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Relevant bibliographies by topics / Electronic Microscope and microscopy

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Academic literature on the topic 'Electronic Microscope and microscopy'

Author: Grafiati

Published: 26 July 2024

Last updated: 31 July 2025

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Journal articles on the topic "Electronic Microscope and microscopy"

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Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.

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Daberkow, I., and M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving." Microscopy and Microanalysis 4, S2 (1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.

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Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for elec

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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Vilà, Anna, Sergio Moreno, Joan Canals, and Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay." Sensors 21, no. 17 (2021): 5941. http://dx.doi.org/10.3390/s21175941.

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Lensless microscopy requires the simplest possible configuration, as it uses only a light source, the sample and an image sensor. The smallest practical microscope is demonstrated here. In contrast to standard lensless microscopy, the object is located near the lighting source. Raster optical microscopy is applied by using a single-pixel detector and a microdisplay. Maximum resolution relies on reduced LED size and the position of the sample respect the microdisplay. Contrarily to other sort of digital lensless holographic microscopes, light backpropagation is not required to reconstruct the i

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Katoh, Kazuo. "Software-Based Three-Dimensional Deconvolution Microscopy of Cytoskeletal Proteins in Cultured Fibroblast Using Open-Source Software and Open Hardware." Journal of Imaging 5, no. 12 (2019): 88. http://dx.doi.org/10.3390/jimaging5120088.

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As conventional fluorescence microscopy and confocal laser scanning microscopy generally produce images with blurring at the upper and lower planes along the z-axis due to non-focal plane image information, the observation of biological images requires “deconvolution.” Therefore, a microscope system’s individual blur function (point spread function) is determined theoretically or by actual measurement of microbeads and processed mathematically to reduce noise and eliminate blurring as much as possible. Here the author describes the use of open-source software and open hardware design to build

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Dantas de Oliveira, Allisson, Carles Rubio Maturana, Francesc Zarzuela Serrat, et al. "Development of a low-cost robotized 3D-prototype for automated optical microscopy diagnosis: An open-source system." PLOS ONE 19, no. 6 (2024): e0304085. http://dx.doi.org/10.1371/journal.pone.0304085.

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In a clinical context, conventional optical microscopy is commonly used for the visualization of biological samples for diagnosis. However, the availability of molecular techniques and rapid diagnostic tests are reducing the use of conventional microscopy, and consequently the number of experienced professionals starts to decrease. Moreover, the continuous visualization during long periods of time through an optical microscope could affect the final diagnosis results due to induced human errors and fatigue. Therefore, microscopy automation is a challenge to be achieved and address this problem

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Schwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope." Practical Metallography 51, no. 3 (2014): 160–79. http://dx.doi.org/10.3139/147.110280.

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Doroshenko, Olga V., Mikhail V. Golub, Oksana Yu Kremneva, et al. "Automated Assessment of Wheat Leaf Disease Spore Concentration Using a Smart Microscopy Scanning System." Agronomy 14, no. 9 (2024): 1945. http://dx.doi.org/10.3390/agronomy14091945.

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An advanced approach to the automated assessment of a microscopic slide containing spores is presented. The objective is to develop an intelligent system for the rapid and precise estimation of phytopathogenic spore concentration on microscopic slides, thereby enabling automated processing. The smart microscopy scanning system comprises an electronic microscope, a coordinate table, and software for the control of the coordinate table and image processing. The developed smart microscopy scanning system processes the entire microscope slide with multiple exposed strips, which are automatically d

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Dissertations / Theses on the topic "Electronic Microscope and microscopy"

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Yu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /." [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.

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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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Harland, C. J. "Detector and electronic developments for scanning electron microscopy." Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.

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于恩華 and Enhua Yu. "Crossed and uncrossed retinal fibres in normal and monocular hamsters: light and electron microscopic studies." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1990. http://hub.hku.hk/bib/B31232449.

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Bélisle, Jonathan. "Design and assembly of a multimodal nonlinear laser scanning microscope." Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=100765.

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The objective of this thesis is to present the fabrication of a multiphoton microscope and the underlying theory responsible for its proper functioning. A basic introduction to nonlinear optics will give the necessary knowledge to the reader to understand the optical effects involved. Femtosecond laser pulses will be presented and characterized. Each part of the microscope, their integration and the design of the microscope will be discussed. The basic concepts of laser scanning microscopy are also required to explain the design of the scanning optics. Fast scanning problems and their solution

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El, Hajraoui Khalil. "Études in-situ dans un microscope électronique en transmission des réactions à l’état solide entre métal et nanofil de Ge." Thesis, Université Grenoble Alpes (ComUE), 2017. http://www.theses.fr/2017GREAY012/document.

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Le domaine des nanofils semi-conducteurs est en pleine expansion depuis ces dix dernières années grâce à leurs applications dans de nombreux domaines tels que l’électronique ou la conversion d’énergie. Dans cette étude on part d’une base de nanofil de germanium (le canal), on dépose des contacts métalliques qui seront chauffés par effet joule. Une différence de potentiel est alors appliquée au contact d’entrée (la source), le courant électrique est récupéré et mesuré par le contact de sortie (le drain). Une réaction à l’état solide permet aux atomes du métal de diffuser dans le nanofil. La pro

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Romero, Leiro Freddy José. "Poly-articulated microrobotics for correlative AFM-in-SEM microscopy." Electronic Thesis or Diss., Sorbonne université, 2023. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2023SORUS520.pdf.

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La microscopie corrélative est le résultat de la combinaison de deux ou plusieurs techniques de microscopie pour fournir des informations complémentaires sur un échantillon. En utilisant un microscope électronique à balayage (MEB) et un microscope à force atomique (AFM), la microscopie corrélative AFM-in-SEM permet non seulement la caractérisation 3D d'échantillons observés à l'intérieur d'un MEB, mais aussi la manipulation de micro- et nanostructures avec une très grande précision. Cette technique peut être appliquée à divers échantillons dans les domaines de la biologie, de l'électronique et

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Leane, Robert B. "Scanning tunnelling microscopy." Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.291716.

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Marturi, Naresh. "Vison and visual servoing for nanomanipulation and nanocharacterization using scanning electron microscope." Thesis, Besançon, 2013. http://www.theses.fr/2013BESA2014/document.

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Avec les dernières avancées en matière de nanotechnologies, il est devenu possible de concevoir, avec une grande efficacité, de nouveaux dispositifs et systèmes nanométriques. Il en résulte la nécessité de développer des méthodes de pointe fiables pour la nano manipulation et la nano caractérisation. La d´étection directe par l’homme n’ étant pas une option envisageable à cette échelle, les tâches sont habituellement effectuées par un opérateur humain expert `a l’aide de microscope électronique à balayage équipé de dispositifs micro nano robotiques. Toutefois, en raison de l’absence de méthode

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Tomic, Aleksandra T. "Scanning tunneling microscopy of complex electronic materials." Diss., Connect to online resource - MSU authorized users, 2008.

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Thesis (Ph.D.)--Michigan State University. Dept. of Physics and Astronomy, 2008.<br>Title from PDF t.p. (viewed on Mar. 27, 2009) Includes bibliographical references (p. 95-102). Also issued in print.

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Books on the topic "Electronic Microscope and microscopy"

1

Doane, Frances W. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada/Société de microscopie du Canada. Microscopical Society of Canada, 1993.

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W, Doane F., Simon G. T, and Watson J. H. L, eds. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada / Société de Microscopie du Canada. Microscopial Society of Canada, 1993.

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Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Springer, 1998.

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J, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Elsevier, 1985.

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Hayat, M. A. Basic techniques for transmission electron microscopy. Academic Press, 1985.

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Champness, P. E. Electron diffraction in the transmission electron microscope. BIOS Scientific Publishers, 2001.

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Ayache, Jeanne. Sample preparation handbook for transmission electron microscopy: Techniques. Springer, 2010.

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Tomb, Howard. Microaliens: Dazzling journeys with an electron microscope. Farrar, Straus and Giroux, 1993.

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Goodhew, Peter J. Electron microscopy and analysis. 2nd ed. Taylor & Francis, 1988.

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Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Published on behalf of ACOL by Wiley, 1987.

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Book chapters on the topic "Electronic Microscope and microscopy"

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Badiye, Ashish, Neeti Kapoor, and Ritesh K. Shukla. "Forensic Applications of Electron Microscope." In Forensic Microscopy. CRC Press, 2022. http://dx.doi.org/10.4324/9781003120995-20.

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Milne, R. H. "Reflection Microscopy in a Scanning Transmission Electron Microscope." In NATO ASI Series. Springer US, 1988. http://dx.doi.org/10.1007/978-1-4684-5580-9_23.

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Sims, Paul, Ralph Albrecht, James B. Pawley, Victoria Centonze, Thomas Deerinck, and Jeff Hardin. "When Light Microscope Resolution Is Not Enough:Correlational Light Microscopy and Electron Microscopy." In Handbook Of Biological Confocal Microscopy. Springer US, 2006. http://dx.doi.org/10.1007/978-0-387-45524-2_49.

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Williams, David B., and C. Barry Carter. "The Transmission Electron Microscope." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_1.

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Williams, David B., and C. Barry Carter. "The Transmission Electron Microscope." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_1.

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Gerber, Ch, G. Binnig, H. Fechs, O. Marti, and H. Rohrer. "Scanning tunneling microscope combined with a scanning electron microscope." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_8.

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Reimer, Ludwig. "Electron Optics of a Scanning Electron Microscope." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_2.

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Reimer, Ludwig. "Elements of a Transmission Electron Microscope." In Transmission Electron Microscopy. Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_4.

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Reimer, Ludwig. "Elements of a Transmission Electron Microscope." In Transmission Electron Microscopy. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_4.

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Reimer, Ludwig. "Elements of a Transmission Electron Microscope." In Transmission Electron Microscopy. Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_4.

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Conference papers on the topic "Electronic Microscope and microscopy"

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Milner, R., and M. W. Phaneuf. "Comparative Carburization of Heat Resistant Alloys." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98431.

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Abstract Two high strength, centrifugally cast heat resistant materials were examined under near identical pack carburizing conditions. The first material represented an alloy class which is becoming the most popular for replacement coils in ethylene pyrolysis furnaces due to its large improvement in carburization resistance over HP based alloys. The second material represented the next generation of alloys to be used for this purpose. Additionally, several investigative techniques were employed to illustrate some of the strengths and weaknesses of each technique. A recent advance in microscop

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Little, Brenda J., Robert K. Pope, Tyrone L. Daulton, and Richard I. Ray. "Application of Environmental Cell Transmission Electron Microscopy to Microbiologically Influenced Corrosion." In CORROSION 2001. NACE International, 2001. https://doi.org/10.5006/c2001-01266.

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Abstract The spatial/chemical relationship between bacteria, their biofilms, and metal substrata was examined in an environmental cell transmission electron microscope equipped with an energy loss spectrometer. The advantage of environmental cell transmission electron microscopy is that unfixed, hydrated specimens can be examined, in more or less their natural state, with high spatial resolution.

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Clark, Ronald N., Robert Burrows, Tomas Martin, et al. "Examination of a Ferritic-Martensitic Steel Following Irradiation and High Temperature Water Corrosion." In CONFERENCE 2022. AMPP, 2022. https://doi.org/10.5006/c2022-18127.

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Abstract This paper focuses on the characterization of an advanced steel which has been developed for use as a structural material within future nuclear fusion reactors, including in irradiated water coolant-facing locations. In the paper an experimental plan is described which would allow both the corrosion and stress corrosion cracking susceptibility of irradiated Eurofer-97 to be studied. Also included are early results from characterization of self-ion irradiated (using Fe ions) Eurofer-97 following high temperature corrosion experiments using electron microscopy techniques. Field emission

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Hye Hyun, Ji, Yanchao Dai, In Chang Choi, and Christopher H. Kang. "The Impact of TEM Analysis Temperature on Photoresist Profiles Using Cryo-FIB and Cryo-TEM." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0221.

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Abstract Photoresist (PR) profiles tend to have deformation and shrinkage with typical transmission electron microscopy (TEM) analysis method using a focused ion beam scanning electron microscope (FIB-SEM) and TEM. The elevated temperatures during sample preparation and TEM analysis are believed to contribute to these issues. This study evaluates the effectiveness of cryogenic workflow in mitigating PR profile shrinkage by employing cryo-focused ion beam (Cryo-FIB) and cryo-transmission electron microscopy (Cryo-TEM). Comparative experiments were conducted at room temperature and cryogenic con

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Galliopoulou, Eirini C., Christopher Jones, Lawrence Coghlan, et al. "Creep Cavitation Imaging and Analysis in 9%Cr-1%Mo P91 Steels." In AM-EPRI 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.am-epri-2024p0219.

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Abstract The current research adopts a novel approach by integrating correlative microscopy and machine learning in order to study creep cavitation in an ex-service 9%Cr 1%Mo Grade 91 ferritic steel. This method allows for a detailed investigation of the early stages of the creep life, enabling identification of features most prone to damage such as precipitates and the ferritic crystal structure. The microscopy techniques encompass Scanning Electron Microscopy (SEM) imaging and Electron Back-scattered Diffraction (EBSD) imaging, providing insights into the two-dimensional distribution of cavi

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Monachon, C., M. S. Zielinski, D. Gachet, et al. "Failure Analysis and Defect Inspection of Electronic Devices by High-Resolution Cathodoluminescence." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0349.

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Abstract Quantitative cathodoluminescence (CL) microscopy is a new optical spectroscopy technique that measures electron beam-induced optical emission over large field of view with a spatial resolution close to that of a scanning electron microscope (SEM). Correlation of surface morphology (SE contrast) with spectrally resolved and highly material composition sensitive CL emission opens a new pathway in non-destructive failure and defect analysis at the nanometer scale. Here we present application of a modern CL microscope in defect and homogeneity metrology, as well as failure analysis in sem

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Yatagai, Toyohiko, Katsuyuki Ohmura, and Shigeo Iwasaki. "Phase sensitive analysis of electron holograms." In Holography. Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.

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Holography has been used in electron microscopy since the field emission electron microscope was developed.[1] Tonomura et al described the interference microscope based on the electron holography to evaluate microscopic distribution of the magnetic field. [2] To gain high sensitivity the use of the optical phase multiplication technique was discussed so as to obtain 10 time magnification of the reconstructed phase. [3] Recently Takeda et al applied the FFT method of the subfringe analysis for electron holographic fringes.[4] They mentioned phase variations much smaller than 2 π could be detec

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Baibyrin, V. B., P. I. Anisimov, N. P. Konnov, A. A. Shcherbakov, and U. P. Volkov. "Near field scanning optical microscope for biological applications." In Laser Applications to Chemical and Environmental Analysis. Optica Publishing Group, 1996. http://dx.doi.org/10.1364/lacea.1996.lwd.9.

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In our biophysical laboratory systematic investigations of plague and choler microbes are carried out by different methods (conventional electron microscopy, scanning tunneling microscopy and atomic force microscopy). At present for the investigations we have develop a near field scanning optical microscope (NSOM).

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Villarraga-Gómez, Herminso, Kyle Crosby, Masako Terada, and Mansoureh Norouzi Rad. "Assessing Electronics with Advanced 3D X-ray Microscopy Techniques and Electron Microscopy." In ISTFA 2023. ASM International, 2023. http://dx.doi.org/10.31399/asm.cp.istfa2023p0554.

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Abstract This paper presents advanced workflows that combine 3D Xray microscopy (XRM), nanoscale tomography, and electron microscopy to generate a detailed visualization of the interior of electronic devices and assemblies to enable the study of internal components for failure analysis (FA). Newly developed techniques such as the integration of deep-learning (DL) based algorithms for 3D image reconstruction are also discussed in this article. In addition, a DL-based tool (called DeepScout) is introduced that uses high-resolution 3D XRM datasets as training data for lower-resolution, larger fie

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Sandoz, P., J. L. Pretet, R. Zeggari, L. Froehly, C. Mougin, and M. P. Bernal. "Micro-patterned microscope slides for position referencing in optical microscopy." In 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference. IEEE, 2007. http://dx.doi.org/10.1109/cleoe-iqec.2007.4386655.

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Reports on the topic "Electronic Microscope and microscopy"

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De Lozanne, Alejandro. Nanofabrication of Electronic Devices With the Scanning Tunneling Microscope. Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada292463.

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Cobden, David. Combined microscopy studies of complex electronic materials. Final report. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1570390.

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LeRoy, Brian. Understanding and Controlling the Electronic Properties of Graphene Using Scanning Probe Microscopy. Defense Technical Information Center, 2014. http://dx.doi.org/10.21236/ada612223.

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Yazdani, Ali. Probing Electronic States of Magnetic Semiconductors Using Atomic Scale Microscopy & Spectroscopy. Defense Technical Information Center, 2013. http://dx.doi.org/10.21236/ada614343.

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Davis, Seamus, and Paul L. McEuen. Electronic Wavefunction Imaging and Spectroscopy in Metallic and Magnetic Nanostructures by Millikelvin Scanning Tunneling Microscopy. Defense Technical Information Center, 2002. http://dx.doi.org/10.21236/ada414343.

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Williams, Clayton, and Christoph Boehme. Room Temperature Single-Spin Tunneling Force Microscopy for Characterization of Paramagnetic Defects in Electronic Materials. Defense Technical Information Center, 2014. http://dx.doi.org/10.21236/ada604959.

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Barbara, Paul F. Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics,. Defense Technical Information Center, 1995. http://dx.doi.org/10.21236/ada294879.

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Wolf, E. L. Control of the Residual Sub-Electronic Charge on a Mesoscopic Conductor by Means of a Scanning Tunneling Microscope Tip. Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada277290.

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Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/6000131.

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Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/7015892.

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