Academic literature on the topic 'Metrology'
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Journal articles on the topic "Metrology"
Brown, Richard J. C., and Paul J. Brewer. "The Silent Benefactor: Why Explaining the Importance of Metrology Involves Addressing the Counterfactual." Metrology 5, no. 2 (2025): 27. https://doi.org/10.3390/metrology5020027.
Full textWidarta, A. "CCEM key comparison CCEM.RF-K26. Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator. Final report of the pilot laboratory." Metrologia 61, no. 1A (2024): 01001. http://dx.doi.org/10.1088/0026-1394/61/1a/01001.
Full textBatóg, Barbara, Mariusz Doszyń, Paweł Majda, et al. "Assessment of the impact of metrology on the economy in Poland by means of the Solow model." Wiadomości Statystyczne. The Polish Statistician 2024, no. 12 (2024): 16–37. https://doi.org/10.59139/ws.2024.12.2.
Full textCosta-Félix, Rodrigo, Americo Bernardes, José Carlos Valente de Oliveira, et al. "VII Brazilian Congress on Metrology (Metrologia 2013)." Journal of Physics: Conference Series 575 (January 6, 2015): 011001. http://dx.doi.org/10.1088/1742-6596/575/1/011001.
Full textAzzumar, Muhammad, та Agah Faisal. "DISEMINASI RESISTOR STANDAR 1 KΩ KE STANDAR KERJA". Jurnal Standardisasi 17, № 3 (2016): 223. http://dx.doi.org/10.31153/js.v17i3.322.
Full textHarfiah, Rismisari. "Implementasi Rancangan Pelatihan Kemetrologian bagi Juru Timbang Menggunakan Metode ADDIE." Cendekia Niaga 3, no. 1 (2019): 9–13. http://dx.doi.org/10.52391/jcn.v3i1.457.
Full textKibble, Bryan. "Everyday instruments from basic metrology [Basic Metrology]." IEEE Instrumentation & Measurement Magazine 18, no. 3 (2015): 9–10. http://dx.doi.org/10.1109/mim.2015.7108212.
Full textDu, Mingxin, Boyong Gao, Shuaizhe Wang, Zilong Liu, Xingchuang Xiong, and Yuqi Luo. "Design and Implementation of Time Metrology Vocabulary Ontology." Electronics 13, no. 14 (2024): 2828. http://dx.doi.org/10.3390/electronics13142828.
Full textKrutikov, V. N., and V. V. Okrepilov. "Money Metrology." Measurement Techniques 63, no. 12 (2021): 993–1003. http://dx.doi.org/10.1007/s11018-021-01883-8.
Full textKrutikov, V. N., and V. V. Okrepilov. "Money metrology." Izmeritel`naya Tekhnika, no. 12 (2020): 42–50. http://dx.doi.org/10.32446/0368-1025it.2020-12-42-50.
Full textDissertations / Theses on the topic "Metrology"
SILVA, PEDRO PAULO ALMEIDA. "METROLOGY IN STANDARDS, STANDARDS IN METROLOGY." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2003. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4049@1.
Full textTONA, ANDREA. "Thermoelectric Metrology." Doctoral thesis, Politecnico di Torino, 2014. http://hdl.handle.net/11583/2546136.
Full textTell, Eric, and Alexander Ökvist. "SMART MANUFACTURING AND METROLOGY : How can metrology enable smart manufacturing?" Thesis, KTH, Industriell produktion, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-244837.
Full textGendra, Casalí Bernat. "Probabilistic quantum metrology." Doctoral thesis, Universitat Autònoma de Barcelona, 2015. http://hdl.handle.net/10803/371132.
Full textFieß, Markus. "Advancing attosecond metrology." Diss., lmu, 2010. http://nbn-resolving.de/urn:nbn:de:bvb:19-119134.
Full textO'Mara, David Thomas John. "Automated facial metrology." University of Western Australia. School of Computer Science and Software Engineering, 2002. http://theses.library.uwa.edu.au/adt-WU2003.0015.
Full textALMEIDA, LUCIANA ALVES DE. "METROLOGY: CITIZENSHIP INSTRUMENT." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2002. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4004@1.
Full textKnott, Paul Alexander. "Robust quantum metrology." Thesis, University of Leeds, 2015. http://etheses.whiterose.ac.uk/8931/.
Full textMehboudi, Mohammad. "Quantum metrology and thermometry in open systems." Doctoral thesis, Universitat Autònoma de Barcelona, 2017. http://hdl.handle.net/10803/405328.
Full textIdowu, Ade. "Dynamic metrology of error motions in precision spindles using optical metrology." Thesis, Cranfield University, 1998. http://dspace.lib.cranfield.ac.uk/handle/1826/3688.
Full textBooks on the topic "Metrology"
Gao, Wei, ed. Metrology. Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-10-4912-5.
Full textNational Institute of Standards and Technology (U.S.), ed. Metrology. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Find full textNational Institute of Standards and Technology (U.S.), ed. Metrology. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Find full textSeminário Rio Metrologia (1st 2002 Rio de Janeiro, Brazil). Seminário Rio Metrologia 2002: 07 a 08 de novembro, Hotel Pestana Rio Atlântica. Rede de Tecnologia do Rio de Janeiro, 2002.
Find full textRio-Metrologia. Rio-Metrologia: Rede de Laboratórios do Rio de Janeiro. Rio Metrologia, 2000.
Find full textFerrero, Alessandro, and Veronica Scotti. Forensic Metrology. Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-14619-0.
Full textSoares, Olivério D. D., ed. Optical Metrology. Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6.
Full textSładek, Jerzy A. Coordinate Metrology. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-48465-4.
Full textBook chapters on the topic "Metrology"
Karaböce, Baki. "Metrology Versus Medical Metrology." In IFMBE Proceedings. Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-49068-2_12.
Full textYagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35950-7_6587-4.
Full textHinduja, Srichand, and Lin Li. "Metrology." In Proceedings of the 37th International MATADOR Conference. Springer London, 2012. http://dx.doi.org/10.1007/978-1-4471-4480-9_7.
Full textYagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6587.
Full textYagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6587.
Full textSoffel, Michael H., and Wen-Biao Han. "Metrology." In Astronomy and Astrophysics Library. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-19673-8_12.
Full textGooch, Jan W. "Metrology." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_7450.
Full textSingh, D. K. "Metrology." In Fundamentals of Manufacturing Engineering. Springer Nature Singapore, 2024. http://dx.doi.org/10.1007/978-981-99-8767-2_22.
Full textMiller, Jimmie. "Metrology." In Basics of Precision Engineering. CRC Press, 2018. http://dx.doi.org/10.1201/9781351204118-2.
Full textArghode, Vaibhav K., and Yogendra Joshi. "Metrology Tools." In Air Flow Management in Raised Floor Data Centers. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-25892-8_2.
Full textConference papers on the topic "Metrology"
Jenssen, Ethan, Zachary Dempsey, and Ali Khounsary. "Ultrafast heliostat metrology." In Nonimaging Optics: Efficient Design for Illumination and Concentration XIX, edited by Lun Jiang, Roland Winston, Håkon Jarand Dugstad Johnsen, and Thomas A. Cooper. SPIE, 2024. http://dx.doi.org/10.1117/12.3028891.
Full textFalaggis, Konstantinos, and Ana Hiza Ramirez-Andrade. "Vision Ray Metrology for the Metrology of Optical Freeform Surfaces." In Frontiers in Optics. Optica Publishing Group, 2024. https://doi.org/10.1364/fio.2024.ftu1b.1.
Full text"Metrology and Metrology Assurance 2023." In 2023 XXXIII International Scientific Symposium Metrology and Metrology Assurance (MMA). IEEE, 2023. http://dx.doi.org/10.1109/mma59144.2023.10317912.
Full textBunday, Benjamin, and George Orji. "Metrology." In 2021 IEEE International Roadmap for Devices and Systems Outbriefs. IEEE, 2021. http://dx.doi.org/10.1109/irds54852.2021.00019.
Full textJachowicz, Ryszard S. "MEMS in metrology, metrology in MEMS." In 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007. IEEE, 2007. http://dx.doi.org/10.1109/imtc.2007.379268.
Full textPou, Jean-Michel, and Laurent Leblond. "Smart Metrology: From the metrology of instrumentation to the metrology of decisions." In 18th International Congress of Metrology, edited by Cosimi Corletto. EDP Sciences, 2017. http://dx.doi.org/10.1051/metrology/201701007.
Full textKuhnert, Andreas C., Stuart B. Shaklan, Yekta Gursel, Steven L. Azevedo, and Yao Lin. "Metrology for the Micro-Arcsecond Metrology testbed." In Astronomical Telescopes & Instrumentation, edited by Robert D. Reasenberg. SPIE, 1998. http://dx.doi.org/10.1117/12.317185.
Full textMarchman, Herschel M. "Dimensional metrology." In Single Frequency Semiconductor Lasers, edited by Jens Buus. SPIE, 2017. http://dx.doi.org/10.1117/12.2284083.
Full textCurrim, Sabah, Richard T. Snodgrass, Young-Kyoon Suh, Rui Zhang, Matthew Wong Johnson, and Cheng Yi. "DBMS metrology." In the 2013 international conference. ACM Press, 2013. http://dx.doi.org/10.1145/2463676.2465331.
Full textGillessen, Stefan, Magdalena Lippa, Frank Eisenhauer, et al. "GRAVITY: metrology." In SPIE Astronomical Telescopes + Instrumentation, edited by Françoise Delplancke, Jayadev K. Rajagopal, and Fabien Malbet. SPIE, 2012. http://dx.doi.org/10.1117/12.926813.
Full textReports on the topic "Metrology"
Shroyer, K. Metrology measurement capabilities. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/481595.
Full textDr. Glen E. Gronniger. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), 2007. http://dx.doi.org/10.2172/920999.
Full textBarnes, L. M. Metrology measurement capabilities. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/587991.
Full textBarnes, L. M. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/818330.
Full textShroyer, K. Metrology measurement capability. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/10116062.
Full textBarnes, L. M. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), 2000. http://dx.doi.org/10.2172/753923.
Full textGilmore, I. S. Metrology Research Roadmap. National Physical Laboratory, 2023. http://dx.doi.org/10.47120/npl.9510.
Full textMorris, C. L., J. M. Anaya, and V. Armijo. Neutron metrology for SBSS. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/348912.
Full textBarsic, Anthony, Rafael Piestun, and Robert R. Boye. Metrology of 3D nanostructures. Office of Scientific and Technical Information (OSTI), 2012. http://dx.doi.org/10.2172/1144015.
Full textDeWeese, Mary E. Metrology for electromagnetic technology :. National Institute of Standards and Technology, 1989. http://dx.doi.org/10.6028/nist.ir.89-3921.
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