Academic literature on the topic 'Worst case tolerance stackup'
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Journal articles on the topic "Worst case tolerance stackup"
Feng, Chang-Xue (Jack), and Andrew Kusiak. "Robust Tolerance Synthesis With the Design of Experiments Approach." Journal of Manufacturing Science and Engineering 122, no. 3 (May 1, 1999): 520–28. http://dx.doi.org/10.1115/1.1285860.
Full textGreenwood, W. H., and K. W. Chase. "Worst Case Tolerance Analysis with Nonlinear Problems." Journal of Engineering for Industry 110, no. 3 (August 1, 1988): 232–35. http://dx.doi.org/10.1115/1.3187874.
Full textBudiwantoro, Bagus, Indra Djodikusumo, and Ade Ramdan. "ANALYSIS OF GEOMETRICAL SPECIFICATION IN DECANTER CENTRIFUGE MACHINE." ASEAN Engineering Journal 8, no. 2 (December 1, 2018): 29–47. http://dx.doi.org/10.11113/aej.v8.15501.
Full textMansuy, Mathieu, Max Giordano, and Pascal Hernandez. "A new calculation method for the worst case tolerance analysis and synthesis in stack-type assemblies." Computer-Aided Design 43, no. 9 (September 2011): 1118–25. http://dx.doi.org/10.1016/j.cad.2011.04.010.
Full textLee, Woo-Jong, and T. C. Woo. "Tolerances: Their Analysis and Synthesis." Journal of Engineering for Industry 112, no. 2 (May 1, 1990): 113–21. http://dx.doi.org/10.1115/1.2899553.
Full textTsai, Jinn-Tsong. "An evolutionary approach for worst-case tolerance design." Engineering Applications of Artificial Intelligence 25, no. 5 (August 2012): 917–25. http://dx.doi.org/10.1016/j.engappai.2012.03.015.
Full textWei Tian, Xie-Ting Ling, and Ruey-Wen Liu. "Novel methods for circuit worst-case tolerance analysis." IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 43, no. 4 (April 1996): 272–78. http://dx.doi.org/10.1109/81.488806.
Full textPetrone, G., G. Spagnuolo, and M. Vitelli. "Worst Case Tolerance Analysis in Static Field Problems." IEEE Transactions on Magnetics 40, no. 2 (March 2004): 366–70. http://dx.doi.org/10.1109/tmag.2004.824098.
Full textYu, Mei Qiong, Yan Yan, Jia Hao, and Guo Xin Wang. "A Nonlinear Tolerance Analysis Method Using Worst-Case and Matlab." Advanced Materials Research 201-203 (February 2011): 247–52. http://dx.doi.org/10.4028/www.scientific.net/amr.201-203.247.
Full textHsueh, Chun-Che, Psang Dain Lin, and Jose Sasian. "Worst-case-based methodology for tolerance analysis and tolerance allocation of optical systems." Applied Optics 49, no. 31 (October 29, 2010): 6179. http://dx.doi.org/10.1364/ao.49.006179.
Full textDissertations / Theses on the topic "Worst case tolerance stackup"
MUSA, RAMI ADNAN. "SIMULATION-BASED TOLERANCE STACKUP ANALYSIS IN MACHINING." University of Cincinnati / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1060975896.
Full textCakir, Sinan. "Tolerance Based Reliability Of An Analog Electric Circuit." Master's thesis, METU, 2011. http://etd.lib.metu.edu.tr/upload/12612929/index.pdf.
Full textWorst Case Circuit Tolerance Analysis&rdquo
(WCCTA) and &ldquo
Failure Modes and Effects Analysis&rdquo
(FMEA). WCCTA involves the analysis of the circuit operation under varying parameters in their tolerance bands. These parameters include the resistances of the resistors, operating temperature and voltage input value. The operation of FPDC is checked and the most critical parameters are determined in the worst case conditions. While performing WCCTA, a method that guarantees the exact worst case conditions is used rather than probabilistic methods like Monte Carlo analysis. The results showed that the parameter variations do not affect the circuit operation unfavorably
operating temperature, voltage input variation and tolerance bands for the resistances are fairly compatible with the circuit operation. FMEA is implemented according to the short circuit and open circuit failures of all the electronic components used in FPDC. The components whose failure has catastrophic effect on the circuit operation have been determined and some preventive actions have been offered for some catastrophic failures.
Books on the topic "Worst case tolerance stackup"
Johanson, Brian. Worst case circuit analysis application guidelines. Rome, NY (P.O. Box 4700, Rome 13442-4700): The Center, 1993.
Find full textDrake, Paul J. Dimensioning and Tolerancing Handbook. McGraw-Hill Professional, 1999.
Find full textBook chapters on the topic "Worst case tolerance stackup"
"Worst-case Tolerance Stackups." In Mechanical Tolerance Stackup and Analysis, 61–104. CRC Press, 2004. http://dx.doi.org/10.1201/9780203021194.ch7.
Full text"Worst-case Tolerance Stackups." In Mechanical Tolerance Stackup and Analysis, 68–106. CRC Press, 2004. http://dx.doi.org/10.1201/9780203021194-11.
Full text"Worst-Case Tolerance Analysis." In Mechanical Tolerance Stackup and Analysis, Second Edition, 57–95. CRC Press, 2011. http://dx.doi.org/10.1201/b10894-8.
Full textSikorski, Krzysztof A. "Fixed Points- Noncontractive Functions." In Optimal Solution of Nonlinear Equations. Oxford University Press, 2001. http://dx.doi.org/10.1093/oso/9780195106909.003.0007.
Full textGetz, Donald. "Stakeholder Management (Donald Getz)." In Crisis Management and Recovery for Events: Impacts and Strategies. Goodfellow Publishers, 2021. http://dx.doi.org/10.23912/9781911635901-4828.
Full textConference papers on the topic "Worst case tolerance stackup"
Shen, Zhengshu, Jami J. Shah, and Joseph K. Davidson. "Automation of Linear Tolerance Charts and Extension to Statistical Tolerance Analysis." In ASME 2003 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/detc2003/cie-48179.
Full textShen, Zhengshu, Jami J. Shah, and Joseph K. Davidson. "Virtual Part Arrangement in Assemblies for Automatic Tolerance Chart Based Stackup Analysis." In ASME 2006 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2006. http://dx.doi.org/10.1115/detc2006-99184.
Full textDresner, Thomas L., and Philip Barkan. "Optimal Tolerance Allocation for Tolerance Stack-Ups." In ASME 1993 Design Technical Conferences. American Society of Mechanical Engineers, 1993. http://dx.doi.org/10.1115/detc1993-0389.
Full textCagan, Jonathan, and Thomas R. Kurfess. "Optimal Tolerance Allocation Over Multiple Manufacturing Alternatives." In ASME 1992 Design Technical Conferences. American Society of Mechanical Engineers, 1992. http://dx.doi.org/10.1115/detc1992-0162.
Full textSpagnuolo and Vitelli. "Worst-case tolerance design by genetic algorithms." In Proceedings of the IEEE International Symposium on Industrial Electronics ISIE-02. IEEE, 2002. http://dx.doi.org/10.1109/isie.2002.1025956.
Full textHao Zhou, Hailin Tang, Wei Su, and Xianxue Liu. "Robust design of a MEMS gyroscope considering the worst-case tolerance." In 2010 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS 2010). IEEE, 2010. http://dx.doi.org/10.1109/nems.2010.5592587.
Full textGuilford, James, M. Sethi, and Joshua Turner. "Worst Case and Statistical Tolerance Analysis of the Daughter Card Assembly." In ASME 1992 International Computers in Engineering Conference and Exposition. American Society of Mechanical Engineers, 1992. http://dx.doi.org/10.1115/cie1992-0042.
Full textKato, Toshiji, Kaoru Inoue, and Kazuya Nishimae. "Worst-Case Tolerance Analysis for a Power Electronic System by Modified Genetic Algorithms." In 2006 5th International Power Electronics and Motion Control Conference. IEEE, 2006. http://dx.doi.org/10.1109/ipemc.2006.297266.
Full textKato, Toshiji, Kaoru Inoue, and Kazuya Nishimae. "Worst-Case Tolerance Analysis for a Power Electronic System by Modified Genetic Algorithms." In 2006 5th International Power Electronics and Motion Control Conference (IPEMC 2006). IEEE, 2006. http://dx.doi.org/10.1109/ipemc.2006.4778187.
Full textSunun, Manas, and Sermsak Uatrongjit. "Improvement of sensitivity band technique for worst case tolerance analysis of linear circuits." In 2008 5th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON). IEEE, 2008. http://dx.doi.org/10.1109/ecticon.2008.4600530.
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