Journal articles on the topic 'X-Means'
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Adams, Fred, and Kenneth Aizawa. "“X” means X: Semantics Fodor-style." Minds and Machines 2, no. 2 (1992): 175–83. http://dx.doi.org/10.1007/bf00704456.
Full textHan, Myoungji, Jihyuk Lim, Junyong Choi, et al. "A Malicious Traffic Detection Method Using X-means Clustering." Journal of KIISE 41, no. 9 (2014): 617–24. http://dx.doi.org/10.5626/jok.2014.41.9.617.
Full textAbdelrahman, Radwan, Abdellatif Nasser, Radwan Eyad, and Akhozahieh Maryam. "Fitness function X-means for prolonging wireless sensor networks lifetime." International Journal of Electrical and Computer Engineering (IJECE) 13, no. 1 (2023): 465–72. https://doi.org/10.11591/ijece.v13i1.pp465-472.
Full textLarasati, Aisyah, Apif Miftahul Hajji, Anik Nur Handayani, Nabila Azzahra, Muhammad Farhan, and Puji Rahmawati. "Profiling Academic Library Patrons using K-means and X-means Clustering." International Journal of Technology 10, no. 8 (2019): 1567. http://dx.doi.org/10.14716/ijtech.v10i8.3440.
Full textHO, T. L. "Petrofabric Analysis by Means of X-Ray1." Bulletin of the Geological Society of China 27, no. 1 (2009): 389–98. http://dx.doi.org/10.1111/j.1755-6724.1947.mp27001027.x.
Full textKrutzenbichler, A., J. Keimel, and G. Fritsch. "Locally Resolved X-Ray Investigations by Means of X-Ray Optics." Materials Science Forum 133-136 (January 1993): 243–48. http://dx.doi.org/10.4028/www.scientific.net/msf.133-136.243.
Full textRokhmatan Khaerullah, Rizal, Nana Suarna, and Odi Nurdiawan. "Analisa Pengelompokan Dataset Komputer Menggunakan Algoritma X-Means." Jurnal Informatika dan Teknologi Informasi 1, no. 3 (2023): 125–31. http://dx.doi.org/10.56854/jt.v1i3.135.
Full textCazaux, J. "Characteristic x-ray imaging by means of filters." X-Ray Spectrometry 28, no. 1 (1999): 9–18. http://dx.doi.org/10.1002/(sici)1097-4539(199901/02)28:1<9::aid-xrs299>3.0.co;2-l.
Full textBustami, Bustami, Rike Mahara, Hendri Ahmadian, Sri Wahyuni, and Khairan AR. "Analisis Clustering Penduduk Miskin Di Provinsi Aceh Menggunakan Algoritma K-Means Dan X-Means." Jurnal Nasional Komputasi dan Teknologi Informasi (JNKTI) 5, no. 1 (2022): 26–35. http://dx.doi.org/10.32672/jnkti.v5i1.3961.
Full textKaligis, Gideon Bartolomeus, and Sri Yulianto. "ANALISA PERBANDINGAN ALGORITMA K-MEANS, K-MEDOIDS, DAN X-MEANS UNTUK PENGELOMPOKKAN KINERJA PEGAWAI." IT-Explore: Jurnal Penerapan Teknologi Informasi dan Komunikasi 1, no. 3 (2022): 179–93. http://dx.doi.org/10.24246/itexplore.v1i3.2022.pp179-193.
Full textWahidin, Ahmad Jurnaidi, and Dana Indra Sensuse. "Perbandingan Algoritma K-Means, X-Means Dan K-Medoids Untuk Klasterisasi Awak Kabin Lion Air." Jurnal ICT : Information Communication & Technology 20, no. 2 (2021): 298–302. http://dx.doi.org/10.36054/jict-ikmi.v20i2.387.
Full textGunnelin, K., P. Glans, P. Skytt, J. H. Guo, J. Nordgren, and H. Ågren. "Assigning x-ray absorption spectra by means of soft-x-ray emission spectroscopy." Physical Review A 57, no. 2 (1998): 864–72. http://dx.doi.org/10.1103/physreva.57.864.
Full textRadwan, Abdelrahman, Nasser Abdellatif, Eyad Radwan, and Maryam Akhozahieh. "Fitness function X-means for prolonging wireless sensor networks lifetime." International Journal of Electrical and Computer Engineering (IJECE) 13, no. 1 (2023): 465. http://dx.doi.org/10.11591/ijece.v13i1.pp465-472.
Full textRohendi, Ghina Fitria, Nana Suarna, and Gifthera Dwi Lestari. "Analisis Rumah Tidak Layak Huni Menggunakan Algoritma X-Means." Jurnal Janitra Informatika dan Sistem Informasi 3, no. 1 (2023): 18–29. http://dx.doi.org/10.25008/janitra.v3i1.151.
Full textZUHRUFILLAH, IRFANI. "Pengelompokkan Jenis Minyak Mentah Menggunakan Metode X-Means Clustering." Journal of Informatics, Information System, Software Engineering and Applications (INISTA) 4, no. 1 (2021): 12–21. http://dx.doi.org/10.20895/inista.v4i1.377.
Full textEbel, H., R. Svagera, and S. Rezai Afshar. "Depth Profiling by Means of X-Ray Fluorescence Analysis." Advances in X-ray Analysis 35, B (1991): 783–94. http://dx.doi.org/10.1154/s0376030800012982.
Full textEbel, M. F., H. Ebel, and F. Olcaytug. "Depth Profiling by Means of X-Ray Photoelectron Spectrometry." Advances in X-ray Analysis 35, B (1991): 857–67. http://dx.doi.org/10.1154/s0376030800013070.
Full textTashenov, S., A. Khaplanov, B. Cederwall, and K. U. Schässburger. "Hard X-ray polarimetry by means of Rayleigh scattering." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 600, no. 3 (2009): 599–603. http://dx.doi.org/10.1016/j.nima.2008.11.145.
Full textZendrato, N., H. W. Dhany, N. A. Siagian, and F. Izhari. "Bigdata Clustering using X-means method with Euclidean Distance." Journal of Physics: Conference Series 1566 (June 2020): 012103. http://dx.doi.org/10.1088/1742-6596/1566/1/012103.
Full textKayser, Yves, Jacinto Sá, and Jakub Szlachetko. "Depth-Resolved X-ray Absorption Spectroscopy by Means of Grazing Emission X-ray Fluorescence." Analytical Chemistry 87, no. 21 (2015): 10815–21. http://dx.doi.org/10.1021/acs.analchem.5b03346.
Full textKumada, N., N. Ozawa, N. Kinomura, and F. Muto. "Preparation of Li3-x H x TaO4 by means of hydrothermal synthesis and protolysis." Journal of Materials Science 21, no. 12 (1986): 4140–42. http://dx.doi.org/10.1007/bf01106519.
Full textLi, J. "Investigation of La1−x Ca x FeO3−y (0≦x≦0.50) by means of X—ray diffraction and Mössbauer spectroscopy." Hyperfine Interactions 69, no. 1-4 (1992): 573–76. http://dx.doi.org/10.1007/bf02401892.
Full textDubeau, Francois. "On a generalization of u-means." International Journal of Mathematics and Mathematical Sciences 14, no. 4 (1991): 803–7. http://dx.doi.org/10.1155/s0161171291001072.
Full textAdhitama, Rifki, Auliya Burhanuddin, and Ridho Ananda. "PENENTUAN JUMLAH CLUSTER IDEAL SMK DI JAWA TENGAH DENGAN METODE X-MEANS CLUSTERING DAN K-MEANS CLUSTERIN." JIKO (Jurnal Informatika dan Komputer) 3, no. 1 (2020): 1–5. http://dx.doi.org/10.33387/jiko.v3i1.1635.
Full textCAO, Peng, Bo LI, Wei LI, and Dazhe ZHAO. "Adaptive random subspace ensemble classification aided by X-means clustering." Journal of Computer Applications 33, no. 2 (2013): 550–53. http://dx.doi.org/10.3724/sp.j.1087.2013.00550.
Full textAch. Syuhbanul Yaumi, Zainul Zulfiqkar, and Aryo Nugroho. "Sistem Penunjang Keputusan Pemasaran Produk X Menggunakan Metode K-Means." Systemic: Information System and Informatics Journal 6, no. 1 (2021): 44–50. http://dx.doi.org/10.29080/systemic.v6i1.936.
Full textSUGAWARA, Katsuhiko, Ryusuke KOJIMA, Yuzo OBARA, Akira SATO, and Hideki SHIMADA. "Crack Opening Analysis by means of the X-Rays CT." Shigen-to-Sozai 114, no. 12 (1998): 881–87. http://dx.doi.org/10.2473/shigentosozai.114.881.
Full textGolovashkin, A. I., N. D. Kuz’michev, and V. V. Slavkin. "Controllable generation of harmonics by means of YBa2Cu3O7 − x superconductors." Technical Physics 53, no. 10 (2008): 1314–18. http://dx.doi.org/10.1134/s1063784208100095.
Full textT. F. Schatzki, R. P. Haff, R. Young, I. Can, L-C. Le, and N. Toyofuku. "DEFECT DETECTION IN APPLES BY MEANS OF X-RAY IMAGING." Transactions of the ASAE 40, no. 5 (1997): 1407–15. http://dx.doi.org/10.13031/2013.21367.
Full textKamminga, J. D., and R. Delhez. "Measurement of dislocation distributions by means of X-ray diffraction." Materials Science and Engineering: A 309-310 (July 2001): 55–59. http://dx.doi.org/10.1016/s0921-5093(00)01665-8.
Full textAnikina, E. Yu, and V. N. Verbetsky. "Investigation of ZrMn2+x-H2 by means of calorimetric method." Journal of Alloys and Compounds 446-447 (October 2007): 443–46. http://dx.doi.org/10.1016/j.jallcom.2006.12.146.
Full textFreyburger, Charline, Fleur Longuetaud, Frédéric Mothe, Thiéry Constant, and Jean-Michel Leban. "Measuring wood density by means of X-ray computer tomography." Annals of Forest Science 66, no. 8 (2009): 804. http://dx.doi.org/10.1051/forest/2009071.
Full textCNUDDE, V., B. MASSCHAELE, H. E. V. DE COCK, et al. "Virtual histology by means of high-resolution X-ray CT." Journal of Microscopy 232, no. 3 (2008): 476–85. http://dx.doi.org/10.1111/j.1365-2818.2008.02142.x.
Full textInoue, Hirofumi. "Texture analysis by means of EBSD and X-ray diffraction." Journal of Japan Institute of Light Metals 60, no. 12 (2010): 666–75. http://dx.doi.org/10.2464/jilm.60.666.
Full textLauer, V., F. Bauer, J. Korec, H. L. Huber, and P. Balk. "Fabrication of halfmicron MOSFETs by means of x-ray lithography." Microelectronic Engineering 6, no. 1-4 (1987): 215–20. http://dx.doi.org/10.1016/0167-9317(87)90040-2.
Full textLangenberg, A., F. Warmer, G. Fuchert, et al. "Impurity transport studies at Wendelstein 7-X by means of x-ray imaging spectrometer measurements." Plasma Physics and Controlled Fusion 61, no. 1 (2018): 014030. http://dx.doi.org/10.1088/1361-6587/aaeb74.
Full textBetz, H. "Resolution limits in x-ray lithography calculated by means of x-ray lithography simulator XMAS." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 4, no. 1 (1986): 248. http://dx.doi.org/10.1116/1.583450.
Full textBlagov, A. E., M. V. Kovalchuk, A. V. Targonsky, and Y. V. Pisarevsky. "A new method for measuring X-ray rocking curves by means of X-ray acoustooptics." Acta Crystallographica Section A Foundations of Crystallography 67, a1 (2011): C325—C326. http://dx.doi.org/10.1107/s0108767311091823.
Full textBouillot, J., J. L. Soubeyroux, and F. Luty. "(KCN)x(KCl)1−x: Structural phase diagram revisited by means of neutron thermo-diffractometry." Physica B: Condensed Matter 156-157 (January 1989): 81–84. http://dx.doi.org/10.1016/0921-4526(89)90593-0.
Full textHafizah, Izatul, and Kiki Vierdayanti. "Probing Supercritical Accretion in Ultraluminous X-ray Source M82 X-1 by means of X-ray Spectral Evolution Analysis." EPJ Web of Conferences 240 (2020): 07005. http://dx.doi.org/10.1051/epjconf/202024007005.
Full textAriza, Disya Nurul, Rahayu Ningsih, Sri Muryani, Herlina Ferliyanti, and Ahmad Jurnaidi Wahidin. "COMPARATIVE ANALYSIS OF K-MEANS, X-MEANS AND K-MEDOIDS IN CLASSIFYING MARRIAGE CHOICED ADMIST QUARTER-LIFE CRISIS." JURTEKSI (Jurnal Teknologi dan Sistem Informasi) 11, no. 1 (2024): 69–76. https://doi.org/10.33330/jurteksi.v11i1.3554.
Full textTahalea, Syilvert, Rahmi Fadhilah, M. Y. Matdoan, and Dinda Ayu Safira. "CLUSTERING SHRIMP DISTRIBUTION IN INDONESIA USING THE X-MEANS CLUSTERING ALGORITHM." VARIANCE: Journal of Statistics and Its Applications 6, no. 1 (2024): 49–54. http://dx.doi.org/10.30598/variancevol6iss1page49-54.
Full textPasteczka, Paweł. "Interval-type theorems concerning means." Annales Universitatis Paedagogicae Cracoviensis. Studia Mathematica 17, no. 1 (2018): 37–43. http://dx.doi.org/10.2478/aupcsm-2018-0004.
Full textTanti, Tanti, and Fadhil M Basysyar. "IMPLEMENTASI ALGORITMA X-MEANS UNTUK MENGELOMPOKAN PENJUALAN BARANG DI CILEDUG STORE." JATI (Jurnal Mahasiswa Teknik Informatika) 8, no. 2 (2024): 1608–13. http://dx.doi.org/10.36040/jati.v8i2.9026.
Full textHidayat, Taofik, and Bramantiyo Eko Putro. "Analisis Karakteristik Konsumen Hotel “X” dengan Menggunakan Metode K-Means Clustering." Jurnal Media Teknik dan Sistem Industri 4, no. 2 (2020): 53. http://dx.doi.org/10.35194/jmtsi.v4i2.995.
Full textFriedrich, Ursula, Mette Warburg, and Arne Lund J�rgensen. "X-inactivation pattern in carriers of X-linked retinitis pigmentosa: A valuable means of prognostic evaluation?" Human Genetics 92, no. 4 (1993): 359–63. http://dx.doi.org/10.1007/bf01247335.
Full textValcheva, E. P. "Characterization of GaAs/Al x Ga 1-x As heterointerface defects by means of capacitive measurememts." Applied Physics A: Materials Science & Processing 65, no. 1 (1997): 39–42. http://dx.doi.org/10.1007/s003390050538.
Full textOSAMURA, Kozo. "Structure analysis by means of X-ray and neutron diffraction techniques." Journal of Japan Institute of Light Metals 42, no. 10 (1992): 593–601. http://dx.doi.org/10.2464/jilm.42.593.
Full textSUGAWARA, Katuhiko, Akira SATO, Yuzo OBARA, and Masahide YANAGISAKO. "Measurement of Permeability of Rock by Means of X-Ray CT." Shigen-to-Sozai 115, no. 11 (1999): 803–8. http://dx.doi.org/10.2473/shigentosozai.115.803.
Full textLopez-Sanchez, Juan M., Shane R. Cloude, and J. David Ballester-Berman. "Rice Phenology Monitoring by Means of SAR Polarimetry at X-Band." IEEE Transactions on Geoscience and Remote Sensing 50, no. 7 (2012): 2695–709. http://dx.doi.org/10.1109/tgrs.2011.2176740.
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