Relevant bibliographies by topics / Ion Beam Analysis

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Ion Beam Analysis'

Author: Grafiati
Published: 4 June 2021
Last updated: 25 July 2025

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Journal articles on the topic "Ion Beam Analysis"

1

Pathak, Anand P., Devesh K. Avasthi, and Bhupendra N. Dev. "Ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 266, no. 8 (2008): iii. http://dx.doi.org/10.1016/j.nimb.2008.03.093.

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FUJIMOTO, Fuminori. "Ion beam analysis." Bunseki kagaku 40, no. 11 (1991): 577–97. http://dx.doi.org/10.2116/bunsekikagaku.40.11_577.

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Kramer, Edward J. "Ion-Beam Analysis of Polymer Surfaces and Interfaces." MRS Bulletin 21, no. 1 (1996): 37–42. http://dx.doi.org/10.1557/s0883769400035144.

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Ion-beam analysis of chemical composition as a function of depth is by now well-established for inorganic materials and is an important method of investigating growth of thin films. It has been applied to polymers much more recently, perhaps because fairly obvious problems with radiation damage discouraged workers in this field initially. Ion-beam analysis has developed, however, into a analytical tool that complements other methods, such as x-ray photoelectron spectroscopy and neutron reflection, very well. The purpose of this short article is to give the reader an introduction to its current
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Al-Bayati, A. H., K. G. Orrman-Rossiter, D. G. Armour, J. A. Van den Berg, and S. E. Donnelly. "Ion beam deposition and in-situ ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 63, no. 1-2 (1992): 109–19. http://dx.doi.org/10.1016/0168-583x(92)95179-u.

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Bahng, Jungbae, Yuncheol Kim, Young-woo Lee, et al. "Multi-filament ion source for uniform ion beam generation." Journal of Physics: Conference Series 2743, no. 1 (2024): 012054. http://dx.doi.org/10.1088/1742-6596/2743/1/012054.

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Abstract Ion beams are employed in various fields such as semiconductor manufacturing, surface modification and material science. The uniformity of ion beams is crucial in many applications, but conventional ion sources that use a single filament often limit the uniformity and intensity of the ion beam. This paper presents a study that aims to optimize a multi-filament ion source to enhance the uniformity of ion beams. The study includes a detailed explanation of the ion source components and design, methods for measuring ion beam uniformity with its experimental design, followed by results, a
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Ishii, Yasuyuki, and Takeru Ohkubo. "Analysis of Ion-Species of a Dedicated Duoplasmatron-type Ion Source for a 100 keV-Rage Compact Ion-Microbeam System." Journal of Physics: Conference Series 2326, no. 1 (2022): 012013. http://dx.doi.org/10.1088/1742-6596/2326/1/012013.

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Abstract Hydrogen-ion beam species generated by a dedicated duoplasmatron-type ion source that was developed for a MeV compact ion-microbeam system was experimentally analyzed in a test bench to study the ion source feature. Bimolecular and trimolecular hydrogen-ion beams were mainly generated by the duoplasmatron-type ion source. The ratio of the two different molecular hydrogen-ion beams was controlled by turning hydrogen-gas pressure. This experiment showed that the duoplasmatron-type ion source could produce a single molecular hydrogen-ion beam for ion-microbeam applications.
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Mingay, D. W., V. M. Prozesky, and P. B. Kotzé. "Prompt ion beam analysis by pulsed beams." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 35, no. 3-4 (1988): 339–43. http://dx.doi.org/10.1016/0168-583x(88)90293-5.

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Cookson, J. A., and T. W. Conlon. "MeV ion-beam analysis." Journal of Research of the National Bureau of Standards 93, no. 3 (1988): 473. http://dx.doi.org/10.6028/jres.093.123.

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Matuo, Youichirou, Yoshinobu Izumi, Ayako N. Sakamoto, Yoshihiro Hase, Katsuya Satoh, and Kikuo Shimizu. "Molecular Analysis of Carbon Ion-Induced Mutations in DNA Repair-Deficient Strains of Saccharomyces cerevisiae." Quantum Beam Science 3, no. 3 (2019): 14. http://dx.doi.org/10.3390/qubs3030014.

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Mutations caused by ion beams have been well-studied in plants, including ornamental flowers, rice, and algae. It has been shown that ion beams have several significantly interesting features, such as a high biological effect and unique mutation spectrum, which is in contrast to low linear energy transfer (LET) radiation such as gamma rays. In this study, the effects of double strand breaks and 8-oxo-2′-deoxyguanosine (8-oxodG) caused by ion-beam irradiation were examined. We irradiated repair-gene-inactive strains rad52, ogg1, and msh2 using carbon ion beams, analyzed the lethality and mutage
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Zhou, Lin, Yi Fan Dai, Xu Hui Xie, Chang Jun Jiao, and Sheng Yi Li. "Analysis of Correcting Ability of Ion Beam Figuring." Key Engineering Materials 364-366 (December 2007): 470–75. http://dx.doi.org/10.4028/www.scientific.net/kem.364-366.470.

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In ion beam figuring process, typically, the smaller ion beam diameter has a good ability to “correct” the optical surface error, i.e. the smaller ion beam diameter indicates the higher material removal efficiency ε. The material removal efficiency is defined as the ratio of the volume of desired material removal to that of the real material removal. However the smaller ion beam diameter always results in more processing time, which usually decreases the process reliability. In this paper, the relationship between the material removal efficiency and the ion beam diameter is analyzed. The theor
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Dissertations / Theses on the topic "Ion Beam Analysis"

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Boudreault, Ghislain. "Accurate ion beam analysis." Thesis, University of Surrey, 2002. http://epubs.surrey.ac.uk/844001/.

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This thesis primarily deals with accuracy obtainable when using IBA (Ion Beam Analysis) techniques to characterize materials. RBS (Rutherford Backscattering Spectrometry) is the main technique used, together with EBS (Elastic Backscattering Spectrometry), ERDA (Elastic Recoil Detection Analysis) and NRA (Nuclear Reaction Analysis). An exhaustive literature review on these analytical methods is made in connection with accuracy issues such as stopping powers and multiple scattering. The experimental set-ups and procedures are described, with emphasis laid on critical aspects of work where the hi
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Müggenburg, Jan. "Ion beam analysis of metallic vanadium superlattices : Ion beam analysis of metallic vanadium superlattices." Thesis, Uppsala universitet, Tillämpad kärnfysik, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-328067.

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Messerly, Michael Joseph. "Ion-beam analysis of optical coatings." Diss., The University of Arizona, 1987. http://hdl.handle.net/10150/184273.

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Rutherford backscattering spectrometry (RBS) is shown to be an elegant, powerful tool for the chemical characterization of optical coatings. RBS studies of several thin film materials are presented to illustrate the technique's unique abilities, and to show how RBS is best exploited in investigations of thin film stoichiometry and diffusion. The text begins with an introduction to optical coatings and the practical problems encountered in their implementation. The basic principles of RBS are discussed, and the technique is compared to other popular surface analysis tools. The introductory mate
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Gauntlett, F. E. "Novel applications of ion beam analysis techniques." Thesis, University of Surrey, 2009. http://epubs.surrey.ac.uk/842938/.

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Ion beam analysis (IBA) has been used as a powerful tool for studying materials for many years. Depending on the specific experimental design, IBA techniques can provide a non-destructive means of analysing samples to obtain such information as the elements or isotopes present and diffusion or depth profiles. Ion beam analysis has the ability to keep up with the rapid progress in new materials both as technology improves and as scientists have the creativity to develop existing and new techniques. Many different types of IBA exist. The experiments reported in this thesis were carried out using
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Shearmur, Thomas E. "Ion beam analysis of diffusion in polymers." Thesis, University of Surrey, 1996. http://epubs.surrey.ac.uk/844449/.

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With the rapid spread in use of polymers the study of diffusion in them is becoming increasingly important. For a number of industrial processes diffusion coefficients and elemental distributions need to be quantified precisely. From a more scientific approach accurate models need to be devised to describe the various diffusion mechanisms involved as well as the concentration and temperature dependencies of the diffusion coefficients. Using ion beam analysis techniques (Rutherford Backscattering and Nuclear Reaction Analysis) three systems were studied. The first was an industrially relevant s
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Healy, M. J. F. "The development of MeV ion beam analysis techniques." Thesis, Cranfield University, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.403621.

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Jenneson, P. M. "Ion beam analysis of molecular diffusion in heterogeneous materials." Thesis, University of Surrey, 1998. http://epubs.surrey.ac.uk/844259/.

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Scanning ion micro-beam analysis has been used to determine the diffusion of molecules in materials with a combination of high spatial resolution and concentration sensitivity not possible with other analytical techniques. The ion beam analysis apparatus and techniques available at the University of Surrey are described. Methodologies have been devised to determine the scanning micro-beam line scan size and the diameter of the beam spot. Adaptations to the micro-beam line hardware have been proposed with the design of a novel form of none interrupting beam current monitor utilising a transmiss
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Chaffee, Kevin Paul. "Ion beam analysis of diffusion in diamondlike carbon films." Case Western Reserve University School of Graduate Studies / OhioLINK, 1991. http://rave.ohiolink.edu/etdc/view?acc_num=case1055777288.

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Tucker, Thomas Marshall. "Three dimensional measurement data analysis in stereolithography rapid prototyping." Thesis, Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/17082.

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Smith, Richard W. "A study of small molecule ingress into planar and cylindrical materials using ion beam analysis." Thesis, University of Surrey, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.390579.

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Books on the topic "Ion Beam Analysis"

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Jalabert, Denis, Ian Vickridge, and Amal Chabli. Swift Ion Beam Analysis in Nanosciences. John Wiley & Sons, Inc., 2017. http://dx.doi.org/10.1002/9781119005063.

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Götz, Gerhard, Prof. Dr. sc. nat. and Gärtner Konrad, eds. High energy ion beam analysis of solids. Akademie-Verlag, 1988.

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Wang, Yongqiang. Handbook of modern ion beam materials analysis. 2nd ed. Materials Research Society, 2009.

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Wang, Yongqiang. Handbook of modern ion beam materials analysis. 2nd ed. Materials Research Society, 2009.

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Komarov, F. F. Non-destructive ion beam analysis of surfaces. Gordon and Breach Science Publishers, 1990.

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R, Tesmer Joseph, and Nastasi Michael Anthony 1950-, eds. Handbook of modern ion beam materials analysis. Materials Research Society, 1995.

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Wang, Yongqiang. Handbook of modern ion beam materials analysis: Appendices. 2nd ed. Materials Research Society, 2009.

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Wang, Yongqiang. Handbook of modern ion beam materials analysis: Appendices. 2nd ed. Materials Research Society, 2009.

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International Conference on Ion Beam Analysis (11th 1993 Balatonfüred, Hungary). Ion beam analysis: Proceedings of the eleventh International Conference on Ion Beam Analysis, Balatonfüred, Hungary, July 5-9, 1993. Edited by Gyulai J. North-Holland, 1994.

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International, Conference on Ion Beam Analysis (10th 1991 Eindhoven The Netherlands). Ion beam analysis: Proceedings of the Tenth International Conference on Ion Beam Analysis, Eindhoven, The Netherlands, 1-5 July, 1991. North-Holland, 1992.

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Book chapters on the topic "Ion Beam Analysis"

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Avasthi, D. K., and G. K. Mehta. "Ion Beam Analysis." In Swift Heavy Ions for Materials Engineering and Nanostructuring. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-1229-4_3.

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Schmidt, Bernd, and Klaus Wetzig. "Ion Beam Technology." In Ion Beams in Materials Processing and Analysis. Springer Vienna, 2012. http://dx.doi.org/10.1007/978-3-211-99356-9_3.

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Šmit, Ž. "Ion-Beam Analysis Methods." In Modern Methods for Analysing Archaeological and Historical Glass. John Wiley & Sons Ltd, 2013. http://dx.doi.org/10.1002/9781118314234.ch7.

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Dresselhaus, M. S., and R. Kalish. "Ion Beam Analysis Techniques." In Ion Implantation in Diamond, Graphite and Related Materials. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-77171-2_4.

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Rupertus, Volker. "Ion Beam Spectrochemical Analysis (IBSCA)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch22.

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Yamamoto, Shunya. "Ion Beam Analysis of Materials." In An Advanced Course in Nuclear Engineering. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-7350-2_12.

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Valković, Vlado. "Ion Beam Analysis: Analytical Applications." In Low Energy Particle Accelerator-Based Technologies and Their Applications. CRC Press, 2022. http://dx.doi.org/10.1201/9781003033684-3.

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Schmidt, Bernd, and Klaus Wetzig. "Ion Beam Preparation of Materials." In Ion Beams in Materials Processing and Analysis. Springer Vienna, 2012. http://dx.doi.org/10.1007/978-3-211-99356-9_5.

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Petzold, G., P. Siebert, and J. Müller. "A Micromachined Electron Beam Ion Source." In Micro Total Analysis Systems 2000. Springer Netherlands, 2000. http://dx.doi.org/10.1007/978-94-017-2264-3_40.

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Sakamoto, Tetsuo. "Focused Ion Beam Scanning Electron Microscope." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_31.

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Conference papers on the topic "Ion Beam Analysis"

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Chong, Xue Yao, and Dionaldo Zudhistira. "Techniques and Applications of Plasma Focused Ion Beam in Silicon Die Delayering." In 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2024. http://dx.doi.org/10.1109/ipfa61654.2024.10690951.

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Johnson, Gregory M., Cheryl Hartfield, Andreas Rummel, Heiko Stegmann, and Lorenz Lechner. "Consideration of a Ga-FIB in Lamella Sample Prep for EBIC/EBAC Analysis of Advanced-Node SRAMs." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0478.

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Abstract The effects of sample prep with a Ga+-ion Focused Ion Beam (Ga-FIB) on measurements of electron beam induced current (EBIC) were studied. Concerns have been occasionally raised about amorphization from the beam, or even Ga+ implantation ruining the ability to make useful measurements for purposes of either failure analysis or device tailoring. To understand the magnitude of any deleterious effects, two different lamellae from a 5 nm SRAM sample were prepared with different areas of increasingly improved polish, as indicated by decreasing, cumulative, FIB beam energy, followed by EBIC
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Toussaint, U. v. "Bayesian analysis of ion beam diagnostics." In The twentieth international workshop on bayesian inference and maximum entropy methods in science and engineering. AIP, 2001. http://dx.doi.org/10.1063/1.1381922.

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Schaaf, Peter, Christof Illgner, Felix Landry, and Klaus-Peter Lieb. "Laser nitriding and ion beam analysis." In The fifteenth international conference on the application of accelerators in research and industry. AIP, 1999. http://dx.doi.org/10.1063/1.59282.

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Klatt, Ch, B. Hartmann, and S. Kalbitzer. "Accelerator limitations to ion beam analysis." In The fourteenth international conference on the application of accelerators in research and industry. AIP, 1997. http://dx.doi.org/10.1063/1.52540.

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He, Chun, Z. Postawa, S. Rosencrance, et al. "Effects of Valence Electron Shell Structure on Ion Beam Sputtered Neutrals." In Laser Applications to Chemical and Environmental Analysis. Optica Publishing Group, 1996. http://dx.doi.org/10.1364/lacea.1996.lthd.7.

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Energetic ion impact on a solid initiates a complex dynamical chain of events which include atomic motion, electronic excitation, ionization, and desorption of atomic and molecular species. Measurements on the desorbed particles during the ion-solid interaction process provide a valuable opportunity to understand the ion-solid interactions.[1-2] For more than three decade, research has been focused on understanding the formation of electronic excited states subsequent to ion bombardment in order to establish the role of inelastic energy transfer on ionization and sputtering yield[2]. The widel
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Respaldiza, Miguel A., and Francisco J. Ager. "Ion beam analysis techniques in interdisciplinary applications." In Experimental nuclear physics in europe: Facing the next millennium. AIP, 1999. http://dx.doi.org/10.1063/1.1301836.

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Jankuhn, St, T. Butz, R. H. Flagmeyer, et al. "Ion beam analysis of ancient human bone." In The fourteenth international conference on the application of accelerators in research and industry. AIP, 1997. http://dx.doi.org/10.1063/1.52700.

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Dran, Jean-Claude, and Thomas Calligaro. "Ion beam analysis in cultural heritage studies: Milestones and perspectives." In MULTIDISCIPLINARY APPLICATIONS OF NUCLEAR PHYSICS WITH ION BEAMS (ION BEAMS '12). AIP, 2013. http://dx.doi.org/10.1063/1.4812900.

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Field, K. G., C. J. Wetteland, G. Cao, et al. "University of Wisconsin Ion Beam Laboratory: A facility for irradiated materials and ion beam analysis." In APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-Second International Conference. AIP, 2013. http://dx.doi.org/10.1063/1.4802311.

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Reports on the topic "Ion Beam Analysis"

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Revesz, Peter, and Michael O. Thompson. Next Generation Ion Beam Analysis. Defense Technical Information Center, 1996. http://dx.doi.org/10.21236/ada316736.

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Kramer, Edward J. Ion Beam Analysis of Diffusion in Polymer Glasses. Defense Technical Information Center, 1989. http://dx.doi.org/10.21236/ada212339.

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Berning, Paul R., and Andrus Niiler. Particle Surface Layer Characterization Using Ion Beam Analysis. Defense Technical Information Center, 1996. http://dx.doi.org/10.21236/ada313848.

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Tegtmeier, Eric, Mary Hill, Daniel Rios, and Juan Duque. Focused Ion Beam analysis of non radioactive samples. Office of Scientific and Technical Information (OSTI), 2021. http://dx.doi.org/10.2172/1766960.

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Kulp, William D., and III. Development of Ion Beam Analysis Techniques for Archeological Research. Defense Technical Information Center, 1991. http://dx.doi.org/10.21236/ada245647.

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Dimitriou, P., ed. Developments in the Ion Beam Analysis Nuclear Data Library (IBANDL). IAEA-Nuclear Data Section, 2014. https://doi.org/10.61092/iaea.ps7j-8bxf.

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D.G. Whyte. Dynamics of Plasma-Surface Interactions using In-situ Ion Beam Analysis. Office of Scientific and Technical Information (OSTI), 2009. http://dx.doi.org/10.2172/959136.

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Nastasi, M. Ion beam analysis and modification of thin-film, high-temperature superconductors. Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5658129.

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Rosenberg, Beth Ellen. Analysis of Heavy-Ion Beam Images and Comparison to RetardingPotential Analyzer Measurements. Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/878114.

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Chiari, M., and P. Dimitirou. Benchmarking Experiments for Ion Beam Analysis (Summary Report of the Technical Meeting). IAEA Nuclear Data Section, 2016. http://dx.doi.org/10.61092/iaea.xfh9-5z24.

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