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Journal articles on the topic 'X-ray Instrumentation'

Author: Grafiati
Published: 4 June 2021
Last updated: 8 February 2022

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1

Ramsey, Brian D., Robert A. Austin, and Rudolf Decher. "Instrumentation for X-ray astronomy." Space Science Reviews 69, no. 1-2 (July 1994): 139–204. http://dx.doi.org/10.1007/bf00756035.

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2

Li, C. K., R. D. Petrasso, K. W. Wenzel, D. H. Lo, and M. C. Borrás. "Comparative study of x‐ray sources characterizing x‐ray instrumentation." Review of Scientific Instruments 66, no. 1 (January 1995): 697–99. http://dx.doi.org/10.1063/1.1146261.

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3

Kovalchuk, M. V., Yu N. Shilin, S. I. Zheludeva, O. P. Aleshko-Ozhevsky, E. H. Arutynyan, D. M. Kheiker, A. Ya Kreines, et al. "X-ray instrumentation for SR beamlines." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 448, no. 1-2 (June 2000): 112–19. http://dx.doi.org/10.1016/s0168-9002(00)00207-2.

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4

Bunaciu, Andrei A., Elena gabriela Udriştioiu, and Hassan Y. Aboul-Enein. "X-Ray Diffraction: Instrumentation and Applications." Critical Reviews in Analytical Chemistry 45, no. 4 (April 2015): 289–99. http://dx.doi.org/10.1080/10408347.2014.949616.

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5

Molodtsov, S. L. "European XFEL: Soft X-Ray instrumentation." Crystallography Reports 56, no. 7 (November 19, 2011): 1217–23. http://dx.doi.org/10.1134/s1063774511070212.

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6

Parrish, W., M. Hart, C. G. Erickson, N. Masciocchi, and T. C. Huang. "Instrumentation for Synchrotron X-Ray Powder Diffractometry." Advances in X-ray Analysis 29 (1985): 243–50. http://dx.doi.org/10.1154/s0376030800010326.

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AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator is step-scanned, and the specimen and scintillation counter are fixed. Both methods use the same instrumentation.
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7

Chatzisotiriou, V., I. Christofis, N. Dimitriou, Ch Dre, N. Haralabidis, S. Karvelas, A. G. Karydas, et al. "X-ray powder crystallography with vertex instrumentation." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 418, no. 1 (November 1998): 173–85. http://dx.doi.org/10.1016/s0168-9002(98)00731-1.

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8

Nordgren, Joseph, and Jinghua Guo. "Instrumentation for soft X-ray emission spectroscopy." Journal of Electron Spectroscopy and Related Phenomena 110-111 (October 2000): 1–13. http://dx.doi.org/10.1016/s0368-2048(00)00154-7.

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9

Espinosa, G. "Instrumentation for X- and gamma-ray spectrometry." Journal of Radioanalytical and Nuclear Chemistry 264, no. 1 (March 2005): 107–11. http://dx.doi.org/10.1007/s10967-005-0682-0.

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10

Baronova, E. O., M. M. Stepanenko, and A. M. Stepanenko. "X-ray spectropolarimeter." Review of Scientific Instruments 79, no. 8 (August 2008): 083105. http://dx.doi.org/10.1063/1.2964121.

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11

Looker, Quinn, Anthony P. Colombo, Mark Kimmel, and John L. Porter. "X-ray characterization of the Icarus ultrafast x-ray imager." Review of Scientific Instruments 91, no. 4 (April 1, 2020): 043502. http://dx.doi.org/10.1063/5.0004711.

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12

Günther, Hans Moritz, Jason Frost, and Adam Theriault-Shay. "MARXS: A Modular Software to Ray-trace X-Ray Instrumentation." Astronomical Journal 154, no. 6 (November 21, 2017): 243. http://dx.doi.org/10.3847/1538-3881/aa943b.

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13

Bras, W., and A. J. Ryan. "Time-Resolved Small-Angle X-ray Scattering Combined with Wide-Angle X-ray Scattering." Journal of Applied Crystallography 30, no. 5 (October 1, 1997): 816–21. http://dx.doi.org/10.1107/s0021889897001040.

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The high X-ray intensity of synchrotron radiation (SR) beamlines makes it possible to perform time-resolved small-angle X-ray scattering (SAXS) experiments. The information that can be obtained by collecting the wide-angle diffraction pattern simultaneously not only increases the information content of an experiment but also increases the reliability of the time-correlations between SAXS and WAXS (wide-angle X-ray scattering) patterns. This is a great advantage for experiments with a time resolution below the level of 1 s per frame. With appropriate instrumentation, this is a time domain that is routinely accessible for a large group of research fields. This has had a considerable impact upon the understanding of fundamental aspects of phase transformations. Not only fundamental processes but also more applied fields have benefited from these developments. In polymer research this has led to a situation in which it has become possible to simulate materials processing techniques on-line. With the advent of third-generation synchrotron-radiation sources (e.g. ESRF, APS, Spring8), it has become possible to develop SAXS/WAXS beamlines that will open up new research opportunities by utilizing the higher intensity, the tuneability and the higher collimation offered by these SR sources. However, some of the instrumentation limits in detector and sample environments that have become apparent in research on second-generation synchrotron-radiation sources still have not been appropriately addressed, which means that in some fields it will not be possible to take full advantage of the superior X-ray beam quality that third-generation synchrotrons can offer. A way in which these instrumentation limits can be overcome is discussed, and the instrumentation for a new bending-magnet beamline at the ESRF is used as an example.
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14

Cash, Webster. "X-ray Interferometry." Symposium - International Astronomical Union 205 (2001): 457–62. http://dx.doi.org/10.1017/s0074180900221761.

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X-rays have tremendous potential for imaging at the highest angular resulution. The high surface brightness of many x-ray sources will reveal angular scales heretofore thought unreachable. The short wavelengths make instrumentation compact and baselines short. We discuss how practical x-ray interferometers can be built for astronomy using existing technology. We describe the Maxim Pathfinder and Maxim missions which will achieve 100 and 0.1 micro-arcsecond imaging respectively. The science to be tackled with resolution of up to one million times that of HST will be outlined, with emphasis on eventually imaging the event horizon of a black hole.
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15

Hitchcock, AP, D. Hernández-Cruz, JJ Dynes, M.-E. Rousseau, and M. Pézolet. "Chemical Imaging by Soft X-ray Scanning Transmission X-ray Microscopy." Microscopy and Microanalysis 12, S02 (July 31, 2006): 1396–97. http://dx.doi.org/10.1017/s1431927606068322.

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16

Hitchcock, Adam P., Peter Krüger, Carla Bittencourt, George D. W. Swerhone, and John R. Lawrence. "Spatially Resolved Soft X-ray Spectroscopy in Scanning X-ray Microscopes." Microscopy and Microanalysis 25, S2 (August 2019): 254–55. http://dx.doi.org/10.1017/s1431927619002009.

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17

Hoshino, Masato, Kentaro Uesugi, Akihisa Takeuchi, Yoshio Suzuki, and Naoto Yagi. "Development of x-ray laminography under an x-ray microscopic condition." Review of Scientific Instruments 82, no. 7 (July 2011): 073706. http://dx.doi.org/10.1063/1.3609865.

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18

Porter, Frederick Scott, Greg V. Brown, Kevin R. Boyce, Richard L. Kelley, Caroline A. Kilbourne, Peter Beiersdorfer, Hui Chen, Stephane Terracol, Steven M. Kahn, and Andrew E. Szymkowiak. "The Astro-E2 X-ray spectrometer/EBIT microcalorimeter x-ray spectrometer." Review of Scientific Instruments 75, no. 10 (October 2004): 3772–74. http://dx.doi.org/10.1063/1.1781758.

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19

Skroblin, D., A. Schavkan, M. Pflüger, N. Pilet, B. Lüthi, and M. Krumrey. "Vacuum-compatible photon-counting hybrid pixel detector for wide-angle x-ray scattering, x-ray diffraction, and x-ray reflectometry in the tender x-ray range." Review of Scientific Instruments 91, no. 2 (February 1, 2020): 023102. http://dx.doi.org/10.1063/1.5128487.

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20

Pablant, N. A., A. Langenberg, J. A. Alonso, M. Bitter, S. A. Bozhenkov, O. P. Ford, K. W. Hill, et al. "Correction and verification of x-ray imaging crystal spectrometer analysis on Wendelstein 7-X through x-ray ray tracing." Review of Scientific Instruments 92, no. 4 (April 1, 2021): 043530. http://dx.doi.org/10.1063/5.0043513.

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21

Yun, Wenbing, SH Lau, Benjamin Stripe, Alan Lyon, David Reynolds, Sylvia JY Lewis, Sharon Chen, Vladimir Semenov, and Richard Ian Spink. "Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation." Microscopy and Microanalysis 22, S3 (July 2016): 118–19. http://dx.doi.org/10.1017/s1431927616001446.

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22

Surman, DJ, C. Blomfield, A. Roberts, and C. Moffitt. "X-ray Photoelectron Spectromicroscopy." Microscopy and Microanalysis 16, S2 (July 2010): 358–59. http://dx.doi.org/10.1017/s1431927610054796.

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23

Failor, B. H., N. Qi, J. S. Levine, H. Sze, and E. M. Gullickson. "Soft x-ray (0.2." Review of Scientific Instruments 75, no. 10 (October 2004): 4026–28. http://dx.doi.org/10.1063/1.1787903.

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24

Smith, Randall. "X-ray observations and analysis with the Chandra X-ray observatory (abstract)." Review of Scientific Instruments 72, no. 1 (January 2001): 1166. http://dx.doi.org/10.1063/1.1326017.

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25

Bozek, J. D. "AMO instrumentation for the LCLS X-ray FEL." European Physical Journal Special Topics 169, no. 1 (March 2009): 129–32. http://dx.doi.org/10.1140/epjst/e2009-00982-y.

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26

Utaka, Tadashi, and Tomoya Arai. "Instrumentation for Total Reflection Fluorescent X-Ray Spectrometry." Advances in X-ray Analysis 35, B (1991): 933–40. http://dx.doi.org/10.1154/s0376030800013124.

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AbstractThis article describes the instrumentation for a total reflection fluorescent x-ray spectrometer. The reflecting intensity and the angular divergence were studied with respect to various kinds of monochromators. Using silicon wafers, the angular divergence effect of the incident beam, surface roughness influences and the smoothing of background x-ray intensity for the improvement of the lower limit of detection were investigated.
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27

Bordessoule, M. "Simple X-ray cameras for beam-line instrumentation." Journal of Physics: Conference Series 425, no. 19 (March 22, 2013): 192018. http://dx.doi.org/10.1088/1742-6596/425/19/192018.

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28

Marshall, Herman L., and Norbert S. Schulz. "Soft X-Ray Polarimeter: Potential Instrumentation and Observations." Acta Polytechnica CTU Proceedings 1, no. 1 (December 4, 2014): 288–92. http://dx.doi.org/10.14311/app.2014.01.0288.

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We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine three Stokes parameters: I, Q, and U - all as a function of energy. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors >90% over the entire 0.2 to 0.8 keV band. This instrument could be used in a small suborbital mission or adapted for use in an orbiting satellite to complement measurements at high energies. We present progress on laboratory work to demonstrate the capabilities of key components.
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29

Jenkins, Ron. "Evolution of X-Ray Instrumentation & Techniques, 1970-1990." Advances in X-ray Analysis 39 (1995): 13–18. http://dx.doi.org/10.1154/s0376030800022400.

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While both X-ray Fluorescence Analysis and X-ray Powder Diffractometry have their roots back in the earlier half of this century it wasn't until the 1960s that the two techniques became widely accepted. The growth in the application of X-ray methods for materials analysis grew rapidly between 1960 and 1970, then gained another major leap forward in the early ‘70s with the introduction of mincomputers. The introduction of Si(Li) detectors in the late’ 60s and early ‘70s added a further dimension to the available instrumentation. This paper reviews the growth in the field of X-ray materials analysis and highlights the major mile-stones in intrumentation and techniques.
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30

Konuma, H., K. Kuroki, K. Kurosawa, and N. Saitoh. "Low Energy X-Ray Transmission Images by using a Microfocus X-Ray Tube and a be-Window X-Ray Image Intensifier(XRII)." Microscopy and Microanalysis 4, S2 (July 1998): 494–95. http://dx.doi.org/10.1017/s1431927600022595.

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Photographs of x-ray transmission images by x-ray films have been used for observing the inside nondestructively. Further, Imaging Plates(IP) are used for precise measurements of x-ray diffraction patterns. But, these integrating area detectors are not suitable for real time nor time resolved measurements. For real time and time resolved measurements, the X-Ray Image Intensifier(XRII, a large image tube that converts an x-ray image into a visible image) is used for biological x-ray TV systems, x-ray nondestructive inspection systems etc. These TV x-ray image systems require high energy x-rays, x-ray tube voltage of 30 to 150 kV, and show faint contrast for x-ray images of light element substances owing to its low absorption coefficients. However, light elements have intense x-ray absorption coefficients in a low energy x-ray region, x-ray tube voltage of 5 to 20 kV, and give fine contrast for x-ray images of light element substances.
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31

Wang, Zhehui, Kaitlin Anagnost, Cris W. Barnes, D. M. Dattelbaum, Eric R. Fossum, Eldred Lee, Jifeng Liu, et al. "Billion-pixel x-ray camera (BiPC-X)." Review of Scientific Instruments 92, no. 4 (April 1, 2021): 043708. http://dx.doi.org/10.1063/5.0043013.

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32

Hayakawa, Y., Y. Takahashi, T. Kuwada, T. Sakae, T. Tanaka, K. Nakao, K. Nogami, M. Inagaki, K. Hayakawa, and I. Sato. "X-ray imaging using a tunable coherent X-ray source based on parametric X-ray radiation." Journal of Instrumentation 8, no. 08 (August 8, 2013): C08001. http://dx.doi.org/10.1088/1748-0221/8/08/c08001.

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33

Arndt, U. W. "Instrumentation in X-ray crystallography: Past, present and future." Notes and Records of the Royal Society of London 55, no. 3 (September 22, 2001): 457–72. http://dx.doi.org/10.1098/rsnr.2001.0157.

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This paper deals with the very great changes in X–ray crystallographic techniques and apparatus over a period of approximately the last 60 years. This is not a general history; it is a personal account of the developments with which I have been directly involved; it is, therefore, biased towards apparatus developments in the field of macromolecular crystallography in which I have worked during most of this period. The bias needs little excuse: many of the new techniques of X–ray crystallography were devised initially for large–molecule structure determinations which had most need of such advances in order to be feasible at all. Among them are the uses of computers in calculating electron density maps, the construction of automatic diffractometers and microdensitometers, the introduction of rotating-anode X–ray generators and of microfocus X–ray tubes, the development of electronic X–ray area detectors, the pioneering work on the use of synchrotron radiation for diffraction studies, the building of three–dimensional atomic models by computer and the complete automation of the mounting, selection and alignment of crystals on the diffractometer.
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34

Davis, Jeffrey M., Julia Schmidt, Martin Huth, Robert Hartmann, Heike Soltau, and Lothar Strüder. "Micro-Focused Five Dimensional X-ray Imaging with the Color X-ray Camera." Microscopy and Microanalysis 24, S1 (August 2018): 986–87. http://dx.doi.org/10.1017/s1431927618005421.

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35

Coffey, T., H. Ade, S. Urquhart, and A. P. Smith. "X-Ray Radiation Damage of Polymers in a Scanning Transmission X-Ray Microscope." Microscopy and Microanalysis 4, S2 (July 1998): 370–71. http://dx.doi.org/10.1017/s1431927600021978.

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We use the Scanning Transmission X-ray Microscope (STXM) at the National Synchrotron Light Source (NSLS) (1) to acquire images and spectra of polymers. To interpret data correctly, the effects X-ray radiation has on polymers must be understood. We have therefore started to characterize radiation damage in a variety of carbonyl containing polymers in two ways. First, we want to ascertain the critical dose for mass loss and the critical dose for the carbonyl in a variety of polymers and relate the critical dose to the polymer structure. (The critical dose is the radiation dose at which the optical density of the material is decreased by 1/e of its original value.) We also want to understand the damage mechanism. STXM acquires images and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra by using X-ray photons to excite inner shell electrons to unoccupied valence orbitals or to the continuum.
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36

Hodoroaba, V.-D., V. Rackwitz, and D. Reuter. "X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM." Microscopy and Microanalysis 15, S2 (July 2009): 1122–23. http://dx.doi.org/10.1017/s1431927609094392.

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37

Baumann, Jonas, Adrian Jonas, Ruth Reusch, Veronika Szwedowski-Rammert, Malte Spanier, Daniel Grötzsch, Kevin Bethke, et al. "Toroidal multilayer mirrors for laboratory soft X-ray grazing emission X-ray fluorescence." Review of Scientific Instruments 91, no. 1 (January 1, 2020): 016102. http://dx.doi.org/10.1063/1.5130708.

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38

Baskaran, R., T. S. Selvakumaran, and C. Sunil Sunny. "Analysis of x-ray spectrum obtained in electron cyclotron resonance x-ray source." Review of Scientific Instruments 77, no. 3 (March 2006): 03C103. http://dx.doi.org/10.1063/1.2147738.

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39

Shibata, Atsushi. "The Evolution of X-ray Analytical Instrumentation at Rigaku Corporation." Advances in X-ray Analysis 39 (1995): 41–46. http://dx.doi.org/10.1154/s0376030800022436.

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Soon after Von Laue's experiment of X-ray diffraction in 1912, a similar experiment was conducted in Japan by Prof. Terada at University of Tokyo. He made direct observation of Laue spots from rock-sault on a fluorescent screen. In 1914, Prof. Nishikawa also at University of Tokyo photographed Laue spots of spinel. The X-ray generator employed was one designed for medical use. The first X-ray diffractometer in Japan was fabricated in the 1920s at the Institute of Physical and Chemical Research, It was designed with reference to Bragg's spectrometer using an ionization chamber as the X-ray detector.In 1932, X-ray generators and cameras were manufactured by Rigaku Denki Mfg., the predecessor of the present Rigaku Corporation, Shimazu Mfg. and some other few companies. X-ray tubes at the time were Coolidge type demountable tubes.
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40

Galler, Andreas, Wojciech Gawelda, Mykola Biednov, Christina Bomer, Alexander Britz, Sandor Brockhauser, Tae-Kyu Choi, et al. "Scientific instrument Femtosecond X-ray Experiments (FXE): instrumentation and baseline experimental capabilities." Journal of Synchrotron Radiation 26, no. 5 (August 9, 2019): 1432–47. http://dx.doi.org/10.1107/s1600577519006647.

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The European X-ray Free-Electron Laser (EuXFEL) delivers extremely intense (>1012 photons pulse−1 and up to 27000 pulses s−1), ultrashort (<100 fs) and transversely coherent X-ray radiation, at a repetition rate of up to 4.5 MHz. Its unique X-ray beam parameters enable novel and groundbreaking experiments in ultrafast photochemistry and material sciences at the Femtosecond X-ray Experiments (FXE) scientific instrument. This paper provides an overview of the currently implemented experimental baseline instrumentation and its performance during the commissioning phase, and a preview of planned improvements. FXE's versatile instrumentation combines the simultaneous application of forward X-ray scattering and X-ray spectroscopy techniques with femtosecond time resolution. These methods will eventually permit exploitation of wide-angle X-ray scattering studies and X-ray emission spectroscopy, along with X-ray absorption spectroscopy, including resonant inelastic X-ray scattering and X-ray Raman scattering. A suite of ultrafast optical lasers throughout the UV–visible and near-IR ranges (extending up to mid-IR in the near future) with pulse length down to 15 fs, synchronized to the X-ray source, serve to initiate dynamic changes in the sample. Time-delayed hard X-ray pulses in the 5–20 keV range are used to probe the ensuing dynamic processes using the suite of X-ray probe tools. FXE is equipped with a primary monochromator, a primary and secondary single-shot spectrometer, and a timing tool to correct the residual timing jitter between laser and X-ray pulses.
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41

Davis, J. M. "R for X-Ray Microanalysis." Microscopy and Microanalysis 19, S2 (August 2013): 832–33. http://dx.doi.org/10.1017/s1431927613006156.

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42

Llovet, Xavier, JoséÈ María Fernández-Varea, Josep Sempau, and Francesc Salvat. "X-ray Microanalysis with PENELOPE." Microscopy and Microanalysis 10, S02 (August 2004): 920–21. http://dx.doi.org/10.1017/s1431927604881923.

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43

Salvat, F., L. Sorbier, X. Llovet, and E. Acosta. "X-Ray Microanalysis with Penelope." Microscopy and Microanalysis 7, S2 (August 2001): 688–89. http://dx.doi.org/10.1017/s1431927600029512.

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Monte Carlo simulation is a suitable tool for the numerical generation of x-ray spectra by electron beams and, more specifically, for the quantification in electron probe microanalysis (EPMA). in this communication we describe the application of the general-purpose code PENELOPE to EPMA. This code simulates electron-photon showers in complex material structures consisting of homogeneous regions of arbitrary composition limited by quadric surfaces. It is devised to cover a wide energy range (from ∼500 eV to about 1 GeV). The interaction models implemented in PENELOPE are based on the most reliable information available. They combine results from first principles calculations (this is the case, e.g., for electron elastic scattering, photon Compton scattering), semiempirical models (in electron inelastic scattering) and information from evaluated data bases. to facilitate the random sampling, the cross sections of various interaction mechanisms are described through analytical expressions, which are adjusted to yield accurate values of relevant transport properties (mass attenuation coefficients, transport mean free paths, stopping powers, . . . ).
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44

Kingston, Andrew M., Glenn R. Myers, Margie P. Olbinado, Alexander Rack, Daniele Pelliccia, and David M. Paganin. "Practical X-ray Ghost Imaging." Microscopy and Microanalysis 24, S2 (August 2018): 134–35. http://dx.doi.org/10.1017/s1431927618013053.

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45

Villanueva-Perez, Pablo, Sasa Bajt, and Henry N. Chapman. "Scanning Compton X-ray Microscopy." Microscopy and Microanalysis 24, S2 (August 2018): 182–83. http://dx.doi.org/10.1017/s1431927618013259.

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46

Kördel, Mikael, Emelie Fogelqvist, Valentina Carannante, Björn Önfelt, Hemanth K. N. Reddy, Kenta Okamoto, Martin Svenda, Jonas A. Sellberg, and Hans M. Hertz. "Biological Laboratory X-ray Microscopy." Microscopy and Microanalysis 24, S2 (August 2018): 348–49. http://dx.doi.org/10.1017/s1431927618014022.

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47

Evans, Scott C., Tom N. Archuleta, John A. Oertel, and Peter J. Walsh. "Quantitative x-ray imager (abstract)." Review of Scientific Instruments 72, no. 1 (January 2001): 705. http://dx.doi.org/10.1063/1.1329655.

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48

Kovalchuk, M. V., A. Yu Kazimirov, and S. I. Zheludeva. "Surface-sensitive X-ray diffraction methods: physics, applications and related X-ray and SR instrumentation." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 101, no. 4 (August 1995): 435–52. http://dx.doi.org/10.1016/0168-583x(95)00377-0.

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49

Haidl, Andreas, Urs Wiesemann, Konstantin Andrianov, Lars Lühl, Thomas Nisius, Aurelie Dehlinger, Hanna Dierks, Birgit KanngieBer, and Thomas Wilhein. "A Portable Endstation for Analytical X-ray Microscopy Using Soft X-ray Synchrotron Radiation." Microscopy and Microanalysis 24, S2 (August 2018): 230–31. http://dx.doi.org/10.1017/s1431927618013508.

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50

Melo, Lis G. A., and Adam P. Hitchcock. "Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer." Microscopy and Microanalysis 24, S2 (August 2018): 460–61. http://dx.doi.org/10.1017/s1431927618014538.

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