Academic literature on the topic 'Metrology'

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Journal articles on the topic "Metrology"

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Brown, Richard J. C., and Paul J. Brewer. "The Silent Benefactor: Why Explaining the Importance of Metrology Involves Addressing the Counterfactual." Metrology 5, no. 2 (2025): 27. https://doi.org/10.3390/metrology5020027.

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Metrology, the science of measurement, is an essential underpinning technology—an infratechnology. The correct functioning of the international measurement system that metrology supports is a prerequisite for the development of technology and wider progress in science. Metrology and the measurement system are at risk of being underappreciated. They potentially face a ‘no-win’ environment: their consistent success, a testament to their effectiveness, ironically leads to invisibility. The public and media tend only to pay attention when things go wrong, resulting in negative headlines. Furthermo
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Widarta, A. "CCEM key comparison CCEM.RF-K26. Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator. Final report of the pilot laboratory." Metrologia 61, no. 1A (2024): 01001. http://dx.doi.org/10.1088/0026-1394/61/1a/01001.

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Main text This report summarizes the results of the Key Comparison CCEM.RF-K26 Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator which has been performed from January 2015 to February 2018. Fourteen National Metrology Institutes (NMIs) participated in this key comparison, including the National Metrology Institute of Japan (NMIJ/AIST, Japan) which served as pilot laboratory, the National Institute of Metrology (NIM, China), the Physikalisch-Technische Bundesanstal (PTB, Germany), the Laboratoire national de métrologie et d'essais (LNE, France), the Swiss Federal Office for Met
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Batóg, Barbara, Mariusz Doszyń, Paweł Majda, et al. "Assessment of the impact of metrology on the economy in Poland by means of the Solow model." Wiadomości Statystyczne. The Polish Statistician 2024, no. 12 (2024): 16–37. https://doi.org/10.59139/ws.2024.12.2.

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The impact of metrology on the economy is typically determined on the basis of econometric models that are the modifications of the Cobb-Douglas function and which take into account total factor productivity (TFP). Such models make it possible to examine the cointegration of metrological variables and basic macroeconomic variables. However, this approach could not be used to determine the impact of metrology on the economy in Poland due to too few observations, and thus short time series of the macroeconomic data. The aim of the study presented in this article is to assess the impact of metrol
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Costa-Félix, Rodrigo, Americo Bernardes, José Carlos Valente de Oliveira, et al. "VII Brazilian Congress on Metrology (Metrologia 2013)." Journal of Physics: Conference Series 575 (January 6, 2015): 011001. http://dx.doi.org/10.1088/1742-6596/575/1/011001.

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Azzumar, Muhammad, та Agah Faisal. "DISEMINASI RESISTOR STANDAR 1 KΩ KE STANDAR KERJA". Jurnal Standardisasi 17, № 3 (2016): 223. http://dx.doi.org/10.31153/js.v17i3.322.

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<p>Abstrak<br />Diseminasi nilai kalibrasi resistor standar kepada standar kerja di Puslit Metrologi - LIPI telah dilakukan. Hal ini bertujuan untuk mendapatkan hasil kalibrasi dan estimasi ketidakpastiannya yang valid dan tertelusur ke SI pada standar kerja. Desiminasi dilakukan dengan cara mengimplenmentasikan nilai kalibrasi resistor standar 1 kΩ ke resistor acuan dan kemudian ke standar kerja. Nilai yang telah diturunkan kepada standar kerja, reference multimeter, telah dibandingkan dengan nilai pengukuran yang dilakukan oleh KRISS (Korea Research Institute of Standards and Sci
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Harfiah, Rismisari. "Implementasi Rancangan Pelatihan Kemetrologian bagi Juru Timbang Menggunakan Metode ADDIE." Cendekia Niaga 3, no. 1 (2019): 9–13. http://dx.doi.org/10.52391/jcn.v3i1.457.

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Legal metrology is a very large and complex field to be implemented. In realizing orderly measurement for all of Indonesia, very large human resources are needed. A total of 1900 Metrology Human Resources currently available cannot meet the needs of the community, which includes at least 14.230 traditional markets and hundreds of modern markets spread throughout Indonesia. Adding large numbers of Metrologi personnel from ASN is very difficult, the most likely choice is to recruit personnel outside metrology such as market managers of traditional and modern market. This situation encouraging id
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Kibble, Bryan. "Everyday instruments from basic metrology [Basic Metrology]." IEEE Instrumentation & Measurement Magazine 18, no. 3 (2015): 9–10. http://dx.doi.org/10.1109/mim.2015.7108212.

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Du, Mingxin, Boyong Gao, Shuaizhe Wang, Zilong Liu, Xingchuang Xiong, and Yuqi Luo. "Design and Implementation of Time Metrology Vocabulary Ontology." Electronics 13, no. 14 (2024): 2828. http://dx.doi.org/10.3390/electronics13142828.

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The advent of the digital era has put forward an urgent need for the digitization of metrology, and the digitization of metrology vocabularies is one of the fundamental and critical steps to achieve the digital transformation of metrology. Metrology vocabulary ontology can facilitate the exchange and sharing of data and is an important way to achieve the digitization of metrology vocabulary. Time metrology vocabulary is a special and important part of the whole metrology vocabulary, and constructing its ontology can reduce the problems caused by semantic confusion, help to smooth the progress
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Krutikov, V. N., and V. V. Okrepilov. "Money Metrology." Measurement Techniques 63, no. 12 (2021): 993–1003. http://dx.doi.org/10.1007/s11018-021-01883-8.

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Krutikov, V. N., and V. V. Okrepilov. "Money metrology." Izmeritel`naya Tekhnika, no. 12 (2020): 42–50. http://dx.doi.org/10.32446/0368-1025it.2020-12-42-50.

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The influence of the provisions of legal metrology on the formation and functioning of the monetary environment in market conditions is studied. It is shown that the use of material (reference) measures for determining the value of goods in monetary units makes it possible to form a stable monetary system, equal for all market participants. This system can reasonably be attributed to information measuring systems. Systems based on the use of constant material measures that determine the value of goods and money in international trade have been formed and functioned for a long time. In the XIX-
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Dissertations / Theses on the topic "Metrology"

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SILVA, PEDRO PAULO ALMEIDA. "METROLOGY IN STANDARDS, STANDARDS IN METROLOGY." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2003. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4049@1.

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COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIOR<br>A presente dissertação de mestrado intitulada Metrologia nas normas, normas na metrologia foi motivada por recomendações explícitas contidas no Plano Nacional de Metrologia (PNM) - transformado em instrumento da política metrológica brasileira, por força de Resolução Interministerial do CONMETRO, que propôs ações de fortalecimento do sistema brasileiro de normalização, priorizando a implementação de um comitê brasileiro para normalização em metrologia na estrutra orgânica da ABNT. Entendidas como funções complementares da te
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TONA, ANDREA. "Thermoelectric Metrology." Doctoral thesis, Politecnico di Torino, 2014. http://hdl.handle.net/11583/2546136.

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Metrology, the science of measure, is in constant evolution and development in every field. Recently, due to the energy problem, some physical effect and related device are receiving new attention, in particular: piezoelectricity and thermoelectricity. We think that the time is ripe to expand the science of measure in a new may:Thermoelectric Metrology. This work represent a new beginning in this field: we study and build a new method and instrument to measure the figure of merit zT and Resistance R, also we describe a new way to use thermoelectric device (in particular Peltier cells), to appl
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Tell, Eric, and Alexander Ökvist. "SMART MANUFACTURING AND METROLOGY : How can metrology enable smart manufacturing?" Thesis, KTH, Industriell produktion, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-244837.

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To create the possibilities needed for more precise simulations and calculations regarding manufacturing changes in the equipment and new technology has to be implemented. This work investigates possible solutions for the gathering of information in manufacturing companies. To get a wider understanding of the current situation in manufacturing we have also researched some possible solutions and applications that can be applied in manufacturing. The work consists of a literature study regarding the possible solutions and technologies of smart manufacturing complemented by a survey and a follow-
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Gendra, Casalí Bernat. "Probabilistic quantum metrology." Doctoral thesis, Universitat Autònoma de Barcelona, 2015. http://hdl.handle.net/10803/371132.

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La Metrologia és el camp d’investigació sobre les eines estadístiques i el disseny tecnològic dels aparells de mesura necessaris per inferir informació precisa sobre paràmetres físics. En un sistema físic el soroll és inherent en última instància amb el de les seves parts, i per tant en un nivell microscòpic està governat per les lleis de la física quàntica. Les mesures quàntiques són intrínsecament sorolloses i per tant limiten la precisió amb la qual es pot obtenir en qualsevol escenari de metrologia. El camp de la metrologia quàntica està dedicat a l’estudi d’aquests límits i al desenvolupa
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Fieß, Markus. "Advancing attosecond metrology." Diss., lmu, 2010. http://nbn-resolving.de/urn:nbn:de:bvb:19-119134.

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O'Mara, David Thomas John. "Automated facial metrology." University of Western Australia. School of Computer Science and Software Engineering, 2002. http://theses.library.uwa.edu.au/adt-WU2003.0015.

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Automated facial metrology is the science of objective and automatic measurement of the human face. There are many reasons for measuring the human face. Psychologists are interested in determining how humans perceive beauty, and how this is related to facial symmetry [158]. Biologists are interested in the relationship between symmetry and biological fitness [124]. Anthropologists, surgeons, forensic experts, and security professionals can also benefit from automated facial metrology [32, 101, 114]. This thesis investigates the concept of automated facial metrology, presenting original techni
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ALMEIDA, LUCIANA ALVES DE. "METROLOGY: CITIZENSHIP INSTRUMENT." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2002. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=4004@1.

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COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIOR<br>Metrologia: instrumento de cidadania configura um traçado crítico do estágio atual (1) da legislação brasileira vigente em metrologia e suas áreas correlatas e (2) do sistema educacional brasileiro em metrologia, ambas as temáticas entendidas como efetivos instrumentos orientados para o desenvolvimento da competitividade industrial e a consolidação da cidadania. O trabalho tem sua fundamentação no ideário filosófico contemporâneo, que volta a eleger o Homem e a qualidade de vida parâmetros e diferenciais competitivos nos pro
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Knott, Paul Alexander. "Robust quantum metrology." Thesis, University of Leeds, 2015. http://etheses.whiterose.ac.uk/8931/.

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In optical interferometry path-entangled states such as NOON states have shown to give quantum-enhanced precision measurements, but these states are notoriously fragile to particle losses, which typically collapse the quantum state and destroy the phase information. A class of inherently robust states that show the potential for great improvements over the alternatives are the entangled coherent states (ECSs). We show that these states allow substantial improvements over unentangled `classical' states and highly-entangled NOON states for a wide range of loss values. We then describe a measurem
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Mehboudi, Mohammad. "Quantum metrology and thermometry in open systems." Doctoral thesis, Universitat Autònoma de Barcelona, 2017. http://hdl.handle.net/10803/405328.

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En mi tesis exploro la metrología cuántica en sistemas abiertos, con especial enfoque en la estimaci ón de temperatura cuántica o termometría. Para este objetivo, voy a clasificar mi estudio en dos regímenes diferentes de equilibrio térmico y más allá del equilibrio térmico. En ambos casos, mis colaboradores y yo planteamos cuestiones de interés fundamental y tecnológico. Entre estas preguntas, señalo lo siguiente: ¿Cuáles son los límites de precisión máximos en la termometría con sondas individuales? ¿Es posible mejorar estos límites utilizando recursos cuánticos tales como las correlac
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Idowu, Ade. "Dynamic metrology of error motions in precision spindles using optical metrology." Thesis, Cranfield University, 1998. http://dspace.lib.cranfield.ac.uk/handle/1826/3688.

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Knowledge of the accuracies of air bearing spindles in the sub-micrometre to nanometre range is required for the design, commissioning and operation of ultra-precise machine tools, measurement systems and other machines employing high precision rotational motion. In order to verify the dynamic performance of a spindle, measurement is required of its error motions in the unwanted five degrees of freedom (one axial, two tilts and two radial motions). Presentation of these error motions (eg in the form of polar charts) can then be used to provide critical spindle metrology data including total, a
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Books on the topic "Metrology"

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Gao, Wei, ed. Metrology. Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-10-4912-5.

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National Institute of Standards and Technology (U.S.), ed. Metrology. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.

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Scholle, Jerome V. Metrology. Addison-Wesley, 1993.

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National Institute of Standards and Technology (U.S.), ed. Metrology. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.

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Seminário Rio Metrologia (1st 2002 Rio de Janeiro, Brazil). Seminário Rio Metrologia 2002: 07 a 08 de novembro, Hotel Pestana Rio Atlântica. Rede de Tecnologia do Rio de Janeiro, 2002.

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Rio-Metrologia. Rio-Metrologia: Rede de Laboratórios do Rio de Janeiro. Rio Metrologia, 2000.

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Anthony, D. M. Engineering metrology. Pergamon Press, 1986.

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Ferrero, Alessandro, and Veronica Scotti. Forensic Metrology. Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-14619-0.

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Soares, Olivério D. D., ed. Optical Metrology. Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6.

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Sładek, Jerzy A. Coordinate Metrology. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-48465-4.

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Book chapters on the topic "Metrology"

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Karaböce, Baki. "Metrology Versus Medical Metrology." In IFMBE Proceedings. Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-49068-2_12.

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Yagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35950-7_6587-4.

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Hinduja, Srichand, and Lin Li. "Metrology." In Proceedings of the 37th International MATADOR Conference. Springer London, 2012. http://dx.doi.org/10.1007/978-1-4471-4480-9_7.

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Yagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6587.

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Yagüe-Fabra, José A. "Metrology." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6587.

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Soffel, Michael H., and Wen-Biao Han. "Metrology." In Astronomy and Astrophysics Library. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-19673-8_12.

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Gooch, Jan W. "Metrology." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_7450.

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Singh, D. K. "Metrology." In Fundamentals of Manufacturing Engineering. Springer Nature Singapore, 2024. http://dx.doi.org/10.1007/978-981-99-8767-2_22.

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Miller, Jimmie. "Metrology." In Basics of Precision Engineering. CRC Press, 2018. http://dx.doi.org/10.1201/9781351204118-2.

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Arghode, Vaibhav K., and Yogendra Joshi. "Metrology Tools." In Air Flow Management in Raised Floor Data Centers. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-25892-8_2.

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Conference papers on the topic "Metrology"

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Jenssen, Ethan, Zachary Dempsey, and Ali Khounsary. "Ultrafast heliostat metrology." In Nonimaging Optics: Efficient Design for Illumination and Concentration XIX, edited by Lun Jiang, Roland Winston, Håkon Jarand Dugstad Johnsen, and Thomas A. Cooper. SPIE, 2024. http://dx.doi.org/10.1117/12.3028891.

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Falaggis, Konstantinos, and Ana Hiza Ramirez-Andrade. "Vision Ray Metrology for the Metrology of Optical Freeform Surfaces." In Frontiers in Optics. Optica Publishing Group, 2024. https://doi.org/10.1364/fio.2024.ftu1b.1.

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Vision Ray Metrology is a novel technique for measuring freeform optics in transmission. This work examines converting geometric wavefronts into height measurements, emphasizing the impact of sample back surface flatness and telecentricity on accuracy.
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"Metrology and Metrology Assurance 2023." In 2023 XXXIII International Scientific Symposium Metrology and Metrology Assurance (MMA). IEEE, 2023. http://dx.doi.org/10.1109/mma59144.2023.10317912.

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Bunday, Benjamin, and George Orji. "Metrology." In 2021 IEEE International Roadmap for Devices and Systems Outbriefs. IEEE, 2021. http://dx.doi.org/10.1109/irds54852.2021.00019.

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Jachowicz, Ryszard S. "MEMS in metrology, metrology in MEMS." In 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007. IEEE, 2007. http://dx.doi.org/10.1109/imtc.2007.379268.

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Pou, Jean-Michel, and Laurent Leblond. "Smart Metrology: From the metrology of instrumentation to the metrology of decisions." In 18th International Congress of Metrology, edited by Cosimi Corletto. EDP Sciences, 2017. http://dx.doi.org/10.1051/metrology/201701007.

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Kuhnert, Andreas C., Stuart B. Shaklan, Yekta Gursel, Steven L. Azevedo, and Yao Lin. "Metrology for the Micro-Arcsecond Metrology testbed." In Astronomical Telescopes & Instrumentation, edited by Robert D. Reasenberg. SPIE, 1998. http://dx.doi.org/10.1117/12.317185.

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Marchman, Herschel M. "Dimensional metrology." In Single Frequency Semiconductor Lasers, edited by Jens Buus. SPIE, 2017. http://dx.doi.org/10.1117/12.2284083.

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Currim, Sabah, Richard T. Snodgrass, Young-Kyoon Suh, Rui Zhang, Matthew Wong Johnson, and Cheng Yi. "DBMS metrology." In the 2013 international conference. ACM Press, 2013. http://dx.doi.org/10.1145/2463676.2465331.

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Gillessen, Stefan, Magdalena Lippa, Frank Eisenhauer, et al. "GRAVITY: metrology." In SPIE Astronomical Telescopes + Instrumentation, edited by Françoise Delplancke, Jayadev K. Rajagopal, and Fabien Malbet. SPIE, 2012. http://dx.doi.org/10.1117/12.926813.

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Reports on the topic "Metrology"

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Shroyer, K. Metrology measurement capabilities. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/481595.

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Dr. Glen E. Gronniger. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), 2007. http://dx.doi.org/10.2172/920999.

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Barnes, L. M. Metrology measurement capabilities. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/587991.

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Barnes, L. M. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/818330.

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Shroyer, K. Metrology measurement capability. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/10116062.

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Barnes, L. M. Metrology Measurement Capabilities. Office of Scientific and Technical Information (OSTI), 2000. http://dx.doi.org/10.2172/753923.

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Gilmore, I. S. Metrology Research Roadmap. National Physical Laboratory, 2023. http://dx.doi.org/10.47120/npl.9510.

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Morris, C. L., J. M. Anaya, and V. Armijo. Neutron metrology for SBSS. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/348912.

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Barsic, Anthony, Rafael Piestun, and Robert R. Boye. Metrology of 3D nanostructures. Office of Scientific and Technical Information (OSTI), 2012. http://dx.doi.org/10.2172/1144015.

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DeWeese, Mary E. Metrology for electromagnetic technology :. National Institute of Standards and Technology, 1989. http://dx.doi.org/10.6028/nist.ir.89-3921.

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