Готові списки джерел за темами / Multilayer film structure

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Добірка наукової літератури з теми "Multilayer film structure"

Автор: Grafiati
Опубліковано: 28 травня 2022
Оновлено: 31 липня 2025

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Статті в журналах з теми "Multilayer film structure"

1

Lai, Bo, Runze Qi, Zengbo Zhang, and Zhanshan Wang. "Study of Optical Performance and Structure of Yb/Al (1.5 wt.% Si) and Yb/Al (Pure) Multilayers Designed for the 73.6 nm Range." Coatings 14, no. 6 (2024): 659. http://dx.doi.org/10.3390/coatings14060659.

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Yb/Al multilayer films exhibit excellent theoretical reflectivity in the 54–90 nm wavelength range. This study attempted to incorporate 1.5% wt.% of Si impurities into Al to suppress the crystallization of Al, reduce interfacial roughness, and enhance the actual reflectivity of the prepared Yb/Al multilayer films. Internal microstructure changes in the film layers before and after Si impurity doping were investigated using GIXRR, AFM, and XRD techniques. The reflectivity of two types of multilayer films, Yb/Al (1.5 wt.% Si) and Yb/Al (pure), was tested to evaluate the effect of Si impurity on
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2

Guo, Dong, Wu Shuai Zheng, Teng Long Huang, Shu Ling Zhang, and Feng Guo. "Friction and Wear Properties of Multilayer Films Designed on Tantalum Substrate." Materials Science Forum 1078 (December 22, 2022): 121–35. http://dx.doi.org/10.4028/p-l75xgh.

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In this paper, a titanium nitride film (TiN) monolayer film was deposited on a pure Tantalum (Ta) substrate with Ti as an intermediate layer by magnetron sputtering technique, and a Ta/Ti/DLC (diamond-like carbon)/Ti/TiN/DLC multilayer film was designed. Raman spectroscopy and scanning electron microscopy were used to observe the film structure and morphology. Friction and wear properties of Ta/Ti/TiN monolayer film and Ta/Ti/DLC/Ti/TiN/DLC multilayer film were analyzed by UMT-3 tester. The results show that the surface of multilayer film is denser and better bonded than TiN monolayer film. Un
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3

Wojcik, Tomasz, Vincent Ott, Sedat Özbilen, et al. "Magnetron sputtered NiAl/TiBx multilayer thin films." Journal of Vacuum Science & Technology A 40, no. 3 (2022): 033410. http://dx.doi.org/10.1116/6.0001734.

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Transition metal diboride-based thin films are currently receiving strong interest in fundamental and applied research. Multilayer thin films based on transition metal diborides are, however, not yet explored in detail. This study presents results on the constitution and microstructure of multilayer thin films composed of TiBx and the intermetallic compound NiAl. Single layer NiAl and TiBx and NiAl/TiBx multilayer thin films with a variation of the individual layer thickness and bilayer period were deposited by D.C. and R.F. magnetron sputtering on silicon substrates. The impact of the operati
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4

Wojcik, Tomasz, Vincent Ott, Sedat Özbilen, et al. "Magnetron sputtered NiAl/TiBx multilayer thin films." Journal of Vacuum Science & Technology A 40, no. 3 (2022): 033410. http://dx.doi.org/10.1116/6.0001734.

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Анотація:
Transition metal diboride-based thin films are currently receiving strong interest in fundamental and applied research. Multilayer thin films based on transition metal diborides are, however, not yet explored in detail. This study presents results on the constitution and microstructure of multilayer thin films composed of TiBx and the intermetallic compound NiAl. Single layer NiAl and TiBx and NiAl/TiBx multilayer thin films with a variation of the individual layer thickness and bilayer period were deposited by D.C. and R.F. magnetron sputtering on silicon substrates. The impact of the operati
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5

Kang, Jihye, Dongsu Park, Donghun Lee, et al. "Enhanced Electrical Properties of AZO/IZO Multilayered Thin Film with Post Laser Annealing Process." Journal of Nanoscience and Nanotechnology 21, no. 3 (2021): 1971–77. http://dx.doi.org/10.1166/jnn.2021.18913.

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In this research, alternative deposition process of ZnO-based thin films have been studied for transparent conducting oxide (TCO) application. To improve the electrical and optical properties of transparent oxide thin films, alternatively stacked Al-doped ZnO and In-doped ZnO thin films were investigated. Multilayer structure of alternative 6 layers of thin films were prepared in this research. Especially, Aluminum and Indium were chosen as dopant materials. Thin films of Al-doped ZnO (AZO) and In-doped ZnO (IZO) were alternatively deposited by spin coating with sol-gel method. After depositio
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6

Zuev S. Yu., Lopatin A. Ya., Luchin V. I., et al. "Comparative study of the thermal stability of Be-based extremeultraviolet pellicles." Technical Physics 92, no. 1 (2022): 68. http://dx.doi.org/10.21883/tp.2022.01.52535.197-21.

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We demonstrate the possibility of manufacturing Be-basedultrathin films with high transmission at wavelengths of 11.4 and 13.5 nm. For free-standing films of Be and Be-based multilayer structures (Si/Be,ZrSi2/Be, Be/BexNy, Zr/Be, Ru/Be, Mo/Be), we determine the thresholds of theabsorbed power at which over a short period (tens of minutes) of vacuumannealing, initially sagging free-standing films became visibly stretchedover the hole. Of the film structures tested here, the Be/BexNy structure(with beryllium nitride interlayers) showed the highest threshold for theabsorbed power (1 W/cm2). Howev
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7

Liu, Yen-Chun, Shih-Nan Hsiao, Ying-Hung Chen, Ping-Yen Hsieh, and Ju-Liang He. "High-Power Impulse Magnetron Sputter-Deposited Chromium-Based Coatings for Corrosion Protection." Coatings 13, no. 12 (2023): 2101. http://dx.doi.org/10.3390/coatings13122101.

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The use of high-power impulse magnetron sputtering (HIPIMS) to deposit chromium-based thin films on brass substrates for the purpose of corrosion-protective coating was investigated. By varying the process parameters (pulse frequency, pulse width and N2 flow rate) and structure design, including single-layer and multilayer structures, the obtained results revealed that the Cr-N films deposited through the use of HIPIMS exhibited higher film density and corrosion resistance compared to traditional direct-current magnetron sputtering. Based on the results of a field test using copper-accelerated
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8

Erwin, Erwin. "Studies on Structural and Magnetic Properties in Co/Sm Multilayers." Jurnal Natur Indonesia 13, no. 1 (2012): 13. http://dx.doi.org/10.31258/jnat.13.1.13-20.

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Анотація:
Co/Sm multilayer films with structure of 20 [Co (x nm)/Sm (1.2 nm)] where x = 1.1, 2.2 and 4.2 nm and 20[Co (4.2nm)/Sm (x nm)] where x=1.2 nm to 7.5 nm were fabricated using dc magnetron sputtering. Each multilayer filmconsisted of 20 bilayers of Co layers with various thicknesses sandwiched with Sm layers. The application of lowangle X-ray diffraction measurements to the characterization of these multilayers is described. The periodiclayered structure with sharp interfaces was observed for all multilayer films. The measured magnetization valuesare lower than the values calculated in terms of
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9

Suzuki, Ryo, Shinji Ishihara, Mitsuru Ohtake, and Masaaki Futamoto. "Fabrication of Tips for Magnetic Force Microscopy Employing Magnetic Multilayer Structures." Key Engineering Materials 605 (April 2014): 465–69. http://dx.doi.org/10.4028/www.scientific.net/kem.605.465.

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Анотація:
Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with [Co (1 nm)/M(1 nm)]20 (M = Pt, Pd, Ni) multilayer films. An MFM tip prepared by coating 40-nm-thick Co film is employed as a reference tip. The influences of M layer material on the spatial resolution and the switching field of MFM tip are investigated. The spatial resolutions of Co/M multilayer coated tips are estimated to be within 9.4 ± 0.3 nm for all the M materials, which is about 6% inferior to that of Co coated tip (8.8 nm). Higher switching fields of 1425 and 825 Oe are respectively observed for th
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Tian, Jun, and Zi Qiong Shi. "PVD Preparation Process of (TiN + CrN) / CrAlN Superhard Nanocomposite Multilayer Coatings." Advanced Materials Research 568 (September 2012): 368–71. http://dx.doi.org/10.4028/www.scientific.net/amr.568.368.

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In this study, multi-source multi-target evaporation-sputtering PVD technology to prepare (TiN + CrN) / CrAlN nanocomposite multilayers, accurate modulation of the composition and structure of the coating can effectively reduce the stress in the coating in order to achieve (TiN + CrN) / CrAlN nano-composite multilayer dielectric films optimized design, to reach a good overall performance. (TiN + CrN) / CrAlN superhard nanocomposite multilayer coatings on the surface of tools and molds with carbide and high-speed tool steel materials, followed by the TiN film; (TiN + CrN) film, in the TiN relat
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Дисертації з теми "Multilayer film structure"

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Souza, Claudio Roberto Lima de. "STRUCTURE-PROPERTY RELATIONSHIPS IN HIGH BARRIER MULTILAYER FILM/FOAM SYSTEMS." Case Western Reserve University School of Graduate Studies / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=case1605692744465504.

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2

Garg, Akhilesh. "Organic Self-Assembled Films for Nonlinear Optics: Film Structure, Composition and Kinetics of Film Formation." Diss., Virginia Tech, 2008. http://hdl.handle.net/10919/28872.

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Organic materials exhibiting second-order non-linear optical (NLO) properties are a key to the development of advanced electro-optic (EO) modulators used in fiber-optic communications system. This work addresses the fabrication and characterization of organic materials with NLO properties using a self-assembly approach by alternately dipping a charged substrate into positively and negatively charged polymers to build up layer-by-layer (LbL) films. The effect of solution pH on the formation of LbL films fabricated using the polycation poly(allylamine hydrochloride) (PAH) and the polyanion poly
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3

Lee, Sangjin. "Structure-Property Relationships in Composite Layers Polymeric Film/Foam Systems." Case Western Reserve University School of Graduate Studies / OhioLINK, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=case1473444646138984.

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4

ZHANG, GUOJUN. "CRYSTALLINE POLYMERS IN MULTILAYERED FILMS AND BLEND SYSTEMS." Case Western Reserve University School of Graduate Studies / OhioLINK, 2014. http://rave.ohiolink.edu/etdc/view?acc_num=case1404923073.

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5

Herbert, Matthew. "Structure Property Relationships in Multilayered Thin Films: Mechanical and Gas Barrier Applications." Case Western Reserve University School of Graduate Studies / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=case1441968026.

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6

Ji, Shanzuo. "BIO-INSPIRED POLYMER LENS SYSTEMS FROM MULTILAYERED FILMS." Case Western Reserve University School of Graduate Studies / OhioLINK, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=case1441292644.

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7

Moussa, Mariam. "Loading of dendrimer nanoparticles into layer-by-layer assembled Poly(diallyl dimethyl ammonium) chloride-(Poly(acrylic acid))n Multilayer Films : Particle Electrokinetics, Film Structure Dynamics and Elasticity." Thesis, Université de Lorraine, 2017. http://www.theses.fr/2017LORR0383/document.

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Une analyse détaillée des propriétés physico-chimiques des nanoparticules (NP) anthropogéniques est nécessaire pour comprendre à un niveau mécanistique leurs interactions/toxicité potentielle avec/envers les composants biotiques des systèmes aquatiques naturels. Une telle analyse est également requise pour réaliser une évaluation complète et une optimisation de la performance des méthodes d’(ultra)filtration développées pour circonscrire le relargage des NPs dans les milieux aquatiques. Dans ce contexte, l'objectif de cette thèse de doctorat était de déchiffrer les processus physico-chimiques
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8

Костенко, М. В., та С. О. Негрійко. "Магнітооптичні властивості плівкових багатошарових структур на основі Fe, Сo, Au і Cu". Thesis, Сумський державний університет, 2013. http://essuir.sumdu.edu.ua/handle/123456789/43971.

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Анотація:
У приладових плівкових багатошарових структурах на основі Fe, Сo, Au і Cu тільки при певних умовах відбувається спін-залежний поляризований перенос електричного заряду, визначальну роль в якому відіграє шорсткість інтерфейсів. Стабілізація певного структурно-фазового стану в даних плівкових системах супроводжується зміною магнітоптичних властивостей. У роботі наведені результати дослідження екваторіального магнітооптичного ефекту Керра (МОКЕ) у дво- та багатошарових плівкових структурах на основі Fe, Сo, Au і Cu
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9

Костенко, Максим Володимирович, Максим Володимирович Костенко, Maksym Volodymyrovych Kostenko, Максим Геннадійович Демиденко, Максим Геннадьевич Демиденко та Maksym Hennadiiovych Demydenko. "Оптичні властивості одношарових плівок Co, Fe і Cu". Thesis, Сумський державний університет, 2015. http://essuir.sumdu.edu.ua/handle/123456789/40922.

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Анотація:
При досліджені фізичних властивостей нанорозмірних багатошарових плівкових структур важливо знати товщини окремих шарів. Зазвичай їх визначають в процесі конденсації методом кварцового резонатора. Після завершення конденсації можна легко визначити загальну товщину плівкової системи, а такий структурний параметр як товщина окремого шару можна визначити руйнівними методами або неруйнівними методами рентгенівської рефлектометрії або еліпсометрії.
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Hatton, Hilary J. "Magnetic and structural studies of nanoscale multilayer and granular alloy systems of Ag and FeCo." Thesis, University of Sheffield, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.286916.

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Книги з теми "Multilayer film structure"

1

FILM-PAK, '87 (1st 1987 Atlanta Ga ). Proceedings of Film-Pak '87: First International Conference on Advanced Films, Foils, and Multilayer Structure. Ryder Associates, 1987.

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2

NATO, Advanced Research Workshop on Magnetism and Structure in Systems of Reduced Dimension (1992 Cargèse France). Magnetism and structure in systems of reduced dimension. Plenum in cooperation with NATO Scientific Affairs Division, 1993.

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3

D, Nguyen Tai, ed. Structure and properties of multilayered thin films: Symposium held April 17-20, 1995, San Francisco, California, U.S.A. Materials Research Society, 1995.

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4

M, Ceglio Natale, Dhez Pierre, Society of Photo-optical Instrumentation Engineers., and University of Alabama in Huntsville. Center for Applied Optics., eds. Multilayer structures and laboratory X-ray laser research: 19-20 August 1986, San Diego, California. SPIE--the International Society for Optical Engineering, 1987.

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5

C, Farrow R. F., North Atlantic Treaty Organization. Scientific Affairs Division., and NATO Advanced Research Workshop on Magnetism and Structure in Systems of Reduced Dimensions (1992 : Cargèse, France), eds. Magnetism and structure in systems of reduced dimension. Plenum Press, 1993.

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6

France) International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures (2nd 2001 Autrans. International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures: TFDOM-2 : Autrans, France, October 18-19, 2001. EDP Sciences, 2001.

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7

Symposium C on Magnetic Thin Films, Multilayers, and Superlattices (1990 Strasbourg, France). Magnetic thin films, multilayers, and superlattices: Proceedings of Symposium C on Magnetic Thin Films, Multilayers, and Superlattices of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. North-Holland, 1991.

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8

F, Marshall Gerald, and Society of Photo-optical Instrumentation Engineers., eds. Applications of thin-film multilayered structures to figured X-ray optics: August 20-22, 1985, San Diego, California. SPIE--the International Society for Optical Engineering, 1985.

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9

M, Clemen B., and Johnson W. L. 1948-, eds. Thin film structures and phase stability: Symposium held April 16-17, 1990, San Francisco, California, U.S.A. Materials Research Society, 1990.

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10

1954-, Bein Thomas, American Chemical Society. Division of Inorganic Chemistry., and American Chemical Society Meeting, eds. Supramolecular architecture: Synthetic control in thin films and solids. American Chemical Society, 1992.

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Частини книг з теми "Multilayer film structure"

1

Zhang, Yafei, and Da Chen. "The FBAR with Membrane Structure." In Multilayer Integrated Film Bulk Acoustic Resonators. Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-31776-7_5.

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Block, Stephan, Olaf Soltwedel, Peter Nestler, and Christiane A. Helm. "Polyelectrolyte Conformation in and Structure of Polyelectrolyte Multilayers." In Multilayer Thin Films. Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527646746.ch12.

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Sukhishvili, Svetlana. "Responsive Layer-by-Layer Assemblies: Dynamics, Structure and Function." In Multilayer Thin Films. Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527646746.ch15.

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Lynn, David M. "A “Multilayered” Approach to the Delivery of DNA: Exploiting the Structure of Polyelectrolyte Multilayers to Promote Surface-Mediated Cell Transfection and Multi-Agent Delivery." In Multilayer Thin Films. Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527646746.ch30.

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Xiao, Karen, and Martin Zatloukal. "Multilayer Die Design and Film Structures." In Film Processing Advances. Carl Hanser Verlag GmbH & Co. KG, 2014. http://dx.doi.org/10.1007/978-1-56990-536-4_3.

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Xiao, Karen, and Martin Zatloukal. "Multilayer Die Design and Film Structures." In Film Processing Advances. Carl Hanser Verlag GmbH & Co. KG, 2014. http://dx.doi.org/10.3139/9781569905364.003.

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Chu, K., and Yao Gen Shen. "Nano-Structured TiN/TiBN Multilayer Thin Films." In Advances in Composite Materials and Structures. Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-427-8.889.

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Li, Ping, Zhuo Li, and Yong Liu. "Band Structures of Multilayer Films with Randomness." In Advances in Computation and Intelligence. Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-16493-4_50.

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Antonov, A. S., and N. A. Buznikov. "Asymmetric Magnetoimpedance in Bimagnetic Multilayered Film Structures." In Proceedings of the Scientific-Practical Conference "Research and Development - 2016". Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-62870-7_12.

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Niedoba, H. "Interactions in Two-Layer Magnetic Films." In Physics, Fabrication, and Applications of Multilayered Structures. Springer US, 1988. http://dx.doi.org/10.1007/978-1-4757-0091-6_60.

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Тези доповідей конференцій з теми "Multilayer film structure"

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Jaeger, M. D., B. R. Pilvelait, and P. J. Magari. "Multilayer Galvanic Cell for Next Generation Corrosion Sensors." In CORROSION 2000. NACE International, 2000. https://doi.org/10.5006/c2000-00302.

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Abstract We describe an improved galvanic corrosion sensor element design that uses a multilayer structure to separate the anode and cathode. The improved design offers significant advantages in sensitivity and lifetime over conventional thin-film galvanic sensors. The sensor element is the key component in an automated corrosion monitoring system that is designed to periodically measure and record corrosive conditions on vehicles, portable equipment, and permanent structures. The information obtained by the system can be used to predict corrosion damage in places that are difficult to access
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Cho, Kyehyun, Y. J. Park, Young Kuk, and T. Sakurai. "BTA Inhibition Mechanism on Clean Cu(110) Surface by Ultraviolet Photoemission Spectroscopy(UPS) and Scanning Tunneling Microscope(STM)." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98245.

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Abstract Adsorption and film growth of the Benzotriazole (BTA) on a copper (110) surface were investigated by the angle-resolved ultra-violet photoemission (UPS), and scanning tunneling microscope (STM). Coverage dependence of the BTA adsorbed structure on the Cu (110) surface exhibited well-ordered c(4x2)structure by STM image and sharp low-energy electron diffraction (LEED) pattern. Further deposition of BTA on monolayer film, polymerized BTA images were observed while a sharp LEED pattern changed to a c(4x2). In a good agreement with STM results, UPS spectra of BTA film by coverage dependen
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Miaoulis, Ioannis N., Haruna Tada, Seth Mann, and Peter Y. Wong. "Selective Multilayer Thin-Film Development in Insects." In ASME 1997 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 1997. http://dx.doi.org/10.1115/imece1997-1309.

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Abstract Multilayer structures of biological thin films play numerous roles in insects, plants, lizards, and birds. Due to microscale radiative effects, small changes in the film thicknesses result in large changes in reflected sunlight and solar absorption. Through selective variations of the thin-film thicknesses and structures, nature has used multilayer structures for a variety of purposes. In butterflies, the thin films result in a colorful iridescence that is used for signaling, courting, camouflage, and display. Moreover, these thin films appear to be multifunctional; the light not refl
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David, Priya, and E. I. Meletis. "Structural and Magnetic Property Characterization of PY/CO Multilayer Films." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-82348.

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Multilayered films have emerged as an attractive choice of coating material in magnetic recording media and magneto-resistance device related applications. These films possess advantages such as excellent magnetic properties, good corrosion resistance and high chemical stability. Hence, it is imperative that their structural and magnetic properties be characterized so that they can be tailored for specific applications. The present study aims towards the development and characterization of Platinum (Pt)/Cobalt (Co) multilayer films for magnetic and structural properties. Pt/Co multilayered fil
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Matyas, Corey, Chenglong You, Yin Huang, Jonathan P. Dowling, and Georgios Veronis. "Optimized Ultrabroadband Absorbing Multilayer Thin Film Structure." In Frontiers in Optics. OSA, 2018. http://dx.doi.org/10.1364/fio.2018.jtu3a.93.

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Shuvalov, Gleb M., and Sergey A. Kostyrko. "Surface self-organization in multilayer film coatings." In PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS WITH HIERARCHICAL STRUCTURE FOR NEW TECHNOLOGIES AND RELIABLE STRUCTURES 2017 (AMHS’17). Author(s), 2017. http://dx.doi.org/10.1063/1.5013877.

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Clemens, B. M., A. P. Payne, T. C. Hufnagel, J. A. Bain, and S. Brennan. "In-Situ Grazing Incidence X-Ray Diffraction During Sputter Deposition." In Physics of X-Ray Multilayer Structures. Optica Publishing Group, 1992. http://dx.doi.org/10.1364/pxrayms.1992.wa4.

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Many aspects of thin film growth can be studied most directly using in-situ techniques. These include a host of critical phenomena which are only observed for very thin layers and are no longer available for study if the film is grown to bulk levels. Although sputter deposition is a very widely used deposition technique both in research and industry, in-situ studies of film growth during sputter deposition are rare. This is primarily because the sputtering gas precludes the use of conventional electron diffraction techniques. Photon based diffraction techniques, on the other hand, are immune t
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Podprocky, T., B. Vandecasteele, J. de Baets, A. van Calster, and J. Bansky. "Integration of thick film resistors in a multilayer structure." In 26th International Spring Seminar on Electronics Technology: Integrated Management of Electronic Materials Production, 2003. IEEE, 2003. http://dx.doi.org/10.1109/isse.2003.1260501.

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Balasubramanian, K., and H. Angus Macleod. "Performance calculations for multilayer thin-film structures containing a magnetooptical film." In OSA Annual Meeting. Optica Publishing Group, 1986. http://dx.doi.org/10.1364/oam.1986.mz3.

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Calculations of the reflectance, transmittance, Kerr magnetooptical polarization rotation, and related constants are important in the design of multilayer thin-film media for magnetooptical disks for data storage. Different methods have been suggested in the literature for specific structures. Based on the approximations suggested by Tomita and Yoshino1 and using the characteristic matrix methods2 for thin films, a powerful technique has been established and a computer program to calculate all the optical responses of the multilayer structure has been written. Calculations for a few specific m
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Cheng, Y., M. B. Stearns, D. J. Smith, and D. G. Stearns. "Imaging X-Ray Multilayer Structures with Cross-Sectional HREM." In Physics of X-Ray Multilayer Structures. Optica Publishing Group, 1992. http://dx.doi.org/10.1364/pxrayms.1992.pd5.

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High-resolution electron microscopy (HREM), with a resolution below 2Å, is the best tool for observing the actual detailed structure for ML. This gives direct atomic scale information about the film structure, including the bilayer thickness, the crystalline structure and the roughness of the individual layers and the interlayers.
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Звіти організацій з теми "Multilayer film structure"

1

Camley, R. E., and D. L. Mills. Magnetic Structures and Excitations in Thin Films and Multilayers. Defense Technical Information Center, 1991. http://dx.doi.org/10.21236/ada244422.

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Chang, R. P. H. Plasma, photon, and beam synthesis of diamond films and multilayered structures. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/5957670.

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Chang, R. P. H. Plasma, photon, and beam synthesis of diamond films and multilayered structures. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/6978198.

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Chang, R. P. H. Plasma, photon, and beam synthesis of diamond films and multilayered structures. Progress report, July 1, 1990--September 1992. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/10183136.

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Chang, R. P. H. Plasma, photon, and beam synthesis of diamond films and multilayered structures. Progress report, July 1, 1990--June 30, 1991. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/10114429.

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Chang, R. P. H. Plasma, photon, and beam synthesis of diamond films and multilayered structures. Final report for the period July 1996 - December 1998. Office of Scientific and Technical Information (OSTI), 1999. http://dx.doi.org/10.2172/806513.

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