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Relevant bibliographies by topics / Neutron Depth Profiling (NDP)

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Academic literature on the topic 'Neutron Depth Profiling (NDP)'

Author: Grafiati

Published: 3 June 2025

Last updated: 31 July 2025

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Journal articles on the topic "Neutron Depth Profiling (NDP)"

1

Lyons, Daniel J., Jamie L. Weaver, and Anne C. Co. "Considerations in applying neutron depth profiling (NDP) to Li-ion battery research." Journal of Materials Chemistry A 10, no. 5 (2022): 2336–51. http://dx.doi.org/10.1039/d1ta09639g.

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Weaver, Jamie Lynn. "(Invited) Considerations in Sample Environment and Data Processing for Operando Cell Studies by Neutron Depth Profiling." ECS Meeting Abstracts MA2023-02, no. 55 (2023): 2693. http://dx.doi.org/10.1149/ma2023-02552693mtgabs.

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Neutron depth profiling (NDP) is a nominally non-destructive analytical technique used to measure select isotopes (6Li, 14N, 10B, etc...) in a diversity of materials. NDP can be conducted on operating Li-ion cells and be used to provide researchers real-time information about cell formation, conductance, and resilience. The increased use of NDP for electrochemical studies within the past decade has inspired the development of new sample preparation and data reduction strategies. Select topics that have been studied in the U.S. have included issues of neutron attenuation and scattering due to t

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3

Hossny, K., S. Magdi, F. Nasr, Y. Yasser, and A. Magdy. "NEUTRON DEPTH PROFILE CALCULATIONS USING ARTIFICIAL NEURAL NETWORKS." EPJ Web of Conferences 247 (2021): 06046. http://dx.doi.org/10.1051/epjconf/202124706046.

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Neutron depth profiling (NDP) is a non-destructive technique used for identifying the concentration of impurity isotopes below the sample surface. NDP is carried out by detection of the emitted charged particles resulting from bombarding the sample with neutrons. NDP specifies the isotopic concentration versus the sample depth for a few micrometers below the surface. The sample is bombarded inside a research reactor using a thermal neutron beam. Charged particles like alpha particles or protons are produced from the neutron induced reactions in the sample. Each neutron isotopic interaction pro

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Tun, Z., J. J. Noël, Th Bohdanowicz, L. R. Cao, R. G. Downing, and L. V. Goncharova. "Cold-neutron depth profiling as a research tool for the study of surface oxides on metalsSpecial Issue on Neutron Scattering in Canada." Canadian Journal of Physics 88, no. 10 (2010): 751–58. http://dx.doi.org/10.1139/p10-062.

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A recent experiment at NIST has demonstrated that neutron depth profiling (NDP) based on the (n, α) reaction could be developed into a tool that could be routinely used for the study of passive oxides on metals. Whereas most metals are not (n, α) active, oxides grown with 17O, the only (n, α) active oxygen isotope, can be observed and tracked by this technique. Problems due to contamination of the samples by boron were encountered, but were shown to be surmountable. For our samples, the NDP facility at NIST, as it exists today, has enough flux and energy resolution to separate the α particles

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Çetiner, S. M., K. Ünlü, and R. G. Downing. "Development and applications of time-of-flight neutron depth profiling (TOF-NDP)." Journal of Radioanalytical and Nuclear Chemistry 276, no. 3 (2008): 623–30. http://dx.doi.org/10.1007/s10967-008-0609-7.

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Gilles, Ralph, Lukas Grossmann, Jiri Vacik, Antonino Cannavo, and Giovanni Ceccio. "In-Situ Neutron Depth Profiling Studies (Measurements and Simulations) to Characterize the Surface of Silicon Anodes and Complementary Neutron Techniques for in-Situ and Operando Characterization." ECS Meeting Abstracts MA2024-02, no. 60 (2024): 4058. https://doi.org/10.1149/ma2024-02604058mtgabs.

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In-situ methods for characterizing electrochemical systems are becoming increasingly important to understand the mechanism of lithiation and delithiation processes. The characterization of surfaces that have been under electrochemical influence is of great interest because many electrochemical processes originate here and are therefore crucial for cell performance. Pure silicon anodes with their large volume expansion, which leads to a short service life, can be modified at WACKER company by partial lithiation of microscale silicon particles [1]. Such anode types promise higher specific capaci

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Çetiner, Sacit M., and Kenan Ünlü. "Depth profiling of boron in ultra-shallow junction devices using time-of-flight neutron depth profiling (TOF-NDP)." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 579, no. 1 (2007): 148–52. http://dx.doi.org/10.1016/j.nima.2007.04.027.

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Frankenberger, Martin, Markus Trunk, Stefan Seidlmayer, et al. "SEI Growth Impacts of Lamination, Formation and Cycling in Lithium Ion Batteries." Batteries 6, no. 2 (2020): 21. http://dx.doi.org/10.3390/batteries6020021.

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The accumulation of solid electrolyte interphases (SEI) in graphite anodes related to elevated formation rates (0.1C, 1C and 2C), cycling rates (1C and 2C), and electrode-separator lamination is investigated. As shown previously, the lamination technique is beneficial for the capacity aging in graphite-LiNi1/3Mn1/3Co1/3O2 cells. Here, surface resistance growth phenomena are quantified using electrochemical impedance spectroscopy (EIS). The graphite anodes were extracted from the graphite NMC cells in their fully discharged state and irreversible accumulations of lithium in the SEI are revealed

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Ceccio, Giovanni, Jiri Vacik, Jakub Siegel, et al. "Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling." Membranes 12, no. 11 (2022): 1061. http://dx.doi.org/10.3390/membranes12111061.

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This work is devoted to the study of controlled preparation and filling of pores in polyethylene terephthalate (PET) membranes. A standard wet chemical etching with different protocols (isothermal and isochronous etching for different times and temperatures and etching from one or both sides of the films) was used to prepare the micrometric pores. The pores were filled with either a LiCl solution or boron deposited by magnetron sputtering. Subsequent control of the pore shape and dopant filling was performed using the nuclear methods of ion transmission spectroscopy (ITS) and neutron depth pro

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Gilles, Ralph. "(Invited) Neutrons as a Powerful Tool for Better Understanding Electrochemistry on Various Length and Time Scales." ECS Meeting Abstracts MA2023-02, no. 55 (2023): 2691. http://dx.doi.org/10.1149/ma2023-02552691mtgabs.

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Today, sophisticated methods are applied to gain a deeper understanding of processes in in-situ electrochemistry. There are few ways to study electrochemically relevant processes on different length and/or time scales without affecting the processes themselves. Probes that cover a sufficient volume of the sample non-destructively and are sensitive to the important charge carriers are in great demand. For such purposes, neutrons are an ideal candidate to perform this task because they have relatively high sensitivity to the light chemical elements, can distinguish neighboring elements of the pe

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Dissertations / Theses on the topic "Neutron Depth Profiling (NDP)"

1

Liu, Danny Xin. "Characterization of Next Generation Lithium-ion Battery Materials Through Electrochemical, Spectroscopic, and Neutron-Based Methods." The Ohio State University, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=osu1437746661.

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Lyons, Daniel J. "Application and Challenges of Neutron Depth Profiling to In-Situ Battery Measurements." The Ohio State University, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=osu1610060345543143.

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Mulligan, Padhraic Liam. "Development of a Multi-detector Digital Neutron Depth Profiling Instrument at the Ohio State University." The Ohio State University, 2012. http://rave.ohiolink.edu/etdc/view?acc_num=osu1339632062.

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Rong, Xiujiang. "Development of a neutron depth profiling facility at the University of Missouri Research Reactor center /." free to MU campus, to others for purchase, 1996. http://wwwlib.umi.com/cr/mo/fullcit?p9821337.

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Lyons, Daniel Joseph. "Electrochemical Characterization of Ultra-Thin Silicon Films." The Ohio State University, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=osu1471727534.

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Turkoglu, Danyal J. "Design, Construction and Characterization of an External Neutron Beam Facility at The Ohio State University Nuclear Reactor Laboratory." The Ohio State University, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=osu1325228897.

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Wahyudi, Olivia. "Exploring oxygen mobility in (Pr/Nd)2NiO4+δ : single crystal growth, isotopic exchange depth profiling and structural characterization by X-ray, neutron and electron diffraction". Rennes 1, 2011. http://www.theses.fr/2011REN1S166.

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Praseodymium and neodymium nickelates with Ruddlesden-Popper type structures were investigated with the aim to better understand oxygen ion mobility at moderate temperature, for applications in solid oxide fuel cells and membranes for oxygen separation. High quality single crystals were synthesized and characterized by X-ray, neutron and electron diffractions. Complex superstructures were evidenced by transmission electron microscopy. Satellite reflections revealed long-range ordering related to intercalated oxygen, that was also observed by single crystal neutron diffraction. An incommensurat

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Cetiner, Mustafa Sacit. "Development of an ion time-of-flight spectrometer for neutron depth profiling." 2008. http://etda.libraries.psu.edu/theses/approved/WorldWideIndex/ETD-2567/index.html.

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Ucar, Dundar Ünlü Kenan. "Neutron depth profiling measurements and Geant4 simulation comparison for Intel-SEA2 borophosphosilicate glass (BPSG) sample." 2009. http://etda.libraries.psu.edu/theses/approved/WorldWideIndex/ETD-3938/index.html.

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Whitney, Scott M. 1982. "Neutron depth profiling benchmarking and analysis of applications to lithium ion cell electrode and interfacial studies research." 2008. http://hdl.handle.net/2152/17818.

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Book chapters on the topic "Neutron Depth Profiling (NDP)"

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Downing, R. G., J. T. Maki, and R. F. Fleming. "Application of Neutron Depth Profiling to Microelectronic Materials Processing." In ACS Symposium Series. American Chemical Society, 1986. http://dx.doi.org/10.1021/bk-1986-0295.ch009.

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Winholtz, R. A., and A. D. Krawitz. "Methods for Depth Profiling Complete Stress Tensors Using Neutron Diffraction." In Advances in X-Ray Analysis. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4615-2528-8_33.

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Conference papers on the topic "Neutron Depth Profiling (NDP)"

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Lamaze, G. P., H. H. Chen-Mayer, and J. K. Langland. "Recent developments in neutron depth profiling at NIST." In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY. ASCE, 1998. http://dx.doi.org/10.1063/1.56883.

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2

Chen-Mayer, H. H. "Characterization of BPSG films using Neutron Depth Profiling and Neutron/X-ray Reflectometry." In The 2000 international conference on characterization and metrology for ULSI technology. AIP, 2001. http://dx.doi.org/10.1063/1.1354433.

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3

Weaver, J., and R. Downing. "Near-Surface Elemental Analysis of Solids by Neutron Depth Profiling." In MS&T18. MS&T18, 2018. http://dx.doi.org/10.7449/2018mst/2018/mst_2018_1334_1341.

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Weaver, J., and R. Downing. "Near-Surface Elemental Analysis of Solids by Neutron Depth Profiling." In MS&T18. MS&T18, 2018. http://dx.doi.org/10.7449/2018/mst_2018_1334_1341.

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Chen-Mayer, Huaiyu H., G. P. Lamaze, David F. R. Mildner, and Robert G. Downing. "Neutron depth profiling of elemental concentration using a focused beam." In Fifth International Conference on Applications of Nuclear Techniques: Neutrons in Research and Industry, edited by George Vourvopoulos. SPIE, 1997. http://dx.doi.org/10.1117/12.267885.

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Wood, David, Matt Bisbee, Andrew Maier, et al. "A demonstration study of lithium-ion battery by neutron depth profiling with a low flux neutron source." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXV, edited by Nerine J. Cherepy, Michael Fiederle, and Ralph B. James. SPIE, 2023. http://dx.doi.org/10.1117/12.2680846.

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7

Vacik, J., I. Tomandl, V. Hnatowicz, et al. "Study of Li diffusion in thin Li-ion batteries by thermal neutron depth profiling (TNDP)." In 25TH INTERNATIONAL CONFERENCE ON THE APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY. AIP Publishing, 2019. http://dx.doi.org/10.1063/1.5127680.

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Reports on the topic "Neutron Depth Profiling (NDP)"

1

Bowman, Robert C., Knudsen Jr., Downing John F., and R. G. NDP (Neutron Depth Profiling) Evaluations of Boron-Implanted Compound Semiconductors,. Defense Technical Information Center, 1988. http://dx.doi.org/10.21236/ada192306.

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2

Tuncay Aktosun. Chemical Depth Profiling from Neutron Reflectometry. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/877659.

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3

Bingham Cady and Kenan Unlu. Development and Applications of Time of Flight Neutron Depth Profiling. Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/838303.

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