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Journal articles on the topic 'X-Ray Micro-diffraction'

Author: Grafiati

Published: 4 June 2021

Last updated: 17 February 2022

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1

Nestola, Fabrizio, Marcello Merli, Paolo Nimis, Matteo Parisatto, Maya Kopylova, Andrea De Stefano, Micaela Longo, Luca Ziberna, and Murli Manghnani. "In situ analysis of garnet inclusion in diamond using single-crystal X-ray diffraction and X-ray micro-tomography." European Journal of Mineralogy 24, no. 4 (July 30, 2012): 599–606. http://dx.doi.org/10.1127/0935-1221/2012/0024-2212.

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2

Musumeci, Daniele, Chunhua Hu, and Michael Ward. "Fighting Counterfeit Drugs Using Micro-X-Ray Diffraction." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1134. http://dx.doi.org/10.1107/s2053273314088652.

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A new protocol using micro-X-ray diffraction is developed to certify the authenticity of drug tablets, and therefore to prevent, deter, or detect counterfeit medicinal products. The method uses X-ray to map hidden patterns printed under the tablet coating and on packages. The patterns such as barcodes and logos are made of compounds approvoved by the Food and Drug Administration. The method is nondestructive, automated and user-friendly. The protocol relies on verification of phase, composition, and pattern readout in a single measurement, which reduces the risk of circumvention.

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3

Duan Zeming, 段泽明, 姜其立 Jiang Qili, 刘俊 Liu Jun, 潘秋丽 Pan Qiuli, and 程琳 Cheng Lin. "Micro Energy Dispersive X-Ray Diffraction Analysis by Polycapillary X-Ray Optics Focusing." Acta Optica Sinica 38, no. 12 (2018): 1230002. http://dx.doi.org/10.3788/aos201838.1230002.

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4

Eatough, M. O., M. A. Rodriguez, D. Dimos, and B. Tuttle. "Microanalysis of Ferroelectric Memories Using Micro X-Ray Diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 244–45. http://dx.doi.org/10.1017/s042482010016368x.

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Since the advent of the microdiffractometer a new world of analysis possibilities have opened. In this paper we will discuss a novel use of microdifraction. We have developed a method for monitoring domain switching in ferroelectric thin films in situ using micro x-ray diffraction (μXRD). μXRD is a nontraditional x-ray diffraction technique which has recently attracted much attention [3]. The microdiffractometer is capable of obtaining a diffraction pattern from 0 – 150° 20 simultaneously from regions as small as 30μm in diameter. The purpose of this study was to determine if ferroelectric switching of ferroelectric Pb(Zr, Ti)O3 (PZT) thin films can be observed using μXRD. This method will be extremely valuable as we target the necessary processing parameters to achieve the desired switching behaviors and to monitor switching in micron-sized devices.

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5

Kirk, C., and G. Cressey. "Pushing the limits of laboratory X-ray (micro) diffraction." Acta Crystallographica Section A Foundations of Crystallography 60, a1 (August 26, 2004): s51. http://dx.doi.org/10.1107/s010876730409899x.

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6

Lau, Deborah, David Hay, and Natasha Wright. "Micro X-ray diffraction for painting and pigment analysis." AICCM Bulletin 30, no. 1 (December 2006): 38–43. http://dx.doi.org/10.1179/bac.2006.30.1.005.

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7

Wang, Hejing, and Jian Zhou. "On the peak shapes of X-ray micro diffraction." Acta Crystallographica Section A Foundations of Crystallography 66, a1 (August 29, 2010): s301—s302. http://dx.doi.org/10.1107/s0108767310093062.

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8

Wroblewski, Thomas, A. Bjeoumikhov, and Bernd Hasse. "Micro Diffraction Imaging of Bulk Polycrystalline Materials." Materials Science Forum 524-525 (September 2006): 273–78. http://dx.doi.org/10.4028/www.scientific.net/msf.524-525.273.

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X-ray diffraction imaging applies an array of parallel capillaries in front of a position sensitive detector. Conventional micro channel plates of a few millimetre thickness have successfully been used as collimator arrays but require short sample to detector distances to achieve high spatial resolution. Furthermore, their limited absorption restricts their applications to low energy X-rays of around 10 keV. Progress in the fabrication of long polycapillaries allows an increase in the sample to detector distance without decreasing resolution and the use of high X-ray energies enables bulk investigations in transmission geometry.

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9

Nichols, M. C., and R. W. Ryon. "An X-Ray Micro-Fluorescence Analysis System With Diffraction Capabilities." Advances in X-ray Analysis 29 (1985): 423–26. http://dx.doi.org/10.1154/s0376030800010533.

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AbstractA prototype X-ray fluorescence system for chemical and phase microanalysis of materials has been developed and tested. Preliminary work with this system has indicated X-ray fluorescence detection limits on the order of 40 picograms for heavier elements such as gold when using a 100 micron collimator, 400 second counting time and a silver anode operating at 12 Kw. Phase identification by X- ray diffraction can be obtained from the same spot. A proposed design for an improved system providing greater elemental sensitivities and capable of semi-automated operation has been completed.

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10

Sun, Tianxi, Meirong Zhang, Xunliang Ding, Zhiguo Liu, Xiaoyan Lin, and Hui Liu. "Characterization of polycapillary X-ray lens for application in confocal three-dimensional energy-dispersive micro X-ray diffraction experiments." Journal of Applied Crystallography 40, no. 6 (November 10, 2007): 1169–73. http://dx.doi.org/10.1107/s0021889807048285.

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A confocal technology based on polycapillary X-ray optics is proposed to perform three-dimensional energy-dispersive micro X-ray diffraction. A three-dimensional energy-dispersive micro X-ray diffractometer based on a polycapillary focusing X-ray lens (PFXRL) in the excitation channel and a polycapillary parallel X-ray lens (PPXRL) in the detection channel has been designed. At 2\theta = 90^ \circ, the lateral resolution l_X \times l_Y of this diffractometer is 49.7 \times 49.9 \rm \micro m at 7.5 keV, and its depth resolution d_Z is 48.1 \rm \micro m at 8.0 keV. The total resolution of this diffractometer in \Delta d/d is 6.5% at 6.4 keV and 2\theta = 140.2^ \circ.

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11

Hofmann, F., X. Song, T. S. Jun, B. Abbey, M. Peel, J. Daniels, V. Honkimäki, and A. M. Korsunsky. "High energy transmission micro-beam Laue synchrotron X-ray diffraction." Materials Letters 64, no. 11 (June 2010): 1302–5. http://dx.doi.org/10.1016/j.matlet.2010.03.014.

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12

Noma, Takashi, Kazuhiro Takada, Hirokatsu Miyata, and Atsuo Iida. "X-ray micro diffraction study on mesostructured silica thin films." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 467-468 (July 2001): 1021–25. http://dx.doi.org/10.1016/s0168-9002(01)00577-0.

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13

Müller, Christian, Morteza Esmaeili, Christian Riekel, Dag W. Breiby, and Olle Inganäs. "Micro X-ray diffraction mapping of a fluorene copolymer fibre." Polymer 54, no. 2 (January 2013): 805–11. http://dx.doi.org/10.1016/j.polymer.2012.10.059.

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14

Lynch, P. A., A. W. Stevenson, D. Liang, D. Parry, S. Wilkins, and N. Tamura. "A laboratory based system for Laue micro x-ray diffraction." Review of Scientific Instruments 78, no. 2 (February 2007): 023904. http://dx.doi.org/10.1063/1.2437777.

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15

Wroblewski, T., A. A. Bjeoumikhov, and B. Hasse. "D004 Micro X-ray Diffraction Imaging of Bulk Polycrystalline Materials." Powder Diffraction 20, no. 2 (June 2005): 173. http://dx.doi.org/10.1154/1.1979023.

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16

Alexeev, A. V., and S. A. Gromilov. "X-Ray Diffraction Study of Micro Amounts of Polycrystalline Samples." Journal of Structural Chemistry 51, no. 4 (August 2010): 744–57. http://dx.doi.org/10.1007/s10947-010-0110-3.

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17

Noma, Takashi, and Atsuo Iida. "Micro X-ray diffraction analysis of thin films using grazing-exit conditions." Journal of Synchrotron Radiation 5, no. 3 (May 1, 1998): 902–4. http://dx.doi.org/10.1107/s090904959701755x.

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An X-ray diffraction technique using a hard X-ray microbeam for thin-film analysis has been developed. To optimize the spatial resolution and the surface sensitivity, the X-ray microbeam strikes the sample surface at a large glancing angle while the diffracted X-ray signal is detected with a small (grazing) exit angle. Kirkpatrick–Baez optics developed at the Photon Factory were used, in combination with a multilayer monochromator, for focusing X-rays. The focused beam size was about 10 × 10 µm. X-ray diffraction patterns of Pd, Pt and their layered structure were measured. Using a small exit angle, the signal-to-background ratio was improved due to a shallow escape depth. Under the grazing-exit condition, the refraction effect of diffracted X-rays was observed, indicating the possibility of surface sensitivity.

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18

He, Bob Baoping. "Microdiffraction using two-dimensional detectors." Powder Diffraction 19, no. 2 (June 2004): 110–18. http://dx.doi.org/10.1154/1.1752948.

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X-ray diffraction analysis on small samples or micro-area of large samples is always a challenge due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution, and preferred orientation. Two-dimensional X-ray diffraction has many advantages in microdiffraction analysis. A two-dimensional detector can collect a large amount of data both in terms of speed and angular coverage. This paper covers some aspects about instrumentation of two-dimensional X-ray diffraction and its applications in phase identification and stress analysis on small samples and micro-area of large samples.

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19

De Nolf, Wout, Frederik Vanmeert, and Koen Janssens. "XRDUA: crystalline phase distribution maps by two-dimensional scanning and tomographic (micro) X-ray powder diffraction." Journal of Applied Crystallography 47, no. 3 (May 29, 2014): 1107–17. http://dx.doi.org/10.1107/s1600576714008218.

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Imaging of crystalline phase distributions in heterogeneous materials, either plane projected or in virtual cross sections of the object under investigation, can be achieved by scanning X-ray powder diffraction employing X-ray micro beams and X-ray-sensitive area detectors. Software exists to convert the two-dimensional powder diffraction patterns that are recorded by these detectors to one-dimensional diffractograms, which may be analysed by the broad variety of powder diffraction software developed by the crystallography community. However, employing these tools for the construction of crystalline phase distribution maps proves to be very difficult, especially when employing micro-focused X-ray beams, as most diffraction software tools have mainly been developed having structure solution in mind and are not suitable for phase imaging purposes.XRDUAhas been developed to facilitate the execution of the complete sequence of data reduction and interpretation steps required to convert large sequences of powder diffraction patterns into a limited set of crystalline phase maps in an integrated fashion.

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20

Tissot, Ralph G., and Raymond P. Goehner. "Diffraction Peaks in X-Ray Spectroscopy: Friend or Foe?" Advances in X-ray Analysis 36 (1992): 89–96. http://dx.doi.org/10.1154/s0376030800018681.

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AbstractDiffraction peaks can occur as unidentifiable peaks in the energy spectrum of an x-ray spectrometric analysis. Recently, there has been increased interest in oriented thin polycrystalline films and epitaxial films on single crystal substrates for electronic applications. Since these materials diffract x-rays more efficiently than randomly oriented polycrystalline materials, diffraction peaks are being observed more frequently in x-ray fluorescent spectra In addition, micro x-ray spectrometric analysis utilizes a small, intense, collimated x-ray beam that can yield well defined diffraction peaks. In some cases these diffraction peaks can occur at the same position as elemental peaks. These diffraction peaks, although a possible problem in qualitative and quantitative elemental analysis, can give very useful information about the crystallographic structure and orientation of the material being analyzed. The observed diffraction peaks are dependent on the geometry of the x-ray spectrometer, the degree of collimation and the distribution of wavelengths (energies) originating from the x-ray tube and striking the sample.

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21

Berberich, F., H. Graafsma, B. Rousseau, A. Canizares, R. Ramy Ratiarison, N. Raimboux, P. Simon, et al. "Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films." Journal of Materials Research 20, no. 12 (December 1, 2005): 3270–73. http://dx.doi.org/10.1557/jmr.2005.0421.

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A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa2Cu3O6+x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO3 substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.

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22

Yamamoto, Naoki, and Shinji Sakata. "Strain Analysis in Fine Al Interconnections by X-Ray Diffraction Spectrometry Using Micro X-Ray Beam." Japanese Journal of Applied Physics 34, Part 2, No. 6A (June 1, 1995): L664—L667. http://dx.doi.org/10.1143/jjap.34.l664.

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23

HORIUCHI, Hiroyuki, and Masahiko TANAKA. "Crystallographic Analyses of Mineral Textures by Micro-area X-ray Diffraction." Journal of the Mineralogical Society of Japan 21, no. 2 (1992): 47–57. http://dx.doi.org/10.2465/gkk1952.21.47.

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24

Reibenspies, Joseph H., and Nattamai S. P. Bhuvanesh. "Combinatorial screening employing nylon loops and micro-X-ray powder diffraction." Journal of Pharmaceutical and Biomedical Analysis 37, no. 3 (March 2005): 611–14. http://dx.doi.org/10.1016/j.jpba.2004.11.007.

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25

Pernot, Etienne, Michel Mermoux, J. Kreisel, O. Chaix-Pluchery, Petra Pernot-Rejmánková, Mikhail Anikin, Bernard Pelissier, A. M. Glazer, and Roland Madar. "X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide." Materials Science Forum 353-356 (January 2001): 283–86. http://dx.doi.org/10.4028/www.scientific.net/msf.353-356.283.

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26

Choi, W. J., T. Y. Lee, K. N. Tu, N. Tamura, R. S. Celestre, A. A. MacDowell, Y. Y. Bong, and Luu Nguyen. "Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction." Acta Materialia 51, no. 20 (December 2003): 6253–61. http://dx.doi.org/10.1016/s1359-6454(03)00448-8.

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27

IZAWA, Matthew R. M., Roberta L. FLEMMING, Neil R. BANERJEE, and Philip J. A. McCAUSLAND. "Micro-X-ray diffraction assessment of shock stage in enstatite chondrites." Meteoritics & Planetary Science 46, no. 5 (April 25, 2011): 638–51. http://dx.doi.org/10.1111/j.1945-5100.2011.01180.x.

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28

Bjelle, Anders, and Bengt Sundström. "MICRO X-RAY DIFFRACTION OF CARTILAGE BIOPSY SPECIMENS IN ARTICULAR CHONDROCALCINOSIS." Acta Pathologica Microbiologica Scandinavica 76, no. 4 (August 18, 2009): 497–500. http://dx.doi.org/10.1111/j.1699-0463.1969.tb03281.x.

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29

Mao, Ho-Kwang, and Russell J. Hemley. "Energy dispersive x-ray diffraction of micro-crystals at ultrahigh pressures." High Pressure Research 14, no. 4-6 (January 1996): 257–67. http://dx.doi.org/10.1080/08957959608201410.

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30

Noyan, I. C. "D-109 Sampling Volume Concerns in Micro X-ray Diffraction—Invited." Powder Diffraction 19, no. 2 (June 2004): 203. http://dx.doi.org/10.1154/1.1779833.

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31

Tardif, Samuel, Alban Gassenq, Kevin Guilloy, Nicolas Pauc, Guilherme Osvaldo Dias, Jean-Michel Hartmann, Julie Widiez, et al. "Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering." Journal of Applied Crystallography 49, no. 5 (August 4, 2016): 1402–11. http://dx.doi.org/10.1107/s1600576716010347.

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Laue micro-diffraction and simultaneous rainbow-filtered micro-diffraction were used to measure accurately the full strain tensor and the lattice orientation distribution at the sub-micrometre scale in highly strained, suspended Ge micro-devices. A numerical approach to obtain the full strain tensor from the deviatoric strain measurement alone is also demonstrated and used for faster full strain mapping. The measurements were performed in a series of micro-devices under either uniaxial or biaxial stress and an excellent agreement with numerical simulations was found. This shows the superior potential of Laue micro-diffraction for the investigation of highly strained micro-devices.

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32

Berti, Giovanni. "Detection and Modelling of Micro-Crystallinity by Means of X-ray Powder Diffractometry." Advances in X-ray Analysis 38 (1994): 405–12. http://dx.doi.org/10.1154/s037603080001805x.

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Methods for detecting and modeling micro-crystallinity are discussed in view of determining the systematic effects produced on powder diffraction patterns by both sample features and instrumentation. The mathematical theory of x-ray powder diffraction is the appropriate developmental base for defining micro-crystallinity models in terms of structural ohservables, as well as the “mean equivalent lattice” in terms of computational approximations. Such a theory indicates the way to detect micro-crystallinity accurately and precisely within the limits of the approximations. Measurements have been carried out on a natural magnetite sample and reported here.

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33

Chen, Hongqiang, Y. Lawrence Yao, and Jeffrey W. Kysar. "Spatially Resolved Characterization of Residual Stress Induced by Micro Scale Laser Shock Peening." Journal of Manufacturing Science and Engineering 126, no. 2 (May 1, 2004): 226–36. http://dx.doi.org/10.1115/1.1751189.

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Single crystal aluminum and copper of (001) and (110) orientation were shock peened using laser beam of 12 micron diameter and observed with X-ray micro-diffraction techniques based on a synchrotron light source. The X-ray micro-diffraction affords micron level resolution as compared with conventional X-ray diffraction which has only mm level resolution. The asymmetric and broadened diffraction profiles registered at each location were analyzed by sub-profiling and explained in terms of the heterogeneous dislocation cell structure. For the first time, the spatial distribution of residual stress induced in micro-scale laser shock peening was experimentally quantified and compared with the simulation result obtained from FEM analysis. Difference in material response and microstructure evolution under shock peening were explained in terms of material property difference in stack fault energy and its relationship with cross slip under plastic deformation. Difference in response caused by different orientations (110 and 001) and active slip systems was also investigated.

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34

Ohta, Noboru, Toshihiko Oka, Katsuaki Inoue, Naoto Yagi, Satoru Kato, and Ichiro Hatta. "Structural analysis of cell membrane complex of a hair fibre by micro-beam X-ray diffraction." Journal of Applied Crystallography 38, no. 2 (March 11, 2005): 274–79. http://dx.doi.org/10.1107/s002188980403403x.

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The cell membrane complex in the cuticle of a human hair fibre or a rat whisker is composed of three layers, that is, β, δ and β layers. The X-ray diffraction technique is a powerful tool to investigate the pathway of aqueous molecules and ions across the cuticle. Small-angle scattering experiments using a micro X-ray beam, which can be applied to a cuticle of 5 µm thickness, provide the structural information on the cell membrane complex without interference from other structures. Taking into account the variation of thickness in the δ and β layers, the overall features of the diffraction profile in a small-angle region can be explained satisfactorily. The method makes it possible to analyse the structure of β, δ and β layers without assuming an ambiguous background in the diffraction profile, and was used for the analysis of a human hair fibre and a rat whisker. In a rat whisker, the X-ray diffraction was stronger and the variation in the layer thickness smaller than in a human hair fibre. This may be due to the fact that the rat whisker had not been washed with soap or cosmetically treated, whereas the variation may depend on the lipids or the proteins that each species naturally has. It is proposed that the method represents convenient tool for quantitative analysis to estimate the thickness of δ and β layers in the cell membrane complex.

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35

Tanaka, Masao, Masahiro Todoh, Takeshi Matsumoto, and Masumi Ihara. "Mechanical Properties of Single Trabecula at Microscale : Elastic Modulus, Hardness and X-ray Diffraction Intensity(Micro- and Nano-biomechanics)." Proceedings of the Asian Pacific Conference on Biomechanics : emerging science and technology in biomechanics 2004.1 (2004): 245–46. http://dx.doi.org/10.1299/jsmeapbio.2004.1.245.

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36

Su, Yang Yu, Liu Ho Chiu, Tao Liang Chuang, Chien Lung Huang, Cheng Yen Wu, and Kuan Chueh Liao. "Retained Austenite Amount Determination Comparison in JIS SKD11 Steel Using Quantitative Metallography and X-Ray Diffraction Methods." Advanced Materials Research 482-484 (February 2012): 1165–68. http://dx.doi.org/10.4028/www.scientific.net/amr.482-484.1165.

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This research compares the difference in determining the austenite amount in SKD 11 tool steel using the micrographic method as opposed to the X-ray diffraction method. Calculating the amount of retained austenite in tool steel using X-ray diffraction analysis requires first taking off the primary carbide content. By etching the SKD11 specimen using Beraha’s CdS reagent, the retained austenite, martensite and carbide are shown as white, red and blue regions in the microstructure, respectively. With quantitative metallography, the retained austenite can be distinguished as separate micro-constituents and properly counted. However, the calculated values are lower than those acquired from the X-ray diffraction. It is more accurate to evaluate the amount of retained austenite with carbide by X-ray diffraction analysis.

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37

Pereira, Filipa, Rui J. C. Silva, António M. Monge Soares, Maria F. Araújo, Maria J. Oliveira, Rui M. S. Martins, and Norberth Schell. "Effects of Long-Term Aging in Arsenical Copper Alloys." Microscopy and Microanalysis 21, no. 6 (October 23, 2015): 1413–19. http://dx.doi.org/10.1017/s1431927615015263.

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AbstractArchaeological materials present unique records on natural processes allowing the study of long-term material behaviors such as structural modifications and degradation mechanisms. The present work is focused on the chemical and microstructural characterization of four prehistoric arsenical copper artifacts. These artifacts were characterized by micro-energy dispersive X-ray fluorescence spectrometry, optical microscopy, scanning electron microscopy with X-ray microanalysis, micro-X-ray diffraction and synchrotron radiation micro-X-ray diffraction. Cu3As is the expected intermetallic arsenide in arsenical copper alloys, reported in the literature as exhibiting a hexagonal crystallographic structure. However, a cubic Cu3As phase was identified by X-ray diffraction in all of our analyzed archaeological artifacts, while the hexagonal Cu3As phase was clearly identified only in the artifact with higher arsenic content. Occurrence of the cubic arsenide in these particular objects, suggests that it was precipitated due to long-term aging at room temperature, which points to the need of a redefinition of the Cu-As equilibrium phase constitution. These results highlight the importance of understanding the impact of structural aging for the assessment of original properties of archaeological arsenical copper artifacts, such as hardness or color.

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38

Baker, Lucas R., Gary M. Pierzynski, Ganga M. Hettiarachchi, Kirk G. Scheckel, and Matthew Newville. "Micro-X-Ray Fluorescence, Micro-X-Ray Absorption Spectroscopy, and Micro-X-Ray Diffraction Investigation of Lead Speciation after the Addition of Different Phosphorus Amendments to a Smelter-Contaminated Soil." Journal of Environmental Quality 43, no. 2 (March 2014): 488–97. http://dx.doi.org/10.2134/jeq2013.07.0281.

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39

Saka, Takashi. "Strain analysis in Si micro-electromechanical systems by dynamical X-ray diffraction." Journal of Applied Crystallography 45, no. 3 (March 31, 2012): 496–502. http://dx.doi.org/10.1107/s0021889812008953.

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Long-range strain in nearly perfect crystalline materials can be detected by dynamical X-ray diffraction. Long-range strain due to uniform bending or torsion is undetectable by conventional methods when the specimen is vertical in a symmetrical Laue setting, but it can be detected by rotating the specimen along the scattering vector. This method is applied to Si devices for a resonating torsion mirror in a micro-electromechanical system. X-ray transmission topography clearly reveals local strain concentrations as enhancements or reductions in the diffraction intensity where non-uniform strain exists. In conjunction with reflection plane-wave topography, a model of local strain is proposed and the strain qualitatively analysed.

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40

Richard, Axel, Etienne Castelier, Herve Palancher, Jean-Sebastien Micha, and Philippe Goudeau. "Elastic strains in polycrystalline UO2 samples implanted with He: micro Laue diffraction measurements and elastic modeling." MRS Proceedings 1514 (2013): 125–30. http://dx.doi.org/10.1557/opl.2013.448.

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Abstract:In the framework of the study of long-term storage of the spent nuclear fuel, polycrystalline UO2 samples have been implanted with He ions. The thin implanted layer, close to the free surface is subjected to elastic stresses which are studied by x-ray diffraction (micro Laue diffraction) and a mechanical modeling. A simple expression of the displacement gradient tensor has been evidenced; it concerns only three terms (ε3, ε4 and ε5) which strongly evolve with considered grain orientations. Finally, we show that results obtained with micro diffraction are in very good agreement with conventional x-ray diffraction measurements done in laboratory at macro scale.

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41

Dobal, P. S., R. S. Katiyar, Y. Jiang, R. Guo, and A. S. Bhalla. "Micro-Raman scattering and x-ray diffraction studies of (Ta2O5)1−x(TiO2)x ceramics." Journal of Applied Physics 87, no. 12 (June 15, 2000): 8688–94. http://dx.doi.org/10.1063/1.373597.

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42

Blanton, Thomas N. "Applications of X-ray microdiffraction in the imaging industry." Powder Diffraction 21, no. 2 (June 2006): 91–96. http://dx.doi.org/10.1154/1.2204059.

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Characterization of materials used in the digital imaging industry has been performed using micro X-ray diffraction (microXRD) techniques. Case studies are described that demonstrate the use of microXRD for identification of phases, texture, and microstructure morphology of components used in imaging applications.

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43

Ning, Guangrong, and Roberta L. Flemming. "Rietveld refinement of LaB6: data from µXRD." Journal of Applied Crystallography 38, no. 5 (September 15, 2005): 757–59. http://dx.doi.org/10.1107/s0021889805023344.

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The Rietveld method of crystal structure refinement was an important breakthrough, allowing crystal structural information to be obtained from powder diffraction data. One remaining challenge is to collect Rietveld-quality data for polycrystalline mineralsin situ, using laboratory-based micro X-ray diffraction (µXRD) techniques. Here a new data collection method is presented, called `multiframes', which produces high-quality data, suitable for Rietveld refinement, using the Bruker D8 DISCOVER micro X-ray diffractometer. 91 frames of two-dimensional X-ray diffraction data were collected for powdered NIST SRM 660 LaB6standard material, using a general area-detector diffraction system (GADDS), at intervals of 0.8° 2θ. For each frame, only the central 1° 2θ was integrated and merged to produce a diffraction profile from 17 to 90° 2θ. Rietveld refinement of this data usingTOPAS2gave a unit-cell parameter (ao) and atomic position of boron (x) for LaB6of 4.1549 (1) Å and 0.1991 (9), respectively (Rwp= 4.26,RBragg= 3.21). The corresponding La—B bond length was calculated to be 3.0522 Å. These parameters are in good agreement with the literature values for LaB6. These encouraging results suggest that Rietveld-quality micro X-ray diffraction data can be collected from the Bruker D8 DISCOVER diffractometer, provided that the GADDS detector is stepped in small increments, for each frame only the central 1° 2θ is integrated at constant arc length, and counting time is sufficient to yield adequate intensity (∼10 000 counts).

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Takakuwa, Osamu, Yuta Mano, and Hitoshi Soyama. "Effect of Hydrogen on the Micro- and Macro-Strain near the Surface of Austenitic Stainless Steel." Advanced Materials Research 936 (June 2014): 1298–302. http://dx.doi.org/10.4028/www.scientific.net/amr.936.1298.

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The objective of this study is to evaluate the effect of hydrogen on the micro-and macro-strain of austenitic stainless steel using X-ray diffraction. When hydrogen is trapped in lattice sites, it can affect both the micro-and macro-strain. The micro-strain was evaluated through fitting profiles to measured X-ray diffraction profile using a fundamental parameter method. The macro-strain, i.e., the residual stress, was evaluated by a 2D method using a two-dimensional PSPC. The experimental samples were charged with hydrogen by a cathodic charging method. The results revealed that the induced residual stress was equi-biaxial and compressive, and that the micro-strain increased. Both of these varied rapidly with increasing hydrogen charging time. Saturation occurred at a compressive stress of around 130 MPa. On reaching saturation, the hydrogen charging was terminated and desorption of hydrogen began at room temperature. Then, the strains decreased and the compressive stress reverted, ultimately, to a tensile stress of 180 MPa. Martensitic transformation occurred due to hydrogen charging and this had a significant effect on the X-ray diffraction profile.

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Murray, Thomas D., Artem Y. Lyubimov, Craig M. Ogata, Huy Vo, Monarin Uervirojnangkoorn, Axel T. Brunger, and James M. Berger. "A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions." Acta Crystallographica Section D Biological Crystallography 71, no. 10 (September 26, 2015): 1987–97. http://dx.doi.org/10.1107/s1399004715015011.

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Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called `fixed-target' sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs.

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Xia, Jin Lan, Hong Chang Liu, Zhen Yuan Nie, Hong Rui Zhu, Yun Yang, Lei Wang, Jian Jun Song, et al. "Characterization of Microbe-Mineral Interfacial Interaction Based on Synchrotron Radiation Techniques." Advanced Materials Research 1130 (November 2015): 123–26. http://dx.doi.org/10.4028/www.scientific.net/amr.1130.123.

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This article presents the progress on characterization of the interfacial interaction between sulfur oxidizing microbes and sulfide minerals by using of synchrotron radiation-based techniques including S/Fe/Cu X-ray absorption near-edge structure spectroscopy (XANES), X-ray Diffraction (XRD), micro-X-ray fluorescence (μ-XRF) mapping and micro-scanning transmission X-ray microscopy (μ-STXM) imaging, together with other accessory approaches such as SEM/EDS, Raman spectroscopy, FT-IR spectroscopy, and electrochemical methods as well as comparative proteomics methodology.

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Xu, Hongliang. "Structure determination from X-ray powder diffraction data at low resolution." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C143. http://dx.doi.org/10.1107/s2053273314098568.

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Knowledge of the structural arrangement of atoms in solids is necessary to facilitate the study of their properties. The best and most detailed structural information is obtained when the diffraction pattern of a single crystal a few tenths of a millimeter in each dimension is analyzed, but growing high-quality crystals of this size is often difficult, sometimes impossible. However, many crystallization experiments that do not yield single crystals do yield showers of randomly oriented micro-crystals that can be exposed to X-rays simultaneously to produce a powder diffraction pattern. Direct Methods routinely solve crystal structures when single-crystal diffraction data are available at atomic resolution (1.0-1.2Å), but fail to determine micro-crystal structures due to reflections overlapping and low-resolution powder diffraction data. By artificially and intelligently extending the measured data to atomic resolution, we have successfully solved structures having low-resolution diffraction data that were hard to solve by other direct-method based computation procedures. The newly developed method, Powder Shake-and-Bake, is implemented in a computer program PowSnB. PowSnB can be incorporated into the state-of-the-art software package EXPO that includes powder data reduction, structure determination and structure refinement. The new combination could have potential to solve structures that have never been solved before by direct-methods approach.

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Hayashi, Makoto, and Shinobu Okido. "Application of X-Ray and Neutron Diffraction Methods to Reliability Evaluation of Structural Components and Electronic Device." Materials Science Forum 490-491 (July 2005): 19–27. http://dx.doi.org/10.4028/www.scientific.net/msf.490-491.19.

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In the X-ray diffraction method, the diffraction intensity, the half-value width, the residual stress and the amount of residual austenitic phase can be measured. By using these parameters, the quality, the mechanical properties and the fatigue strength of materials, the remaining life of fatigue and creep can be evaluated. While the X-ray study has been widely performed for the various kinds of industrial fields in the laboratory, the applications to the actual structure and components have not so many. However, the small size X-ray residual stress analyzer, the position sensitive detector and the micro area diffraction apparatus have been developed for these twenty years. Thus the X-ray diffraction methods have been variously applied to the industrial fields. The X-ray diffraction methods were used to be applied for the large scale structures and machine parts, but recently applied to the semi-conductor fields. On the other hand, the neutron diffraction method has been introduced to measure the residual stresses in the internals of components because of its deep penetration depth. Based on the experiences of X-ray diffraction method, the various kinds of techniques have been proposed. In this paper, the applications of X-ray and neutron diffraction method to the reliability evaluations of structural components and the electronic devices are described.

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Castillo, Francisco, Miguel Avalos Borja, Heather Jamieson, Gerardo Hernández Bárcenas, and Nadia Martínez Villegas. "Identification of diagenetic calcium arsenates using synchrotron-based micro X-ray diffraction." Boletín de la Sociedad Geológica Mexicana 67, no. 3 (2015): 479–91. http://dx.doi.org/10.18268/bsgm2015v67n3a11.

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Das, Rasmi R., W. Pérez, and Ram S. Katiyar. "X-Ray diffraction and micro-raman investigation of (Sr1-xCax)Bi2Ta2O9 ceramics." Integrated Ferroelectrics 37, no. 1-4 (January 2001): 295–303. http://dx.doi.org/10.1080/10584580108015688.

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