preparation and may also damage the microstructure.

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Gerrity, Ross G., and George W. Forbes. "Microwave Processing in Diagnostic Electron Microscopy." Microscopy Today 11, no. 6 (December 2003): 38–41. http://dx.doi.org/10.1017/s155192950005344x.

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Transmission electron microscopy (TEM) continues to play an important role in diagnostic surgical pathology, particularly in such areas as kidney pathology and tumor diagnosis, among others. Diagnostic TEM is subject to unique time constraints, quality control regulations, and other problems not seen in other TEM applications. The diagnostic TEM laboratory must produce high-quality electron microscopy on small samples which frequently are suboptirnal in fixation and tissue quality due to the pathology involved and time factors associated with biopsy and surgery.

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Hansen, Thomas W., and Jakob B. Wagner. "Environmental Transmission Electron Microscopy in an Aberration-Corrected Environment." Microscopy and Microanalysis 18, no. 4 (June 12, 2012): 684–90. http://dx.doi.org/10.1017/s1431927612000293.

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AbstractThe increasing use of environmental transmission electron microscopy (ETEM) in materials science provides exciting new possibilities for investigating chemical reactions and understanding both the interaction of fast electrons with gas molecules and the effect of the presence of gas on high-resolution imaging. A gaseous atmosphere in the pole-piece gap of the objective lens of the microscope alters both the incoming electron wave prior to interaction with the sample and the outgoing wave below the sample. Whereas conventional TEM samples are usually thin (below 100 nm), the gas in the environmental cell fills the entire gap between the pole pieces and is thus not spatially localized. By using an FEI Titan environmental transmission electron microscope equipped with a monochromator and an aberration corrector on the objective lens, we have investigated the effects on imaging and spectroscopy caused by the presence of the gas.

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Bostanjoglo, Oleg, and Jochen Kornitzky. "Nanoseconds Double-Frame and Streak Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 180–81. http://dx.doi.org/10.1017/s0424820100179658.

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Material processing and synthesis is increasingly done by lasers. In order to apply this modern tool effectively, the laser-induced physical processes must be well known. As transmission electron microscopy is a powerful method to study the structure of the treated material, it seemed worthwhile to extend this technique for fast phase transitions, as are triggered by laser radiation. High-speed TEM may be realized either by pulsing the detector /l/ or the illuminating electron beam. The latter technique is more convenient and is described here.Fig. 1 shows a high-speed TEM designed for taking either double frame images (exposure/ repetition times ≿ 10 ns/≿ 50 ns) or streak images of transitions induced by a laser in the thin film specimen. It consists of a modified commercial TEM, an attached Q-switched (FWHM 50 ns), frequency-doubled (532 nm) Nd:YAG laser for treating the specimen, and electronics for electron beam pulsing and image storage. The TEM is equipped with focusing/deflecting optics for the laser radiation, an electron beam pulser generating either the exposure times for double frame pictures or the streak, and an image shifter. The image detector is a proximity focusing double stage MicroChannel Plate (MCP)/scintillator assembly. A CCD camera transfers the image to a PC-backed digitizing and frame grabbing card. The components are synchronized by a specially designed logic unit /2/.

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Bocker, Christian, Michael Kracker, and Christian Rüssel. "Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques." Microscopy and Microanalysis 20, no. 6 (October 14, 2014): 1654–61. http://dx.doi.org/10.1017/s1431927614013336.

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AbstractIn the field of electron microscopy the replica technique is known as an indirect method and also as an extraction method that is usually applied on metallurgical samples. This contribution describes a fast and simple transmission electron microscopic (TEM) sample preparation by complete removal of nanoparticles from a substrate surface that allows the study of growth mechanisms of nanostructured coatings. The comparison and combination of advanced diffraction techniques in the TEM and scanning electron microscopy (SEM) provide possibilities for operators with access to both facilities. The analysis of TEM-derived diffraction patterns (convergent beam electron diffraction) in the SEM/electron backscatter diffraction software simplifies the application, especially when the patterns are not aligned along a distinct zone axis. The study of the TEM sample directly by SEM and transmission Kikuchi diffraction allows cross-correlation with the TEM results.

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Aggarwal, Sanjeev, Peter J. Goodhew, and R. T. Murray. "Scanning transmission electron microscopy (STEM)–transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel." Thin Solid Films 446, no. 1 (January 2004): 12–17. http://dx.doi.org/10.1016/s0040-6090(03)01233-1.

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Xin, Ren Long, Yang Leng, and Ning Wang. "TEM Examinations of OCP/HA Transformation." Key Engineering Materials 309-311 (May 2006): 191–94. http://dx.doi.org/10.4028/www.scientific.net/kem.309-311.191.

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We have directly observed the transformation from octacalcium phosphate (OCP) to hydroxyapatite (HA) in transmission electron microscope (TEM). The phase transformation was induced by electron beam irradiation in TEM. Several TEM techniques were employed to examine the crystal structure change, including bright field images, electron diffraction, high resolution microscopy (HRTEM) and fast Fourier transformation pattern of HRTEM images. The examinations indicate possible hydrolysis reaction in solid state transformation and crystallographic orientation of OCP (010)//HA (010) and OCP (001)//HA (001) which has not been reported previously.

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Journal articles on the topic 'Transmission electron microscopy (TEM)'

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