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Journal articles on the topic 'X-Ray Fluorescence (XRF) Analysis'

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1

Ariyama, Kaoru. "X-ray Fluorescence Analysis (XRF)." Nippon Shokuhin Kagaku Kogaku Kaishi 61, no. 3 (2014): 150. http://dx.doi.org/10.3136/nskkk.61.150.

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2

Gurker, N. "Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction." Advances in X-ray Analysis 30 (1986): 53–65. http://dx.doi.org/10.1154/s0376030800021145.

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Electron induced X-ray mapping together with modern SEM/EDX analysis systems has reached a high level of perfection due to established methods of beam deflection and focusing and today's standard in energy dispersive X-ray detection and data processing. X-ray analysis of specimens based on X-ray excitation (XRF/XRD) is routinely performed on comparatively large specimen areas without conserved spatial information. XRF-/XRD-imaging capabilities are not yet commonly available on standard spectrometers, since both suitable X-ray optical elements are missing and there is a large intensity loss due
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3

Chung, Frank H. "Unified Theory for Decoding the Signals from X-Ray Florescence and X-Ray Diffraction of Mixtures." Applied Spectroscopy 71, no. 5 (2016): 1060–68. http://dx.doi.org/10.1177/0003702816664105.

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For research and development or for solving technical problems, we often need to know the chemical composition of an unknown mixture, which is coded and stored in the signals of its X-ray fluorescence (XRF) and X-ray diffraction (XRD). X-ray fluorescence gives chemical elements, whereas XRD gives chemical compounds. The major problem in XRF and XRD analyses is the complex matrix effect. The conventional technique to deal with the matrix effect is to construct empirical calibration lines with standards for each element or compound sought, which is tedious and time-consuming. A unified theory of
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4

Gilfrich, N. L., D. E. Leyden, and E. A. Erslev. "XRF Macroprobe Analysis of Geologic Materials." Advances in X-ray Analysis 33 (1989): 593–601. http://dx.doi.org/10.1154/s0376030800020061.

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An x-ray fluorescence macroprobe was built for intermediate-scale compositional mapping to bridge the gap in spatial resolution between bulk x-ray fluorescence and electron beam methods. The macroprobe was optimized for quantitative whole rock mapping on a millimeter scale to evaluate changes in bulk composition of fine-grained mineral aggregates.
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5

Kerner, Jonathan A., Edward D. Franco, and John Marshall. "Combined XRD and XRF Analysis for Portable and Remote Applications." Advances in X-ray Analysis 38 (1994): 319–24. http://dx.doi.org/10.1154/s037603080001795x.

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Abstract A prototype instrument, which provides x-ray powder diffraction and x-ray fluorescence analysis in a compact unit, has been developed to support the needs of NASA for planetary exploration. The instrument uses a 9-watt Fe-anodc x-ray tube and CCD in a fixed geometry for recording powder patterns with a 2θ range of 35°. The fluorescence spectrum for elements below Fe is collected simultaneously with the diffraction data. A shuttered Cd-109 isotopic source with emissions at 22 and 80 keV is used to excite higher energy fluorescence. The low-energy limit for discriminating single photon
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6

Bortolotti, M., L. Lutterotti, and G. Pepponi. "Combining XRD and XRF analysis in one Rietveld-like fitting." Powder Diffraction 32, S1 (2017): S225—S230. http://dx.doi.org/10.1017/s0885715617000276.

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X-ray diffraction (XRD) and X-ray fluorescence (XRF) are widely used analytical techniques for materials characterization; the information they provide can be considered complementary, as the former is mostly used to obtain crystallographic information and analyze phase content, whereas the latter is sensitive to elemental composition. Many researchers and technologists working in a variety of application fields already use them together in some sort of a “combined” approach, by separately performing XRD and XRF data collection and analysis on the same sample and then comparing the analytical
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Chung, Frank H. "Quantitative X-ray diffraction and X-ray fluorescence analyses of mixtures – unified and simplified." Journal of Applied Crystallography 51, no. 3 (2018): 789–95. http://dx.doi.org/10.1107/s1600576718005228.

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Owing to the complex matrix effects, the current approach to quantitative X-ray diffraction (XRD) and X-ray fluorescence (XRF) analyses of mixtures requires calibration lines from standards, and is hence tedious and time consuming. New insights reveal that both the matrix effects and the calibration lines can be eliminated mathematically. Any complex mixture can be transformed into a set of simple binary mixtures. One straightforward formula decodes both XRD and XRF. A single XRD or XRF scan quantifies the chemical compounds or chemical elements in any mixture. The unified and simplified proce
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8

Hien, P. Z., N. T. Anh, D. D. Thao, and T. Truong. "X-ray fluorescence /XRF/ analysis with71Ge excitation source." Journal of Radioanalytical and Nuclear Chemistry Letters 118, no. 3 (1987): 217–24. http://dx.doi.org/10.1007/bf02169558.

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9

Ingham, Mark N., and Bruno A. R. Vrebos. "High Productivity Geochemical XRF Analysis." Advances in X-ray Analysis 37 (1993): 717–24. http://dx.doi.org/10.1154/s0376030800016281.

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XRF has become over the years a method of choice when dealing with elemental analysis of large quantities of samples. Geochemical analysis pushes the technique to its limits because of the large number of samples to be analysed as well as the lower limits of detection required for many trace elements of geochemical and economic importance. The Analytical Geochemistry Group at the British Geological Survey (BGS) has access to a wide variety of methods for instrumental analysis. Instrumental methods for inorganic analysis include x-ray fluorescence as well as DC arc emission spectrometry, atomic
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10

He, Z., Y. J. Xu, N. Huang, et al. "Optimization of parameters for portable X-ray diffraction/X-ray fluorescence combined analysis device (P-XRDF-CAD)." Journal of Instrumentation 18, no. 09 (2023): P09027. http://dx.doi.org/10.1088/1748-0221/18/09/p09027.

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Abstract This paper aims to optimize the parameters of a portable device that combines X-ray diffraction (XRD) and X-ray fluorescence (XRF) analysis techniques. By using the same X-ray source and detector, the device enables the simultaneous acquisition of two-dimensional XRD and XRF information from a sample with the advantage of high analysis efficiency and consistency in the measurement points. The equipment and slit materials are discussed, including the selection of the X-ray source (Moxtek MAGNUM) and the detector (Andor CCD camera). We also explore two different slit designs (the bottom
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11

A.Vaishnavi. "Portable X-Ray Fluorescence-A Versatile Tool for Analysis." International Journal of Pharmacy and Biological Sciences (IJPBS) 14, no. 1 (2024): 101–9. https://doi.org/10.5281/zenodo.11119082.

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AbstractThe elemental analysis technique known as portable XRF spectrometer, or pXRF, is a rapid, affordable, non-destructive, and sustainable method to assess the elements in a variety of liquid and solid samples. Since food samples are easy to evaluate, rapid, simple, and accurate, it is desirable and promising to utilize pXRF to detect and fingerprint components in food products. We emphasized on reading the literature and making careful assessments of analytical elements such as linearity, LOD, LOQ, calibration methods, and the pXRF instrument's working mode. This accurate analysis, which
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12

Revenko, A. G. "X-Ray Fluorescence Analysis in Biology and Medicine." Аналитика и контроль 24, no. 4 (2020): 236–76. http://dx.doi.org/10.15826/analitika.2020.24.4.005.

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X-ray fluorescence analysis (XRF) is widely used when determining the concentrations of elements in various materials in biological research. Current review considers the achievements related to the features of the XRF method. X-ray fluorescence analysis in most cases is a non-destructive method that has proven its potential for measuring the concentrations of elements with a high atomic number Z in organs and tissues in vivo. The main areas of its application in biology and medicine are content determination of basic and toxic elements in plants, samples of bones, teeth, hairs, nails and tiss
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13

Iida, Atsuo. "Semiconductor Surface Characterization by Synchrotron X-ray Fluorescence Analysis." Advances in X-ray Analysis 34 (1990): 23–33. http://dx.doi.org/10.1154/s0376030800014300.

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Recently, external X-ray total reflection, or the grazing-incidence condition, is being widely used for the surface characterization in various research fields. Surface X-ray diffraction, or grazing-incidence diffraction/scattering, and total-reflection fluorescence XAFS (X-ray absorption fine structure) are typical, powerful techniques for surface characterization. X-ray fluorescence (XRF) analysis under the total-reflection condition has also been attracting much attention regarding analytical applications. Two types of XRF experiments have been carried out under the grazing-incidence condit
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Moreno-Díaz, Cristina, Piera Maresca, Jesús Caja García, and Alberto Andrés Dámaso. "Surface Quality Control by X-Ray Fluorescence." Key Engineering Materials 959 (October 6, 2023): 139–48. http://dx.doi.org/10.4028/p-9jbaon.

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Elemental analysis by X-ray fluorescence, XRF, is a well-known technique, widely used in laboratories and industrial plants. XRF equipment manufacturers offer accessories and programs to integrate their equipment into automated plants and use it as quality control tools. The relationshipbetween the surface roughness of the samples and the quality of the measurement is studied and its physical principles are known. In this work it is proposed to use an XRF equipment to analyze the surface roughness of the elements produced in chain, and establish a pass/do not pass control of a batch.By integra
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15

Sabri, Mohammed M. "Chemical and Structural Analysis of Rocks Using X-ray Fluorescence and X-ray Diffraction Techniques." ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY 8, no. 1 (2020): 79–87. http://dx.doi.org/10.14500/aro.10643.

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Rock examinations for mining and commercial use are a vital process to save money and time. A variety of methods and approaches have been used to analyze rocks and among them, X-ray fluorescence (XRF), and X-ray diffraction (XRD) techniques proved to be an accurate method. This research was conducted to evaluate the utility and reliability of XRF and XRD to analyze the major and trace elements of rocks as well as their crystalline structures. Results showed that XRF and XRD techniques are fast and reliable, nondestructive and non-invasive analytical tools for mineral analysis, particularly for
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16

Eveno, Myriam, Brice Moignard, and Jacques Castaing. "Portable Apparatus for In Situ X-Ray Diffraction and Fluorescence Analyses of Artworks." Microscopy and Microanalysis 17, no. 5 (2011): 667–73. http://dx.doi.org/10.1017/s1431927611000201.

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AbstractA portable X-ray fluorescence/X-ray diffraction (XRF/XRD) system for artwork studies has been designed constructed and tested. It is based on Debye Scherrer XRD in reflection that takes advantage of many recent improvements in the handling of X-rays (polycapillary optics; advanced two-dimensional detection). The apparatus is based on a copper anode air cooled X-ray source, and the XRD analysis is performed on a 5–20 μm thick layer from the object surface. Energy dispersive XRF elemental analysis can be performed at the same point as XRD, giving elemental compositions that support the i
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17

Hayakawa, Shinjiro, Shunji Goto, Takashi Shoji, Eiji Yamada, and Yohichi Gohshi. "X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU." Journal of Synchrotron Radiation 5, no. 3 (1998): 1114–16. http://dx.doi.org/10.1107/s090904959701892x.

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An X-ray microprobe system for X-ray fluorescence (XRF) analysis and spectroscopy has been developed at SPring-8 BL39XU; it comprises an X-ray focusing or collimation system, energy-dispersive (ED) and wavelength-dispersive (WD) XRF spectrometers, and a sample-scanning system. The conventional ED spectrometer will be utilized for qualitative and quantitative trace-element analysis, and the WD spectrometer will be used both for trace-element analysis and XRF spectroscopy. A combination of monochromated undulator radiation and the WD spectrometer will enable resonant XRF spectroscopy using brill
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18

Abubaker, Shawbo A., Faten A. Chaqmaqchee, and Akram H. Taha. "Identification and Characterization of Different Types of Plastics Wastes Using X-Ray Diffraction and X-Ray Fluorescence Techniques." ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY 9, no. 2 (2021): 22–25. http://dx.doi.org/10.14500/aro.10840.

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In this study, different types of polymers in postconsumer plastics with pure plastics have been studied. Highdensity polyethylene (HDPE1 and HDPE2), polyvinyl chloride (PVC3 and PVC4), polyethylene terephthalate (PET5 and PET6), and polypropylenes (PP7 and PP8) were compared using X-ray diffraction (XRD) and X-ray fluorescence (XRF) techniques. XRF has shown the spectral in K-lines of polymer materials present in plastics waste. The peak intensity and degree of crystallinity of commercial polymers are varied using XRD analysis. The intensity not attributable to the crystalline peaks may be re
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19

Mustafa, Rebaz M., Bashdar I. Meenaa, Emad K. Mohammed, et al. "Estimation of Minor and Trace Elements Concentration and Investigation of Chemical Composition of Kidney Stones in Kurdistan Region." Oriental Journal Of Chemistry 39, no. 2 (2023): 439–45. http://dx.doi.org/10.13005/ojc/390224.

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Investigations of the chemical composition of kidney stones are essential for understanding of the nature formation of stones and for the development of preventative treatment methods. Instrumental activation analysis radiations are significant tools for determining the composition of kidney stones. Kidney stones of varying compositions were investigated through the use of X-ray powder diffraction (XRD) and X-ray fluorescence (XRF) techniques. Materials can be observed in two very different ways due to the X-ray photon's unique interaction with matter. Using a combination of X-ray fluorescence
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20

Ahadova, Aybeniz, Ahmad Ahadov, Aqshin Abishov, Muslim Gurbanov, and Sahib Mammadov. "Firing conditions and production techniques of ancient ceramics." Journal of Radiation Researches 11, no. 1 (2024): 23–32. https://doi.org/10.5281/zenodo.14060132.

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During the firing process, the mineral components of ceramics experience phase transitions andchemical composition changes, and these processes depend on the temperature at which they are fired.Comprehensive analysis of ancient ceramics often involves the study of their mineralogical, chemical,and thermal characteristics. By analyzing the data through an interdisciplinary approach usingthermogravimetry (TG), thermoluminescence (TL), X-ray diffraction (XRD), and X-ray fluorescence(XRF) techniques and considering the archaeological context, researchers can draw important conclusionsabout the ori
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21

Engelbrecht, Johann P., Johan P. R. de Villiers, and Stefan W. de Bruyn. "The On-Stream X-Ray Analysis of Slurries for Process Control." Advances in X-ray Analysis 35, A (1991): 661–72. http://dx.doi.org/10.1154/s0376030800009393.

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AbstractAn integrated XRD-XRF system for the on-stream analysis of slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator and a windowless sample presenter. The XRD part of the system is composed of a molybdenum anode X-ray tube, a pyrolytic graphite primarybeam monochromator, a vertical fixed-geometry goniometer, and a simultaneous detector system. The X-ray beam is transmitted through the slurry curtain so that the diffracted intensities are measured in the forward diffracted mode. The energy-dis
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22

Dea, Nadeah amanda, and Sinardi Sinardi. "COMPARATIVE ANALYSIS OF PELLET PRESS AND FUSION BEAD METHODS USING ED-XRF AND WD-XRF INSTRUMENTS." Journal of Scientech Research and Development 7, no. 1 (2025): 702–11. https://doi.org/10.56670/jsrd.v7i1.939.

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Penelitian ini membandingkan metode preparasi Press Pellet dan Fusion Bead dalam analisis kandungan unsur nikel (Ni) dan elemen lainnya menggunakan instrumen Energy Dispersive X-Ray Fluorescence [ED-XRF] dan Wavelength Dispersive X-Ray Fluorescence [WD-XRF]. Nikel merupakan mineral logam yang terbentuk ketika batuan ultrabasa mengalami pelapukan kimia, dan metode XRF dipilih karena ketepatan dan kecepatannya dalam menentukan kadar logam. Hasil penelitian menunjukkan bahwa metode Press Pellet memiliki keunggulan dalam efisiensi waktu, sedangkan metode Fusion Bead menghasilkan data yang lebih st
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Herm, Christoph. "Mobile Micro-X-ray Fluorescence Analysis (XRF) on Medieval Paintings." CHIMIA International Journal for Chemistry 62, no. 11 (2008): 887–98. http://dx.doi.org/10.2533/chimia.2008.887.

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Herholz, C., M. Flisch, D. Rinaldi, M. Dreier, A. Ammann, and C. Kopp. "Metal analysis of horse bits using X-ray fluorescence (XRF)." Pferdeheilkunde Equine Medicine 35, no. 3 (2019): 234–39. http://dx.doi.org/10.21836/pem20190304.

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Gibson, Walter M., Z. W. Chen, and Danhong Li. "High-Definition X-Ray Fluorescence: Applications." X-Ray Optics and Instrumentation 2008 (September 30, 2008): 1–17. http://dx.doi.org/10.1155/2008/709692.

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Energy dispersive X-ray fluorescence (EDXRF) is a well-established and powerful tool for nondestructive elemental analysis of virtually any material. It is widely used for environmental, industrial, pharmaceutical, forensic, and scientific research applications to measure the concentration of elemental constituents or contaminants. The fluorescing atoms can be excited by energetic electrons, ions, or photons. A particular EDXRF method, monochromatic microbeam X-ray fluorescence (MμEDXRF), has proven to be remarkably powerful in measurement of trace element concentrations and distributions in a
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Bukit, Nurdin, Erna Frida, Ferry Rahmat Astianta Bukit, and Bunga Fisikanta Bukit. "Analysis structure and morphology of bentonite-opba nanocomposites as nanofillers." Journal of Applied Research and Technology 20, no. 2 (2022): 117–25. http://dx.doi.org/10.22201/icat.24486736e.2022.20.2.1710.

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used as a nanofiller. The methods used to synthesis bentonite nanoparticles are ball mill and co-precipitation and modification with surfactant cetyltrimethylammonium bromide (CTAB). Likewise, the OPBA synthesis process with the ball mill process and co-precipitation. Characterization using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), scanning electron microscope (SEM), FTIR and X-ray fluorescence (XRF). The results of characterization using XRD showed a decrease in particle size in bentonite-OPBA nanocomposites. The SEM results show uniformity of particle size in B
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Gilfrich, John V. "Synchrotron Radiation X-Ray Fluorescence Analysis." Advances in X-ray Analysis 32 (1988): 1–7. http://dx.doi.org/10.1154/s0376030800020243.

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The physical principles giving rise to synchrotron radiation(SR), the facilities necessary to make use of this source of radiation and the way in which it can be used for x-ray diffraction experiments have been described in other parts of this proceedings. The use of synchrotron radiation as an excitation source for x-ray fluorescence takes advantage of many of its unique properties to provide the potential for an improved analytical capability, beyond that which can be realized with more conventional laboratory x-ray sources. Workers around the world are studying this application (as well as
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Rodriguez, Mark A., Paul G. Kotula, James J. M. Griego, Jason E. Heath, Stephen J. Bauer, and Daniel E. Wesolowski. "Multivariate statistical analysis of micro-X-ray fluorescence spectral images." Powder Diffraction 27, no. 2 (2012): 108–13. http://dx.doi.org/10.1017/s0885715612000243.

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Multivariate statistical analysis (MSA) is applied to the extraction of chemically relevant signals acquired with a micro-X-ray fluorescence (μ-XRF) mapping (full-spectral imaging) system. The separation of components into individual histograms enables separation of overlapping peaks, which is useful in qualitatively determining the presence of chemical species that have overlapping emission lines, and holds potential for quantitative analysis of constituent phases via these same histograms. The usefulness of MSA for μ-XRF analysis is demonstrated by application to a geological rock core obtai
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Barcellos, Lins Sergio Augusto, Boris Bremmers, and Giovanni Ettore Gigante. "XISMuS — X-ray fluorescence imaging software for multiple samples." SoftwareX 12, July–December 2020 (2020): 100621. https://doi.org/10.1016/j.softx.2020.100621.

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X-rays have long been used as a non-destructive analytical technique to investigate artefacts and objects that can be considered cultural heritage. With the unceasing development of technologies and miniaturization of electronics, X-ray Fluorescence (XRF) analysis has undergone a natural evolution, being now extensively used in a bi-dimensional manner, scanning whole surfaces and generating astonishing amounts of data. Evaluating all this data demands a software distribution or at least a stand-alone algorithm. The former being an obvious choice, as software are easy to install and the learnin
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Nakai, Izumi, and Atsuo Iida. "Application of SR-XRF Imaging and Micro-Xanes to Meteorites, Archaeological Objects and Animal Tissues." Advances in X-ray Analysis 35, B (1991): 1307–15. http://dx.doi.org/10.1154/s0376030800013641.

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AbstractSynchrotron Radiation Induced X-ray Fluorescence analysis was successfully applied to the analyses of meteorites, archaeological objects and animal tissues. Electronic states of Fe and Ti in chondrules of chondrites were clarified by micro-XANES to be Fe2+ and Ti4+. Ancient iron implement (B.C. 3c A.D. 3c) with zoning of rusts was characterized by micro-XANES. Two dimensional chemical state analyses of the sample were made by selective excitation of iron. Trace element analyses of Cu, Zn, Se, and Hg in the brain and kidney of rat, mouse, and guinea pig dosed with alkyl mercury and/or S
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Schreiner, M., B. Frühmann, D. Jembrih-Simbürger, and R. Linke. "X-rays in art and archaeology: An overview." Powder Diffraction 19, no. 1 (2004): 3–11. http://dx.doi.org/10.1154/1.1649963.

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An overview of the techniques used in art and archaeology is presented and the applicability of X-ray radiography, X-ray fluorescence (XRF), and X-ray diffraction analysis (XRD) as a tool for nondestructive investigations of objects of art and archaeology is discussed. X-ray radiography, for example, is a standard technique widely used and accepted by art historians, archaeologists, curators, and conservators as this method enables information about the manufacturing process and the condition of an object without “touching” the artifact. XRF and XRD enable a nondestructive determination of the
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Leland, D. J., D. E. Leyden, and A. R. Harding. "Application of Fundamental Parameter Software to On-Line XRF Analysis." Advances in X-ray Analysis 32 (1988): 39–44. http://dx.doi.org/10.1154/s0376030800020279.

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X-ray fluorescence analysis (XRF) is an analytical method which has been adapted with considerable success to on-line industrial process analysis with various degrees of sophistication. Process analysis XRF systems range from relatively simple units utilizing radioisotope sources with non-dispersive analyzers to complex wavelength dispersive systems in a central location receiving samples from a number of process streams. The advantages of on-line process analytical instrumentation for quality control, regulatory 2 compliance and safety considerations are well documented. ' Advances in the dev
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Valadas, S., A. Candeias, J. Mirão та ін. "Study of Mural Paintings Using In Situ XRF, Confocal Synchrotron-μ-XRF, μ-XRD, Optical Microscopy, and SEM-EDS—The Case of the Frescoes from Misericordia Church of Odemira". Microscopy and Microanalysis 17, № 5 (2011): 702–9. http://dx.doi.org/10.1017/s1431927611000195.

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AbstractIn this work, we present the results of an analytical method developed for detailed pigment identification, stratigraphy, and degradation of the paint layers of mural paintings applied in the study of the 17th century frescoes from the Misericordia Church of Odemira (Southwest Portugal). In situ X-ray fluorescence spectrometry analyses were performed on three panels of the mural paintings and complemented by colorimetric measurements. The different color areas were also sampled as microfragments (approx. 1 mm2) that were studied as taken or mounted in epoxy resin to expose the differen
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Swider, J. R., T. Jach, and E. Steel. "Micro X-ray Fluorescence of Particles Using a Laboratory X-ray Source and Capillary Optics." Microscopy and Microanalysis 5, S2 (1999): 354–55. http://dx.doi.org/10.1017/s1431927600015099.

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Micro X-ray fluorescence (micro-XRF) is a useful nondestructive technique for multielement analysis of samples from a few hundred to a few micrometers in size. Micro-XRF is usually performed at synchrotron sources where element sensitivities are not compromised by micrometer spatial collimation of high flux beams. Ideally, micro-XRF would not have the burden of transporting samples to a synchrotron facility, but could be performed on a laboratory or portable scale. At the National Institute of Standards and Technology we are developing a micro-XRF system that combines a polycapillary optic wit
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Hayashi, Hisashi, and Hitoshi Abe. "X-ray spectroscopic analysis of Liesegang patterns in Mn–Fe-based Prussian blue analogs." Journal of Analytical Atomic Spectrometry 31, no. 8 (2016): 1658–72. http://dx.doi.org/10.1039/c6ja00173d.

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Ebel, H. "X-Ray Fluorescence Analysis (XRP) in Europe." Advances in X-ray Analysis 30 (1986): 7–11. http://dx.doi.org/10.1154/s037603080002108x.

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The European contributions to X-ray fluorescence analysis (XRF) have shown remarkable fluctuations with regard to time and can be divided into three groups, each of them covering about thirty years.At the beginning there was the discovery of X-rays by Röntgen in 1895. He received the first Nobel Prize in physics (1901). Barkla (Nobel Prize in physics 1917) gave a description of the interaction of X–rays with matter–scattering (1904) and polarization (1906), absorption (1909) and fluorescence (1911). In 1912 the crucial experiment of Friedrich, Knipping and von Laue brought the confirmation on
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Kaneyoshi, T., T. Ishihara, H. Yoshioka, et al. "Material analysis end-station of the Hyogo-ken beamline at SPring-8." Journal of Synchrotron Radiation 5, no. 3 (1998): 509–11. http://dx.doi.org/10.1107/s0909049598001502.

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Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC an
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Kišek, Marko, and Zdravko Praunseis. "ELEMENTAL ANALYSIS OF WELDS WITH AN X-RAY FLUORESCENCE ANALYSER." Journal of Energy Technology 9, no. 3 (2024): 61–77. https://doi.org/10.18690/jet.9.3.61-77.2016.

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High-strength low-alloyed (HSLA) steels are often used as an advanced material for the construction of multi-pass welded joints. Chemical analyses of welds are performed with X-ray fluorescencespectrometry (XRF) using an X-ray fluorescence spectrometer (Thermo Scientific Niton XL3t GOLD+). The aim of this paper is to design a measuring table for the x-ray fluorescence analyser. At the endof the research, the experimental results measured with the table are compared with the values obtained from manual measurements.
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39

Willis, James E. "Characterization of Thin Films Using XRF." Advances in X-ray Analysis 33 (1989): 189–95. http://dx.doi.org/10.1154/s0376030800019583.

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Thin film samples represent ideal samples for analysis using X-ray fluorescence in that they tend to be flat, smooth and homogeneous. However, before a sample can be characterized using XRF, several questions must be answered.
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40

Gilfrich, John V. "100 Years of Progress in X-Ray Fluorescence Analysis." Advances in X-ray Analysis 39 (1995): 29–39. http://dx.doi.org/10.1154/s0376030800022424.

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In the 100 years since the landmark work of Wilhelm Conrad Röntgen, much progress has been made in X-ray science and applications. X-ray Fluorescence Analysis (XRF) essentially had its beginning not long after that development, when, in 1913, Moseley demonstrated the relationship between the atomic number of an element and the wavelength of its X-ray spectra. As early as the 1930's, workers were analyzing materials for trace elements. By the time of the 1940's, X-ray spectroscopic instruments were becoming commercially available, and analysts were beginning to appreciate the simplicity of the
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41

Sedlačková, Katarína, Jozef Sitek, Patrik Novák, and Július Dekan. "Analysis of Mount Etna’s volcanic rocks." Journal of Electrical Engineering 72, no. 2 (2021): 106–12. http://dx.doi.org/10.2478/jee-2021-0014.

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Abstract In this work we have analysed the basalt rocks from the area of Mount Etna using 57Fe Mössbauer spectroscopy (MS), X-ray diffraction (XRD) and X-ray fluorescence analysis (XRF). Mössbauer spectroscopy was used to identify and to quantify the content and the magnetic nature of the iron-bearing minerals in the lava samples. Magnetite, olivine, pyroxene, hornblende, hematite and goethite of different relative abundances were found in the investigated samples. X-ray diffraction supported the structural analysis and determined the phases not visible by MS, like albite and calcite. X-ray fl
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42

Rodriguez, Mark A., Mark H. Van Benthem, Donald F. Susan, et al. "Materials assurance through orthogonal materials measurements: X-ray fluorescence aspects." Powder Diffraction 32, no. 2 (2017): 124–32. http://dx.doi.org/10.1017/s0885715617000446.

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X-ray fluorescence (XRF) has been employed as one of several orthogonal means of screening materials to prevent counterfeit and adulterated products from entering the product stream. We document the use of principal component analysis (PCA) of XRF data on compositionally similar and dissimilar stainless steels for the purpose of testing the feasibility of employing XRF spectra to parse and bin these alloys as the same or significantly different alloy materials. The results indicate that XRF spectra can separate and assign alloys via PCA, but that important corrections for detector drift and sc
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43

Sugino, Tomohiro, Ryohei Tanaka, Jun Kawai, Yusuke Takenami, and Jun-ichiro Kadono. "3D-printed compact XRF spectrometer." International Journal of PIXE 27, no. 03n04 (2017): 87–92. http://dx.doi.org/10.1142/s0129083518500080.

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In order to address the applicability of 3D printers to assembling a spectrometer, we made a compact energy dispersive X-ray fluorescence (XRF) spectrometer with the use of a 3D printer and applied it to the measurements of trace elements in multicomponent alloys. The spectrometer was made of polycarbonate. The X-ray path was in the air, and the distance between equipment was designed so as to obtain enough input count rate even though a low-power X-ray source was employed. As an X-ray source and a detector, we used a low-power X-ray tube (4 watts) and a silicon drift detector. Although the ef
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44

Price, C. W., and E. F. Lindsey. "Analysis of electroless nickel thin films." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 510–11. http://dx.doi.org/10.1017/s0424820100086854.

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Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thic
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45

CESAREO, R., V. BISCEGLIE, L. J. PEDRAZA, M. GALLUCCI, G. ALPI, and F. DI SILVERIO. "Analysis of Urinary Calculi Using Photon Induced X-ray Fluorescence (XRF)." British Journal of Urology 58, no. 2-4 (1986): 253–55. http://dx.doi.org/10.1111/j.1464-410x.1986.tb09049.x.

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Cesareo, R., V. Bisceglie, L. J. Pedraza, M. Gallucci, G. Apli, and F. Di Silverio. "Analysis of Urinary Calculi Using Photon Induced X-Ray Fluorescence (XRF)." Journal of Urology 138, no. 1 (1987): 225. http://dx.doi.org/10.1016/s0022-5347(17)43065-5.

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47

Al-Eshaikh, Mohammad A., and Ahmed Kadachi. "Elemental analysis of steel products using X-ray fluorescence (XRF) technique." Journal of King Saud University - Engineering Sciences 23, no. 2 (2011): 75–79. http://dx.doi.org/10.1016/j.jksues.2011.03.002.

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48

Kalnicky, Dennis J. "A Combined Fundamental Alphas/Curve Fitting Algorithm for Routine XRF Sample Analysis." Advances in X-ray Analysis 29 (1985): 451–60. http://dx.doi.org/10.1154/s0376030800010570.

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AbstractAnalysis of sample composition and/or thickness in a routine, process-control or monitoring environment generally requires rapid turn-around time with minimal sample handling. X-ray Fluorescence (XRF) is well-suited for these kinds of analyses and has been applied to various bulk and thin sample applications (1-7). This technique is rapid, precise, non-destructive, and requires minimal sample handling.X-ray Fluorescence is generally considered a secondary analysis technique, that is, instrumentation must be calibrated using known standards before unknown samples may be analyzed (quanti
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49

Arboleda, Johana, and Adriana Echavarría. "X-ray powder diffraction data for two new compounds (NH4)1.5Ni2V2O7(OH)1.5 · H2O and (NH4)1.5Cu1.125Ni1.125V2O7(OH)2 · H2O." Powder Diffraction 26, S1 (2011): S51—S54. http://dx.doi.org/10.1154/1.3660817.

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Two new bimetallic and trimetallic compounds (NH4)1.5Ni2V2O7(OH)1.5 · H2O and (NH4)1.5Cu1.125 Ni1.125V2O7(OH)2 · H2O were synthesized by hydrothermal method and characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), thermogravimetric analysis (TGA), and X-Ray fluorescence (XRF). Crystallographic studies showed that both compounds are hexagonal with space group P-62c.
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50

Chappell, Bruce W. "Trace Element Analysis of Rocks by X-ray Spectrometry." Advances in X-ray Analysis 34 (1990): 263–76. http://dx.doi.org/10.1154/s0376030800014555.

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Undoubtedly the most important applications of X-ray fluorescence spectrometry (XRF) have been in the analysis of major elements where the technique provides a unique method of measuring the concentration of all elements having Z > 10 with extremely good precision in a wide range of matrices. However, XRF is in addition a powerful method for trace element analysis. In this discussion, the principles of the method for the trace element analysis of rocks are outlined, its capabilities are summarized, and the advantages and disadvantages of the technique are pointed out.
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