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Journal articles on the topic 'AFM Modes'

Author: Grafiati

Published: 6 September 2023

Last updated: 31 July 2025

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1

Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, et al. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach." Beilstein Journal of Nanotechnology 11 (May 4, 2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.

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In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to

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Dillon, Eoghan, Kevin Kjoller, and Craig Prater. "Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale." Microscopy Today 21, no. 6 (2013): 18–24. http://dx.doi.org/10.1017/s1551929513000989.

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Atomic force microscopy (AFM) has been widely used in both industry and academia for imaging the surface topography of a material with nanoscale resolution. However, often little other information is obtained. Contact resonance AFM (CR-AFM) is a technique that can provide information about the viscoelastic properties of a material in contact with an AFM probe by measuring the contact stiffness between the probe and sample. In CR-AFM, an AFM cantilever is oscillated, and the amplitude and frequency of the resonance modes of the cantilever are monitored. When a probe or sample is oscillated, the

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Xia, Fangzhou, and Kamal Youcef-Toumi. "Review: Advanced Atomic Force Microscopy Modes for Biomedical Research." Biosensors 12, no. 12 (2022): 1116. http://dx.doi.org/10.3390/bios12121116.

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Visualization of biomedical samples in their native environments at the microscopic scale is crucial for studying fundamental principles and discovering biomedical systems with complex interaction. The study of dynamic biological processes requires a microscope system with multiple modalities, high spatial/temporal resolution, large imaging ranges, versatile imaging environments and ideally in-situ manipulation capabilities. Recent development of new Atomic Force Microscopy (AFM) capabilities has made it such a powerful tool for biological and biomedical research. This review introduces novel

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Eby, R. K., R. L. McEvoy, and S. Marchese-Ragona. "AFM of polymers using force spectroscopy modes." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1076. http://dx.doi.org/10.1017/s042482010017311x.

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Several novel imaging modes in scanning-probe microscopy are capable of imaging the surface compliance properties of polymers. The atomic-force microscope is used with a silicon nitride cantilever, in contact mode. While scanning, the tip can be modulated with a low amplitude (25 Å) and low frequency (5 kHz), and the amplitude of tip deflection is compared with the input modulation signal. This mode, called modulated force, maps out the surface compliance of a sample, and gives pixel-to-pixel matching with a topography mode image. Alternatively, while scanning a topography mode image, a force-

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Ignat, Ioan, Bernhard Schuster, Jonas Hafner, MinHee Kwon, Daniel Platz, and Ulrich Schmid. "Intermodal coupling spectroscopy of mechanical modes in microcantilevers." Beilstein Journal of Nanotechnology 14 (January 19, 2023): 123–32. http://dx.doi.org/10.3762/bjnano.14.13.

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Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries of nanotechnology. Fundamental research in atomic interactions, molecular reactions, and biological cell behaviour are key focal points, demanding a continuous increase in resolution and sensitivity. While renowned fields such as optomechanics have marched towards outstanding signal-to-noise ratios, these improvements have yet to find a practical way to AFM. As a solution, we investigate here a mechanism in which individual mechanical eigenmodes of a microcantilever couple to one another, mimicking opt

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Dzedzickis, Andrius, Justė Rožėnė, Vytautas Bučinskas, Darius Viržonis, and Inga Morkvėnaitė-Vilkončienė. "Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy." Materials 16, no. 19 (2023): 6379. http://dx.doi.org/10.3390/ma16196379.

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In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The main questions the review addresses are the problems of working in contact, noncontact, and tapping AFM modes. We do not include applications of AFM but rather the design of different parts and operation modes. Since the main part of AFM is the cantilever, we focused on its operation and design. Infor

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Sadžak, Anja, Lucija Mandić, Suzana Šegota, and Vida Strasser. "Use of atomic force microscopy for characterization of model membranes and cells." Periodicum Biologorum 125, no. 1-2 (2023): 101–13. http://dx.doi.org/10.18054/pb.v125i1-2.24080.

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Background: To provide a fundamental understanding of the potential and use of atomic force microscopy (AFM) in medicine and the life sciences, this work presents a thorough description of imaging and non-imaging atomic force microscopy modes for characterizing model membranes and cells at the nanoscale. Methods: The imaging and non-imaging AFM modes are described with examples in terms of the characterization of topographic, morphological, and nanomechanical sample properties. Results: AFM imaging of supported lipid bilayers (SLBs) revealed the effects of temperature and medium composition on

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Patel, Anisha N., and Christine Kranz. "(Multi)functional Atomic Force Microscopy Imaging." Annual Review of Analytical Chemistry 11, no. 1 (2018): 329–50. http://dx.doi.org/10.1146/annurev-anchem-061417-125716.

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Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial proce

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Li, Qing Fen, Li Zhu, Guo Jin, and Xiu Fang Cui. "3D-Modeling and Numerical Analysis of Fracture Behavior in AFM-Specimen on Mixed-Mode I-II Loading Condition." Advanced Materials Research 450-451 (January 2012): 1391–94. http://dx.doi.org/10.4028/www.scientific.net/amr.450-451.1391.

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The computational analysis of a three-dimensional (3D) finite element model of all fracture modes (AFM) specimen on mixed-mode I-II fracture was presented in this paper. The separated energy release rates (SERRs) along the crack front of the AFM-model were calculated by the modified virtual crack closure integral (MVCCI)-method and commercially available software ANSYS. The influence of finite geometry and loading angles on mixed mode I-II fracture was investigated.

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Starodubtseva, M. N. "Atomic force microscopy of cells as a method for the study of the pathogenesis and AS THE basis for the development of methods of DISEASE DIAGNOSIS." Health and Ecology Issues, no. 4 (December 28, 2017): 99–106. http://dx.doi.org/10.51523/2708-6011.2017-14-4-21.

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The application of atomic force microscopy (AFM) for the study of micro- and nanoscale areas of the cell surface allows researchers to introduce new cell parameters and to obtain qualitatively new notions about the causes and mechanisms of changes of the cell properties. The aim of the work was to assess the prospects of AFM of cells using the example of blood cells for the study and development of new methods of disease diagnosis based on the specificity of AFM modes of operation and the recent AFM data on the cell surface properties.

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Guzman, Horacio V., Pablo D. Garcia, and Ricardo Garcia. "Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments." Beilstein Journal of Nanotechnology 6 (February 4, 2015): 369–79. http://dx.doi.org/10.3762/bjnano.6.36.

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We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy experiments. The simulator presents the cantilever–tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental situations in air or liquid. The code provides all the variables and parameters relevant in those modes, for example, the instantaneous deflection and tip–surface force, velocity, virial, dissipated energy, sample deformation and peak force as a function of time or distance. The simulator includes a v

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Tang, Deman, and Earl H. Dowell. "Reduced Order Model Analysis for Two-Dimensional Molecular Dynamic Chain Structure Attached to an Atomic Force Microscope." Journal of Dynamic Systems, Measurement, and Control 126, no. 3 (2004): 531–46. http://dx.doi.org/10.1115/1.1789969.

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Dynamic analysis and numerical simulation of a protein-ligand chain structure connected to a moving atomic force microscope (AFM) has been conducted. The elements of the chain are free to extend and rotate relative to each other in a two-dimensional plane. Sinusoidal base excitation of the cantilevered beam of the AFM is considered in some detail. Reduced order (dynamic) models are constructed using global modes for both linear and nonlinear dynamic systems with and without the “nearest neighbor assumption.” The agreement between the original and reduced order models (ROM) is very good even wh

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Blinov, Iliya V., Tatiana P. Krinitsina, Mikhail A. Milyaev, Vladimir V. Popov, and Vladimir V. Ustinov. "Unidirectional Anisotropy in Nanostructures with Antiferromagnetic NiFeMn Layer." Solid State Phenomena 233-234 (July 2015): 517–21. http://dx.doi.org/10.4028/www.scientific.net/ssp.233-234.517.

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Magnetic properties of nanostructures including an antiferromagnetic (NiFe)1-хMnx alloy have been studied for various modes of this AFM layer preparation. The possibility for application of the AFM (NiFe)1-хMnx alloy as a material of the pinning layer in spin valves is discussed.

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Pishkenari, Hossein Nejat, and Ali Meghdari. "Effects of higher oscillation modes on TM-AFM measurements." Ultramicroscopy 111, no. 2 (2011): 107–16. http://dx.doi.org/10.1016/j.ultramic.2010.10.015.

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15

Woodward, John T. "Choosing a Cantilever for In Situ Atomic Force Microscopy." Microscopy Today 11, no. 2 (2003): 42–43. http://dx.doi.org/10.1017/s1551929500052500.

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What is the best cantilever for intermittent contact mode (often called Tapping Mode™) atomic force microscope (AFM) imaging under water? This is a question I hear often and one that recently generated some interesting discussion on an AFM newsgroup (more on the newsgroup below). The ability of the AFM to image samples En physiologically relevant environments has made it a popular technique in the biological sciences. However, because scanning the AFM tip in contact mode easily perturbs many biological samples, it was the advent of intermittent contact modes that lead to AFM's widespread use i

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Moore, Steven Ian, Michael G. Ruppert, and Yuen Kuan Yong. "Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement." Beilstein Journal of Nanotechnology 8 (February 6, 2017): 358–71. http://dx.doi.org/10.3762/bjnano.8.38.

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Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous characteristics compared to the optical beam deflection method. The possibility of down scaling, parallelization of cantilever arrays and the absence of optical interference associated imaging artifacts have led to an increased research interest in these methods. However, for multifrequency AFM, the optimization of the transducer layout on the cantilever for higher order modes has not been addressed. To fully utilize an integrated piezoelectric transducer, this work alters the layout of the piezoele

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Ho, Huddee J. "Near Contact Mode AFM: Overcoming Surface Fluid Layer In Air And Achieve Ultra-High Resolution." Microscopy Today 6, no. 8 (1998): 12–15. http://dx.doi.org/10.1017/s1551929500069170.

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A major goal of Atomic Force Microscopy (AFM) is to achieve nanometer resolution on surface topography, Vibrating cantilever mode (VCM) is an important configuration of an AFU instrument, It was proposed in the first AFM paper.VCM in ultra-high vacuum (UHV) results in true AFM atomic resolution, which reveals atomic scale surface defects such as a single missing atom in a lattice. However, the VCM operation in air has many difficulties due to the surface contamination on the sample and the AFM tip. The most popular operation modes of the VCM are the non-contact mode and the Tapping mode. Both

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18

Marcuello, Carlos. "Current and future perspectives of atomic force microscopy to elicit the intrinsic properties of soft matter at the single molecule level." AIMS Bioengineering 9, no. 3 (2022): 293–306. http://dx.doi.org/10.3934/bioeng.2022020.

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<abstract> <p>Soft matter encompasses multitude of systems like biomolecules, living cells, polymers, composites or blends. The increasing interest to better understand their physico-chemical properties has significantly favored the development of new techniques with unprecedented resolution. In this framework, atomic force microscopy (AFM) can act as one main actor to address multitude of intrinsic sample characteristics at the nanoscale level. AFM presents many advantages in comparison to other bulk techniques as the assessment of individual entities discharging thus, ensemble av

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Slattery, Ashley, Cameron Shearer, Joseph Shapter, Adam Blanch, Jamie Quinton, and Christopher Gibson. "Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode." Nanomaterials 8, no. 10 (2018): 807. http://dx.doi.org/10.3390/nano8100807.

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In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition

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Seewald, Lukas Matthias, Jürgen Sattelkow, Michele Brugger-Hatzl, et al. "3D Nanoprinting of All-Metal Nanoprobes for Electric AFM Modes." Nanomaterials 12, no. 24 (2022): 4477. http://dx.doi.org/10.3390/nano12244477.

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3D nanoprinting via focused electron beam induced deposition (FEBID) is applied for fabrication of all-metal nanoprobes for atomic force microscopy (AFM)-based electrical operation modes. The 3D tip concept is based on a hollow-cone (HC) design, with all-metal material properties and apex radii in the sub-10 nm regime to allow for high-resolution imaging during morphological imaging, conductive AFM (CAFM) and electrostatic force microscopy (EFM). The study starts with design aspects to motivate the proposed HC architecture, followed by detailed fabrication characterization to identify and opti

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Zhang, Suoxin, Jianqiang Qian, Yingzi Li, Yingxu Zhang, and Zhenyu Wang. "A Novel Method to Reconstruct the Force Curve by Higher Harmonics of the First Two Flexural Modes in Frequency Modulation Atomic Force Microscope (FM-AFM)." Microscopy and Microanalysis 24, no. 3 (2018): 256–63. http://dx.doi.org/10.1017/s1431927618000363.

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AbstractAtomic force microscope (AFM) is an idealized tool to measure the physical and chemical properties of the sample surfaces by reconstructing the force curve, which is of great significance to materials science, biology, and medicine science. Frequency modulation atomic force microscope (FM-AFM) collects the frequency shift as feedback thus having high force sensitivity and it accomplishes a true noncontact mode, which means great potential in biological sample detection field. However, it is a challenge to establish the relationship between the cantilever properties observed in practice

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Russell, Phillip E., and A. D. Batchelor. "AFM and Other Scanned Probe Microscopies Tutorial." Microscopy and Microanalysis 4, S2 (1998): 878–79. http://dx.doi.org/10.1017/s143192760002451x.

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While the techniques offer high spatial resolution in some cases down to the atomic scale and three dimensional mapping of surface topography, there still remain issues related to quantitative interpretation of scanned probe data, particularly in the recently developed phase contrast imaging modes. In this talk, the various modes of force microscopy will be introduced, along with examples. New techniques are starting to emerge which allow us to use the scanned probe microscope to measure properties such as local adhesion and local elastic and plastic deformation of samples.Each scanned probe t

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Ulcinas, Arturas, and Valentinas Snitka. "Intermittent contact AFM using the higher modes of weak cantilever." Ultramicroscopy 86, no. 1-2 (2001): 217–22. http://dx.doi.org/10.1016/s0304-3991(00)00084-x.

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Mišić Radić, Tea, Petra Vukosav, Andrea Čačković, and Alexander Dulebo. "Insights into the Morphology and Surface Properties of Microalgae at the Nanoscale by Atomic Force Microscopy (AFM): A Review." Water 15, no. 11 (2023): 1983. http://dx.doi.org/10.3390/w15111983.

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Atomic force microscopy (AFM) is a method that provides the nanometer-resolution three-dimensional imaging of living cells in their native state in their natural physiological environment. In addition, AFM’s sensitivity to measure interaction forces in the piconewton range enables researchers to probe surface properties, such as elasticity, viscoelasticity, hydrophobicity and adhesion. Despite the growing number of applications of AFM as a method to study biological systems, AFM is not yet an established technique for studying microalgae. Following a brief introduction to the basic principles

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Choi, Youngwoo, and Seungbum Hong. "Development of a Machine Learning Model for Quantifying SEM Images of Electrode Materials Based on AFM Topography Image." ECS Meeting Abstracts MA2024-02, no. 3 (2024): 353. https://doi.org/10.1149/ma2024-023353mtgabs.

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Scanning electron microscopy (SEM) is a tool that allows for easy visualization of surface morphology of materials, but it has the drawback of difficulty in quantitative shape analysis. On the other hand, atomic force microscopy (AFM) enables quantitative analysis of material surface morphology with very high precision; however, it suffers from long analysis times and difficulties in analyzing a wide area. In particular, materials like graphite, used in electrode materials for batteries, possess high roughness, which poses additional challenges for AFM analysis. To extend the spatial precision

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Zhang, Rui, Evgeny Zhuravlev, René Androsch, and Christoph Schick. "Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry." Polymers 11, no. 5 (2019): 890. http://dx.doi.org/10.3390/polym11050890.

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A chip-based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micrometers to nanometers after fast thermal treatments becomes accessible. An FSC can treat the sample isothermally or at heating and cooling rates up to 1 MK/s. The short response time of the FSC in the order of milliseconds enables rapid changes from scanning to isothermal modes and vice versa. Additionally, FSC provides crystallization/melting curves of the sample just imaged by AFM. We describe a combined AFM-FSC device,

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Casuso, Ignacio, Lorena Redondo-Morata, and Felix Rico. "Biological physics by high-speed atomic force microscopy." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 378, no. 2186 (2020): 20190604. http://dx.doi.org/10.1098/rsta.2019.0604.

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While many fields have contributed to biological physics, nanotechnology offers a new scale of observation. High-speed atomic force microscopy (HS-AFM) provides nanometre structural information and dynamics with subsecond resolution of biological systems. Moreover, HS-AFM allows us to measure piconewton forces within microseconds giving access to unexplored, fast biophysical processes. Thus, HS-AFM provides a tool to nourish biological physics through the observation of emergent physical phenomena in biological systems. In this review, we present an overview of the contribution of HS-AFM, both

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Boisgard, R., J. P. Aimé, and G. Couturier. "Dynamic operation modes of AFM: Non-linear behavior and theoretical analysis of the stability of the AFM oscillator." International Journal of Non-Linear Mechanics 42, no. 4 (2007): 673–80. http://dx.doi.org/10.1016/j.ijnonlinmec.2007.03.006.

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Gibson, Christopher T. "The Attachment of Carbon Nanotubes to Atomic Force Microscopy Tips Using the Pick-Up Method." Applied Sciences 10, no. 16 (2020): 5575. http://dx.doi.org/10.3390/app10165575.

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In the last 30 years research has shown that the resolution and reproducibility of data acquired using the atomic force microscope (AFM) can be improved through the development of new imaging modes or by modifying the AFM tip. One method that has been explored since the 1990s is to attach carbon nanotubes (CNT) to AFM tips. CNTs possess a small diameter, high aspect ratio, high strength and demonstrate a high degree of wear resistance. While early indications suggested the widespread use of these types of probes would be routine this has not been the case. A number of methods for CNT attachmen

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Killgore, Jason P., William King, Kevin Kjoller, and René M. Overney. "Heated-Tip AFM: Applications in Nanocomposite Polymer Membranes and Energetic Materials." Microscopy Today 15, no. 1 (2007): 20–25. http://dx.doi.org/10.1017/s1551929500051142.

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Atomic Force Microscopy (AFM) is a key technique for the measurement and analysis of samples when nanoscale topography is of interest. It offers a number of complementary probing modes that extend an AFM's measurement capability to a wide range of material and transport properties of surfaces, including hardness, friction, conductivity and adhesion among others. Sample temperature controlled AFM extends the study of surface morphology and properties to include changes in the material phases.Recently, silicon microfabricated AFM cantilevers that have integrated heaters, as shown in figure 1, ha

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Chen, Ying, Ke Ma, Ting Hu, et al. "Investigation of the binding modes between AIE-active molecules and dsDNA by single molecule force spectroscopy." Nanoscale 7, no. 19 (2015): 8939–45. http://dx.doi.org/10.1039/c5nr01247c.

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Damircheli, Mehrnoosh, Amir F. Payam, and Ricardo Garcia. "Optimization of phase contrast in bimodal amplitude modulation AFM." Beilstein Journal of Nanotechnology 6 (April 28, 2015): 1072–81. http://dx.doi.org/10.3762/bjnano.6.108.

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Bimodal force microscopy has expanded the capabilities of atomic force microscopy (AFM) by providing high spatial resolution images, compositional contrast and quantitative mapping of material properties without compromising the data acquisition speed. In the first bimodal AFM configuration, an amplitude feedback loop keeps constant the amplitude of the first mode while the observables of the second mode have not feedback restrictions (bimodal AM). Here we study the conditions to enhance the compositional contrast in bimodal AM while imaging heterogeneous materials. The contrast has a maximum

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Kalafut, Devin, Ryan Wagner, Maria Jose Cadena, Anil Bajaj, and Arvind Raman. "Cantilever signature of tip detachment during contact resonance AFM." Beilstein Journal of Nanotechnology 12 (November 24, 2021): 1286–96. http://dx.doi.org/10.3762/bjnano.12.96.

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Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are atomic force microscopy modes in which the cantilever is held in contact with the sample at a constant average force while monitoring the cantilever motion under the influence of a small, superimposed vibrational signal. Though these modes depend on permanent contact, there is a lack of detailed analysis on how the cantilever motion evolves when this essential condition is violated. This is not an uncommon occurrence since higher operating amplitudes tend to yield better signal-

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Stylianou, Andreas, Stylianos-Vasileios Kontomaris, Colin Grant, and Eleni Alexandratou. "Atomic Force Microscopy on Biological Materials Related to Pathological Conditions." Scanning 2019 (May 12, 2019): 1–25. http://dx.doi.org/10.1155/2019/8452851.

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Atomic force microscopy (AFM) is an easy-to-use, powerful, high-resolution microscope that allows the user to image any surface and under any aqueous condition. AFM has been used in the investigation of the structural and mechanical properties of a wide range of biological matters including biomolecules, biomaterials, cells, and tissues. It provides the capacity to acquire high-resolution images of biosamples at the nanoscale and allows at readily carrying out mechanical characterization. The capacity of AFM to image and interact with surfaces, under physiologically relevant conditions, is of

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Liu, Hao, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru, and Hans J. Hug. "A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy." Beilstein Journal of Nanotechnology 13 (October 11, 2022): 1120–40. http://dx.doi.org/10.3762/bjnano.13.95.

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Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral resolution, and the characterization of various sample properties using multifrequency and multimodal AFM operation modes. Research of new quantum materials and devices, however, often requires low temperatures and ultrahigh vacuum (UHV) conditions and, more specifically, AFM instrumentation providing atomic resolution. For this, AFM instrumentatio

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Williams, R. E. "Acoustic Emission Characteristics of Abrasive Flow Machining." Journal of Manufacturing Science and Engineering 120, no. 2 (1998): 264–71. http://dx.doi.org/10.1115/1.2830123.

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Abrasive Flow Machining (AFM) is a nontraditional finishing process that deburrs and polishes by forcing an abrasive-laden viscoelastic polymer across the workpiece surface. Current applications include improvement in air and fluid flow for cylinder heads, intake manifold runners and injector nozzles. Present manufacturing methods include a series of flow test and AFM operations which require significant material handling and operator adjustment. An effective on-line monitoring and adaptive control system for AFM is needed. This paper reports on the development of an acoustic emission (AE) bas

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Villeneuve-Faure, Christina, Abdelhaq Boumaarouf, Vishal Shah, Peter M. Gammon, Ulrike Lüders, and Rosine Coq Germanicus. "SiC Doping Impact during Conducting AFM under Ambient Atmosphere." Materials 16, no. 15 (2023): 5401. http://dx.doi.org/10.3390/ma16155401.

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The characterization of silicon carbide (SiC) by specific electrical atomic force microscopy (AFM) modes is highly appreciated for revealing its structure and properties at a nanoscale. However, during the conductive AFM (C-AFM) measurements, the strong electric field that builds up around and below the AFM conductive tip in ambient atmosphere may lead to a direct anodic oxidation of the SiC surface due to the formation of a water nanomeniscus. In this paper, the underlying effects of the anodization are experimentally investigated for SiC multilayers with different doping levels by studying g

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Ouyang, Qijian, Zhiwei Xie, Jinhai Liu, Minghui Gong, and Huayang Yu. "Application of Atomic Force Microscopy as Advanced Asphalt Testing Technology: A Comprehensive Review." Polymers 14, no. 14 (2022): 2851. http://dx.doi.org/10.3390/polym14142851.

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In the past three decades, researchers have engaged in the relationship between the composition, macro performance, and microstructure of asphalt. There are many research results in the use of atomic force microscopy (AFM) to study the microstructure and related mechanisms of asphalt. Based on previous studies, the performance of asphalt from its microstructure has been observed and analyzed, and different evaluation indices and modification methods have been proposed, providing guidance toward improving the performance of asphalt materials and benefiting potential applications. This review fo

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Meier, Dale J. "Application of various modes of scanning-probe microscopies in polymer systems." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 196–97. http://dx.doi.org/10.1017/s0424820100163447.

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The invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 demonstrated an unparalleled ability to image materials at the sub-nanometer scale. The invention rapidly lead to an explosion of applications of STM in a wide variety of fields. However, imaging by an STM is essentially limited to materials which are conductive, or could be made conductive, so many materials of interest could not be imaged by STM. This limitation was removed a few years later (1985) by the invention of the atomic force microscope (AFM) by Binnig, Quate and Gerber, in which imaging is based o

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Carmichael, Stephen W., and Julio M. Fernandez. "Unzipping a Membrane." Microscopy Today 8, no. 9 (2000): 3–7. http://dx.doi.org/10.1017/s1551929500059368.

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The atomic force microscope (AFM) is well known for its outstanding spatial resolution, but it is becoming increasingly useful as the instrument for force spectroscopy. In the force spectroscopy mode, the AFM can measure tiny tension forces, in the piconewton (pN) range. Daniel Müller, Wolfgang Baurmeister, and Andreas Engel have used the AFM in both the imaging and force spectroscopy modes to pull proteins out of membranes in a controlled fashion.Müller et al. used Deinococcus radiodurans, a bacterium best known for its high resistance to radiation (as its Genus name implies), as their test s

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Surtchev, Marko, Mark Wall, and Sergei Magonov. "Combined AFM/Raman Studies of Heterogeneous Polymer Materials." MRS Advances 1, no. 25 (2016): 1859–64. http://dx.doi.org/10.1557/adv.2016.412.

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ABSTRACTCompositional imaging of several immiscible polymer blends was examined with the combination of AFM-based mechanical and electric modes with chemically-specific Raman mapping. Results showed that these methods substantially complement each other in comprehensive characterization of surface morphology by helping to identify a composition of top surface and sub-surface materials in polymer heterogeneous systems.

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Abbasi, Mohammad, and Seyed E. Afkhami. "Resonant Frequency and Sensitivity of a Caliper Formed With Assembled Cantilever Probes Based on the Modified Strain Gradient Theory." Microscopy and Microanalysis 20, no. 6 (2014): 1672–81. http://dx.doi.org/10.1017/s1431927614013117.

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AbstractThe resonant frequency and sensitivity of an atomic force microscope (AFM) with an assembled cantilever probe (ACP) is analyzed utilizing strain gradient theory, and then the governing equation and boundary conditions are derived by a combination of the basic equations of strain gradient theory and Hamilton’s principle. The resonant frequency and sensitivity of the proposed AFM microcantilever are then obtained numerically. The proposed ACP includes a horizontal cantilever, two vertical extensions, and two tips located at the free ends of the extensions that form a caliper. As one of t

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Castanié, Fabien, Laurent Nony, Sébastien Gauthier, and Xavier Bouju. "Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM." Beilstein Journal of Nanotechnology 3 (April 2, 2012): 301–11. http://dx.doi.org/10.3762/bjnano.3.34.

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Background: Characterization at the atomic scale is becoming an achievable task for FM-AFM users equipped, for example, with a qPlus sensor. Nevertheless, calculations are necessary to fully interpret experimental images in some specific cases. In this context, we developed a numerical AFM (n-AFM) able to be used in different modes and under different usage conditions. Results: Here, we tackled FM-AFM image calculations of three types of graphitic structures, namely a graphite surface, a graphene sheet on a silicon carbide substrate with a Si-terminated surface, and finally, a graphene nanorib

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Li, Qing Fen, Li Zhu, Sheng Yuan Yan, and Xiao Nan Zhang. "Computational Analysis of the AFM Specimen on Mixed-Mode I+II+III Fracture." Key Engineering Materials 488-489 (September 2011): 258–61. http://dx.doi.org/10.4028/www.scientific.net/kem.488-489.258.

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The computational analysis of an all fracture modes (AFM) specimen on mixed-mode I+II+III fracture is presented in this paper. The separated energy release rates (SERRs) along the crack front of the AFM-model are calculated by the modified virtual crack closure integral (MVCCI)-method and the commercially available software ANSYS. A transition model is built by adopting several 3D elements of SOLID45 and one point element of MASS21 in the ANSYS program. Under the related constraint conditions, the separate force and moments are respectively applied on the point element of the transition model,

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Kheirodin, Mohsen, Hossein Nejat Pishkenari, Ali Moosavi, and Ali Meghdari. "Study of Biomolecules Imaging Using Molecular Dynamics Simulations." Nano 10, no. 07 (2015): 1550096. http://dx.doi.org/10.1142/s1793292015500964.

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The process of imaging a biomolecule by atomic force microscope (AFM) is modeled using molecular dynamics (MD) simulations. Since the large normal force exerted by the tip on the biosample in contact and tapping modes may damage the sample structure and produce irreversible deformation, the noncontact mode of AFM (NC-AFM) is employed as the operating mode. The biosample is scanned using a carbon nanotube (CNT) as the AFM probe. CNTs because of their small diameter, high aspect ratio and high mechanical resistance attract many attentions for imaging purposes. The tip–sample interaction is simul

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Coq Germanicus, R., and U. Lüders. "Electrical Characterizations Based on AFM: SCM and SSRM Measurements with a Multidimensional Approach." EDFA Technical Articles 24, no. 3 (2022): 24–31. http://dx.doi.org/10.31399/asm.edfa.2022-3.p024.

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Abstract This article demonstrates the value of atomic force microscopes, particularly the different electrical modes, for characterizing complex microelectronic structures. It presents experimental results obtained from deep trench isolation (DTI) structures using SCM and SSRM analysis with emphasis on the voltage applied by the AFM. From these measurements, a failure analysis workflow is proposed that facilitates AFM voltage optimization to reveal the structure of cross-sectioned samples, make comparisons, and determine the underlying cause of failures.

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Dorozhkin, P., E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov. "AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications." Microscopy Today 18, no. 6 (2010): 28–32. http://dx.doi.org/10.1017/s1551929510000982.

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Atomic Force Microscopy (AFM) has developed into a very powerful tool for characterization of surfaces and nanoscale objects. Many physical properties of an object can be studied by AFM with nanometer-scale resolution. Local stiffness, elasticity, conductivity, capacitance, magnetization, surface potential and work function, friction, piezo response—these and many other physical properties can be studied with over 30 AFM modes. What is typically lacking in information provided by AFM studies is the chemical composition of the sample and information about its crystal structure. To obtain this i

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Kangül, Mustafa, Navid Asmari, Santiago H. Andany, Marcos Penedo, and Georg E. Fantner. "Enhanced feedback performance in off-resonance AFM modes through pulse train sampling." Beilstein Journal of Nanotechnology 15 (February 1, 2024): 134–43. http://dx.doi.org/10.3762/bjnano.15.13.

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Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological samples, soft polymers, and hard materials. These modes offer precise and stable control of vertical force, as well as reduced lateral force. Simultaneously, they enable mechanical property mapping of the sample. However, ORT modes have an intrinsic drawback: a low scan speed due to the limited ORT rate, generally in the low-kilohertz range. He

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Jazvinšćak Jembrek, Maja, Goran Šimić, Patrick R. Hof, and Suzana Šegota. "Atomic force microscopy as an advanced tool in neuroscience." Translational Neuroscience 6, no. 1 (2015): 117–30. http://dx.doi.org/10.1515/tnsci-2015-0011.

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AbstractThis review highlights relevant issues about applications and improvements of atomic force microscopy (AFM) toward a better understanding of neurodegenerative changes at the molecular level with the hope of contributing to the development of effective therapeutic strategies for neurodegenerative illnesses. The basic principles of AFM are briefly discussed in terms of evaluation of experimental data, including the newest PeakForce Quantitative Nanomechanical Mapping (QNM) and the evaluation of Young’s modulus as the crucial elasticity parameter. AFM topography, revealed in imaging mode,

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Rodriguez, D. J., A. V. Kotosonova, H. A. Ballouk, N. A. Shandyba, O. I. Osotova, and A. S. Kolomiytsev. "Fabrication of probe tips via the FIB method for nanodiagnostics of the surface of solids by atomic force microscopy." Journal of Physics: Conference Series 2086, no. 1 (2021): 012204. http://dx.doi.org/10.1088/1742-6596/2086/1/012204.

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Abstract In this work, we carried out an investigation of commercial atomic force microscope (AFM) probes for contact and semi-contact modes, which were modified by focused ion beam (FIB). This method was used to modify the original tip shape of silicon AFM probes, by ion-etching and ion-enhance gas deposition. we show a better performance of the FIB-modified probes in contrast with the non-modified commercial probes. These results were obtained after using both probes in semi-contact mode in a calibration grating sample.

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