Relevant bibliographies by topics / Atomic Force Microscopy

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Atomic Force Microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 25 July 2025

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Journal articles on the topic "Atomic Force Microscopy"

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Marti, O., B. Drake, S. Gould, and P. K. Hansma. "Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 3 (1988): 2089–92. http://dx.doi.org/10.1116/1.575191.

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Razumić, Andrej, Biserka Runje, Dragutin Lisjak, et al. "Atomic Force Microscopy." Tehnički glasnik 18, no. 2 (2024): 209–14. http://dx.doi.org/10.31803/tg-20230829155921.

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The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices. Thus far, there are no guidelines or guides available in the field of atomic force microscopy that analyze the influence of input parameters on the quality of measurement results, nor has the measurement uncertainty of the results been estimated. Given the complex functional relationship between input and output variables, which cannot always be explicitly expressed, one of the prima
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NAKAJIMA, Ken, Kei SEKINE, Kaede MOGI, Makiko ITO, and Xiaobin LIANG. "Atomic Force Microscopy." Journal of the Japan Society of Colour Material 93, no. 10 (2020): 321–28. http://dx.doi.org/10.4011/shikizai.93.321.

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Binnig, G. K. "Atomic-Force Microscopy." Physica Scripta T19A (January 1, 1987): 53–54. http://dx.doi.org/10.1088/0031-8949/1987/t19a/008.

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Slater, S. D., and K. P. Parsons. "Atomic Force Microscopy." Imaging Science Journal 45, no. 3-4 (1997): 269. http://dx.doi.org/10.1080/13682199.1997.11736428.

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Prater, C. B., H. J. Butt, and P. K. Hansma. "Atomic force microscopy." Nature 345, no. 6278 (1990): 839–40. http://dx.doi.org/10.1038/345839a0.

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Chatterjee, Snehajyoti, Shrikanth S. Gadad, and Tapas K. Kundu. "Atomic force microscopy." Resonance 15, no. 7 (2010): 622–42. http://dx.doi.org/10.1007/s12045-010-0047-z.

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Schwarz, Udo D. "Atomic Force Microscopy." Physics Today 64, no. 4 (2011): 60–61. http://dx.doi.org/10.1063/1.3580496.

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Rugar, Daniel, and Paul Hansma. "Atomic Force Microscopy." Physics Today 43, no. 10 (1990): 23–30. http://dx.doi.org/10.1063/1.881238.

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Meyer, E. "Atomic force microscopy." Progress in Surface Science 41, no. 1 (1992): 3–49. http://dx.doi.org/10.1016/0079-6816(92)90009-7.

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Dissertations / Theses on the topic "Atomic Force Microscopy"

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Payton, Oliver David. "High-speed atomic force microscopy under the microscope." Thesis, University of Bristol, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.574416.

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SINCE its invention in 1986, the atomic force microscope (AFM) has revolutionised the field of nanotechnology and nanoscience. It is a tool that has enabled research into areas of medicine, advanced materials, biology, chemistry and physics. However due to its low frame rate it is a tool that has been limited to imaging small areas using a time lapse technique. It has only been in recent years that the frame rate of the device has been increased in a tool known as high-speed AFM (HSAFM). This increased frame rate allows, for the first time, biological processes to be viewed in real time or mac
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Grimble, Ralph Ashley. "Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy." Thesis, University of Oxford, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312277.

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Carnally, Stewart Antoni Michael. "Carbon nanotube atomic force microscopy." Thesis, University of Nottingham, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.491631.

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This thesis concerns the manufacture of carbon nanotube atomic force microscope (NTAFM) probes and their employment in the high-resolution imaging of biological macromolecules. Attention was focused initially on synthesis of carbon nanotubes and the refinement of the growth processes to obtain nanotubes of controlled dimensions. These growth processes were subsequently used to grow nanotubes directly onto AFM tips, followed by attempts at controlling the dimensions of these directly-grown nanotubes. Individually fabricated NTAFM probes are also described, along with attempts to optimise the st
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Jeong, Younkoo. "HIGH SPEED ATOMIC FORCE MICROSCOPY." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109.

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Vithayaveroj, Viriya. "Atomic force microscopy for sorption studies." Diss., Available online, Georgia Institute of Technology, 2004:, 2004. http://etd.gatech.edu/theses/available/etd-09282004-121825/unrestricted/vithayaveroj%5Fviriya%5F200412%5Fphd.pdf.

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Thesis (Ph. D.)--Civil and Environmental Engineering, Georgia Institute of Technology, 2005.<br>Dr. Rina Tannenbaum, Committee Member ; Dr. Michael Sacks, Committee Member ; Dr. Sotira Yiacoumi, Committee Chair ; Dr. Costas Tsouris, Committee Co-Chair ; Dr. Ching-Hua Huang, Committee Member. Vita. Includes bibliographical references.
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Muys, James Johan. "Cellular Analysis by Atomic Force Microscopy." Thesis, University of Canterbury. Electrical and Computer Engineering, 2006. http://hdl.handle.net/10092/1158.

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Exocytosis is a fundamental cellular process where membrane-bound secretory granules from within the cell fuse with the plasma membrane to form fusion pore openings through which they expel their contents. This mechanism occurs constitutively in all eukaryotic cells and is responsible for the regulation of numerous bodily functions. Despite intensive study on exocytosis the fusion pore is poorly understood. In this research micro-fabrication techniques were integrated with biology to facilitate the study of fusion pores from cells in the anterior pituitary using the atomic force microsc
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Konopinski, D. I. "Forensic applications of atomic force microscopy." Thesis, University College London (University of London), 2013. http://discovery.ucl.ac.uk/1402411/.

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The first project undertaken was to develop a currently non-existent forensic technique -- data recovery from damaged SIM cards. SIM cards hold data valuable to a forensic investigator within non-volatile EEPROM/flash memory arrays. This data has been proven to be able to withstand temperatures up to 500°C, surviving such scenarios as house fires or criminal evidence disposal. A successful forensically-sound sample extraction, mounting and backside processing methodology was developed to expose the underside of a microcontroller circuit's floating gate transistor tunnel oxide, allowing probing
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Acosta, Mejia Juan Camilo. "Atomic force microscopy based micro/nanomanipulation." Paris 6, 2011. http://www.theses.fr/2011PA066691.

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A l’échelle nanoscopique, un problème scientifique fondamental réside dans la difficulté de manipuler de façon interactive et répétable un nano-objet. Cette difficulté est un frein majeur pour des applications comme les nanotransistors, les nanosystèmes ou les futurs NEMS (Nano Electro Mechanical System). Ces dispositifs émergents sont ainsi ralentis dans leur cadre expérimental. Cette thèse s’inscrit dans la continuité des recherches développées au sein de l’équipe de microrobotique de l'ISIR. Elle se focalise sur l'exploitation de capteurs d'effort pour la manipulation contrôlée à plusieurs
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Sykulska-Lawrence, Hanna Maria. "Atomic force microscopy for Martian investigations." Thesis, Imperial College London, 2008. http://hdl.handle.net/10044/1/4396.

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The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) instrument for the study of dust and regolith at the Martian arctic. The microscopy payload comprises an AFM and Optical Microscope (OM) to which samples are delivered by a robot arm. The setup allows imaging of individual dust and soil particles at a higher spatial resolution than any other in-situ instrument. A fully functioning test-bed of the flight microscopy setup within an environmental chamber to simulate Mars conditions was assembled at Imperial College, enabling characterization of the mi
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Anderson, Evan V. "Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis." Digital WPI, 2012. https://digitalcommons.wpi.edu/etd-theses/337.

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This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
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Books on the topic "Atomic Force Microscopy"

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Braga, Pier Carlo, and Davide Ricci. Atomic Force Microscopy. Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.

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Ahmed, Touhami. Atomic Force Microscopy. Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-031-02385-9.

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Santos, Nuno C., and Filomena A. Carvalho, eds. Atomic Force Microscopy. Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.

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Haugstad, Greg. Atomic Force Microscopy. John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.

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Voigtländer, Bert. Atomic Force Microscopy. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.

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Paul, West, ed. Atomic force microscopy. Oxford University Press, 2010.

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J, Drelich, and Mittal K. L. 1945-, eds. Atomic force microscopy in adhesion studies. VSP, 2005.

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García, Ricardo Castro. Amplitude modulation atomic force microscopy. Wiley-VCH, 2010.

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Lanza, Mario, ed. Conductive Atomic Force Microscopy. Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.

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Morita, S., R. Wiesendanger, and E. Meyer, eds. Noncontact Atomic Force Microscopy. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.

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Book chapters on the topic "Atomic Force Microscopy"

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Marinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35950-7_6577-3.

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Marinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6577.

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Sugawara, Yasuhiro. "Atomic Force Microscopy." In Roadmap of Scanning Probe Microscopy. Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_3.

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Marinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6577.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, et al. "Atomic Force Microscopy." In Encyclopedia of Nanotechnology. Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_31.

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Cubillas, Pablo, and Michael W. Anderson. "Atomic Force Microscopy." In Multi Length-Scale Characterisation. John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118683972.ch3.

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Alguel, Yilmaz, and Thomas G. M. Schalkhammer. "Atomic Force Microscopy." In Analytical Biotechnology. Birkhäuser Basel, 2002. http://dx.doi.org/10.1007/978-3-0348-8101-2_8.

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Nordlund, Thomas M., and Peter M. Hoffmann. "Atomic Force Microscopy." In Quantitative Understanding of Biosystems. CRC Press, 2019. http://dx.doi.org/10.1201/b22104-19.

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Lopes, Catarina S., Filomena A. Carvalho, and Nuno C. Santos. "Atomic force microscopy." In Fluorescence Imaging and Biological Quantification. CRC Press, 2017. http://dx.doi.org/10.1201/9781315121017-4.

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Dufrêne, Yves F. "Atomic Force Microscopy." In Methods for General and Molecular Microbiology. ASM Press, 2014. http://dx.doi.org/10.1128/9781555817497.ch6.

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Conference papers on the topic "Atomic Force Microscopy"

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Pleskova, Svetlana, Nikolay Bezrukov, and Sergey Bobyk. "Bacterial 1anomotion: Detection with Atomic Force Microscopy." In 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO). IEEE, 2024. https://doi.org/10.1109/3m-nano61605.2024.10769722.

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Dongdong Zhang and Xiaoping Qian. "Scanning in atomic force microscopy." In 2009 IEEE International Conference on Robotics and Automation (ICRA). IEEE, 2009. http://dx.doi.org/10.1109/robot.2009.5152555.

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Mahmoodi, S. Nima, Amin Salehi-Khojin, and Mehdi Ahmadian. "Nonlinear Force Analysis of Atomic Force Microscopy." In ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2011. http://dx.doi.org/10.1115/detc2011-48482.

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The objective of this work is to highlight and discuss some critical conditions in which the imprecision of atomic force microscopy (AFM) system will be intensified. To precisely address these issues, we developed a complete close form solution for a non-linear motion of AFM system subjected to non-linear contact and van der Waals forces. Galerkin method and multiple time scale approach are used to solve the governing non-linear differential equation of the AFM system. A nonlinear frequency-response equation is then obtained as a function of displacement excitation, resonance frequency and ass
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Stark, R. W. "Force Feedback in Dynamic Atomic Force Microscopy." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81264.

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The feedback perspective of dynamic AFM provides a powerful tool to investigate the non-linear system dynamics from a system theoretic point of view. Including the higher order dynamics of the extended cantilever beam in the model the contact resonances can be reproduced faithfully without the need to solve the partial differential equation of motion directly. The investigation of the non-linear dynamics provides valuable insight into the generation of higher harmonics in dynamic AFM. However, the light lever detection scheme is widely used in dynamic AFM. This means that — strictly speaking —
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Sawatzki, Juergen, Carsten Wehlack, Wulff Possart, et al. "Combining Atomic Force Microscopy with Polarized Raman Microscopy." In XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY. AIP, 2010. http://dx.doi.org/10.1063/1.3482820.

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Hansma, Helen G., Robert L. Sinsheimer, Scot A. C. Gould, et al. "Toward Sequencing DNA With an Atomic Force Microscope." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41431.

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Pishkenari, Hossein Nejat, and Ali Meghdari. "The Atomic-Scale Hysteresis in Non Contact Atomic Force Microscopy." In ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis. ASMEDC, 2010. http://dx.doi.org/10.1115/esda2010-24683.

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In this research, the hysteresis in the tip-sample interaction force in noncontact force microscopy (NC-AFM) is measured with the aid of atomistic dynamics simulations. The observed hystersis in the interaction force and displacement of the system atoms leads to the loss of energy during imaging of the sample surface. Using molecular dynamics simulations it is shown that the mechanism of the energy dissipation occurs due to bistabilities caused by atomic jumps of the surface and tip atoms in the contact region. The conducted simulations demonstrate that when a gold coated nano probe is brought
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de Pablo, Pedro. "Physical Virology with Atomic Force Microscopy." In Microscience Microscopy Congress 2021 incorporating EMAG 2021. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.mmc2021.265.

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Kudelka, Josef, Tomas Martinek, Milan Navratil, and Vojtech Kresalek. "Nano-steganography using atomic force microscopy." In 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO). IEEE, 2016. http://dx.doi.org/10.1109/nano.2016.7751451.

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Rabe and Arnold. "Atomic force microscopy at ultrasonic frequencies." In Proceedings of IEEE Ultrasonics Symposium ULTSYM-94. IEEE, 1994. http://dx.doi.org/10.1109/ultsym.1994.401611.

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Reports on the topic "Atomic Force Microscopy"

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Turner, Joseph A. Materials Characterization by Atomic Force Microscopy. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada414116.

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Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada246852.

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Houston, J. E., and J. G. Fleming. Non-contact atomic-level interfacial force microscopy. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/453500.

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Crone, Joshua C., Santiago Solares, and Peter W. Chung. Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples. Defense Technical Information Center, 2007. http://dx.doi.org/10.21236/ada469876.

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Salapaka, Srinivasa M., and Petros G. Voulgaris. Fast Scanning and Fast Image Reconstruction in Atomic Force Microscopy. Defense Technical Information Center, 2009. http://dx.doi.org/10.21236/ada495364.

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Noy, A., J. J. De Yoreo, and A. J. Malkin. Carbon Nanotube Atomic Force Microscopy for Proteomics and Biological Forensics. Office of Scientific and Technical Information (OSTI), 2002. http://dx.doi.org/10.2172/15004647.

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Haydell, Jr, and Michael W. Direct Writing of Graphene-based Nanoelectronics via Atomic Force Microscopy. Defense Technical Information Center, 2012. http://dx.doi.org/10.21236/ada571834.

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Hough, P., and V. Elings. Methods for Study of Biological Structure by Atomic Force Microscopy. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/770449.

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Klabunde, Kenneth J., and Dong Park. Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents). Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada281417.

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Hatch, Andrew G., Ralph C. Smith, and Tathagata De. Model Development and Control Design for High Speed Atomic Force Microscopy. Defense Technical Information Center, 2004. http://dx.doi.org/10.21236/ada444057.

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