Relevant bibliographies by topics / Electron microscopy (TEM)

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Electron microscopy (TEM)'

Author: Grafiati
Published: 3 June 2025
Last updated: 31 July 2025

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Journal articles on the topic "Electron microscopy (TEM)"

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Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM
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Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

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AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele
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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th
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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling
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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-contro
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Kuokkala, V. T., and T. K. Lepistö. "TEMTUTOR - a Teaching Multimedia Program for TEM." Microscopy and Microanalysis 3, S2 (1997): 1161–62. http://dx.doi.org/10.1017/s1431927600012691.

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Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simu
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Winey, Mark, Janet B. Meehl, Eileen T. O'Toole, and Thomas H. Giddings. "Conventional transmission electron microscopy." Molecular Biology of the Cell 25, no. 3 (2014): 319–23. http://dx.doi.org/10.1091/mbc.e12-12-0863.

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Researchers have used transmission electron microscopy (TEM) to make contributions to cell biology for well over 50 years, and TEM continues to be an important technology in our field. We briefly present for the neophyte the components of a TEM-based study, beginning with sample preparation through imaging of the samples. We point out the limitations of TEM and issues to be considered during experimental design. Advanced electron microscopy techniques are listed as well. Finally, we point potential new users of TEM to resources to help launch their project.
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Carmichael, Stephen W., and Jon Charlesworth. "Correlating Fluorescence Microscopy with Electron Microscopy." Microscopy Today 12, no. 1 (2004): 3–7. http://dx.doi.org/10.1017/s1551929500051749.

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The use of fluorescent probes is becoming more and more common in cell biology. It would be useful if we were able to correlate a fluorescent structure with an electron microscopic image. The ability to definitively identify a fluorescent organelle would be very valuable. Recently, Ying Ren, Michael Kruhlak, and David Bazett-Jones devised a clever technique to correlate a structure visualized in the light microscope, even a fluorescing cell, with transmission electron microscopy (TEM).Two keys to the technique of Ren et al are the use of grids (as used in the TEM) with widely spaced grid bars
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Fan, G. Y., and M. H. Ellisman. "Current State of the Art of Digital Imaging in TEM." Microscopy and Microanalysis 3, S2 (1997): 1087–88. http://dx.doi.org/10.1017/s1431927600012320.

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The increasingly wide use of digital computers, the world-wide-web and electronic publishing has had a fundamental impact on the way scientists conduct research in every discipline of science. Electron microscopy is no exception. A considerable amount of effort has been devoted to the development of digital imaging acquisition systems for transmission electron microscopy (TEM). Digital image acquisition systems for TEM, including complete systems, have been produced by several companies, including: Advanced Microscopy Techniques (Rowley, MA), JEOL (Peabody, MA), Gatan (Warrendale, PA), Princet
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Lee, M. R. "Transmission electron microscopy (TEM) of Earth and planetary materials: A review." Mineralogical Magazine 74, no. 1 (2010): 1–27. http://dx.doi.org/10.1180/minmag.2010.074.1.1.

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AbstractUsing high intensity beams of fast electrons, the transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) enable comprehensive characterization of rocks and minerals at micrometre to sub-nanometre scales. This review outlines the ways in which samples of Earth and planetary materials can be rendered sufficiently thin for TEM and STEM work, and highlights the significant advances in site-specific preparation enabled by the focused ion beam (FIB) technique. Descriptions of the various modes of TEM and STEM imaging, electron diffraction and X-ray and el
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Dissertations / Theses on the topic "Electron microscopy (TEM)"

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Schellkopf, Leonard. "Investigation of Polymer Systems in Solutions with Electron Microscopy and Scattering Methods." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2015. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-167948.

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This work is focused on the visualization and thus in the aid in finding explanations for the behavior of polymer structures as they exist in solution. For this aim, preparation and imaging techniques based on cryo-TEM protocols were developed for a large variety of polymeric specimens using new commercially available devices and the results were compared with the findings of other means of structural investigations. The systems used in this work were chosen, as their investigations can be adapted to other polymer systems by slight adaptation of the preparation procedures.
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TIYYAGURA, MADHAVI. "TRANSMISSION ELECTRON MICROSCOPY STUDIES IN SHAPE MEMORY ALLOYS." Master's thesis, University of Central Florida, 2005. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/3913.

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In NiTi, a reversible thermoelastic martensitic transformation can be induced by temperature or stress between a cubic (B2) austenite phase and a monoclinic (B19') martensite phase. Ni-rich binary compositions are cubic at room temperature (requiring stress or cooling to transform to the monoclinic phase), while Ti-rich binary compositions are monoclinic at room temperature (requiring heating to transform to the cubic phase). The stress induced transformation results in the superelastic effect, while the thermally induced transformation is associated with strain recovery that results in the sh
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Karlsson, Linda. "Transmission Electron Microscopy of 2D Materials : Structure and Surface Properties." Doctoral thesis, Linköpings universitet, Tunnfilmsfysik, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-127526.

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During recent years, new types of materials have been discovered with unique properties. One family of such materials are two-dimensional materials, which include graphene and MXene. These materials are stronger, more flexible, and have higher conductivity than other materials. As such they are highly interesting for new applications, e.g. specialized in vivo drug delivery systems, hydrogen storage, or as replacements of common materials in e.g. batteries, bulletproof clothing, and sensors. The list of potential applications is long for these new materials. As these materials are almost entire
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Sharp, Joanne. "Electron tomography of defects." Thesis, University of Cambridge, 2010. https://www.repository.cam.ac.uk/handle/1810/228638.

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Tomography of crystal defects in the electron microscope was first attempted in 2005 by the author and colleagues. This thesis further develops the technique, using a variety of samples and methods. Use of a more optimised, commercial tomographic reconstruction program on the original GaN weak beam dark-field (WBDF) tilt series gave a finer reconstruction with lower background, line width 10-20 nm. Four WBDF tilt series were obtained of a microcrack surrounded by dislocations in a sample of indented silicon, tilt axes parallel to g = 220, 220, 400 and 040. Moiré fringes in the defect impaired
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Melichárek, Václav. "Návrh manipulátoru pro TEM." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-417138.

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The topic of this master’s thesis is the design of a sample manipulator for TEM. Regarding which the segment of the sample manipulator used to move the sample in the direction of the x-axis (so-called x-stage) was designed. The introductory theoretical part is concerned with a brief description of transmission electron microscopy focused on the imaging methods used in TEM and the procedures of preparing and loading TEM samples. The theoretical part follows with the design of precise mechanisms, especially with respect to the inaccuracies of their operation and the technological aspect of the d
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Wan, Qian. "Transmission electron microscopy study of heterostructures grown on GaAs (110)." Doctoral thesis, Humboldt-Universität zu Berlin, Mathematisch-Naturwissenschaftliche Fakultät I, 2014. http://dx.doi.org/10.18452/16949.

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In der Arbeit werden die mikrostrukturellen Eigenschaften von an (110)-Flächen orientierten Heterostrukturen auf GaAs-Substraten mittels verschiedener Techniken der Transmissionselektronenmikroskopie untersucht. Kubisch flächenzentrierte (Al,Ga)As/AlAs/GaAs Mehrschichtstrukturen auf GaAs(110) weisen in orthogonalen Richtungen parallel zur Substratoberfläche verschiedene Mechanismen zur Aufnahme der Verspannungen aufgrund von Fehlanpassungen auf. Defektfreie Strukturen sind durch eine geeignete, kurz periodische AlAs/GaAs-Überstruktur erfolgreich realisiert worden. Abschließend sind künstliche
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Asaulenko, L. G., L. M. Purish, and D. R. Abdulina. "Use of the Transmission Electron Microscopy for Examination of Biofilms Structure." Thesis, Sumy State University, 2013. http://essuir.sumdu.edu.ua/handle/123456789/35267.

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Combination of transmission electron microscopy technics with colloidal gold labeled lectin staining allowed investigating glycoconjugates in biofilms of the corrosion relevant bacteria. Lectins with the same specificity were found to express different affinity to the compounds of the bacterial biofilms. LBA lectin showed the highest binding capacity to N-acetyl-D-galactosamine in Desulfovibrio sp. 10 and Bacillus subtilis 36 biofilms. For the assessment of N-acetyl-D-glucosamine presence in Bacillus subtilis 36 and Pseudomonas aeruginosa 27 biofilms WGA lectin was the most efficient. Sta
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Ayele, Yohannes Haileyesus. "Region-Based Contrast Transfer Function correction for Electron Microscopy Images." Thesis, KTH, Skolan för teknik och hälsa (STH), 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-119305.

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Electron crystallography is one of the methods for determining the structure of membrane proteins. However, the resolution that we get from electron crystallography of membrane proteins is limited by crystal disorder and inaccurate determination of contrast transfer function (CTF) parameters. To overcome these problems, we applied single particle refinement with local averaging for long range variation of the crystals and local region-based CTF correction for the tilted images. These two corrections are done on the Melibiose Permease (MelB) data sets and a resolution of 8.6Å is reported.<br>El
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Agnese, Fabio. "Advanced transmission electron microscopy studies of semiconductor nanocrystals synthesized by colloidal methods." Thesis, Université Grenoble Alpes (ComUE), 2018. http://www.theses.fr/2018GREAY043/document.

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Les recherches sur les nanocristaux semiconducteur (NCs) ont conduit à des résultats scientifiques fascinants, spécialement pour l'application en dispositifs optoelectroniques. Afin de répondre à certaines exigences comme des coûts mineurs, des gains d'efficacité, des composants respectueux de l'environnement, etc., des nouvelles méthodes sont explorées: dans les procédés en solution, dans l'ingénierie de bande et des niveaux d'énergie. En particulier, la méthode de synthèse peut influencer les propriétés optoélectroniques. Par conséquent, une meilleure compréhension des facteurs complexes pen
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Lai, Pooi-fun. "TEM and structural investigations of synthesized and modified carbon materials /." Connect to thesis, 1999. http://eprints.unimelb.edu.au/archive/00000770.

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Books on the topic "Electron microscopy (TEM)"

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Henning, K. H. Electron micrographs (TEM, SEM) of clays and clay minerals. Akademie-Verlag, 1986.

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Srivastava, D. Tem examination of irradiated Zircaloy - 2 pressure tube material. Bhabha Atomic Research Centre, 2005.

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United States. National Aeronautics and Space Administration., ed. Soot precursor material: Visualization via simultaneous LIF-LII and characterization via TEM. National Aeronautics and Space Administration, 1996.

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Vsesoi͡uznyĭ, simpozium po rastrovoĭ ėlektronnoĭ mikroskopii i. analiticheskim metodam issledovanii͡a tverdykh tel (6th 1989 Zvenigorod R. S. F. S. R. ?). Tezisy dokladov VI Vsesoi͡uznogo simpoziuma po rastrovoĭ ėlektronnoĭ mikroskopii i analiticheskim metodam issledovanii͡a tverdykh tel (RĖM-89). [s.n.], 1989.

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Egerton, R. F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer, 2016.

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Egerton, R. F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer London, Limited, 2006.

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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer London, Limited, 2016.

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Physical principles of electron microscopy: An introduction to TEM, SEM, and AEM. Springer Science+Business Media, 2005.

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Egerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer, 2007.

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Egerton, R. F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer, 2010.

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Book chapters on the topic "Electron microscopy (TEM)"

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Williams, David B., and C. Barry Carter. "Diffraction in TEM." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_11.

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Williams, David B., and C. Barry Carter. "High-Resolution TEM." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_28.

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Williams, David B., and C. Barry Carter. "High-Resolution TEM." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_28.

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Williams, David B., and C. Barry Carter. "Imaging in the TEM." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_22.

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Williams, David B., and C. Barry Carter. "The XEDS-TEM Interface." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_33.

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Chen, Bin, Jianming Cao, and Dongping Zhong. "4D Ultrafast TEM." In In-Situ Transmission Electron Microscopy. Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-19-6845-7_10.

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Verkade, Paul. "Electron Microscopy (TEM and SEM)." In Essential Guide to Reading Biomedical Papers. John Wiley & Sons, Ltd, 2012. http://dx.doi.org/10.1002/9781118402184.ch7.

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Costa, Pedro M. F. J., and Paulo J. Ferreira. "In Situ TEM of Carbon Nanotubes." In Advanced Transmission Electron Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9_7.

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Zhou, Guangwen, and Judith C. Yang. "In-Situ TEM Studies of Oxidation." In In-Situ Electron Microscopy. Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527652167.ch8.

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Egerton, R. F. "TEM Specimens and Images." In Physical Principles of Electron Microscopy. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-39877-8_4.

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Conference papers on the topic "Electron microscopy (TEM)"

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Hye Hyun, Ji, Yanchao Dai, In Chang Choi, and Christopher H. Kang. "The Impact of TEM Analysis Temperature on Photoresist Profiles Using Cryo-FIB and Cryo-TEM." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0221.

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Abstract Photoresist (PR) profiles tend to have deformation and shrinkage with typical transmission electron microscopy (TEM) analysis method using a focused ion beam scanning electron microscope (FIB-SEM) and TEM. The elevated temperatures during sample preparation and TEM analysis are believed to contribute to these issues. This study evaluates the effectiveness of cryogenic workflow in mitigating PR profile shrinkage by employing cryo-focused ion beam (Cryo-FIB) and cryo-transmission electron microscopy (Cryo-TEM). Comparative experiments were conducted at room temperature and cryogenic con
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Gaida, John H., Hugo Lourenço-Martins, Murat Sivis, et al. "Attosecond electron microscopy using free-electron homodyne detection." In CLEO: Fundamental Science. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/cleo_fs.2024.fm2b.2.

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We implement attosecond electron microscopy in a TEM to measure the optical near-field of a plasmonic nanoprism with 54 as (FWHM) temporal and few-nm spatial resolution, demonstrating free-electron homodyne detection.
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Bonifacio, Cecile S. "TEM Sample Preparation for Electron Microscopy Characterization and Failure Analysis of Advanced Semiconductor Devices." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024tpn1.

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Zhang, Yu, Kevin Davidson, Po-Cheng Lu, Frieder Baumann, and Travis Mitchell. "Unlocking Insights into 3D Transistor Defects: The Power of Supplementing TEM with Elemental Electron Tomography." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0374.

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Abstract This study investigates the application of 3D electron tomography to enhance transmission electron microscopy (TEM)-based failure analysis of 3D FinFET transistors. Traditional TEM analysis is challenged by projection effects due to the thickness of the sample, complicating accurate defect characterization in miniaturized semiconductor structures. The defects seen by conventional (2D projection) TEM imaging are unclear and difficult to interpret. Leveraging scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDS) tomography techniques, the study
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Demarest, J., B. Austin, L. Tierney, and Z. Martin. "Targeted TEM SRAM-Like Analysis Without Delayering." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0079.

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Abstract In the ever-increasing complexity of today’s state-of-the-art semiconductor structures, it is desirable to seek any advantage in the fault isolation and analysis paradigm to improve time to data. This paper discusses one such improvement where it is shown to be possible to target silicon (Si) devices, their metal contacts, or any other location in the wafer stack in a SRAM test structure from metal level 7 (M7) for transmission electron microscopy (TEM) sample fabrication using a modified sample geometry, focused ion beam (FIB) software targeting tools, and planning for failure analys
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Clark, Ronald N., Robert Burrows, Tomas Martin, et al. "Examination of a Ferritic-Martensitic Steel Following Irradiation and High Temperature Water Corrosion." In CONFERENCE 2022. AMPP, 2022. https://doi.org/10.5006/c2022-18127.

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Abstract This paper focuses on the characterization of an advanced steel which has been developed for use as a structural material within future nuclear fusion reactors, including in irradiated water coolant-facing locations. In the paper an experimental plan is described which would allow both the corrosion and stress corrosion cracking susceptibility of irradiated Eurofer-97 to be studied. Also included are early results from characterization of self-ion irradiated (using Fe ions) Eurofer-97 following high temperature corrosion experiments using electron microscopy techniques. Field emission
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Perez, R., O. Flores, L. Martinez, A. Zaragoza, and N. Acuña. "Microstructural and Chemical Characterization of MIC Products from Stainless Steel Probes in Seawater Using SEM and AFM Techniques." In CORROSION 1996. NACE International, 1996. https://doi.org/10.5006/c1996-96282.

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Abstract The use of electron microscopy techniques have various applications in the corrosion research. Scanning electron microscopy (SEM) and the chemical analysis of the corrosion products are commonly found in the corrosion related literature. Also, microstructural characterizations based on transmision electron microscopy (TEM) and electron diffraction patterns are widely used. More recent microscopy techniques such as the atomic force microscopy (AFM) have also been used for corrosion research. One of the main advantages of this technique is that allows to perform microscopy observations
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Noor, Mohamed Yaseen, Emma DeAngelis, Maxwell Weiss, Carmen S. Menoni, and Enam Chowdhury. "Ultrafast laser-induced damage and transmission electron microscopy (TEM) investigations in nanolaminates and mixed layer dielectric coatings." In Laser-Induced Damage in Optical Materials 2024, edited by Christopher W. Carr, Detlev Ristau, Carmen S. Menoni, and Michael D. Thomas. SPIE, 2024. https://doi.org/10.1117/12.3033005.

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Yoon, Aram. "Liquid cell electron microscopy: A comparison between SEM and TEM." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1180.

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Subramanian, Sam, Khiem Ly, and Tony Chrastecky. "Transmission Electron Microscopy (TEM) Techniques for Semiconductor Failure Analysis." In ISTFA 2022. ASM International, 2022. http://dx.doi.org/10.31399/asm.cp.istfa2022tpl1.

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Abstract This presentation shows how transmission electron microscopy (TEM) is used in semiconductor failure analysis to locate and identify defects based on their physical and elemental characteristics. It covers sample preparation methods for planar, cross-sectional, and elemental analysis, reviews the capabilities of different illumination and imaging modes, and shows how beam-specimen interactions are employed in energy dispersive (EDS) and electron energy loss spectroscopy (EELS). It describes the various ways transmission electron microscopes can be configured for elemental analysis and
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Reports on the topic "Electron microscopy (TEM)"

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Noel, Erika, Giulia Mattana, and Anthony McGoron. A Comparative Analysis of Nanoparticle Sizing Techniques for Enhanced Drug Delivery Applications. Florida International University, 2025. https://doi.org/10.25148/fiuurj.3.1.5.

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Nanoparticle-based drug delivery systems hold promise for improving therapeutic efficacy and targeting precision. However, a critical challenge in their development is ensuring size stability, as particle size directly influences biodistribution, cellular uptake, and drug release profiles. This study establishes a streamlined methodology to assess nanoparticle size consistency by comparing three widely used characterization techniques: Dynamic Light Scattering (DLS), Transmission Electron Microscopy (TEM), and Nanoparticle Tracking Analysis (NTA). Two types of nanoparticles were analyzed: 100
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Greaves, C., and J. B. R. Eamer. Focus stacking for cataloguing, presentation, and identification of microfossils in marine sediments. Natural Resources Canada/CMSS/Information Management, 2023. http://dx.doi.org/10.4095/331355.

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Microfossils represent an important part of studying past depositional environments and determining ages for the strata they are found within. The key to ascribing paleoenvironmental interpretations to the sediments in which a microfossil is found is accurate identification of the microfossil. A number of techniques can be used to identify microfossils, including ones that use key features, morphologies, and characteristics from imagery acquired using a scanning electron microscope. A low-cost, efficient alternative method is digital photography of optical microscope images. This technical not
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Unlu, Kenan, Carlos Rios-Martinez, Mehmet Saglam, Ron R. Hart, John D. Shipp, and John Rennie. Electron Microscopy Study of Stainless Steel Radiation Damage Due to Long-Term Irradation by Alpha Particles Emitted From Plutonium. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/1184375.

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Gafny, Ron, A. L. N. Rao, and Edna Tanne. Etiology of the Rugose Wood Disease of Grapevine and Molecular Study of the Associated Trichoviruses. United States Department of Agriculture, 2000. http://dx.doi.org/10.32747/2000.7575269.bard.

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Rugose wood is a complex disease of grapevines, characterized by modification of the woody cylinder of affected vines. The control of rugose wood is based on the production of healthy propagation material. Detection of rugose wood in grapevines is difficult and expensive: budwood from tested plants is grafted onto sensitive Vitis indicators and the appearance of symptoms is monitored for 3 years. The etiology of rugose wood is complex and has not yet been elucidated. Several elongated clostero-like viruses are consistently found in affected vines; one of them, grapevine virus A (GVA), is close
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Dickman, Martin B., and Oded Yarden. Genetic and chemical intervention in ROS signaling pathways affecting development and pathogenicity of Sclerotinia sclerotiorum. United States Department of Agriculture, 2015. http://dx.doi.org/10.32747/2015.7699866.bard.

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Abstract: The long-term goals of our research are to understand the regulation of sclerotial development and pathogenicity in S. sclerotior11111. The focus in this project was on the elucidation of the signaling events and environmental cues involved in the regulation of these processes, utilizing and continuously developing tools our research groups have established and/or adapted for analysis of S. sclerotiorum, Our stated objectives: To take advantage of the recent conceptual (ROS/PPs signaling) and technical (amenability of S. sclerotiorumto manipulations coupled with chemical genomics and
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