Books on the topic 'XAS spectrosopy'

Crist, B. Vincent. Handbook of monochromatic XPS spectra. Chichester: John Wiley, 2000.

Cultural heritage materials: An XPS approach. New York: Nova Science Publishers, 2012.

1948-, Briggs D., ed. High resolution XPS of organic polymers: The Scienta ESCA300 database. Chichester [England]: Wiley, 1992.

An introduction to surface analysis by XPS and AES. Chichester, UK: Wiley, 2004.

Bunker, Grant. Introduction to XAFS: A practical guide to X-ray absorption fine structure spectroscopy. New York: Cambridge University Press, 2010.

Surface analysis of polymers by XPS and static SIMS. Cambridge, U.K: Cambridge University Press, 1998.

Grasserbauer, M. Angewandte Oberflächenanalyse: Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie. Berlin: Springer-Verlag, 1986.

Moulder, John F. Handbook of x-ray photoelectron spectroscopy: A reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, Minn: Perkin-Elmer Corporation, Physical Electronics Division, 1992.

Saffarini, Ghassan. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), differential scanning calorimetry (DSC) and density study of ternary chalcogenide glasses based on Ge-Se and Ge-S. Uxbridge: Brunel University, 1991.

High-Resolution XAS/XES: Analyzing Electronic Structures of Catalysts. Taylor & Francis Group, 2014.

Sa, Jacinto. High-Resolution XAS/XES: Analyzing Electronic Structures of Catalysts. Taylor & Francis Group, 2017.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Xafs For Everyone. Taylor & Francis Inc, 2013.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Limited, John, 2019.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2019.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2019.

Wolstenholme, John, and John F. Watts. An Introduction to Surface Analysis by XPS and AES. Wiley, 2003.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

Bunker, Grant. Introduction to XAFS: A Practical Guide to X-ray Absorption Fine Structure Spectroscopy. Cambridge University Press, 2011.

Introduction to XAFS: A practical guide to X-ray Absorption Fine Structure Spectroscopy. Cambridge University Press, 2010.

XAP: A program for deconvolution and analysis of complex x-ray spectra. Denver, CO: Dept. of the Interior, U.S. Geological Survey, 1989.

Malik, Haleby Abdul, Saudi Arabia. Deputy Ministry for Mineral Resources, and Geological Survey (U.S.), eds. XAP: A program for deconvolution and analysis of complex x-ray spectra. Denver, CO: Dept. of the Interior, U.S. Geological Survey, 1989.

Briggs, D. Surface Analysis of Polymers by XPS and Static SIMS. Cambridge University Press, 2005.

F, Moulder John, and Chastain Jill, eds. Handbook of x-ray photoelectron spectroscopy: A reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, Minn: Perkin-Elmer Corporatioon, Physical Electronics Division, 1992.

Moulder, John F., William F. Stickle, Peter E. Sobol, and Kenneth D. Bomben. Handbook of X Ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of Xps Data. Physical Electronics, 1995.

Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques. Springer-Verlag, Heidelberg, Germany, 2007.