Дисертації з теми "Transmission electron"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся з топ-50 дисертацій для дослідження на тему "Transmission electron".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Переглядайте дисертації для різних дисциплін та оформлюйте правильно вашу бібліографію.
Jin, Liang. "Direct electron detection in transmission electron microscopy." Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.
Title from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).
McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.
Worden, R. H. "Transmission electron microscopy of metamorphic reactions." Thesis, University of Manchester, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.234381.
Chan, Yu Fai. "Nanostructure characterization by transmission electron microscopy /." View Abstract or Full-Text, 2002. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202002%20CHAN.
Includes bibliographical references (leaves 62-63). Also available in electronic version. Access restricted to campus users.
Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Elektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Agarwal, Akshay. "A nanofabricated amplitude-division electron interferometer in a transmission electron microscope." Thesis, Massachusetts Institute of Technology, 2016. http://hdl.handle.net/1721.1/107101.
"September 2016." Cataloged from PDF version of thesis.
Includes bibliographical references (pages 56-62).
Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by Marton and co-workers in 1954, can overcome this limitation. The implementation of these interferometers is hindered by the precise rotational and translational alignment required. This thesis develops a self-aligned, monolithic electron interferometer consisting of two 45 nm thick silicon layers separated by 20 gm and fabricated from a single crystal silicon cantilever on a transmission electron microscope grid by gallium focused ion-beam milling. Using this interferometer, beam path-separation and interference fringes of lattice periodicity and a maximum contrast of 15% in an unmodified 200 kV transmission electron microscope was demonstrated. This interferometer design can potentially be scaled to millimeter-scale and used in electron holography. It can also be applied to perform fundamental physics experiments such as interaction-free measurement with electrons, with the aim of significantly reducing the damage suffered by biological samples during high-resolution microscopy. Thus, the interferometer can serve as a proof-of-concept of the recently proposed 'Quantum Electron Microscope'.
by Akshay Agarwal.
S.M.
Johnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope." Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
The technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Findlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /." Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.
Koda, Nobuko. "Transmission electron microscopy studies of fega alloys." College Park, Md. : University of Maryland, 2003. http://hdl.handle.net/1903/167.
Thesis research directed by: Dept. of Material, Science and Engineering. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
Hetherington, C. "Transmission electron microscopy of GaAs/AlGaAs multilayers." Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967.
Dwyer, C. "Scattering theory for advanced transmission electron microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.598710.
Whittle, Caroline Kay. "Analytical transmission electron microscopy of authigenic chlorites." Thesis, University of Sheffield, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.324284.
Cardoch, Sebastian. "Studying Atomic Vibrations by Transmission Electron Microscopy." Thesis, Uppsala universitet, Materialteori, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-305370.
Zhang, Yucheng. "Characterisation of GaN using transmission electron microscopy." Thesis, University of Cambridge, 2008. https://www.repository.cam.ac.uk/handle/1810/252119.
Bücker, Kerstin. "Characterization of pico- and nanosecond electron pulses in ultrafast transmission electron microscopy." Thesis, Strasbourg, 2017. http://www.theses.fr/2017STRAE014/document.
This thesis presents a study of ultrashort electron pulses by using the new ultrafast transmission electron microscope (UTEM) in Strasbourg. The first part focuses on the stroboscopic operation mode which works with trains of picosecond multi-electron pulses in order to study ultrafast, reversible processes. A detailed parametric study was carried out, revealing fundamental principles of electron pulse dynamics. New mechanisms were unveiled which define the pulse characteristics. These are trajectory effects, limiting the temporal resolution, and chromatic filtering, which acts on the energy distribution and signal intensity. Guidelines can be given for optimum operation conditions adapted to different experimental requirements. The second part starts with the setup of the single-shot operation mode, based on intense nanosecond electron pulses for the investigation of irreversible processes. Having the first ns-UTEM equipped with an electron energy loss spectrometer, the influence of chromatic aberration was studied and found to be a major limitation in imaging. It has to be traded off with spherical aberration and signal intensity. For the first time, the feasibility of core-loss EELS with one unique ns-electron pulse is demonstrated. This opens a new field of time-resolved experiments
Pierce, William Renton. "High-resolution transmission electron microscopy and electron energy loss spectroscopy of doped nanocarbons." Thesis, University of Manchester, 2014. https://www.research.manchester.ac.uk/portal/en/theses/highresolution-transmission-electron-microscopy-and-electron-energy-loss-spectroscopy-of-doped-nanocarbons(dd1340ba-4a31-49e5-a421-9dd47ea35256).html.
Meng, Ting, and Yating Yu. "Deconvolution algorithms of 2D Transmission Electron Microscopy images." Thesis, KTH, Optimeringslära och systemteori, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-110096.
Chang, Michael Ming Yuen. "A computer-controlled system in transmission electron microscopy." Thesis, University of Cambridge, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292941.
Strobel, Julian [Verfasser]. "Transmission Electron Microscopy on Memristive Devices / Julian Strobel." Kiel : Universitätsbibliothek Kiel, 2019. http://d-nb.info/1185485244/34.
TIYYAGURA, MADHAVI. "TRANSMISSION ELECTRON MICROSCOPY STUDIES IN SHAPE MEMORY ALLOYS." Master's thesis, University of Central Florida, 2005. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/3913.
M.S.M.E.
Department of Mechanical, Materials and Aerospace Engineering;
Engineering and Computer Science
Materials Science and Engineering
Batstone, J. L. "Cathodoluminescence and transmission electron microscopy characterization of ZnSe." Thesis, University of Bristol, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.355952.
Nellist, Peter David. "Image resolution improvement in scanning transmission electron microscopy." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361613.
Holsgrove, Kristina. "Transmission electron microscopy study of domains in ferroelectrics." Thesis, Queen's University Belfast, 2017. https://pure.qub.ac.uk/portal/en/theses/transmission-electron-microscopy-study-of-domains-in-ferroelectrics(e83e215a-bcf7-465b-bab9-31442486bb71).html.
Ramasse, Quentin Mathieu. "Diagnosis of aberrations in scanning transmission electron microscopy." Thesis, University of Cambridge, 2005. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615070.
Webster, Richard Francis. "Transmission electron microscopy of indium gallium nitride nanorods." Thesis, University of Bristol, 2016. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.690381.
McLaren, Mathew Jonathon. "Transmission electron microscope characterisation of iron-rhodium epilayers." Thesis, University of Leeds, 2014. http://etheses.whiterose.ac.uk/8281/.
Soundararajah, Queenie Yoganandhi. "Characterization of InGaN nanorods using transmission electron microscopy." Thesis, University of Bristol, 2016. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.720816.
Gass, Mhairi Hope. "Low-loss electron energy loss spectroscopy in a scanning transmission electron microscope of GaInNAs." Thesis, University of Liverpool, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.415656.
Tanaka, N., H. Iwai, K. Kakushima, E. Okunishi, J. Yamasaki, and S. Inamoto. "Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy." American Institute of Physics, 2010. http://hdl.handle.net/2237/14189.
Ryll, Henning [Verfasser]. "Direct detection of electrons with the pnCCD for applications in transmission electron microscopy / Henning Ryll." Siegen : Universitätsbibliothek der Universität Siegen, 2018. http://d-nb.info/116044370X/34.
Tanaka, H., T. Kojima, H. Tsuruta, J. Chen, T. Tanji, and M. Ichihashi. "Development of a Real-Time Stereo Transmission Electron Microscope." Cambridge University Press, 2005. http://hdl.handle.net/2237/10297.
Tao, Shizhong. "High-resolution transmission electron microscopy of copper-oxide compounds /." [S.l.] : [s.n.], 1994. http://e-collection.ethbib.ethz.ch/show?type=diss&nr=10775.
Pretorius, Angelika. "Transmission electron microscopy of GaN based, doped semiconductor heterostructures." [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=981822002.
Hashimoto, Richard Y. "Analytical transmission electron microscopy studies on copper-alumina interfaces." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1999. http://handle.dtic.mil/100.2/ADA362728.
Cherns, Peter David. "A transmission electron microscopy study of AlGaN/GaN heterostructures." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.597581.
Kuang, Qie. "Structural studies of membrane proteins using transmission electron microscopy." Doctoral thesis, KTH, Strukturell bioteknik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-161721.
QC 20150320
Wisnet, Andreas. "1D TiO2 nanostructures probed by 2D transmission electron microscopy." Diss., Ludwig-Maximilians-Universität München, 2014. http://nbn-resolving.de/urn:nbn:de:bvb:19-179430.
Smith, Jaqueline Margaret. "Microcharacterisation of halogenated copper phthalocyanines using transmission electron microscopy." Thesis, University of Glasgow, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.241835.
Murdoch, Susan Jane Tara. "Transmission electron microscopy study of advanced magnetic sensor films." Thesis, University of Glasgow, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.410170.
Faisal, A. Q. D. "Transmission electron diffraction studies of xenon adsorbed on graphite." Thesis, University of Sussex, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.380531.
Trevor, Colin. "Transmission electron microscopy of chemical vapour deposited diamond films." Thesis, University of Bristol, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.295064.
Jian, Nan. "Scanning transmission electron microscopy of atomic structure of nanoparticle." Thesis, University of Birmingham, 2016. http://etheses.bham.ac.uk//id/eprint/7131/.
Kong, Lisa (Lisa Fanzhen). "High-resolution transmission electron microscopy of III-V FinFETs." Thesis, Massachusetts Institute of Technology, 2018. http://hdl.handle.net/1721.1/119065.
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 47-50).
III-V materials have great potential for integration into future complementary metal-oxide-semiconductor technology due to their outstanding electron transport properties. InGaAs n-channel metal-oxide-semiconductor field-effect transistors have already demonstrated promising characteristics, and the antimonide material system is emerging as a candidate for p-channel devices. As transistor technology scales down to the sub-10-nm regime, only devices with a 3D configuration can deliver the necessary performance. III-V fin field-effect transistors (finFETs) have displayed impressive characteristics but have shown degradation in performance as the fin width is scaled to the sub-10-nm regime. In this work, we use high-resolution transmission electron microscopy (HRTEM) in an effort to understand how interfacial properties between the channel and high-k dielectric affect device performance. At the interface between the channel material, such as InGaSb or InGaAs, and the high-k gate dielectric, properties of interest include defect density, interdiffusion between the semiconductor and dielectric, and roughness of the dielectric - semiconductor interface. Using HRTEM, we can directly study this interface and try to understand how it is affected by different processing conditions and its correlation with device characteristics. In this thesis, we have analyzed both InGaAs and InGaSb finFETs with state-of-the-art fin widths. Analysis of TEM images was combined with electrical data to correlate interfacial properties with device performance. We compared the materials properties of InGaAs and InGaSb and also explored the impact of processing steps on interfacial properties.
by Lisa Kong.
S.B.
Liu, Chuan-Pu. "Characterisation of ultrathin semiconductor layers using transmission electron microscopy." Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624121.
Vaughn, Joel M. "Manipulation Of Nanoscale Objects in the Transmission Electron Microscope." Ohio University / OhioLINK, 2007. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1191525305.
Liberti, Emanuela. "Transmission electron microscopy of titanium dioxide nanoplatelets and nanorods." Thesis, Imperial College London, 2013. http://hdl.handle.net/10044/1/40093.
Kadifachi, Sadiq Hussein. "Electron transmission spectroscopy of some inorganic and organic molecules." Thesis, Birkbeck (University of London), 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.398339.
Shmeliov, Aleksey. "Transmission electron imaging and diffraction characterisation of 2D nanomaterials." Thesis, University of Oxford, 2014. http://ora.ox.ac.uk/objects/uuid:4bc4d60f-4db0-43d2-9119-cb0a0366090e.
Sharp, Joanne. "Electron tomography of defects." Thesis, University of Cambridge, 2010. https://www.repository.cam.ac.uk/handle/1810/228638.
Muto, S., K. Tatsumi, K. Ikeda, and S. Orimo. "Dehydriding process of alpha-AlH3 observed by transmission electron microscopy and electron energy-loss spectroscopy." American Institite of Physics, 2009. http://hdl.handle.net/2237/12636.