Dissertations / Theses on the topic 'Vacancy defects'
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Mui, Wing-ki, and 梅詠琪. "Studies of Ga vacancy related defects in GaSb." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2002. http://hub.hku.hk/bib/B31226541.
Full textMa, Shun-kit Martin. "The two gallium vacancy-related defects in undoped gallium antimonide." Click to view the E-thesis via HKUTO, 2004. http://sunzi.lib.hku.hk/hkuto/record/B31319658.
Full textMa, Shun-kit Martin, and 馬信傑. "The two gallium vacancy-related defects in undoped gallium antimonide." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2004. http://hub.hku.hk/bib/B31319658.
Full textAl-Abdulmalik, Dana A. "Evolution of vacancy-type defects in semiconductors : a positron annihilation study." Thesis, University of Bath, 2007. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.442881.
Full textCORONEL, SANCHEZ Edwin Danelli. "Optically detected magnetic resonance in nanodiamonds with single nitrogen-vacancy defects." Universidade Federal de Pernambuco, 2016. https://repositorio.ufpe.br/handle/123456789/24441.
Full textMade available in DSpace on 2018-04-23T23:42:59Z (GMT). No. of bitstreams: 1 DISSERTAÇÃO Edwin Danelle Coronel Sanches.pdf: 7893948 bytes, checksum: 06bf9f839c5aed283d85a7cffdc4f1a9 (MD5) Previous issue date: 2016-04-28
FACEPE
The control of the radiation-matter interaction, in our case of photons with quan- tum single emitters, as the nitrogen-vacancy (NV) defect in nanodiamonds, is crucial in the process of nano-devices fabrication. This is achieved taking advantage of the latest advances of the nano-optics to increase the interaction with single emitters for which ade-quate tools for precise interaction control has been developed. In this dissertation, we use a home-made inverted optical confocal microscope and coherent manipulation of spin states to study single NV defect in nanodiamonds. The NV defect in nanodiamonds presents optical properties that depend on the spin state of its optically active electrons, which makes them interesting for applications in nanomagnetometry, quantum informa- tion processing and nanobiothermometry. In particular, the negatively charged NV defect (NV-) exhibits single photon emission and long coherence times even at room tempera- ture. Furthermore, it has a paramagnetic ground state and can be optically polarized and read out, in an experimental technique known as Optically Detected Magnetic Resonance (ODMR). In this technique, the intensity of the fluorescence emitted by a nanodiamond depends on the spin configuration of the electronic ground state, from which an electronic transition is excited. In order to study these defects, nanodiamonds were deposited on a photolitographically structured antenna on a coverslip by spin coating and placed on the microscope. The microscope allows to both, the detection of the fluorescence and its exci- tation, by a CW laser emitting at 532 nm. The fluorescence emitted by the nanodiamond is centered around 650 nm with a zero phonon line at 637 nm. The collected fluores¬cence is sent to two avalanche photodiodes (APDs), that are in a configuration known as Hanbury-Brown and Twiss (HBT) interferometer. In it, we can verify whether the col- lected emission comes from an individual emitter, analyzing the second order correlation function g(2)(r): if g(2)(r) < 0.5 we have an emission from single photons generated by a single NV- defect in diamond. Working whit single emitter we could radiate a microwave field over the nanodiamond, which allows us to determine the resonance frequency for spin transitions in the ground state. At resonance one observes a drop in the fluorescence emitted by the nanodiamond. We explore the fact that the resonance frequency of the spin transition depends on the local magnetic field to measure the Zeeman effect gener- ated by the magnetic field of a permanent magnet (NdFeB). Finally, we realized coherent manipulation via an appropriate sequence of pulses of microwave and laser, observing Rabi oscillations. Thus, we can measure the inhomogeneous coherence time (T2*) given by the damping of Rabi oscillations.
O controle da interação radiação-matéria, em nosso caso de fotons com emissores quânticos individuais, como os defeitos de nitrogenio-vacancia (NV) em nanodiamantes, e crucial no processo da fabricacao de nano-dispositivos. Isto e conseguido aproveitando-se os ultimos avanços em nano-óptica para aumentar a interacao com emissores unicos, para os quais ferramentas adequadas para o controle preciso da interacao foi desenvolvido. Nesta dissertacao, descreveremos o uso de um microscopio confocal invertido e mani- pulacao coerente dos estados de spin de um defeito individual NV num nanodiamante. Os defeitos NV em nanodiamantes apresentam propriedades opticas que dependem do estado de spin dos seus eletrons opticamente ativos, o que os tornam interessantes para aplicacoes em nanomagnetometria, processamento de informaçao quantica e nanobioter- mometria. Em particular, defeitos NV negativamente carregados (NV-) exibem emissao de fótons unicos e longos tempos de coerência, mesmo a temperatura ambiente. Alem disso, tem um estado fundamental paramagnetico e o sistema pode ser opticamente pola¬rizado e lido, usando-se uma técnica experimental conhecida como Ressonância Magnetica Detectada Opticamente (ODMR). Nesta técnica, a intensidade de fluorescencia emitida pelo nanodiamante depende da configuracao de spin do estado eletrónico fundamental, a partir do qual a transicao eletrónica e excitada. Para estudar esses defeitos NV, nan- odiamantes foram depositados ao longo de uma antena, fotolitograficamente estruturada sobre um coverslip, usando spin coating e colocados sobre o microscopio. O microscopio permite a detecçao da fluorescencia do defeito e sua excitacao e feita por um laser CW emitindo em 532 nm. A fluorescencia emitida pelo nanodiamante ocorre em torno dos 650 nm com uma linha zero fonon em 637 nm. A fluo-rescencia coletada e enviada a dois foto-diodos de avalanche, que estao em configuraçao interferometrica do tipo Hanbury-Brown and Twiss (HBT). Nela, podemos garantir se a emissao coletada provem de um emissor individual, analisando a funcão de correlacão de segunda ordem (T): se g(2)(r) < 0, 5 comprovamos a emissão de fotons ónicos por um unico defeito NV- no nanodiamante. Trabalhamos entãao com um unico defeito NV- como emissor. Irradiando um campo de microondas sobre o nanodiamante, nos permite determinar a frequência de ressonância com a transicao de spin no estado fundamental, evidenciado por uma diminuto da flu- orescencia emitida pelo nanodiamante. Usamos o fato de que a frequencia de ressonancia da transiçao do spin depende do campo magnetico local para observar o efeito Zeeman gerado pelo campo magnetico de um ima (Nd-Fe-B). Finalmente, realizamos manipulacao coerente atraves de uma adequada sequencia de pulsos de microondas e laser, observando oscilações de Rabi. Assim, pudemos medir o tempo de coerência inhomogeneo (T2*) dado pelo amortecimento das oscilacões de Rabi.
Chen, Haiyan. "Probing Defects and Electronic Processes on Gadolinia-doped Ceria Surfaces Using Electron Stimulated Desorption." Diss., Georgia Institute of Technology, 2006. http://hdl.handle.net/1853/10427.
Full textPersson, Gulda Maria Christina Margareta. "Defects in Hard-Sphere Colloidal Crystals." Thesis, Harvard University, 2012. http://dissertations.umi.com/gsas.harvard:10695.
Full textEngineering and Applied Sciences
Fuchs, Franziska [Verfasser], and Vladimir [Gutachter] Dyakonov. "Optical spectroscopy on silicon vacancy defects in silicon carbide / Franziska Fuchs. Gutachter: Vladimir Dyakonov." Würzburg : Universität Würzburg, 2016. http://d-nb.info/1112040560/34.
Full textLopez, Nicolas A. "All-optical method of nanoscale magnetometry for ensembles of nitrogen-vacancy defects in diamond." Thesis, Massachusetts Institute of Technology, 2015. http://hdl.handle.net/1721.1/103712.
Full textCataloged from PDF version of thesis.
Includes bibliographical references (pages 61-65).
The Nitrogen-Vacancy (NV) defect in diamond has shown considerable promise in the field of small scale magnetometry due to its high localization and retention of favorable optical properties at ambient conditions. Current methods of magnetometry with the NV center achieve high sensitivity to fields aligned with the defect axis; however, with most present methods transverse fields are not directly measurable. The all-optical method of NV magnetometry provides a means to detect transverse fields by monitoring changes in the overall fluorescence profile. In this work the all-optical method is extended to ensembles of non-interacting NV centers. By establishing an external bias field aligned with the (1, 1, 1) axis, the magnitude of an unknown transverse field can be unambiguously identified through the measurement of the signal curvature. The angular orientation can be determined up to a two-fold degeneracy by observing the change in signal curvature produced when the bias field is shifted off-axis. The magnetometry method explored in this thesis thus provides good sensitivity to transverse fields, while reducing to a minimum the experimental apparatus required to operate the magnetometer.
by Nicolas A. Lopez.
S.B.
Caulfield, John Christopher. "Transition-metal dichalcogenides and the scanning tunnelling microscope : the creation and imaging of vacancy defects." Thesis, University College London (University of London), 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.286294.
Full textChatzidrosos, Georgios [Verfasser]. "A perfect imperfection: Quantum magnetometry and applications using nitrogen-vacancy defects in diamond / Georgios Chatzidrosos." Mainz : Universitätsbibliothek der Johannes Gutenberg-Universität Mainz, 2021. http://d-nb.info/1241739544/34.
Full textPurser, Carola Midori. "Magnetic Resonance Detection using Nitrogen-Vacancy Centers in Diamond." The Ohio State University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1560279273608591.
Full textNagy, Roland [Verfasser], and Jens [Akademischer Betreuer] Anders. "Silicon vacancy defects in 4H-silicon carbide semiconductor for quantum applications / Roland Nagy ; Betreuer: Jens Anders." Stuttgart : Universitätsbibliothek der Universität Stuttgart, 2019. http://d-nb.info/1201646154/34.
Full textNgetich, Geoffrey. "The defect level of carbon vacancy carbon antisite pair in 4H-SiC photo induced electron paramagnetic resonance." Birmingham, Ala. : University of Alabama at Birmingham, 2008. https://www.mhsl.uab.edu/dt/2008m/ngetich.pdf.
Full textMaurer, Peter. "Coherent control of diamond defects for quantum information science and quantum sensing." Thesis, Harvard University, 2014. http://dissertations.umi.com/gsas.harvard:11431.
Full textPhysics
Maiti, Debtanu. "Defect Laden Metal Oxides and Oxynitrides for Sustainable Low Temperature Carbon Dioxide Conversion to Fuel Feedstocks." Scholar Commons, 2018. https://scholarcommons.usf.edu/etd/7694.
Full textKasper, Christian Andreas [Verfasser], Vladimir [Gutachter] Dyakonov, Björn [Gutachter] Trauzettel, and Volker [Gutachter] Behr. "Engineering of Highly Coherent Silicon Vacancy Defects in Silicon Carbide / Christian Andreas Kasper ; Gutachter: Vladimir Dyakonov, Björn Trauzettel, Volker Behr." Würzburg : Universität Würzburg, 2021. http://d-nb.info/1233968130/34.
Full textWiktor, Julia. "Identification of equilibrium and irradiation-induced defects in nuclear ceramics : electronic structure calculations of defect properties and positron annihilation characteristics." Thesis, Aix-Marseille, 2015. http://www.theses.fr/2015AIXM4050.
Full textDuring in-pile irradiation the fission of actinide nuclei causes the creation of large amounts of defects, which affect the physical and chemical properties of materials inside the reactor, in particular the fuel and structural materials. Positron annihilation spectroscopy (PAS) can be used to characterize irradiation induced defects, empty or containing fission products. This non-destructive experimental technique involves detecting the radiation generated during electron-positron annihilation in a sample and deducing the properties of the material studied. As positrons get trapped in open volume defects in solids, by measuring their lifetime and momentum distributions of the annihilation radiation, one can obtain information on the open and the chemical environments of the defects. In this work electronic structure calculations of positron annihilation characteristics were performed using two-component density functional theory (TCDFT). To calculate the momentum distributions of the annihilation radiation, we implemented the necessary methods in the open-source ABINIT program. The theoretical results have been used to contribute to the identification of the vacancy defects in two nuclear ceramics, silicon carbide (SiC) and uranium dioxide (UO2)
Chen, Junbo. "Effect of Defects and Photoexcited Electrons on CO2 Reduction using Supported Single Atom Catalysts." Digital WPI, 2018. https://digitalcommons.wpi.edu/etd-theses/1266.
Full textHe, Chenwei. "Experimental study of the interaction of vacancy defects with Y, O and Ti solutes to better understand their roles in the nanoparticles formation in ODS steels." Thesis, Orléans, 2014. http://www.theses.fr/2014ORLE2057/document.
Full textThe severe operating conditions of the future nuclear reactor, Generation-IV, -high temperature and high irradiation damage-, require the adapted materials development. Oxide-dispersion strengthened (ODS) alloy is one of the most potential candidates expected to be used for fuel cladding material because of their outstanding swelling and creep properties. Their excellent properties are induced by the fine dispersion of oxide nanoparticles (Y, O, Ti), obtained by mechanical alloying of steel and oxide powders and which has to be better mastered. But the atomic scale clustering mechanism of these nanoparticles is not yet cleared. In this context, the present thesis using positron annihilation spectroscopy (PAS) and secondary ion mass spectrometry (SIMS) sheds light on the interaction of vacancy defects with Y, O and Ti solutes to better understand their roles in the nanoparticles formation. The He irradiations have been performed to reveal the vacancy defects properties and Y, Ti, O implantations realized to study the Y, Ti, O-vacancy interactions in bcc Fe matrix. In all cases, the defects depth distribution shows a lower size of vacancy defects in the region where the concentration of the incident ions Y, Ti and O is the highest. This effect of the ions on the damage formation is more pronounced for respectively O, Y and Ti. It is explained by the formation of V-X (X=O, Y, Ti) complexes which reduce the mobility and agglomeration probability of the vacancy defects. The annealing of the Y and O implanted samples reveals that some O-vacancy complexes are mobile at room temperature and Y doesn’t diffuse up to 550°C whilst Y-vacancy complexes remain as it is expected from theory. A model of the first steps of the ODS nanoparticles nucleation is proposed by using the results obtained in this thesis
Agarwal, Sahil. "Defect Studies In Metals, Alloys, and Oxides By Positron Annihilation Spectroscopy and Related Techniques." Bowling Green State University / OhioLINK, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=bgsu1626713209028374.
Full textFugate, Elizabeth Anne. "Understanding the Role of Lattice Defects and Metal Composition Ratio on the Photochemistry of CuFeO2 toward Solar Energy Conversion." The Ohio State University, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=osu157788103637799.
Full textAlves, Horacio Wagner Leite. "Níveis profundos associados a vacância e nitrogênio em diamante." Universidade de São Paulo, 1985. http://www.teses.usp.br/teses/disponiveis/43/43133/tde-01042014-092413/.
Full textIn this work we studied the electronic structure of point defects in diamond. To do this we used the molecular cluster model within two formalisms: the first-principles X Scattered wave method MS-X ) and the semiempirical Complete Neglect of Differential Overlap (CNOO/BW) method. In each case, an adequate surface orbitals treatment was utilized. We studied the following systems: the substitutional Nitrogen and the simple neutral vacancy. For the substitutional Nitrogen. We analyzed the possible distortion related to this center trying to interprete the experimental results. For the simple neutral vacancy in diamond. The results showed to be similar to the simple Silicon vacancy picture: In both cases we observed a Jahn-Teller distortion (lowering the symmetry of the center). The adopted model showed to be able to describe satisfactorily their electronic structures, and quantitative results are given, which are compared with the experimental data.
Razumovskiy, Vsevolod. "Thermodynamic and kinetic properties of Fe-Cr and TiC-ZrC alloys from Density Functional Theory." Doctoral thesis, KTH, Materialteknologi, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-96285.
Full textQC 20120604
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Pentecoste, Lucile. "Etude de la formation de défauts lacunaires dans un cristal de tungstène par accumulation d’hélium." Thesis, Orléans, 2015. http://www.theses.fr/2015ORLE2040/document.
Full textTungsten will be exposed to severe plasma conditions such as high temperature and high particle bombardment as a target of the divertor in the nuclear fusion reactor ITER. High fluxes of light ions will impact its surface and can generate defects in the crystal. This study means to observe the first steps of the vacancy-type defects formation in the tungsten crystal subject to low ion flux of low kinetic energy in order to understand the influence of the accumulation of helium, one of the nuclear reaction products. For the experiments, an ICP-RF plasma source was developed and characterized to perform helium implantations under perfectly controlled conditions. Helium implantations were performed under various conditions of fluence, energy and substrate temperature on polycrystalline tungsten samples. Positron annihilation spectroscopy was used to characterize vacancy-type defects, nuclear reaction analysis to quantify implanted helium and thermal desorption spectrometry to characterize the interactions of helium in the crystal. Results show that, for a kinetic energy of 320 eV and at room temperature, a saturation of the helium implanted quantity is reached for a limit incident fluence and that large vacancy defects starts to form. Study of the kinetic energy and the surface temperature influences show the importance of the depth distribution and the mobility of the helium in the crystal on the size and the diversity of the generated defects. Implantations are performed by molecular dynamic simulations. Results obtained by the numerical approach are compared to experimental ones in order to get a better understanding of the atomic scale mechanisms
Sidibe, Moussa. "Etude du comportement du tungstène sous irradiation : applications aux réacteurs de fusion." Phd thesis, Université d'Orléans, 2014. http://tel.archives-ouvertes.fr/tel-01068634.
Full textBelhabib, Tayeb. "Comportement thermique des défauts lacunaires induits par l’hélium et les gaz de fission dans le dioxyde d’uranium." Thesis, Orléans, 2012. http://www.theses.fr/2012ORLE2071/document.
Full textIn the new fourth generation nuclear plants, as in the old ones, uranium dioxide must operate in hostile environments of temperature and irradiation with the presence of fission products (FP) and alpha particles (α). Operation in these extreme conditions will induce atoms displacements and degrade the thermal and mechanical properties of UO2 fuel. Understanding the behavior of induced vacancy defects, FP and helium is crucial to predict the uranium dioxide behavior in the future nuclear reactors. The first part of this thesis is dedicated to the study of vacancy defects induced by krypton and iodine implantation (a few MeV) in the UO2 polycrystalline and of their evolution under annealing. Analysis by positron annihilation spectroscopy (PAS) has highlighted the creation of Schottky defects VU-2VO in the case of iodine implantations and formation of vacancy clusters containing the gas for krypton implantation. The temperature evolution of these defects depends on the implantation parameters (nature of the ion energy, fluence). This study showed the important roles that can play vacancy defects and the presence of fission gases in the evolution of UO2 material. Then we were interested in the study of the helium behavior in UO2 its location and migration, agglomeration and interaction with vacancy defects by using PAS and ion beam analysis (NRA/C and RBS/C). The NRA/C and RBS/C characterizations showed a localization of a large helium fraction in the octahedral interstitial sites of the UO2 matrix. The helium location in these sites remains stable for T <600°C, changing slightly between 600 and 700°C and becomes random at 800°C. Positron annihilation spectroscopy reveals three stages of vacancy defects evolution : The recombination with oxygen interstitial migration, defects agglomeration between 600 and 800°C and their dissociation and elimination when the temperature increases. These results suggest that the He transport is assisted by the vacancy defects
Lee, Donghun. "Atomic Scale Gate Electrode Formed by a Charged Defect: Scanning Tunneling Microscopy of Single Impurities in GaAs Semiconductors." The Ohio State University, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=osu1274913629.
Full textGérardin, Marie. "Etude du comportement thermique des gaz de fission dans l'UO₂ en présence de défauts d'irradiation." Thesis, Orléans, 2018. http://www.theses.fr/2018ORLE2051/document.
Full textDuring in-reactor irradiation, fission gases such as xenon or krypton are produced. In the fuel, those gases diffuse and precipitate to form bubbles. In addition, fission reactions induce small defects(vacancies and interstitials) and larger defects (cavities and dislocations) formation. Data acquire menton fission gases migration considering radiation-induced defects is thus necessary to better understand and improve models of in-pile fuel behavior. The experimental approach developed in this work aims to study thermal diffusion of rare gases and to understand their interaction with radiation-induced defects.To do this, separated effect studies were performed coupling ion implantations/irradiations to fine characterization techniques. Positron Annihilation Spectroscopy (PAS) coupled to Transmission Electron Microscopy (TEM) observations allows for defects characterizations (vacancies and/or cavities induced by ion implantation) and for their thermal behavior study. On the other hand, gas release measurements are performed by thermal desorption spectrometry. Simulation of gas kinetic release allows to determine diffusion coefficients and to lighten trapping mechanisms. The synthesis of those various experimental results brings us to identify gas migration mechanism and to describe their interaction with radiation-induced defects
Markevich, Alexander. "Ab-initio calculations of diffusion barriers of small vacancy clusters in silicon." Master's thesis, Universidade de Aveiro, 2009. http://hdl.handle.net/10773/2288.
Full textEsta tese apresenta os resultados de um programa de investigação sobre a difusão da lacuna, bi-lacuna e tri-lacuna em silício utilizando simulações numéricas pelo método da teoria do funcional da densidade. Este método está implementado na forma de um programa informático referido como AIMPRO (Ab Initio Modelling PROgram). Para o cálculo dos pontos cela dos mecanismos de difusão foi usado o método “Nudged Elastic Band”. As condições fronteira dos problemas foram impostas recorrendo à utilização de agregados esféricos de silício com 275 atomos, cuja superfície foi saturada por ligações Si-H. As lacunas foram então introduzidas no centro destes agregados. Os valores calculados das barreiras de difusão para a lacuna simples e para a bi-lacuna são respectivamente 0.68 e 1.75 eV. Estes valores apresentam um acordo razoável com os obtidos experimentalmente e obtidos em outros cálculos anteriores. A barreira de difusão da tri-lacuna foi, de acordo com a literatura disponível, calculada pela primeira vêz. O mecanismo de difusão mais favorável apresenta uma barreira de 2.2 eV. No seguimento dos resultados para a lacuna e bi-lacuna, pensamos que este resultado sobrestima a barreira em cerca de 0.25 eV, colocando a nossa melhor estimativa em 1.9- 2.0 eV. Varias fontes de erro nos resultados são comentadas, assim como são sugeridas várias formas de as evitar. ABSTRACT: This work presents the results of a computational investigation into the diffusion of the single vacancy (V) and small vacancy clusters, divacancy (V2) and trivacancy (V3), in silicon. The calculations were performed principally using local density functional theory as implemented by the AIMPRO (Ab Initio Modelling PROgram) code. The Nudged Elastic Band Method was used for elucidating diffusion paths and obtaining the energy barriers for diffusion of the defects considered. Based on ab-initio calculations with H-terminated Si clusters with 275 host atoms, diffusion paths for neutral Vn (n = 1 to 3) defects were found. Calculated values of the activation energy for the diffusion of the Si vacancy and divacancy are 0.68 and 1.75 eV, respectively. These values are in a reasonable agreement with those derived from experimental and previous ab-initio modelling studies. The diffusion of trivacancy in Si has been modelled for the first time. The diffusion barrier of V3 along the proposed diffusion path was found to be about 2.2 eV. This result comes overestimated as the experimental data indicates that the values of diffusion barriers for divacancy and trivacancy in Si should be similar. Probable sources of the calculation errors have been considered and possible ways to surmount these difficulties are proposed.
Asplet, William. "Etude des interactions entre les défauts lacunaires et les solutés Y,O, Ti pour mieux comprendre leur rôle dans la formation des nanoparticules d'oxydes dans les aciers ODS." Thesis, Orléans, 2018. http://www.theses.fr/2018ORLE2056/document.
Full textThis PhD thesis is dedicated to the study of interaction between vacancies and Y, Ti,O solutes for a better understanding of formation of oxide nanoparticles in ODS steel (Oxide Dispersion Strengthened). These ODS steels are considered as structural material for the next generation of fission and fusion nuclear reactors. Their good properties are induced by the fine dispersion of low size oxide nanoparticles. However, obtaining this distribution is not mastered and atomic scale clustering is not yet defined. Furthermore, it was shown by theoretical models that the presence of vacancy during mechanical alloying could affect the formation of these nanoparticles. This study follows upon on a previous study made by C.He, and bring new results, new interpretation and conclusions. Some implantations with Y, Ti, O ions with several energy have been made in order to simulate the mechanical alloying step used for ODS steel fabrication. Theses irradiations have induced defects and solutes into the iron matrix. Then we characterized samples using positron annihilation spectroscopy (PAS) and secondary ion mass spectrometry (SIMS). The nature of defects was studied according to nature of the implanted ion and the annealing temperature by PAS and correlated to depth profiles of solutes obtained by SIMS. Annihilation characteristics of some defects still unknown were able to be determined thanks to positron lifetime measurements. SIMS analysis showed that titanium doesn’t migrate for annealing experiments between 100°C and 450°C and that oxygen show a complex behavior of migration and trapping dependent on the microstructure of the material. PAS results show that ionic implantations produce vacancy clusters, dislocations and solutes-vacancies complex. Their proportion changes as a function of depth and nature of these irradiations. Vacancy clusters and dislocations are detected deeper than the implantation peak with a higher fraction for the dislocations indicating that the defects were able to migrate during implantations. The fraction of vacancy-solutes complexes is the highest in the ion stopping zone and is in a good agreement with the theoretical binding energy of vacancies-solutes complex. The nature and the distribution of the defects evolve according to the annealing temperature. Vacancy clusters disappear between RT and 300°C while the dislocations are eliminated from 400°C. Oxide phases are detected for annealing at 500 and 550°C in relation with the oxygen contamination during these annealings. Some defects which the nature is not yet identified were highlighted for annealing between 300 and 400°C for Y, O and Y+O irradiations
Stokes, Stephen J. "Atomistic modelling studies of fluorite- and perovskite-based oxide materials." Thesis, University of Bath, 2010. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.527142.
Full textBelloir, Jean-Marc. "Spectroscopie du courant d’obscurité induit par les effets de déplacement atomique des radiations spatiales et nucléaires dans les capteurs d’images CMOS à photodiode pincée." Thesis, Toulouse, ISAE, 2016. http://www.theses.fr/2016ESAE0029/document.
Full textCMOS image sensors are envisioned for an increasing number of high-end scientific imaging applications such asspace imaging or nuclear experiments. Indeed, the performance of high-end CMOS image sensors has dramaticallyincreased in the past years thanks to the unceasing improvements of microelectronics, and these image sensors havesubstantial advantages over CCDs which make them great candidates to replace CCDs in future space missions.However, in space and nuclear environments, CMOS image sensors must face harsh radiation which can rapidlydegrade their electro-optical performances. In particular, the protons, electrons and ions travelling in space or thefusion neutrons from nuclear experiments can displace silicon atoms in the pixels and break the crystalline structure.These displacement damage effects lead to the formation of stable defects and to the introduction of states in theforbidden bandgap of silicon, which can allow the thermal generation of electron-hole pairs. Consequently, nonionizingradiation leads to a permanent increase of the dark current of the pixels and thus a decrease of the imagesensor sensibility and dynamic range. The aim of the present work is to extend the understanding of the effect ofdisplacement damage on the dark current increase of CMOS image sensors. In particular, this work focuses on theshape of the dark current distribution depending on the particle type, energy and fluence but also on the imagesensor physical parameters. Thanks to the many conditions tested, an empirical model for the prediction of the darkcurrent distribution induced by displacement damage in nuclear or space environments is experimentally validatedand physically justified. Another central part of this work consists in using the dark current spectroscopy techniquefor the first time on irradiated CMOS image sensors to detect and characterize radiation-induced silicon bulk defects.Many types of defects are detected and two of them are identified, proving the applicability of this technique to studythe nature of silicon bulk defects using image sensors. In summary, this work advances the understanding of thenature of the radiation-induced defects responsible for the dark current increase in space or nuclear environments. Italso leads the way to the design of more advanced dark current prediction models, or to the development ofmitigation strategies in order to prevent the formation of the responsible defects or to allow their removal
Dalponte, Mateus. "Redistribuição e ativação de dopantes em Si com excesso de vacâncias." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2008. http://hdl.handle.net/10183/15397.
Full textThe redistribution and electrical activation of n type (As and Sb) and p type (Ga and In) dopants in Si with excess vacancy concentration were analyzed. The vacancies were formed by high dose ion implantation of oxygen or nitrogen at high temperature, following previously studied procedures. Dopants were implanted to a dose of 5x1014 cm-2 at 20 keV in the vacancy rich regions of the samples. Identical doping implantations were performed in bulk Si and SIMOX. Samples were then submitted to thermal annealing at 1000ºC for 10 s or 15 min. The dopants atomic profiles were obtained by Medium Energy Ion Scattering and the active dopant profiles, by differential Hall measurements. The redistribution and the electrical properties of each dopant in bulk Si were similar to those observed in SIMOX, but several differences were observed in the vacancy-rich samples. Vacancies reduced the electrical activation of As and Sb, although the activation was maintained stable after long annealing times. The redistribution of these dopants was, otherwise, dominated by the ion used in the vacancy generation, i.e., nitrogen or oxygen. The presence of oxygen resulted in larger As retained dose, while the presence of nitrogen, in larger Sb retained dose. Regarding the p type dopants, Ga and In, the vacancies played an important role in their redistribution, reducing their out-diffusion and allowing larger retained doses. Ga and especially In electrical activation was low, where strong influence of the pre-implanted ions was observed, especially oxygen.
Li, Hongfei. "Density functional simulations of defect behavior in oxides for applications in MOSFET and resistive memory." Thesis, University of Cambridge, 2018. https://www.repository.cam.ac.uk/handle/1810/274924.
Full textLhuillier, Pierre-Emile. "Etude du comportement de l'hélium et des défauts lacunaires dans le tungstène." Phd thesis, Université d'Orléans, 2010. http://tel.archives-ouvertes.fr/tel-00587482.
Full textRohr, Sven. "Hybrid spin-nanomechanical systems in parametric interaction." Thesis, Grenoble, 2014. http://www.theses.fr/2014GRENY046/document.
Full textProbing the quantum world with macroscopic objects has been a core challenge for research in physics during the past decades. Proposed systems to reach this goal include hybrid devices that couple a nanomechanical resonator to a single spin qubit. In particular, the coherent actuation of a macroscopic mechanical oscillator by a single electronic spin would open perspectives in the creation of arbitrary quantum states of motion.In this manuscript, we investigate a hybrid system coupling a nanomechanical oscillator and a single electronic spin of a NV defect in magnetic interaction. We focus on the parametric interaction case, when the mechanical motion modulates the qubit energy, and in particular when the driven qubit and mechanical oscillators evolves on similar timescales. In that situation a synchronization of the qubit dynamics onto the mechanical motion is observed. The phenomenon is first explored on a test experiment where mechanical motion is replaced by a parametrically coupled RF field. It allows to establish the main properties of the phenomenon, which is subsequently investigated on the core experiment. It consists of a NV defect attached at the vibrating extremity of a silicon carbide nanowire, immersed in a strong magnetic field gradient. The bidimensional character of the nanowire deformations is responsible for novel vectorial signatures in the synchronization, which can also be viewed as a phononic Mollow triplet as observed in early quantum electrodynamics experiments. We finally explore the robustness of the synchronization against the Brownian motion of the resonator and demonstrate the possibility to protect the qubit against this additional decoherence source by applying a small coherent mechanical drive
Schröder, Tim. "Integrated photonic systems for single photon generation and quantum applications." Doctoral thesis, Humboldt-Universität zu Berlin, Mathematisch-Naturwissenschaftliche Fakultät I, 2013. http://dx.doi.org/10.18452/16723.
Full textThe presented thesis covers the development and investigation of novel integrated single photon (SP) sources and their application for quantum information schemes. SP generation was based on single defect centers in diamond nanocrystals. Such defect centers offer unique optical properties as they are room temperature stable, non-blinking, and do not photo-bleach over time. The fluorescent nanocrystals are mechanically stable, their size down to 20nm enabled the development of novel nano-manipulation pick-and-place techniques, e.g., with an atomic force microscope, for integration into photonic structures. Two different approaches were pursued to realize novel SP sources. First, fluorescent diamond nanocrystals were integrated into nano- and micrometer scaled fiber devices and resonators, making them ultra-stable and maintenance free. Secondly, a solid immersion microscope (SIM) was developed. Its solid immersion lens acts as a dielectric antenna for the emission of defect centers, enabling the highest photon rates of up to 2.4Mcts/s and collection efficiencies of up to 4.2% from nitrogen vacancy defect centers achieved to date. Implementation of the SIM at cryogenic temperatures enabled novel applications and fundamental investigations due to increased photon rates. The determination of the spectral diffusion time of a single nitrogen vacancy defect center (2.2µs) gave new insights about the mechanisms causing spectral diffusion. Spectral diffusion is a limiting property for quantum information applications. The table-top SIM was integrated into a compact mobile SP system with dimension of only 7x19x23cm^3 while still maintaining record-high stable SP rates. This makes it interesting for various SP applications. First, a quantum key distribution scheme based on the BB84 protocol was implemented, for the first time also with silicon vacancy defect centers. Secondly, a conceptually novel scheme for the generation of infrared SPs was introduced and realized.
Guttman, Jeremy. "Polymer-based Tunnel Diodes Fabricated using Ultra-thin, ALD Deposited, Interfacial Films." The Ohio State University, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=osu1469125487.
Full textBerroudji, Sid-Ahmed. "Cinétiques de mise en ordre à courte distance et caractéristiques des lacunes et des autointerstitiels dans des alliages [gamma]-FeNiCr." Grenoble 1, 1988. http://www.theses.fr/1988GRE10095.
Full textHuguenin, Denis. "Effets induits par irradiation électronique dans les alliages austénitiques Fe-Ni-Cr." Grenoble 1, 1989. http://www.theses.fr/1989GRE10034.
Full textTsai, You-Sheng, and 蔡尤勝. "Orientation of the vacancy line defects on Si(100)." Thesis, 1996. http://ndltd.ncl.edu.tw/handle/66729282645104305987.
Full text國立中山大學
物理研究所
84
Using the local-orbital density-functional molecular-dynamics method, we have obtained relaxed Si(100) surfaces with vacancy line defects that are perpendicular and parallel to the surface dimer rows and their corresponding total energies. Our results show that the perpendicular line defects with two-dimer wide are most favorable with respect to the parallel line defects in agreement with scanning tunneling microscopy (STM) observations. This preference can be attributed mainly to the formation of troughs around the defect in the perpendicular case and the limited space that prevents the exposed second- layer atoms to form long dimer rows in the parallel case.
Fuchs, Franziska. "Optical spectroscopy on silicon vacancy defects in silicon carbide." Doctoral thesis, 2015. https://nbn-resolving.org/urn:nbn:de:bvb:20-opus-124071.
Full textIn dieser Arbeit werden verschiedene Aspekte der Silizium-Fehlstelle in SiC beleuchtet: (1) Die Erzeugung der Defekte durch Bestrahlung, sowohl mit Elektronen als auch Neutronen. Einige optische Eigenschaften wurden ermittelt: die Anregung der Fehlstelle ist im Bereich von 720nm bis 800nm am effizientesten. Das Abklingen der PL zeigt eine charakteristische Lebensdauer des angeregten Zustands von (6.3±0.6)ns. (2) Maßschneidern der Defektdichte meint die kontrollierte Erzeugung von Defekten durch variablen Neutronenfluss. Hier konnte die Defektdichte gezielt über acht Größenordnungen verändert werden. Auf der einen Seite, in der Probe mit der höchsten Defektdichte, konnte das ohnehin schon große PL Signal noch um den Faktor fünf durch Temperprozesse erhöht werden. Auf der anderen Seite konnten in den Proben mit geringer Defektdichte einzelne Defekte mit stabiler nahinfrarot Emission bei Raumtemperatur zweifelsfrei nachgewiesen werden. Ihre Lebensdauer von etwa 7ns bestätigt den Wert aus den transienten Messungen. (3) Auch die elektrische Anregung der Defekte in einer SiC LED Struktur konnte gezeigt werden. (4) Die Untersuchung zeigte zum ersten Mal, dass Silizium-Fehlstellen in SiC Nanokristallen bis hinunter zu einer Größe von ca. 60 nm existieren können. Die Defekte zeigen stabile PL Emission im Nahinfraroten und sogar Magnetresonanz in der 600 nm Fraktion. Zusammenfassend werden in dieser Arbeit zum Einen grundlegende Eigenschaften der Silizium-Fehlstelle in Siliziumkarbid herausgefunden. Zum Anderen können Messungen zur Machbarkeit von verschiedenen Anwendungen sowohl das Potenzial der Fehlstelle in SiC für defektbasierte Anwendungen aufzeigen, als auch die Umsetzbarkeit von z.B. elektrisch betriebenen Einzelphotonenquellen oder Nanosensoren in naher Zukunft bestätigen
Tien, Li-Gan, and 田力耕. "Effect of vacancy defects and defects interaction on electrical properties of single-walled carbon nanotube." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/78507458848639643220.
Full textKasper, Christian Andreas. "Engineering of Highly Coherent Silicon Vacancy Defects in Silicon Carbide." Doctoral thesis, 2021. https://doi.org/10.25972/OPUS-23779.
Full textIn dieser Arbeit wird die Erzeugung von Silizium Fehlstellen in Siliziumkarbid mit vorhersagbaren Eigenschaften nachgewiesen. Neutronen- und Elektronenbestrahlung wurden zur Erzeugung von Ensembles von Silizium Fehlstellen verwendet, während isolierte Fehlstellen an einer gewünschten Position mit Hilfe eines Protonenstrahls erzeugt wurden. Die Kohärenz der erzeugten Silizium Fehlstellen wurde in Abhängigkeit der Emitterdichte untersucht und eine Gesetzmäßigkeit hierfür eingeführt. Um die Kohärenz der Silizium Fehlstellen zu erhöhen, wurden Annealing Experimente durchgeführt. Des Weiteren wurde spektrales Holeburning verwendet, um absolute DC-Magnetometrie nachzuweisen
Huang, Cheng-Yen, and 黃丞言. "Studies of Oxygen Vacancy Defects and Magnetism in Co-Doped Cerium Oxide Nanoparticles." Thesis, 2012. http://ndltd.ncl.edu.tw/handle/45604922345335992055.
Full textWebb, Geoffrey. "Ab-initio investigation of the antimony-vacancy complex and related defects in germanium." Diss., 2016. http://hdl.handle.net/2263/52849.
Full textDissertation (MSc)--University of Pretoria, 2016.
National Research Foundation (NRF)
Physics
MSc
Unrestricted
Griffith, John W. "Indium donor/metal vacancy defect complexes in Cadmium Telluride studied with Perturbed Angular Correlation Spectroscopy." Thesis, 2002. http://hdl.handle.net/1957/32627.
Full textGraduation date: 2002
McCrate, Joseph Michael. "Characterization of low density oxide surface sites using fluorescent probes." 2013. http://hdl.handle.net/2152/23078.
Full texttext
Chu, Yow-Lin, and 朱宥霖. "Effects of nitrogen-vacancy-related defects on optical and electrical properties of heavily Mg-doped GaN films." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/15466132004323546009.
Full text國立彰化師範大學
光電科技研究所
94
We have employed the photoluminescence (PL), surface photovoltage spectroscopy (SPS), x-ray photoelectron spectroscopy (XPS), and secondary-ion-mass spectroscopy (SIMS) measurements to study the effects of nitrogen-related defects on optical and electrical properties of heavily Mg-doped p-type GaN (p-GaN) in this study. From the PL and SPS measurements, p-GaN of (NH4)2Sx treatment suggests that the (MgGa–VN)2+ (MgGa:Ga vacancies occupied by Mg; VN:nitrogen vacancies) complexes near the p-GaN surface region were transformed into the (MgGa-SN)0 (SN:N vacancies occupied by S) complexes after (NH4)2Sx treatment, which resulted in the reduction of the ~2.8eV PL intensity and the increase of the hole concentration near the p-GaN surface region. According to the observed results from XPS and SIMS measurements, we found that the formation of more nitrogen-vacancy- related defects created near the surface by reactive ion etching technique would lead to an increase in the surface band bending, a shift of the surface Fermi level toward the conduction-band edge, the reduction of the current flow at the metal/etched p-GaN interface, and an increase in the barrier height at the metal/etched p-GaN interface. In addition, from the SIMS measurements, it is suggested that the depth of the nitrogen- deficient near-surface region resulting from the dry-etch process is about 60 nm.