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Journal articles on the topic 'X-ray absorption fine structure (XAFS)'

Author: Grafiati

Published: 4 June 2021

Last updated: 2 February 2022

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1

Hsu, Rebekah Min-Fang, Kai-Jan Lin, Cheng Tien, and Lin-Yan Jang. "X-Ray Absorption Fine Structure Study in FeTiO3." Modern Physics Letters B 11, no. 16n17 (1997): 745–48. http://dx.doi.org/10.1142/s0217984997000918.

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X-ray absorption fine structure XAFS spectroscopy has been used to determine the valence system for the Fe atom in ilmenite, FeTiO3 . This is the first XAFS data in FeTiO3 to our knowledge. The α- Fe2O3 data served as the standard in determining the ionization of the Fe atom in FeTiO3 . Observation of intensity and k-space are consistent. There was no evidence of mixed valence on comparing the FeTiO3 near edge X-ray absorption spectrum with α- Fe2O3 data. The absorption spectra suggest that iron is in the trivalent state in ilmenite.

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2

Taguchi, Takeyoshi, and Peter S. White. "Use of the Metals Data File (CRYSTMET) in XAFS analysis." Acta Crystallographica Section B Structural Science 58, no. 3 (2002): 358–63. http://dx.doi.org/10.1107/s0108768102004135.

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The X-ray absorption spectrometry (XAS) technique has been widely used to determine the local structure of materials that are poorly suited to study by ordinary diffraction methods, such as fine particles or amorphous matter. XAS is among the major applications at synchrotron radiation facilities and many existing beamlines perform the measurement of XAFS (X-ray absorption fine structure) spectra. XAFS spectra can also be measured with conventional X-ray sources. Measurement of XAFS spectra is relatively straightforward, but real difficulties arise in the analysis and interpretation of the dat

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3

Berry, Frank J., Alberto Bohorquez, Julia Mcmanus, Paul Wynn, and Robert Bilsborrow. "X-Ray Absorption Fine Structure in FeTiO3." Modern Physics Letters B 12, no. 11 (1998): 413–18. http://dx.doi.org/10.1142/s0217984998000500.

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The recent report1 that the Fe K-edge X-ray absorption fine structure (XAFS) recorded from FeTiO 3 are best interpreted in terms of the presence of Fe 3+ is erroneous. The X-ray absorption near edge structure recorded at both the Fe K- and Ti K-edges are consistent with the presence of Fe 2+ and Ti 4+. The results are endorsed by 57 Fe Mössbauer spectroscopy. The compound FeTiO 3 is accurately formulated as Fe 2+ Ti 4+ O 3.

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4

Gaur, A., and B. D. Shrivastava. "Speciation using X-ray absorption fine structure (XAFS)." Review Journal of Chemistry 5, no. 4 (2015): 361–98. http://dx.doi.org/10.1134/s2079978015040032.

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5

Ikemoto, H. "miXAFS: a program for X-ray absorption fine-structure data analysis." Journal of Synchrotron Radiation 25, no. 2 (2018): 618–24. http://dx.doi.org/10.1107/s1600577518001765.

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A new program calledmiXAFSfor the analysis of X-ray absorption fine-structure (XAFS) data is presented.miXAFScan analyze the XAFS functions simultaneously for all measured X-ray absorption edges of the constituent elements in a sample under the constraints for the structural parameters over the edges. The program provides a surface plot of theR-factor as a function of two structural parameters, which is useful to validate the optimized structural parameters. The structural parameters can be obtained from the XAFS data in a few steps using the setting file and batch process. The program, which

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6

Sham, T. K., X. H. Feng, D. T. Jiang, et al. "Si K-edge X-ray absorption fine structure studies of porous silicon." Canadian Journal of Physics 70, no. 10-11 (1992): 813–18. http://dx.doi.org/10.1139/p92-128.

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X-ray absorption fine structure (XAFS) spectra of porous Si prepared by the anodization of a Si wafer in aqueous HF solution have been obtained with synchrotron radiation. The Si K-edge near-edge X-ray absorption fine structure and extended X-ray absorption fine structures clearly show that porous silicon samples that have been exposed to the ambient environment (untreated) have an oxide layer, while the "clean" (treated) porous Si sample regenerated by HF treatment shows some degradation in its crystallinity. Noticeable differences in the XAFS between porous Si and crystalline Si are noted. T

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7

Chantler, Christopher T., M. Tauhidul Islam, Stephen P. Best, et al. "High-accuracy X-ray absorption spectra from mMsolutions of nickel (II) complexes with multiple solutions using transmission XAS." Journal of Synchrotron Radiation 22, no. 4 (2015): 1008–21. http://dx.doi.org/10.1107/s1600577515006190.

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A new approach is introduced for determining X-ray absorption spectroscopy (XAS) spectra on absolute and relative scales using multiple solutions with different concentrations by the characterization and correction of experimental systematics. This hybrid technique is a development of standard X-ray absorption fine structure (XAFS) along the lines of the high-accuracy X-ray extended range technique (XERT) but with applicability to solutions, dilute systems and cold cell environments. This methodology has been applied to determining absolute XAS of bis(N-n-propyl-salicylaldiminato) nickel(II) a

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8

Dalba, G. "XAFS studies of glass structure." Physics and Chemistry of Glasses: European Journal of Glass Science and Technology Part B 61, no. 6 (2020): 222–32. http://dx.doi.org/10.13036/17533562.61.6.dalba.

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X-ray absorption fine structure (XAFS) spectroscopy has become one of the most important techniques to characterise the local coordination of specific atomic species present in condensed matter. The possibility of investigating the structure of noncrystalline materials has made XAFS very attractive for the study of the short range structure of the glassy state. The XAFS acronym denotes the structure present above the x-ray absorption edges; such a structure is distinguished as x-ray absorption near edge structure (XANES) and extended x-ray absorption fine structure (EXAFS). XANES carries infor

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9

Sung, Nark-Eon, Ik-Jae Lee, Sung-hoon Jeong, and Seen-Woong Kang. "Characteristics of a tapered undulator for the X-ray absorption fine-structure technique at PLS-II." Journal of Synchrotron Radiation 21, no. 6 (2014): 1282–87. http://dx.doi.org/10.1107/s1600577514015549.

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An in-vacuum undulator (IVU) with a tapered configuration was installed in the 8C nanoprobe/XAFS beamlime (BL8C) of the Pohang Light Source in Korea for hard X-ray nanoprobe and X-ray absorption fine-structure (XAFS) experiments. It has been operated in planar mode for the nanoprobe experiments, while gap-scan and tapered modes have been used alternatively for XAFS experiments. To examine the features of the BL8C IVU for XAFS experiments, spectral distributions were obtained theoretically and experimentally as functions of the gap and gap taper. Beam profiles at a cross section of the X-ray be

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10

Pinto de Carvalho, Regina, G. C. Silva, M. Sylvia S. Dantas, I. F. Vasconcelos, and Virgínia S. T. Ciminelli. "X-Ray Absorption Spectroscopy Applied to Metal Accumulation." Advanced Materials Research 71-73 (May 2009): 613–16. http://dx.doi.org/10.4028/www.scientific.net/amr.71-73.613.

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X-Rays Absorption Fine Structure Spectroscopy (XAFS) is an analytical technique that can be used as a probe to characterize almost all elements, even if they appear in diluted or non-crystalline systems. This is due to the fact that the absorption probability of X-rays has a unique feature for each element, and is modulated by the chemical and physical state of that element, as well as by its neighborhood. This paper presents a brief description of the X-rays absorption phenomenon and the analytical technique involving this phenomenon, as well as the application of XAFS in biosorption studies.

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11

Shrivastava, B. D. "X-ray absorption fine structure (XAFS) spectroscopy using synchrotron radiation." Journal of Physics: Conference Series 365 (May 18, 2012): 012002. http://dx.doi.org/10.1088/1742-6596/365/1/012002.

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12

Bartlett, Stuart A., Michelle L. Hamilton, and John Evans. "Dynamic structure elucidation of chemical reactivity by laser pulses and X-ray probes." Dalton Transactions 44, no. 14 (2015): 6313–19. http://dx.doi.org/10.1039/c5dt00210a.

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Inelastic X-ray scattering techniques enhance chemical speciation by X-ray absorption fine structure (XAFS) spectroscopy and open up application of X-ray free electron lasers to observe chemical transformations.

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13

Miyanaga, Takafumi. "Local Structure and Dynamics of Functional Materials Studied by X-ray Absorption Fine Structure." Symmetry 13, no. 8 (2021): 1315. http://dx.doi.org/10.3390/sym13081315.

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X-ray absorption fine structure (XAFS) is a powerful technique used to analyze a local electronic structure, local atomic structure, and structural dynamics. In this review, I present examples of XAFS that apply to the local structure and dynamics of functional materials: (1) structure phase transition in perovskite PbTiO3 and magnetic FeRhPd alloys; (2) nano-scaled fluctuations related to their magnetic properties in Ni–Mn alloys and Fe/Cr thin films; and (3) the Debye–Waller factors related to the chemical reactivity for catalysis in polyanions and ligand exchange reaction. This study shows

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14

Amnuyswat, K., Pitiporn Thanomngam, Suwat Sopitpan, A. Sungthong, Supanit Porntheeraphat, and J. Nukeaw. "Investigation of Oxygen Contamination in Indium Nitride Thin Film by X-Ray Absorption Fine Structure." Advanced Materials Research 93-94 (January 2010): 493–96. http://dx.doi.org/10.4028/www.scientific.net/amr.93-94.493.

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Local structures of indium oxynitride (InON) nano-crystal prepared by reactive gas-timing RF magnetron sputtering technique are under investigation. Since the optical properties of these InON thin films depend on gas-timing ratio, the local structure analysis is needed in order to determine the relation between the gas timing ratio and its optical properties. In this work, InON thinfilm with 30:0 seconds (N2:O2) gas-timings ratio was analyzed for its local structure using X-ray absorption fine structure (XAFS) technique in conjunction with first principle calculation. The results indicate that

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15

Pao, Chih-Wen, Jeng-Lung Chen, Jyh-Fu Lee, et al. "The new X-ray absorption fine-structure beamline with sub-second time resolution at the Taiwan Photon Source." Journal of Synchrotron Radiation 28, no. 3 (2021): 930–38. http://dx.doi.org/10.1107/s1600577521001740.

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The new TPS 44A beamline at the Taiwan Photon Source, located at the National Synchrotron Radiation Research Center, is presented. This beamline is equipped with a new quick-scanning monochromator (Q-Mono), which can provide both conventional step-by-step scans (s-scans) and on-the-fly scans (q-scans) for X-ray absorption fine-structure (XAFS) spectroscopy experiments, including X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine-structure (EXAFS) spectral measurements. Ti and Te K-edge XAFS spectra were used to demonstrate the capability of collecting spectra at th

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16

Wakisaka, Yuki, Bing Hu, Daiki Kido, et al. "Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies." Journal of Synchrotron Radiation 27, no. 6 (2020): 1618–25. http://dx.doi.org/10.1107/s1600577520011170.

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A bent crystal Laue analyser (BCLA) is an X-ray energy analyser used for fluorescence X-ray absorption fine-structure (XAFS) spectroscopy to separate the fluorescence X-ray emission line of a target atom from the elastic scattering X-rays and other fluorescence emission lines. Here, the feasibility of the BCLA for total reflection fluorescence XAFS (TRF-XAFS), which has a long X-ray footprint on the substrate surface owing to grazing incidence, was tested. The focal line of the BCLA was adjusted on the X-ray footprint and the XAFS signal for one monolayer of Pt deposited on a 60 nm Au film wit

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17

Yiwata, Noriyuki, Atsuyuki Watada, Tetsu Yamamuro, et al. "X-ray absorption fine structure of V2O5 and Li x V2O5." Journal of Synchrotron Radiation 5, no. 3 (1998): 1146–48. http://dx.doi.org/10.1107/s0909049597018670.

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Vanadium K-edge XAFS measurements of five compounds were carried out. The compounds studied were crystalline V2O5 and four types of Li x V2O5 with different insertion levels x, which show different EMFs (2.0–3.4 V). The EXAFS data analysis shows no remarkable difference in the V—O distances in the five compounds, showing that the structure of the VO5 square pyramids changes only slightly as lithium atoms are intercalated into the V2O5. In the XANES spectra, three peaks are observed for crystalline V2O5 and Li x V2O5 (3.4 V). When the EMF is decreased, the intensity difference between the first

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18

Nishihata, Y., O. Kamishima, Y. Kubozono, H. Maeda, and S. Emura. "XAFS in the high-energy region." Journal of Synchrotron Radiation 5, no. 3 (1998): 1007–9. http://dx.doi.org/10.1107/s0909049597016749.

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XAFS (X-ray absorption fine-structure) spectra were measured near K-absorption edges of Ce (40.5 keV), Dy (53.8 keV), Ta (67.4 keV) and Pt (78.4 keV). The blunt K-edge jump due to the finite lifetime of the core hole was observed. This makes it difficult to extract EXAFS (extended X-ray absorption fine-structure) functions at low k values. Local structure parameters can be evaluated from the EXAFS spectra above K-absorption edges in the high-energy region as well as from those above L III-edges. It was found that the finite-lifetime effect of the core hole is effectively taken into the photoel

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19

Song, Chulho, Okkyun Seo, Daiju Matsumura, et al. "Hydrogen absorption and desorption on Rh nanoparticles revealed by in situ dispersive X-ray absorption fine structure spectroscopy." RSC Advances 10, no. 34 (2020): 19751–58. http://dx.doi.org/10.1039/d0ra03322g.

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To unveil the origin of the hydrogen-storage properties of rhodium nanoparticles (Rh NPs), we investigated the dynamical structural change of Rh NPs using in situ dispersive X-ray absorption fine structure spectroscopy (XAFS).

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20

Boscherini, Federico, and Matthew Newville. "Fourteenth International Conference on X-ray Absorption Fine Structure (XAFS-14)." Synchrotron Radiation News 23, no. 3 (2010): 21–23. http://dx.doi.org/10.1080/08940886.2010.485519.

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21

Soderholm, L., G. K. Liu, Mark R. Antonio, and F. W. Lytle. "X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)." Journal of Chemical Physics 109, no. 16 (1998): 6745–52. http://dx.doi.org/10.1063/1.477320.

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22

Bourke, Jay D., Christopher T. Chantler, and Yves Joly. "FDMX: extended X-ray absorption fine structure calculations using the finite difference method." Journal of Synchrotron Radiation 23, no. 2 (2016): 551–59. http://dx.doi.org/10.1107/s1600577516001193.

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A new theoretical approach and computational package,FDMX, for general calculations of X-ray absorption fine structure (XAFS) over an extended energy range within a full-potential model is presented. The final-state photoelectron wavefunction is calculated over an energy-dependent spatial mesh, allowing for a complete representation of all scattering paths. The electronic potentials and corresponding wavefunctions are subject to constraints based on physicality and self-consistency, allowing for accurate absorption cross sections in the near-edge region, while higher-energy results are enabled

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23

Oyanagi, H., A. Kolobov, and K. Tanaka. "Pump and probe X-ray absorption fine structure using high-brilliance photon sources." Journal of Synchrotron Radiation 5, no. 3 (1998): 1001–3. http://dx.doi.org/10.1107/s0909049597014301.

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Pump and probe X-ray absorption fine structure (XAFS) is used as a local probe of excited atoms, which can provide direct information on lattice distortion, relaxation and atomic rearrangements associated with electronic excitations. In situ XAFS experiments during optical excitation are reported. Utilizing a grazing-incidence fluorescence excitation, which minimizes the mismatch between the probing depths of X-ray excitation and optical pumping, it is found that the dominant photoinduced defect state in amorphous selenium at low temperature is a pair of threefold neutral C^0_3 states: 2C^*_2

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24

Okamoto, Y., H. Shiwaku, T. Yaita, S. Suzuki, K. Minato, and H. Tanida. "Local Structure of Molten CdCl2 Systems." Zeitschrift für Naturforschung A 59, no. 11 (2004): 819–24. http://dx.doi.org/10.1515/zna-2004-1116.

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The local structure of molten CdCl2 was investigated by X-ray absorption fine structure (XAFS) and X-ray diffraction(XRD) analyses. The nearest Cd2+-Cl− distance decreases from 2.61 Å in the room temperature solid state to 2.47 - 2.50 Å in the molten state. The coordination number decreases from 6 in the solid to 4 in the melt. The obtained structural parameters from the XAFS and the XRD analyses suggest that a tetrahedral coordination (CdCl4)2− is predominant in molten CdCl2. The XAFS result of a molten 50%CdCl2-KCl mixture shows that the 4-fold (CdCl4)2− structure holds also in the mixture

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Sarikaya, Mehmet, Maoxu Qian, and Edward A. Stern. "Elfs: Energy Loss Fine Structure Analysis in Materials." Microscopy and Microanalysis 3, S2 (1997): 953–54. http://dx.doi.org/10.1017/s143192760001165x.

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ELFS (energy loss fine structure), similar to XAFS (x-ray absorption fine structure) provides short-range order atomic structural information of crystalline and amorphous materials. Although known quite sometime, ELFS spectroscopy only until recently has gained importance, mainly due new developments in spectrometer and TEM designs, spectra acquisition and interpretation techniques. This paper focuses on some new developments in the acquisition, interpretation, and the use of the extended regime of the ELFS spectroscopy.Although fine structure spectroscopy in EELS and its similarity to XAFS we

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Wang, Hai Bo, Qian Wang, Yan Dong Ji, Meng Meng Yang, and Yong Qi Dong. "Characterization of Local Crystal and Electronic Structure on Sr₂CuO₂F_2+x Material by Synchrotron Radiation." Materials Science Forum 850 (March 2016): 175–79. http://dx.doi.org/10.4028/www.scientific.net/msf.850.175.

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In order to study the evolution of local crystal and electronic structure of Sr2CuO2F2+x, the synchrotron radiation x-ray absorption (XAS) and x-ray absorption fine structure (XAFS) techniques were both performed on different amount of Sr2CuO2F2+x materials. The relationship between high Tc superconductivity and valence state of cooper was mainly discussed. And the effect of by-reproduce SrF2 in non-superconductive Sr2CuO2F2+x on physical property of this material was considered. The experimental results showed that the valence state of Cu and the amount of SrF2 was mainly related with high Tc

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27

Hung, Nguyen Van. "Contributions to Developments of Photoelectron Spectroscopy and X-ray Absorption Fine Structure Applied to Materials Studies." Communications in Physics 31, no. 2 (2021): 113. http://dx.doi.org/10.15625/0868-3166/15826.

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This work reviews the contributions of author to the developments and applications of Photoelectron Spectroscopy (PES) and X-ray Absorption Fine Structure (XAFS) to materials studies. Focusing on Angle resolved PES (ARPES) the energy distribution is discussed for angle-resolved photoemission from valence bands of single crystals. The important influence of the spectrometer angle of acceptance on the results of X-ray PES (XPS) is investigated in detail. The Plane Density of States (PDOS) is introduced as a new property of the electronic structure. Most meaningful contributions to XAFS consist o

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28

UO, Motohiro, Kiyotaka ASAKURA, Atsuro YOKOYAMA, et al. "X-ray Absorption Fine Structure (XAFS) Analysis of Titanium-implanted Soft Tissue." Dental Materials Journal 26, no. 2 (2007): 268–73. http://dx.doi.org/10.4012/dmj.26.268.

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Edwards, Ann, and Dale Sayers. "The 7th international conference on X‐ray absorption fine structure (XAFS VII)." Synchrotron Radiation News 6, no. 1 (1993): 9–10. http://dx.doi.org/10.1080/08940889308602718.

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Chantler, Christopher. "Volume I: X-ray Absorption Spectroscopy, International Tables." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1524. http://dx.doi.org/10.1107/s2053273314084757.

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Research in core physics and atomic and condensed matter science are increasingly relevant for diverse fields and are finding application in chemistry, engineering and biological sciences, linking to experimental research at synchrotrons, reactors and specialized facilities. A plethora of different approaches are popular in the literature and the Volume will hope to capture their greatest achievements and value by representation of all the leading groups from Europe, America, Asia, Australia plus elsewhere! Specifically, common elements and novel elements of XAFS, XANES, EXAFS, RIXS and divers

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Liu, Jing, Katla Sai Krishna, Chanaka Kumara, et al. "Understanding Au∼98Ag∼46(SR)60 nanoclusters through investigation of their electronic and local structure by X-ray absorption fine structure." RSC Advances 6, no. 30 (2016): 25368–74. http://dx.doi.org/10.1039/c5ra27396j.

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Synchrotron radiation-based X-ray absorption fine structure (XAFS) of thiol-stabilized Au<sub>∼98</sub>Ag<sub>∼46</sub>(SR)<sub>60</sub> nanoclusters suggests that Au atoms preferred to occupy the metal core sites while the Ag atoms were mainly on the surface.

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Chang, S. Y., Y. Gründer, S. G. Booth, et al. "Detection and characterisation of sub-critical nuclei during reactive Pd metal nucleation by X-ray absorption spectroscopy." CrystEngComm 18, no. 5 (2016): 674–82. http://dx.doi.org/10.1039/c5ce01883h.

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The interfacial reduction of aqueous [PdCl<sub>4</sub>]<sup>2−</sup> at the interface with an organic solution of ferrocene has been characterised by X-ray absorption fine structure (XAFS) spectroscopy.

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Balerna, Antonella. "DAFNE-Light DXR1 Soft X-Ray Synchrotron Radiation Beamline: Characteristics and XAFS Applications." Condensed Matter 4, no. 1 (2019): 7. http://dx.doi.org/10.3390/condmat4010007.

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X-ray Absorption Fine Structure Spectroscopy (XAFS) is a powerful technique to investigate the local atomic geometry and the chemical state of atoms in different types of materials, especially if lacking a long-range order, such as nanomaterials, liquids, amorphous and highly disordered systems, and polymers containing metallic atoms. The INFN-LNF DAΦNE-Light DXR1 beam line is mainly dedicated to soft X-ray absorption spectroscopy; it collects the radiation of a wiggler insertion device and covers the energy range from 0.9 to 3.0 keV or the range going from the K-edge of Na through to the K-ed

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HITCHCOCK, A. P., T. TYLISZCZAK, P. BRODERSEN, Z. H. LU, and M. W. C. DHARMA-WARDANA. "STRUCTURE OF CHEMICALLY PREPARED PASSIVATION LAYERS ON SINGLE CRYSTAL SEMICONDUCTOR SURFACES." Surface Review and Letters 06, no. 06 (1999): 1109–20. http://dx.doi.org/10.1142/s0218625x99001232.

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Monolayers of S and Cl have useful passivation properties for group IV and III–V semiconductor surfaces. The structures of Ge(111)–Cl; GaAs(111)–Cl; GaAs(111)A–S, GaAs(111)B–S and GaAs(001)–S monolayer-passivated single crystal semiconductor surfaces have been studied using synchrotron radiation X-ray absorption fine structure spectroscopy (XAFS). The near edge and extended fine structure signals are interpreted using comparisons to multiple scattering XAFS calculations and, in the cases of Ge(111)–Cl and GaAs(111)–Cl, comparison to first-principles calculations. Relationships between the surf

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Jiang, Fangling, Cheng Li, Haiying Fu, Xiaojing Guo, Guozhong Wu, and Shimou Chen. "Probing the spontaneous reduction mechanism of platinum ions confined in the nanospace by X-ray absorption fine structure spectroscopy." Physical Chemistry Chemical Physics 18, no. 28 (2016): 19259–66. http://dx.doi.org/10.1039/c6cp02565j.

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The reduction mechanism of Pt<sup>4+</sup> ions confined in the channel of multi-walled carbon nanotubes was mainly investigated using X-ray absorption fine structure (XAFS) spectroscopy, with the aid of TEM, Raman, XRD and ICP-AES studies.

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Ekanayake, Ruwini S. K., Christopher T. Chantler, Daniel Sier, et al. "High-accuracy measurement of mass attenuation coefficients and the imaginary component of the atomic form factor of zinc from 8.51 keV to 11.59 keV, and X-ray absorption fine structure with investigation of zinc theory and nanostructure." Journal of Synchrotron Radiation 28, no. 5 (2021): 1492–503. http://dx.doi.org/10.1107/s1600577521005981.

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High-accuracy X-ray mass attenuation coefficients were measured from the first X-ray Extended Range Technique (XERT)-like experiment at the Australian Synchrotron. Experimentally measured mass attenuation coefficients deviate by ∼50% from the theoretical values near the zinc absorption edge, suggesting that improvements in theoretical tabulations of mass attenuation coefficients are required to bring them into better agreement with experiment. Using these values the imaginary component of the atomic form factor of zinc was determined for all the measured photon energies. The zinc K-edge jump r

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YOSHIASA, AKIRA, KEI-ICHIRO MURAI, HIROSHI ARIMA, and YOSHINORI KATAYAMA. "PRECISE STRUCTURE ANALYSES OF ADVANCED MATERIALS UNDER HIGH-PRESSURE AND HIGH-TEMPERATURE." International Journal of Modern Physics B 25, no. 31 (2011): 4159–62. http://dx.doi.org/10.1142/s0217979211066489.

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Precise structure analyses of advanced materials under pressure were performed using each advantage of X-ray absorption fine structure (XAFS) and diffraction methods. Measurements were performed in-situ under pressure and temperature using a large-volume multi-anvil pressure apparatus and synchrotron radiation. XAFS spectra are useful for phase study under high temperature and high pressure. The XAFS Debye Waller factor provides anharmonic effective pair potential with a pressure-dependent and temperature-independent shape. The phonon energies and anharmonicity are affected largely by the chan

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38

Epple, Matthias, Uta Sazama, Armin Reller, Nicole Hilbrandt, Manfred Martin, and Larc Tröger. "Simultaneous X-ray absorption fine-structure spectroscopy (XAFS) and differential scanning calorimetry (DSC)." Chem. Commun., no. 15 (1996): 1755–56. http://dx.doi.org/10.1039/cc9960001755.

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Kozak, Maciej, Wojciech M. Kwiatek, Maya Kiskinova, Augusto Marcelli, and Sakura Pascarelli. "Proceedings of the 17thInternational Conference on X-Ray Absorption Fine Structure (XAFS 2018)." Radiation Physics and Chemistry 175 (October 2020): 108985. http://dx.doi.org/10.1016/j.radphyschem.2020.108985.

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Schlesiger, Christopher, Sebastian Praetz, Richard Gnewkow, Wolfgang Malzer, and Birgit Kanngießer. "Recent progress in the performance of HAPG based laboratory EXAFS and XANES spectrometers." Journal of Analytical Atomic Spectrometry 35, no. 10 (2020): 2298–304. http://dx.doi.org/10.1039/d0ja00208a.

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New developments in the description and modeling of Highly Annealed Pyrolytic Graphite (HAPG) mosaic crystals have led to the possibility of designing optimized optical solutions for X-ray absorption fine structure (XAFS) spectroscopy.

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Yoshida, Takefumi, Manas Kumar Bera, Yemineni S. L. V. Narayana, Sanjoy Mondal, Hitoshi Abe, and Masayoshi Higuchi. "Electrochromic Os-based metallo-supramolecular polymers: electronic state tracking by in situ XAFS, IR, and impedance spectroscopies." RSC Advances 10, no. 41 (2020): 24691–96. http://dx.doi.org/10.1039/d0ra03236k.

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In this study, the electronic states of Os-based metallo-supramolecular polymers (poly(OsL)2+) during electrochromism were tracked by in situ X-ray absorption fine structure (XAFS), infrared (IR), and impedance spectroscopies.

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Sung, Nark-Eon, Ik-Jae Lee, Kug-Seong Lee, Seong-Hun Jeong, Seen-Woong Kang, and Yong-Bi Shin. "A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source." Journal of Synchrotron Radiation 22, no. 5 (2015): 1306–11. http://dx.doi.org/10.1107/s1600577515014071.

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A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS-II, South Korea. Owing to the reproducible switch of the gap of the in-vacuum undulator (IVU), the intense and brilliant hard X-ray beam of an IVU can be used in X-ray fluorescence (XRF) and X-ray absorption fine-structure (XAFS) experiments. For high-spatial-resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter-sized X-ray beam to a micrometer-sized beam. The performance of this system was examined by a combination of micro-XRF imaging and micro-XAFS of a beet

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Sier, Daniel, Geoffrey P. Cousland, Ryan M. Trevorah, et al. "High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique." Journal of Synchrotron Radiation 27, no. 5 (2020): 1262–77. http://dx.doi.org/10.1107/s1600577520010097.

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Measurements of mass attenuation coefficients and X-ray absorption fine structure (XAFS) of zinc selenide (ZnSe) are reported to accuracies typically better than 0.13%. The high accuracy of the results presented here is due to our successful implementation of the X-ray extended range technique, a relatively new methodology, which can be set up on most synchrotron X-ray beamlines. 561 attenuation coefficients were recorded in the energy range 6.8–15 keV with measurements concentrated at the zinc and selenium pre-edge, near-edge and fine-structure absorption edge regions. This accuracy yielded d

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Hung, Nguyen Van, Trinh Thi Hue, Ha Dang Khoa, and Tong Sy Tien. "X-ray Absorption Fine Structure of bcc Crystals Studied Based on High-order Expanded Debye-Waller Factors." Communications in Physics 27, no. 1 (2017): 55. http://dx.doi.org/10.15625/0868-3166/27/1/8912.

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In this work, X-ray absorption fine structure (XAFS) of bcc crystals and it Fourier transformmagnitude have been studied based on the anharmonic correlated Debye model high-order expandedDebye-Waller factors. The many-body effects are taken into account in the present one-dimensionalmodel based on the anharmonic effective potential that includes interactions of absorber andbackscatterer atoms with their first shell near neighbors, where Morse potential is assumed to describethe single-pair atomic interaction. Analytical expressions of four first temperature-dependent cumulantsof bcc crystals h

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Xiong, Jian Z., Detong Jiang, Craig E. Dixon, Kim M. Baines, and T. K. Sham. "Structure and bonding of organosilicon compounds containing silicon–silicon and silicon–germanium bonds: an X-ray absorption fine structure study." Canadian Journal of Chemistry 74, no. 11 (1996): 2229–39. http://dx.doi.org/10.1139/v96-251.

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Si K-edge X-ray Absorption Fine Structures (XAFS) spectroscopy has been used to study the structure and bonding of a series of highly symmetric organosilicon compounds, Si(CH3)4, Ge[Si(CH3)3]4, Si[Ge(CH3)3]4, and Si[Si(CH3)3]4, in the gas phase. It was found that there is a significant difference in the absorption coefficient in the near-edge region between local Si–Si interactions in these compounds and long-range Si–Si interactions in crystalline solids and that the Si—Si bond length in the molecule Si[Si(CH3)3]4 is 2.364(10) Å and the Si—Ge bond lengths in Si[Ge(CH3)3]4 and Ge[Si(CH3)3]4 ar

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Han, S. W., and S. H. Kang. "Sensitivity of Zn_1-xCd_x Te to Tera-Hertz Signals Enhanced by Structural Orderings." Solid State Phenomena 111 (April 2006): 25–30. http://dx.doi.org/10.4028/www.scientific.net/ssp.111.25.

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A better efficiency of sensing tera-hertz signals (T-rays) depends on a better crystalline structure which is obtained by replacing a small amount of Cd on Zn sites of ZnTe crystals. Zn1-xCdxTe (ZCT) crystals were fabricated with an advanced vertical Bridgeman method and the structural properties of the ZCT crystals were studied with high resolution x-ray diffraction (HRXRD) and x-ray absorption fine structure (XAFS) measurements. The Rietveld refinement to the HRXRD data showed that the ZCT crystals at x ~ 0.05 were slightly less disordered than the ZnTe crystals. These results were confirmed

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Okamoto, Yoshihiro, and Haruhiko Motohashi. "XAFS Study of Molten ZrCl4 in LiCl-KCl Eutectic." Zeitschrift für Naturforschung A 57, no. 5 (2002): 277–80. http://dx.doi.org/10.1515/zna-2002-0512.

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The local structure of motlen ZrCl4 in LiCl-KCl eutectic was investigated by using an X-ray absorption fine structure (XAFS) of the Zr K-absorption edge. The nearest Zr4+-Cl- distance and coordination number from the curve fitting analysis were (2.51±0.02) Å and 5.9±0.6, respectively. These suggest that a 6-fold coordination (ZrCl6)2- is predominant in the molten mixture.

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Ditter, Alexander S., Evan P. Jahrman, Liam R. Bradshaw, Xiaojing Xia, Peter J. Pauzauskie, and Gerald T. Seidler. "A mail-in and user facility for X-ray absorption near-edge structure: the CEI-XANES laboratory X-ray spectrometer at the University of Washington." Journal of Synchrotron Radiation 26, no. 6 (2019): 2086–93. http://dx.doi.org/10.1107/s1600577519012839.

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There are more than 100 beamlines or endstations worldwide that frequently support X-ray absorption fine-structure (XAFS) measurements, thus providing critical enabling capability for research across numerous scientific disciplines. However, the absence of a supporting tier of more readily accessible, lower-performing options has caused systemic inefficiencies, resulting in high oversubscription and the omission of many scientifically and socially valuable XAFS applications that are incompatible with the synchrotron facility access model. To this end, this work describes the design, performanc

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Wu, Tai-Sing, Horng-Tay Jeng, Shih-Lin Chang, and Yun-Liang Soo. "Effects of Annealing and X-ray Exposure in (Y,Co)-Codoped CeO2 Probed by XAFS." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1781. http://dx.doi.org/10.1107/s2053273314082187.

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Local structures surrounding Co dopoant atoms in (Y,Co) codoped CeO2 nanocrystals prepared by a chemical method followed by a series of thermal annealing and x-ray exposure have been probed using x-ray absorption fine structure (XAFS) techniques. These material systems are of great interest for catalytic applications. Our x-ray results show systematic variation of local structures surrounding Co atoms due to thermal annealing at different temperatures. It was also found that x-ray exposure with sufficient incident photon energy can substantially neutralize the structural effects of annealing.

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Sakurai, Masaki, and Kenji Suzuki. "X-ray Absorption Fine Structure (XAFS) for Local Structure Analysis Around Small Amount of Additives." Materia Japan 36, no. 1 (1997): 68–74. http://dx.doi.org/10.2320/materia.36.68.

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