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Journal articles on the topic 'Transmission Kikuchi Diffraction'

Author: Grafiati

Published: 4 June 2021

Last updated: 20 February 2023

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1

Nolze, Gert, Tomasz Tokarski, Łukasz Rychłowski, Grzegorz Cios, and Aimo Winkelmann. "Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns." Journal of Applied Crystallography 54, no. 3 (May 28, 2021): 1012–22. http://dx.doi.org/10.1107/s1600576721004210.

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A new software is presented for the determination of crystal lattice parameters from the positions and widths of Kikuchi bands in a diffraction pattern. Starting with a single wide-angle Kikuchi pattern of arbitrary resolution and unknown phase, the traces of all visibly diffracting lattice planes are manually derived from four initial Kikuchi band traces via an intuitive graphical user interface. A single Kikuchi bandwidth is then used as reference to scale all reciprocal lattice point distances. Kikuchi band detection, via a filtered Funk transformation, and simultaneous display of the band intensity profile helps users to select band positions and widths. Bandwidths are calculated using the first derivative of the band profiles as excess-deficiency effects have minimal influence. From the reciprocal lattice, the metrics of possible Bravais lattice types are derived for all crystal systems. The measured lattice parameters achieve a precision of <1%, even for good quality Kikuchi diffraction patterns of 400 × 300 pixels. This band-edge detection approach has been validated on several hundred experimental diffraction patterns from phases of different symmetries and random orientations. It produces a systematic lattice parameter offset of up to ±4%, which appears to scale with the mean atomic number or the backscatter coefficient.

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2

Brodu, Etienne, and Emmanuel Bouzy. "A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission." Microscopy and Microanalysis 24, no. 6 (December 2018): 634–46. http://dx.doi.org/10.1017/s1431927618015441.

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AbstractThe finding of this study is that the interaction volume in electron microscopy in transmission is well ordered laterally, with a remarkable and unexpected consequence being that lateral subsections of the interaction volume produce subsections of the Kikuchi diffraction pattern. It makes the microstructure of samples directly visible in Kikuchi patterns. This is first illustrated with polycrystalline Ti–10Al–25Nb with an on-axis transmission Kikuchi diffraction set-up in a scanning electron microscope. It is then shown via a Monte Carlo simulation and a large-angle convergent-beam electron diffraction experiment that this phenomenon finds its origin in the nature of the differential elastic and quasi-elastic cross sections. This phenomenon is then quantified by a careful image analysis of Kikuchi patterns recorded across a vertical interface in a silicon sample specifically designed and fabricated. A Monte Carlo simulation reproducing all the geometric parameters is conducted. Experiments and simulations match very well qualitatively, but with a slight quantitativity gap. The specificity of the thermal diffuse scattering cross-section, not available in the simulation, is thought to be responsible for this gap. Beside Kikuchi diffraction, the case of diffraction spots and diffuse background present in the pattern is also discussed.

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3

Vespucci, S., A. Winkelmann, K. Mingard, D. Maneuski, V. O'Shea, and C. Trager-Cowan. "Exploring transmission Kikuchi diffraction using a Timepix detector." Journal of Instrumentation 12, no. 02 (February 27, 2017): C02075. http://dx.doi.org/10.1088/1748-0221/12/02/c02075.

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4

Fanta, Alice Bastos, Matteo Todeschini, Andrew Burrows, Henri Jansen, Christian D. Damsgaard, Hossein Alimadadi, and Jakob B. Wagner. "Elevated temperature transmission Kikuchi diffraction in the SEM." Materials Characterization 139 (May 2018): 452–62. http://dx.doi.org/10.1016/j.matchar.2018.03.026.

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5

Pascal, Elena, Saransh Singh, Ben Hourahine, Carol Trager-Cowan, and Marc De Graef. "Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns." Microscopy and Microanalysis 23, S1 (July 2017): 540–41. http://dx.doi.org/10.1017/s1431927617003385.

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6

Brodu, Etienne, Emmanuel Bouzy, Jean Jacques Fundenberger, Benoit Beausir, Lydia Laffont, and Jacques Lacaze. "Crystallography of Growth Blocks in Spheroidal Graphite." Materials Science Forum 925 (June 2018): 54–61. http://dx.doi.org/10.4028/www.scientific.net/msf.925.54.

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A better understanding of spheroidal graphite growth is expected in a near future thanks to widespread use of transmission electron microscopy. However, common transmission electron microscopy is quite time consuming and new indexing techniques are being developed, among them is transmission Kikuchi diffraction in a scanning electron microscope, a recent technique derived from electron backscatter diffraction. In the present work, on-axis transmission Kikuchi diffraction in scanning electron microscope, completed by transmission electron microscopy, was used with the objective of producing new observations on the microstructure of spheroidal graphite. This study shows that disorientations between blocks and sectors in spheroidal graphite are quite large in the early growth stage, which may be indicative of a competition process selecting the best orientations for achieving radial growth along thecdirection of graphite.

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7

Geiss, Roy H., Katherine P. Rice, and Robert R. Keller. "Transmission EBSD in the Scanning Electron Microscope." Microscopy Today 21, no. 3 (May 2013): 16–20. http://dx.doi.org/10.1017/s1551929513000503.

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We demonstrate in this article an exciting new method for obtaining electron Kikuchi diffraction patterns in transmission from thin specimens in a scanning electron microscope (SEM) fitted with a conventional electron backscattered diffraction (EBSD) detector. We have labeled the method transmission EBSD (t-EBSD) because it uses off-the-shelf commercial EBSD equipment to capture the diffraction patterns and also to differentiate it from transmission Kikuchi diffraction available in the transmission electron microscope (TEM). Lateral spatial resolution of less than 10 nm has been demonstrated for particles and better than 5 nm for orientation mapping of thin films. The only new requirement is a specimen holder that allows the transmitted electrons diffracted from an electron transparent sample to intersect the EBSD detector. We briefly outline our development of the technique, followed by descriptions of sample preparation techniques and operating conditions. We then present examples of t-EBSD patterns from a variety of specimens, including particles of diameter <10 nm, wires of diameter <80 nm, and films with thicknesses from ~5 nm to 300 nm. Finally, we discuss the phenomenon in the context of Monte Carlo electron scattering simulations.

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8

Weiland, H., and D. P. Field. "Automatic analysis of Kikuchi diffraction patterns." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 900–901. http://dx.doi.org/10.1017/s0424820100172231.

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Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

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9

Fundenberger, J. J., E. Bouzy, D. Goran, J. Guyon, A. Morawiec, and H. Yuan. "Transmission Kikuchi Diffraction (TKD)via a horizontally positioned detector." Microscopy and Microanalysis 21, S3 (August 2015): 1101–2. http://dx.doi.org/10.1017/s1431927615006297.

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10

Fancher, Chris M., Matthew J. Burch, Srikanth Patala, and Elizabeth C. Dickey. "Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction." Journal of Microscopy 285, no. 2 (January 4, 2022): 85–94. http://dx.doi.org/10.1111/jmi.13077.

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11

Nolze, Gert, Tomasz Tokarski, Grzegorz Cios, and Aimo Winkelmann. "Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns." Journal of Applied Crystallography 53, no. 2 (March 25, 2020): 435–43. http://dx.doi.org/10.1107/s1600576720000692.

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A historical tool for crystallographic analysis is provided by the Hilton net, which can be used for manually surveying the crystal lattice as it is manifested by the Kikuchi bands in a gnomonic projection. For a quantitative analysis using the Hilton net, the projection centre as the relative position of the signal source with respect to the detector plane needs to be known. Interplanar angles are accessible with a precision and accuracy which is estimated to be ≤0.3°. Angles between any directions, e.g. zone axes, are directly readable. Finally, for the rare case of an unknown projection-centre position, its determination is demonstrated by adapting an old approach developed for photogrammetric applications. It requires the indexing of four zone axes [uvw] i in a backscattered Kikuchi diffraction pattern of a known phase collected under comparable geometric conditions.

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12

Kim, Yootaek, and Tung Hsu. "The Panoramic Rheed Patterns." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 324–25. http://dx.doi.org/10.1017/s0424820100180379.

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When applying the reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) methods[1] on the study of crystal surfaces it is necessary to index the RHEED spots and recognize the azimuth of the electron beam direction. This can be difficult because the RHEED pattern, unlike the transmission electron diffraction (TED) pattern, is distorted by the inner potential of the specimen and only one half of the pattern is shown. We found that it is useful, at the beginning of working on a certain surface of a certain crystal, to record a panoramic RHEED pattern by rotating the crystal through a large azimuth angle. This produces a map which is similar to the Kikuchi maps[2] used in transmission electron microscopy (TEM).Two examples of these panoramic RHEED patterns, one from the Pt(111) [3] and the other from α-Al203 (0001) [4,5,6), are shown in Figs. 1 and 2.The transmission Kikuchi maps are recorded using a specimen of suitable thickness such that the Kikuchi lines are strong and the diffraction spots are practically invisible. On the contrary, in making the panoramic RHEED patterns (or RHEED maps) we have no control over the thickness of the specimen. The electron beam enters and exits the same surface of the crystal; therefore, the relative intensities of the Bragg diffracted spots and the Kikuchi lines are not adjustable. The only adjustment lies in choosing the accelerating voltage and the incidence angle of the electrons such that the RHEED pattern has relatively low diffuse scattering.

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13

Sneddon, Glenn, Xuyang Zhou, Gregory Thompson, and Julie Cairney. "A Comparative Investigation Between Transmission Kikuchi Diffraction (TKD) and Precession Electron Diffraction (PED)." Microscopy and Microanalysis 26, S2 (July 30, 2020): 270–71. http://dx.doi.org/10.1017/s1431927620014026.

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14

Chen, Yueyun, Jared Lodico, B. C. Regan, and Matthew Mecklenburg. "Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns." Microscopy and Microanalysis 27, S1 (July 30, 2021): 2020–21. http://dx.doi.org/10.1017/s1431927621007340.

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15

Liu, Junliang, Sergio Lozano-Perez, Angus J. Wilkinson, and Chris R. M. Grovenor. "On the depth resolution of transmission Kikuchi diffraction (TKD) analysis." Ultramicroscopy 205 (October 2019): 5–12. http://dx.doi.org/10.1016/j.ultramic.2019.06.003.

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16

Breen, Andrew J., Katharina Babinsky, Alec C. Day, K. Eder, Connor J. Oakman, Patrick W. Trimby, Sophie Primig, Julie M. Cairney, and Simon P. Ringer. "Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data." Microscopy and Microanalysis 23, no. 2 (March 14, 2017): 279–90. http://dx.doi.org/10.1017/s1431927616012605.

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AbstractCorrelative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline Al–0.5Ag alloy specimen collected on a straight flight-path atom probe and the other a high purity Mo specimen collected on a reflectron-fitted instrument, will be compared. We find that the average minimum misorientation angle, calculated from calibrated atom probe reconstructions with two different pole combinations, deviate 0.7° and 1.4°, respectively, from the TKD results. The type of atom probe and experimental conditions appear to have some impact on this accuracy and the reconstruction and measurement procedures are likely to contribute further to degradation in angular resolution. The challenges and implications of this correlative approach will also be discussed.

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17

Erdman, Natasha, Masateru Shibata, Tara Nylese, and Travis Rampton. "Nanoscale Crystallographic Analysis in FE-SEM Using Transmission Kikuchi Diffraction." Microscopy and Microanalysis 20, S3 (August 2014): 864–65. http://dx.doi.org/10.1017/s1431927614006047.

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18

Sneddon, Glenn C., Patrick W. Trimby, and Julie M. Cairney. "Transmission Kikuchi diffraction in a scanning electron microscope: A review." Materials Science and Engineering: R: Reports 110 (December 2016): 1–12. http://dx.doi.org/10.1016/j.mser.2016.10.001.

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19

Schwarzer, R. A. "Measurement of Local Textures With Transmission and Scanning Electron Microscopes." Textures and Microstructures 13, no. 1 (January 1, 1990): 15–30. http://dx.doi.org/10.1155/tsm.13.15.

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Transmission and scanning electron microscopy methods are discussed for the determination of grain orientations. For the study of local textures with a TEM electron-transparent thin samples are required. The standard techniques of orientation determination grain by grain are the interpretation of selected area electron spot and microbeam Kikuchi diffraction patterns. Specimen areas smaller than 500 nm or 50 nm in diameter can be selected. More recently selected area pole-figures can be measured directly with a TEM technique similar to the conventional transmission X-ray method.The orientation of grains in a bulk sample can be obtained with a scanning electron microscope from reflection Kikuchi (i.e. electron backscattering) and channeling patterns. Local resolution is approximately 1 μm or 5 μm, respectively.Since the interpretation of electron diffraction patterns is tedious, techniques have been developed to perform measurements on-line by interfacing the electron microscope to a computer. An outstanding advantage of texture measurements by electron diffraction is the high local resolution and the ability of imaging the microstructure of the sampled region. Experimental results of individual grain-orientation measurements may be represented statistically by inverse pole-figures, orientation distribution functions and misorientation distribution functions.

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20

Parish, Chad M., Kun Wang, Philip D. Edmondson, Kurt A. Terrani, Xunxiang Hu, Rachel L. Seibert, and Yutai Katoh. "Combining Transmission Kikuchi Diffraction and Scanning Transmission Electron Microscopy for Irradiated Materials Studies." Microscopy and Microanalysis 23, S1 (July 2017): 2218–19. http://dx.doi.org/10.1017/s1431927617011758.

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21

Shen, Yitian, Jingchao Xu, Yongsheng Zhang, Yongzhe Wang, Jimei Zhang, Baojun Yu, Yi Zeng, and Hong Miao. "Spatial Resolutions of On-Axis and Off-Axis Transmission Kikuchi Diffraction Methods." Applied Sciences 9, no. 21 (October 23, 2019): 4478. http://dx.doi.org/10.3390/app9214478.

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Spatial resolution is one of the key factors in orientation microscopy, as it determines the accuracy of grain size investigation and phase identification. We determined the spatial resolutions of on-axis and off-axis transmission Kikuchi diffraction (TKD) methods by calculating correlation coefficients using only the effective parts of on-axis and off-axis transmission Kikuchi patterns. During the calculation, we used average filtering to evaluate the spatial resolution more accurately. The spatial resolutions of both on-axis and off-axis TKD methods were determined in the same scanning electron microscope at different accelerating voltages and specimen thicknesses. The spatial resolution of the on-axis TKD was higher than that of the off-axis TKD at the same parameters. Furthermore, with an increase in accelerating voltage or a decrease in specimen thickness, the spatial resolutions of the two configurations could be significantly improved, from tens of nanometers to below 10 nm. At a voltage of 30 kV and sample thickness of 74 nm, both on-axis and off-axis TKD methods exhibited the highest resolutions of 6.2 and 9.7 nm, respectively.

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22

Brodu, E., and E. Bouzy. "Complementarity of On-Axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM." Microscopy and Microanalysis 24, S1 (August 2018): 612–13. http://dx.doi.org/10.1017/s1431927618003550.

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23

Yao, Nan, and John M. Cowley. "Inelastic Electron Scattering and Total Reflectivity in RHEED." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 392–93. http://dx.doi.org/10.1017/s0424820100135563.

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The detailed studies of the electron energy distribution of the specular reflected beam and the total reflectivity for a platinum single crystal (111) surface under a variety of diffraction conditions were carried out on a JEM-2000FX transmission electron microscope equipped with a Gatan 666 paralleldetection electron energy loss spectrometer.Five different diffraction conditions are characterized as D1-D5. With D1, the specular reflected spot falls in an intersection of a parallel Kikuchi line with a parabola; with D2, the specular reflected spot coincides with an intersection of the Kikuchi lines running parallel to and inclined to the crystal surface; with D3, that is pure specular Bragg reflection (the specular reflected spot crosses only the parallel Kikuchi line); with D4, the specular reflected spot intersects only with a parabola; and with D5, the specular reflected spot falls only on the oblique K-lines. A series of specular reflected beam energy loss spectra collected from the first four different diffraction conditions is shown in figure 1, where the spectra 1-4 correspond to conditions D1-D4, respectively.

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24

Chen, Yueyun, Jared J. Lodico, Xin Yi Ling, B. C. Regan, and Matthew Mecklenburg. "Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction." Microscopy and Microanalysis 28, S1 (July 22, 2022): 576–77. http://dx.doi.org/10.1017/s1431927622002884.

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25

Fanta, Alice. "Challenges and perspectives of Transmission Kikuchi Diffraction for nanocrystalline materials characterization." Microscopy and Microanalysis 27, S1 (July 30, 2021): 2018–19. http://dx.doi.org/10.1017/s1431927621007339.

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26

Tokarski, Tomasz, Gert Nolze, Aimo Winkelmann, Łukasz Rychłowski, Piotr Bała, and Grzegorz Cios. "Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio." Ultramicroscopy 230 (November 2021): 113372. http://dx.doi.org/10.1016/j.ultramic.2021.113372.

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27

Mungole, T., J. Zhang, B. Mansoor, G. Ayoub, and D. P. Field. "Transmission Kikuchi diffraction from nano-crystalline Ti and TiN thin-films." IOP Conference Series: Materials Science and Engineering 375 (June 2018): 012009. http://dx.doi.org/10.1088/1757-899x/375/1/012009.

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28

Tokarski, Tomasz, Grzegorz Cios, Anna Kula, and Piotr Bała. "High quality transmission Kikuchi diffraction analysis of deformed alloys - Case study." Materials Characterization 121 (November 2016): 231–36. http://dx.doi.org/10.1016/j.matchar.2016.10.013.

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29

Bauer, F., S. Sitzman, C. Lang, C. Hartfield, and J. Goulden. "Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction." Microscopy and Microanalysis 20, S3 (August 2014): 326–27. http://dx.doi.org/10.1017/s1431927614003353.

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30

Wong, D. C. K., W. K. Yeoh, P. W. Trimby, K. S. B. De Silva, P. Bao, W. X. Li, X. Xu, S. X. Dou, S. P. Ringer, and R. K. Zheng. "Characterisation of nano-grains in MgB2 superconductors by transmission Kikuchi diffraction." Scripta Materialia 101 (May 2015): 36–39. http://dx.doi.org/10.1016/j.scriptamat.2015.01.012.

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31

Rice, Katherine P., Yimeng Chen, Ty J. Prosa, and David J. Larson. "Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography." Microscopy and Microanalysis 22, no. 3 (June 2016): 583–88. http://dx.doi.org/10.1017/s1431927616011296.

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AbstractThere are advantages to performing transmission electron backscattering diffraction (tEBSD) in conjunction with focused ion beam-based specimen preparation for atom probe tomography (APT). Although tEBSD allows users to identify the position and character of grain boundaries, which can then be combined with APT to provide full chemical and orientation characterization of grain boundaries, tEBSD can also provide imaging information that improves the APT specimen preparation process by insuring proper placement of the targeted grain boundary within an APT specimen. In this report we discuss sample tilt angles, ion beam milling energies, and other considerations to optimize Kikuchi diffraction pattern quality for the APT specimen geometry. Coordinated specimen preparation and analysis of a grain boundary in a Ni-based Inconel 600 alloy is used to illustrate the approach revealing a 50° misorientation and trace element segregation to the grain boundary.

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32

Galceran, M., A. Albou, K. Renard, M. Coulombier, P. J. Jacques, and S. Godet. "Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films." Microscopy and Microanalysis 19, no. 3 (May 3, 2013): 693–97. http://dx.doi.org/10.1017/s1431927613000445.

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AbstractA new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures.

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33

Zieliński, W., T. Płociński, and K. J. Kurzydłowski. "Transmission Kikuchi diffraction and transmission electron forescatter imaging of electropolished and FIB manufactured TEM specimens." Materials Characterization 104 (June 2015): 42–48. http://dx.doi.org/10.1016/j.matchar.2015.04.003.

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34

Ling, Xin Yi, Jared Lodico, B. C. Regan, and Matthew Mecklenburg. "Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction." Microscopy and Microanalysis 27, S1 (July 30, 2021): 1608–9. http://dx.doi.org/10.1017/s1431927621005912.

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35

Naghdy, S., L. L. Percq, R. Serret, R. Petrov, S. Hertelé, L. Kestens, and P. Verleysen. "Microstructural evolution study of severely deformed commercial aluminium by transmission Kikuchi diffraction." Materials Science and Technology 33, no. 6 (June 7, 2016): 678–87. http://dx.doi.org/10.1080/02670836.2016.1194019.

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36

Cios, G., T. Tokarski, and P. Bała. "Strain-induced martensite reversion in 18Cr–8Ni steel – transmission Kikuchi diffraction study." Materials Science and Technology 34, no. 5 (September 14, 2017): 580–83. http://dx.doi.org/10.1080/02670836.2017.1376456.

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37

Niessen, F., A. Burrows, and A. Bastos da Silva Fanta. "A systematic comparison of on-axis and off-axis transmission Kikuchi diffraction." Ultramicroscopy 186 (March 2018): 158–70. http://dx.doi.org/10.1016/j.ultramic.2017.12.017.

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38

Gazder, A. A., A. A. Saleh, A. G. Kostryzhev, and E. V. Pereloma. "Application of Transmission Kikuchi Diffraction to a Multi-phase TRIP-TWIP Steel." Materials Today: Proceedings 2 (2015): S647—S650. http://dx.doi.org/10.1016/j.matpr.2015.07.367.

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39

Burch, Matthew J., David T. Harris, Chris M. Fancher, Jon-Paul Maria, and Elizabeth C. Dickey. "Domain Structure of Bulk and Thin-Film Ferroelectrics By Transmission Kikuchi Diffraction." Microscopy and Microanalysis 21, S3 (August 2015): 777–78. http://dx.doi.org/10.1017/s1431927615004687.

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40

Brodu, Etienne, and Emmanuel Bouzy. "Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)." Microscopy and Microanalysis 23, no. 6 (December 2017): 1096–106. http://dx.doi.org/10.1017/s1431927617012697.

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AbstractTransmission Kikuchi diffraction is an emerging technique aimed at producing orientation maps of the structure of materials with a nanometric lateral resolution. This study investigates experimentally the depth resolution of the on-axis configuration, via a twinned silicon bi-crystal sample specifically designed and fabricated. The measured depth resolution varies from 30 to 65 nm in the range 10–30 keV, with a close to linear dependence with incident energy and no dependence with the total sample thickness. The depth resolution is explained in terms of two mechanisms acting concomitantly: generation of Kikuchi diffraction all along the thickness of the sample, associated with continuous absorption on the way out. A model based on the electron mean free path is used to account for the dependence with incident energy of the depth resolution. In addition, based on the results in silicon, the use of the mean absorption coefficient is proposed to predict the depth resolution for any atomic number and incident energy.

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41

Bocker, Christian, Michael Kracker, and Christian Rüssel. "Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques." Microscopy and Microanalysis 20, no. 6 (October 14, 2014): 1654–61. http://dx.doi.org/10.1017/s1431927614013336.

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AbstractIn the field of electron microscopy the replica technique is known as an indirect method and also as an extraction method that is usually applied on metallurgical samples. This contribution describes a fast and simple transmission electron microscopic (TEM) sample preparation by complete removal of nanoparticles from a substrate surface that allows the study of growth mechanisms of nanostructured coatings. The comparison and combination of advanced diffraction techniques in the TEM and scanning electron microscopy (SEM) provide possibilities for operators with access to both facilities. The analysis of TEM-derived diffraction patterns (convergent beam electron diffraction) in the SEM/electron backscatter diffraction software simplifies the application, especially when the patterns are not aligned along a distinct zone axis. The study of the TEM sample directly by SEM and transmission Kikuchi diffraction allows cross-correlation with the TEM results.

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42

Wilkinson, Angus J., Yevhen Zayachuk, David M. Collins, and Rajesh Korla. "Applications of Multivariate Statistical Methods to Analysis of Electron Backscatter Diffraction and Transmission Kikuchi Diffraction Datasets." Microscopy and Microanalysis 23, S1 (July 2017): 544–45. http://dx.doi.org/10.1017/s1431927617003403.

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43

Sitzman, Scott. "Tutorial: Ultra-high Spatial Resolution EBSD: Transmission Kikuchi Diffraction (TKD) in the SEM." Microscopy and Microanalysis 24, S1 (August 2018): 2324–25. http://dx.doi.org/10.1017/s1431927618012102.

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Saleh, Ahmed A., Gilberto Casillas, Elena V. Pereloma, Kristin R. Carpenter, Christopher R. Killmore, and Azdiar A. Gazder. "A transmission Kikuchi diffraction study of cementite in a quenched and tempered steel." Materials Characterization 114 (April 2016): 146–50. http://dx.doi.org/10.1016/j.matchar.2016.02.016.

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Abbasi, Majid, Ihho Park, Raghavan Ayer, Yunjo Ro, and Hwan-Uk Guim. "Three-Dimensional Analysis of Cracks by Focused Ion Beam and Transmission Kikuchi Diffraction." Microscopy and Microanalysis 23, S1 (July 2017): 536–37. http://dx.doi.org/10.1017/s1431927617003361.

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White, Rachel, and Mark Weaver. "Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr." Microscopy and Microanalysis 24, S1 (August 2018): 614–15. http://dx.doi.org/10.1017/s1431927618003562.

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Daly, Luke, Phil A. Bland, Kathryn A. Dyl, Lucy V. Forman, David W. Saxey, Steven M. Reddy, Denis Fougerouse, et al. "Crystallography of refractory metal nuggets in carbonaceous chondrites: A transmission Kikuchi diffraction approach." Geochimica et Cosmochimica Acta 216 (November 2017): 42–60. http://dx.doi.org/10.1016/j.gca.2017.03.037.

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Brodu, E., E. Bouzy, and J. J. Fundenberger. "Diffraction contrast dependence on sample thickness and incident energy in on-axis Transmission Kikuchi Diffraction in SEM." Ultramicroscopy 181 (October 2017): 123–33. http://dx.doi.org/10.1016/j.ultramic.2017.04.017.

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Zhang, Xinxin, Xiaorong Zhou, Guangyi Cai, Yang Yu, Xueqin Lu, Yanbin Jiao, and Zehua Dong. "The Influence of Stored Energy on Grain Boundary Chemistry and Intergranular Corrosion Development in AA2024-T3 Alloy." Materials 11, no. 11 (November 16, 2018): 2299. http://dx.doi.org/10.3390/ma11112299.

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Abstract:

Following our previous research, the correlation between the micro-chemistry of grain boundary and the distribution of stored energy in AA2024-T3 alloy is investigated, using the combination of transmission Kikuchi diffraction and transmission electron microscopy. It is found that the difference of dislocation density, namely stored energy, between two neighboring grains significantly affects the micro-chemistry of the grain boundary. Further, it is revealed that intergranular corrosion development in the AA2024-T3 alloy is mainly attributed to the combined effect of grain boundary chemistry and stored energy distribution.

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Proust, Gwénaëlle, Delphine Retraint, Mahdi Chemkhi, Arjen Roos, and Clemence Demangel. "Electron Backscatter Diffraction and Transmission Kikuchi Diffraction Analysis of an Austenitic Stainless Steel Subjected to Surface Mechanical Attrition Treatment and Plasma Nitriding." Microscopy and Microanalysis 21, no. 4 (July 3, 2015): 919–26. http://dx.doi.org/10.1017/s1431927615000793.

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AbstractAustenitic 316L stainless steel can be used for orthopedic implants due to its biocompatibility and high corrosion resistance. Its range of applications in this field could be broadened by improving its wear and friction properties. Surface properties can be modified through surface hardening treatments. The effects of such treatments on the microstructure of the alloy were investigated here. Surface Mechanical Attrition Treatment (SMAT) is a surface treatment that enhances mechanical properties of the material surface by creating a thin nanocrystalline layer. After SMAT, some specimens underwent a plasma nitriding process to further enhance their surface properties. Using electron backscatter diffraction, transmission Kikuchi diffraction, energy dispersive spectroscopy, and transmission electron microscopy, the microstructural evolution of the stainless steel after these different surface treatments was characterized. Microstructural features investigated include thickness of the nanocrystalline layer, size of the grains within the nanocrystalline layer, and depth of diffusion of nitrogen atoms within the material.

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