Books on the topic 'VLSI Testing'
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Nicolaidis, Michael, Yervan Zorian, and Dhiraj K. Pradan, eds. On-Line Testing for VLSI. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4757-6069-9.
Full textGulati, Ravi K., and Charles F. Hawkins, eds. IDDQ Testing of VLSI Circuits. Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3146-3.
Full text1949-, Reghbati Hassan K., ed. Tutorial--VLSI testing & validation techniques. IEEE Computer Society Press, 1985.
Find full textK, Gulati Ravi, and Hawkins Charles F, eds. IDDQ testing of VLSI circuits. Kluwer Academic Publishers, 1993.
Find full textReghbati, Hassan K. VLSI: Testing and validation techniques. IEEE Computer Society Press, 1985.
Find full textBhattacharya, Debashis. Hierarchical Modeling for VLSI Circuit Testing. Springer US, 1990.
Find full textKrstić, Angela, and Kwang-Ting Cheng. Delay Fault Testing for VLSI Circuits. Springer US, 1998. http://dx.doi.org/10.1007/978-1-4615-5597-1.
Full textSayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-69673-7.
Full textBhattacharya, Debashis, and John P. Hayes. Hierarchical Modeling for VLSI Circuit Testing. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-1527-8.
Full textBonnenberg, Heinz. Secure testing of VLSI cryptographic equipment. Hartung-Gorre, 1993.
Find full textBhattacharya, Debashis. Hierarchical modeling for VLSI circuit testing. Kluwer Academic Publishers, 1990.
Find full text1934-, Zobrist George W., ed. VLSI fault modeling and testing techniques. Ablex Pub. Corp., 1993.
Find full textPetlin, Oleg Alexandrovich. Random testing of asynchronous VLSI circuits. University of Manchester, 1994.
Find full textKrstić, Angela. Delay fault testing for VLSI circuits. Kluwer Academic Publishers, 1998.
Find full textLombardi, Fabrizio, and Mariagiovanna Sami, eds. Testing and Diagnosis of VLSI and ULSI. Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-009-1417-9.
Full textLombardi, Fabrizio. Testing and Diagnosis of VLSI and ULSI. Springer Netherlands, 1988.
Find full text1955-, Lombardi Fabrizio, Sami Mariagiovanna, and North Atlantic Treaty Organization. Scientific Affairs Division., eds. Testing and diagnosis of VLSI and ULSI. Kluwer Academic Publishers, 1988.
Find full textHurst, S. L. VLSI testing: Digital and mixed analogue/digital techniques. Institution of Electrical Engineers, 1998.
Find full textBlaschke, Volker. Modularer Testprozessor für VLSI-Schaltungen. TÜV Rheinland, 1987.
Find full textIEEE VLSI Test Symposium (1990 Atlantic City, N.J.). VLSI system test: Cost versus quality. IEEE Philadelphia Section, 1990.
Find full textChattopadhyay, Santanu. Thermal-Aware Testing of Digital VLSI Circuits and Systems. CRC Press, 2018. http://dx.doi.org/10.1201/9781351227780.
Full textSachdev, Manoj, and José Pineda de Gyvez, eds. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Springer US, 2007. http://dx.doi.org/10.1007/0-387-46547-2.
Full textCorliss, Walter F. An engineering methodology for implementing and testing VLSI circuits. Naval Postgraduate School, 1989.
Find full textBushnell, Michael L., and Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Springer US, 2002. http://dx.doi.org/10.1007/b117406.
Full text1943-, Agrawal Vishwani D., ed. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Kluwer Academic, 2000.
Find full textLee, Mike Tien-Chien. High-level test synthesis of digital VLSI circuits. Artech House, 1997.
Find full text1952-, Staunstrup J., IFIP WG 10 5, and Danmarks tekniske højskole. Instituttet for datateknik., eds. Formal methods for VLSI design: IFIP WG 10.5 lecture notes. North-Holland, 1990.
Find full textWiesław, Marciniak, and Przewłocki Henryk M, eds. Diagnostic measurements in LSI/VLSI integrated circuits production. World Scientific, 1991.
Find full textIFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design (1989 Houthalen, Belgium). Formal VLSI specification and synthesis: Proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design. North-Holland, 1990.
Find full textIEEE VLSI Test Symposium (16th 1998 Monterey, California). 16th IEEE VLSI Test Symposium: Proceedings : April 26-30, 1998, Monterey, California. IEEE Computer Society Press, 1998.
Find full textIEEE VLSI Test Symposium (14th 1996 Princeton, N.J.). 14th IEEE VLSI Test Symposium: April 28-May 1, 1996, Princeton, New Jersey. IEEE Computer Society Press, 1996.
Find full textIEEE VLSI Test Symposium (17th 1999 Dana Point, Calif.). 17th IEEE VLSI Test Symposium: Proceedings : April 25-29, 1999, Dana Point, California. IEEE Computer Society, 1999.
Find full textSalsbury, Duane. In-situ testing of radiation effects on VLSI capacitors using the NPS linear accelerator. Naval Postgraduate School, 1996.
Find full textIEEE VLSI Test Symposium (12th 1994 Cherry Hill, N. J.). 12th IEEE VLSI Test Symposium: April 25-28, 1994, Cherry Hill, New Jersey : proceedings. IEEE Computer Society Press, 1994.
Find full textIEEE VLSI Test Symposium (18th 2000 Montréal, Québec). 18th IEEE VLSI Test Symposium: Proceedings : 30 April-4 May 2000, Montréal, Québec, Canada. IEEE, 2000.
Find full textIEEE VLSI Test Symposium (13th 1995 Princeton, N.J.). 13th IEEE VLSI Test Symposium: April 30-May 3, 1995, Princeton, New Jersey : proceedings. IEEE Computer Society Press, 1995.
Find full textIEEE, VLSI Test Symposium (20th 2002 Monterey Calif ). Proceedings: 20th IEEE VLSI Test Symposium : (VTS 2002) : 28 April - 2 May 2002, Monterey, California. IEEE Computer Society, 2002.
Find full textIEEE VLSI Test Symposium (19th 2001 Marina Del Rey, Calif.). 19th IEEE VLSI Test Symposium: Proceedings : April 29-May 3, 2001, Marina Del Rey, California, USA. IEEE, 2001.
Find full textIEEE VLSI Test Symposium (27th 2009 Santa Cruz, Calif.). 2009 27th IEEE VLSI Test Symposium: Proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009. IEEE Computer Society, 2009.
Find full textIEEE, VLSI Test Symposium (11th 1993 Atlantic City N. J. ). Digest of papers: Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey. IEEE Computer Society Press, 1993.
Find full textFanucci, Luca. An experimental approach to CDMA and interference mitigation: From system architecture to hardware testing through VLSI design. Kluwer Academic, 2004.
Find full textFanucci, Luca. An experimental approach to CDMA and interference mitigation: From system architecture to hardware testing through VLSI design. Springer, 2011.
Find full textSh, Gildenblat Gennady, Schwartz Gary P, and Society of Photo-optical Instrumentation Engineers., eds. Metallization: Performance and reliability issues for VLSI and ULSI ; 12-13 September 1991, San Jose, California. SPIE, 1991.
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