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Relevant bibliographies by topics / Polycrystalline films

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Academic literature on the topic 'Polycrystalline films'

Author: Grafiati

Published: 28 May 2022

Last updated: 30 July 2025

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Journal articles on the topic "Polycrystalline films"

1

Tetyorkin, V. V. "Photoluminescence studies of CdTe polycrystalline films." Semiconductor Physics Quantum Electronics and Optoelectronics 15, no. 4 (2012): 340–44. http://dx.doi.org/10.15407/spqeo15.04.340.

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Chung, C. K., and T. S. Chen. "Effect of nitrogen flow ratio on the microstructure evolution and nanoindented mechanical property of the Ta–Si–N thin films." Journal of Materials Research 23, no. 2 (2008): 494–99. http://dx.doi.org/10.1557/jmr.2008.0065.

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The relations among the process, microstructure, and nanomechanical properties of cosputtered Ta–Si–N thin films have been investigated. The microstructure evolution and varied hardness and elastic modulus property of Ta–Si–N were influenced by nitrogen flow ratios [FN2% = FN2/(Far + FN2) × 100%] during cosputtering together with phase formation and the composition of films. The microstructure of Ta–Si–N formed at a low 2–10 FN2% was an amorphous-like phase with nanocrystalline grains embedded in an amorphous matrix, while polycrystalline Ta–Si–N was obtained at a high 20–30 FN2%. The cubic Ta

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3

Sukach, A. V. "Heterostructure ohmic contacts to p-CdTe polycrystalline films." Semiconductor Physics Quantum Electronics and Optoelectronics 17, no. 3 (2014): 268–71. http://dx.doi.org/10.15407/spqeo17.03.268.

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Tetyorkin, V. V. "Characterization of grain boundaries in CdTe polycrystalline films." Semiconductor Physics Quantum Electronics and Optoelectronics 18, no. 4 (2015): 428–32. http://dx.doi.org/10.15407/spqeo18.04.428.

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Wan, Linfeng, Caoyuan Mu, Yaofeng Liu, et al. "Structure and Wettability Engineering of Polycrystalline Diamond Films Treated by Thermally Oxidation, Second Growth and Surface Termination." Chinese Physics Letters 39, no. 3 (2022): 036801. http://dx.doi.org/10.1088/0256-307x/39/3/036801.

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High-quality polycrystalline diamond films with dominated (100)-oriented grains are realized by combining the thermally oxidation and the homogeneous second growth processes. Moreover, we investigate the wettability property of the polycrystalline diamonds in various stages. Different surface structures (with various grain sizes, voids, and orientations, etc.) and terminations (hydrogen or oxygen) have significant effects on the wettability of polycrystalline diamond films. The wettability is further closely related to the polarity of solutions. By measuring the contact angle and calculating t

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Srinivas, S., J. Mercado, R. R. Das, W. Perez, A. Martinez, and R. S. Katiyar. "Polycrystalline SrBi2Ta0.8Nb1.2O9 thin films." Integrated Ferroelectrics 29, no. 1-2 (2000): 99–110. http://dx.doi.org/10.1080/10584580008216678.

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Ze-Bo, Zhang, Li Yin-An, Xie Si-Shen, and Yang Guo-Zhen. "Polycrystalline ?-C3N4 thin films." Journal of Materials Science Letters 14, no. 24 (1995): 1742–44. http://dx.doi.org/10.1007/bf00270994.

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8

Wang, Wei Yan, Jin Hua Huang, Xian Peng Zhang, Wei Jie Song, and Rui Qin Tan. "Effect of Rapid Thermal Annealing Condition on the Structure and Conductivity Properties of Polycrystalline Silicon Films on Glass." Materials Science Forum 687 (June 2011): 634–40. http://dx.doi.org/10.4028/www.scientific.net/msf.687.634.

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The effect of rapid thermal annealing (RTA) temperature (700~1200 °C) and time (1~8 min) on the structure and conductivity properties of polycrystalline silicon (Si) films on glass, grown by RTA crystallization of magnetron sputtering (MS) deposited amorphous Si (a-Si) films, was investigated by means of X-ray diffraction (XRD) and UV reflectance. It was observed the critical temperature for crystallizing a-Si films was ~750 °C and ~700 °C based on XRD and reflectance measurements, respectively. As soon as RTA temperature reached and exceeded the critical value, the structural property of poly

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9

Yan, Y., K. M. Jones, and M. M. Al-Jassim. "Transmission Electron Microscopy Study of Planar Defects in Polycrystalline CdTe Thin Films." Microscopy and Microanalysis 7, S2 (2001): 556–57. http://dx.doi.org/10.1017/s1431927600028853.

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CdTe is a promising photovoltaic material due to its near optimum band gap and high absorption coefficient. Polycrystalline, thin-film CdTe/CdS solar cells have demonstrated an efficiency of 15.8%. High density of extended defects is often found in polycrystalline CdTe films grown by close-spaced sublimation (CSS). So far, most investigations of defects in CdTe have focused on epitaxially grown films, and the reported extended defects are mainly lamellar twins. However, epitaxially grown films generally have a different microstructure compared to CSS grown polycrystalline CdTe thin films. in t

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10

Wan, Xiao Hang, Zhao Wei Dong, Shu Jun Li, and Sheng Yong Liu. "Research on Thermal Stress of Slab Heating Process Based on Transient Non-Linear Analysis." Advanced Materials Research 311-313 (August 2011): 936–39. http://dx.doi.org/10.4028/www.scientific.net/amr.311-313.936.

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Polycrystalline α-HgI2 films have been grown through combining vertical deposition method with hot wall vapor phase deposition (HWPVD) method. The influence of the α-HgI2 seed layers on the structural and electrical properties of the polycrystalline α-HgI2 films was investigated. It is found that the α-HgI2 seed layers play an important role in reducing the grain sizes, increasing the density improving the crystallographic orientation and electrical properties of the polycrystalline α-HgI2 films.

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Dissertations / Theses on the topic "Polycrystalline films"

1

Cooke, Michael D. "Magnetostrictive properties of polycrystalline iron cobalt films." Thesis, University of Sheffield, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.340249.

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Solovai, M. M. "Phase tomography of the polycrystalline of blood films." Thesis, БДМУ, 2022. http://dspace.bsmu.edu.ua:8080/xmlui/handle/123456789/19684.

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Brunson, K. M. "Characterization of semi-insulating polycrystalline silicon." Thesis, University of Bradford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379835.

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Castano, Fernando J. "Structure and thermo-magnetic properties of amorphous thin films and multilayers." Thesis, University of Sheffield, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.267189.

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Abbott, Patrick Roland. "The Effect of Average Grain Size on Polycrystalline Diamond Films." Thesis, University of North Texas, 2002. https://digital.library.unt.edu/ark:/67531/metadc3164/.

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The work function of hydrogen-terminated, polycrystalline diamond was studied using ultraviolet photoelectron spectroscopy. Polycrystalline diamond films were deposited onto molybdenum substrates by electrophoresis for grain sizes ranging from 0.3 to 108 microns. The work function and electron affinity were measured using 21.2 eV photons from a helium plasma source. The films were characterized by x-ray photoelectron spectroscopy to determine elemental composition and the sp2/sp3 carbon fraction. The percentage of (111) diamond was determined by x-ray diffraction, and scanning electron microsc

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6

Locke, Christopher William. "Stress-Strain Management of Heteroepitaxial Polycrystalline Silicon Carbide Films." Scholar Commons, 2011. http://scholarcommons.usf.edu/etd/3211.

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Silicon carbide (SiC) is one of the hardest known materials and is also, by good fortune, a wide bandgap semiconductor. While the application of SiC for high-temperature and high-power electronics is fairly well known, its utility as a highly robust, chemically-inert material for microelectrical mechanical systems (MEMS) is only beginning to be well recognized. SiC can be grown on both native SiC substrates or on Si using heteroepitaxial growth methods which affords the possibility to use Si micromachining methods to fabricate advanced SiC MEMS devices. The control of film stress in heteroepi

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7

Hajjar, Jean-Jacques Joseph. "Characterization of chemical vapor deposited polycrystalline silicon thin films." Thesis, Massachusetts Institute of Technology, 1985. http://hdl.handle.net/1721.1/15006.

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Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1986.<br>MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING<br>Bibliography: leaves 134-139.<br>by Jean-Jacques Joseph Hajjar.<br>M.S.

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8

Iverson, Ralph Benhart. "Crystallization in self-implanted polycrystalline silicon-on-insulator films." Thesis, Massachusetts Institute of Technology, 1987. http://hdl.handle.net/1721.1/32570.

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Zhao, Shulai. "Characterization of the Electrical Properties of Polycrystalline Diamond Films." The Ohio State University, 1994. http://rave.ohiolink.edu/etdc/view?acc_num=osu1394810346.

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Bremer, Imke [Verfasser]. "Polycrystalline films of microporous materials on different substrates / Imke Bremer." Hannover : Technische Informationsbibliothek und Universitätsbibliothek Hannover (TIB), 2014. http://d-nb.info/1049297180/34.

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Books on the topic "Polycrystalline films"

1

Lindquist, Sten-Eric. Photoelectrochemical properties of polycrystalline TiO₂ thin film electrodes. Distributor, Almqvist & Wiksell International, 1988.

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2

Pan, Wenkai. Melt Initiation and Propagation in Polycrystalline Thin Films. [publisher not identified], 2021.

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3

T, Voutsas Apostolos, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Poly-silicon thin film transistor technology and applications in displays and other novel technology areas: 21-22 January, 2003, Santa Clara, California, USA. SPIE, 2003.

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4

Wong, Vernon. 2-D Melting in Excimer-Laser Irradiated Polycrystalline Silicon Films. [publisher not identified], 2021.

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5

S, Ullal Harin, IEEE Photovoltaic Specialists Conference (33rd : 2008 : San Diego, Calif.), and National Renewable Energy Laboratory (U.S.), eds. The role of polycrystalline thin-film PV technologies in competitive PV module markets: Preprint. National Renewable Energy Laboratory, 2008.

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6

L, Krainsky I., and United States. National Aeronautics and Space Administration., eds. Negative electron affinity effect on the surface of chemical vapor deposited diamond polycrystalline films. National Aeronautics and Space Administration, 1996.

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7

Katayun, Barmak, and Materials Research Society, eds. Polycrystalline thin films: Structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A. Materials Research Society, 1994.

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8

National Renewable Energy Laboratory (U.S.), ed. Porous polycrystalline silicon thin film solar cells: Final report, 24 May 1999-24 May 2002. National Renewable Energy Laboratory, 2003.

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9

Deline, Chris. Metastable electrical characteristics of polycrystalline thin-film photovoltaic modules upon exposure and stabilization: Preprint. National Renewable Energy Laboratory, 2011.

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10

1926-, Frost Harold J., ed. Polycrystalline thin films: Structure, texture, properties, and applications II : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A. Materials Research Society, 1996.

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Book chapters on the topic "Polycrystalline films"

1

Kosec, Marija, Danjela Kuscer, and Janez Holc. "Processing of Ferroelectric Ceramic Thick Films." In Multifunctional Polycrystalline Ferroelectric Materials. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-90-481-2875-4_2.

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2

Chima-Okereke, C., W. L. Roberts, A. J. Bushby, and M. J. Reece. "The Elastic Properties of Ferroelectric Thin Films Measured Using Nanoindentation." In Multifunctional Polycrystalline Ferroelectric Materials. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-90-481-2875-4_11.

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3

Einaga, Yasuaki, and Akira Fujishima. "Applications of Polycrystalline and Modified Functional Diamond Electrodes." In Synthetic Diamond Films. John Wiley & Sons, Inc., 2011. http://dx.doi.org/10.1002/9781118062364.ch5.

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4

Gardos, M. N. "Tribological Behavior of Polycrystalline Diamond Films." In Protective Coatings and Thin Films. Springer Netherlands, 1997. http://dx.doi.org/10.1007/978-94-011-5644-8_15.

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5

Slaoui, A., and P. Siffert. "Polycrystalline Silicon Films for Electronic Devices." In Silicon. Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-09897-4_4.

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6

Harbeke, Günther. "Optical Properties of Polycrystalline Silicon Films." In Springer Series in Solid-State Sciences. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-642-82441-8_9.

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7

Alexenko, A. E., A. F. Belyanin, L. L. Bouilov, A. P. Semenov, and B. V. Spitsyn. "Ion Milling of Polycrystalline Diamond Films." In Wide Band Gap Electronic Materials. Springer Netherlands, 1995. http://dx.doi.org/10.1007/978-94-011-0173-8_22.

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8

Kato, Kazumi. "Tailored Liquid Alkoxides for the Chemical Solution Processing of Pb-Free Ferroelectric Thin Films." In Multifunctional Polycrystalline Ferroelectric Materials. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-90-481-2875-4_3.

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9

Bretos, Iñigo, and M. Lourdes Calzada. "Approaches Towards the Minimisation of Toxicity in Chemical Solution Deposition Processes of Lead-Based Ferroelectric Thin Films." In Multifunctional Polycrystalline Ferroelectric Materials. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-90-481-2875-4_5.

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10

Grätzel, M. "Photocatalysis with Colloidal Semiconductors and Polycrystalline Films." In Photocatalysis and Environment. Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-009-3015-5_13.

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Conference papers on the topic "Polycrystalline films"

1

Moraes, F. C. D., P. V. Pinho, C. M. Kersul, et al. "High Q-factor Nanobeams in Polycrystalline Diamond." In CLEO: Applications and Technology. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/cleo_at.2024.jth2a.65.

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2

Iwanczyk, Jan S., Bradley E. Patt, Carolyn R. Tull, et al. "Mercuric iodide polycrystalline films." In International Symposium on Optical Science and Technology, edited by H. Bradford Barber, Hans Roehrig, F. P. Doty, Richard C. Schirato, and Edward J. Morton. SPIE, 2001. http://dx.doi.org/10.1117/12.450793.

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3

Harker, Alan B., John F. Flintoff, and Jeffrey F. DeNatale. "Polishing of polycrystalline diamond films." In SPIE Proceedings, edited by Albert Feldman and Sandor Holly. SPIE, 1990. http://dx.doi.org/10.1117/12.22461.

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4

Plano, Linda S., and Fran Adar. "Raman Spectroscopy Of Polycrystalline Diamond Films." In 31st Annual Technical Symposium, edited by Fran Adar and James E. Griffiths. SPIE, 1988. http://dx.doi.org/10.1117/12.941935.

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5

Strizhak, Peter E., Boris A. Snopok, Taras Melnik, et al. "Multifractal properties of polycrystalline gold films." In International Conference on Correlation Optics, edited by Oleg V. Angelsky. SPIE, 1999. http://dx.doi.org/10.1117/12.370427.

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6

Akerman, M. Alfred, Joseph R. McNeely, and Robert E. Clausing. "Optical characterization of polycrystalline diamond films." In SPIE Proceedings, edited by Albert Feldman and Sandor Holly. SPIE, 1990. http://dx.doi.org/10.1117/12.22457.

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7

Buffiere, Marie, Guy Brammertz, Abdel-Aziz El Mel, et al. "Recombination stability in polycrystalline Cu2ZnSnSe4 thin films." In 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC). IEEE, 2013. http://dx.doi.org/10.1109/pvsc.2013.6744850.

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Tremsin, Anton S., and Oswald H. W. Siegmund. "Polycrystalline diamond films as prospective UV photocathodes." In International Symposium on Optical Science and Technology, edited by Silvano Fineschi, Clarence M. Korendyke, Oswald H. W. Siegmund, and Bruce E. Woodgate. SPIE, 2000. http://dx.doi.org/10.1117/12.410530.

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PYZIAK, L., I. STEFANIUK, and W. OBERMAYR. "NOISE SPECTROSCOPY OF POLYCRYSTALLINE Hg1-xCdxTe FILMS." In Proceedings of the 7th International School on Theoretical Physics. WORLD SCIENTIFIC, 2003. http://dx.doi.org/10.1142/9789812704474_0041.

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10

Chou, Hsueh-Tao, Chia-Chang Lee, and Chia-Hsin Sun. "Conduction mechanisms in undoped polycrystalline diamond films." In Photonics Taiwan, edited by Yan-Kuin Su and Pallab Bhattacharya. SPIE, 2000. http://dx.doi.org/10.1117/12.392107.

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Reports on the topic "Polycrystalline films"

1

Zweibel, Ken. Polycrystalline Thin Films FY92 Project Report. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/7095842.

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Zweibel, K. Polycrystalline thin films FY 1992 project report. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/10121960.

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3

Yu Qiao. Size Effect in Cleavage Cracking in Polycrystalline Thin Films. Office of Scientific and Technical Information (OSTI), 2007. http://dx.doi.org/10.2172/912827.

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Abdeljawad, Fadi F. Microstructural evolution of thin polycrystalline metallic films under extreme conditions. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1562840.

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Venkat Selvamanickam and Alex Freundlich. Recovery Act : Near-Single-Crystalline Photovoltaic Thin Films on Polycrystalline, Flexible Substrates. Office of Scientific and Technical Information (OSTI), 2010. http://dx.doi.org/10.2172/993422.

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Venkat Selvamanickam and Alex Freundlich. Recovery Act : Near-Single-Crystalline Photovoltaic Thin Films on Polycrystalline, Flexible Substrates. Office of Scientific and Technical Information (OSTI), 2010. http://dx.doi.org/10.2172/993423.

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Dannenberg, Rand, Eric Stach, Darin Glenn, Peter Sieck, and Kyle Hukari. Microstructural and conductivity comparison of Ag films grown on amorphous TiO2 and polycrystalline ZnO. Office of Scientific and Technical Information (OSTI), 2001. http://dx.doi.org/10.2172/821432.

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Wang, Z. L., A. Goyal, D. M. Kroeger, et al. Effect of thermal annealing on grain boundary chemistry of polycrystalline TlBa{sub 2}Ca{sub 2}Cu{sub 3}O{sub y} films. Office of Scientific and Technical Information (OSTI), 1994. http://dx.doi.org/10.2172/10148809.

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9

Budai, J. D. Advanced Photon Source Activity Report 2002 at Argonne National Laboratory, Argonne, IL, December 2003 - contribution title:"Microdiffraction Study of Epitaxial Growth and Lattice Tilts in Oxide Films on Polycrystalline Metal Substrates". Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/885661.

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Strand, T., B. Kroposki, R. Hansen, and L. Mrig. Polycrystalline thin-film module and system performance. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/132676.

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