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Relevant bibliographies by topics / VP SEM)

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Journal articles

Academic literature on the topic 'VP SEM)'

Author: Grafiati

Published: 4 June 2021

Last updated: 22 February 2023

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Journal articles on the topic "VP SEM)"

1

Rafaelsen, Jens, and T. Nylese. "EDS and VP-SEM: Practical Considerations and Challenges." Microscopy and Microanalysis 24, S1 (2018): 684–85. http://dx.doi.org/10.1017/s1431927618003914.

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2

Nishimura, Masako, Sukehiro Itoh, and Steve Joens. "Development of a Field Emission VP-SEM and Some Initial Applications." Microscopy and Microanalysis 7, S2 (2001): 882–83. http://dx.doi.org/10.1017/s1431927600030488.

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The use of variable pressure SEMs (VP-SEMs) is increasing in various fields of science and industry, allowing microscopy in a variable pressure environment of 1 ∼ 270 Pa utilizing backscattered electrons for imaging. The VP-SEM allows microscopy of insulated samples without the need for sample preparation. Charging artifacts can be minimized as well. When the VP-SEM is operated with a cooling stage, which allows cooling of samples at −20° and above, vaporization of water from samples is reduced. This permits microscopy of wet samples at close to the natural state for extended periods of time.P

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3

Newbury, Dale E. "Diagnostics for Assessing Spectral Quality for X-Ray Microanalysis in Low Voltage and Variable Pressure Scanning Electron Microscopy." Microscopy and Microanalysis 7, S2 (2001): 702–3. http://dx.doi.org/10.1017/s1431927600029585.

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There is increasing interest in performing x-ray microanalysis of uncoated insulators while operating in unconventional SEM operating modes such as “low voltage” scanning electron microscopy (LVSEM), where the accelerating voltage is ≤ 5 kV and the pressure is low (<10-4 Pa), or variable pressure environmental SEM (VP-ESEM), where a selected gas is maintained at pressures in the range of 1 Pa -1000 Pa. LVSEM and VP-ESEM as microscopy techniques have proven to be extremely successful for imaging uncoated insulators through various charge dissipation mechanisms that are not available under co

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4

Relucenti, Michela, Giuseppe Familiari, Orlando Donfrancesco, et al. "Microscopy Methods for Biofilm Imaging: Focus on SEM and VP-SEM Pros and Cons." Biology 10, no. 1 (2021): 51. http://dx.doi.org/10.3390/biology10010051.

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Several imaging methodologies have been used in biofilm studies, contributing to deepening the knowledge on their structure. This review illustrates the most widely used microscopy techniques in biofilm investigations, focusing on traditional and innovative scanning electron microscopy techniques such as scanning electron microscopy (SEM), variable pressure SEM (VP-SEM), environmental SEM (ESEM), and the more recent ambiental SEM (ASEM), ending with the cutting edge Cryo-SEM and focused ion beam SEM (FIB SEM), highlighting the pros and cons of several methods with particular emphasis on conven

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5

Robertson, Kevin, Raynald Gauvin, and James Finch. "Charge Contrast Imaging of Gibbsite Using the Variable Pressure SEM." Microscopy and Microanalysis 10, no. 6 (2004): 721–32. http://dx.doi.org/10.1017/s1431927604040590.

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The variable pressure scanning electron microscope (VP-SEM) allows imaging of insulators without the need for a conductive coating, due to charge neutralization at the surface from recombination of positive ions and surface electrons. Varying certain parameters such as pressure, bias, and working distance creates incomplete neutralization, and localized charging develops called charge contrast. Although the exact mechanism creating charge contrast imaging (CCI) is unknown, it is agreed that it is related to an optimum charge compensation. The behavior of the CCI is still vague, which presents

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6

Jirak, J., P. Čudek, and V. Nedela. "Detection of Secondary Electrons by Scintillation Detector at VP SEM." Microscopy and Microanalysis 17, S2 (2011): 922–23. http://dx.doi.org/10.1017/s1431927611005484.

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7

Myers, BD, Z. Pan, and VP Dravid. "Beam skirting effects on energy deposition profile in VP-SEM." Microscopy and Microanalysis 14, S2 (2008): 1208–9. http://dx.doi.org/10.1017/s1431927608085589.

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8

DUBEY, J. P., M. HILALI, E. VAN WILPE, S. K. VERMA, R. CALERO-BERNAL, and A. ABDEL-WAHAB. "Redescription of Sarcocystis fusiformis sarcocysts from the water buffalo (Bubalus bubalis)." Parasitology 142, no. 2 (2014): 385–94. http://dx.doi.org/10.1017/s003118201400122x.

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SUMMARYFour valid species of Sarcocystis have been reported from the water buffalo (Bubalus bubalis): Sarcocystis fusiformis, Sarcocystis buffalonis, Sarcocystis levinei and Sarcocystis dubeyi. Here, we redescribe structure of S. fusiformis sarcocysts by scanning and transmission electron microscopy (SEM, TEM). Twenty-one macroscopic sarcocysts from oesophagus of the water buffalo in Egypt were examined by light microscopy, SEM and TEM. The sarcocyst wall was up to 9 μm thick, depending on the section and the technique. In 5 μm paraffin-embedded sections, the sarcocyst wall was indistinct, 2–5

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9

Kato, Mary. "Clivadas sem operador no português brasileiro (Clefts without an operator in Brazilian Portuguese)." Estudos da Língua(gem) 8, no. 2 (2010): 61. http://dx.doi.org/10.22481/el.v8i2.1128.

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O português apresenta um tipo de sentença que tem sido tradicionalmente analisado como uma pseudo-clivada reduzida, as semi-clivadas, obtidas através do apagamento do operador-Q. Construcões semelhantes são também encontradas no Espanhol Caribenho (EsC) e analisadas como tendo um Operador nulo. Percebendo que nem todas as pseudo-clivadas têm uma reduzida correspondente, Bosque (1999) e Camacho (2006), tratando do EsC, e Mioto (2008), tratando do português brasileiro (PB), propoÃÉem uma derivação independente para as semi-clivadas. O presente trabalho se constitui numa tentativa diferente de ex

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10

Gauvin, Raynald. "X-Ray Microanalysis of Materials in the ESEM or VP-SEM." Microscopy and Microanalysis 7, S2 (2001): 778–79. http://dx.doi.org/10.1017/s1431927600029962.

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When performing X-Ray microanalysis in the ESEM (Environmental Scanning Electron Microscope) or in the VP-SEM (Variable Pressure Scanning Electron Microscope), the operating conditions of the microscope must be optimized. This is to reduce the beam broadening of the incident electrons when they scatter with the gas molecules before entering into the specimen. As a result of this scattering, the incident beam is composed of two parts. The first part of the beam is the unscattered beam and the second part is the scattered beam, named the skirt. in high pressure and long working distances conditi

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