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Relevant bibliographies by topics / Scanning electron microscoppy

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Academic literature on the topic 'Scanning electron microscoppy'

Author: Grafiati

Published: 2 June 2025

Last updated: 31 July 2025

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Journal articles on the topic "Scanning electron microscoppy"

1

Elsheikh, Eman H., Sahar S. Hassan, and Sheren A. Al-Zahaby. "Olfactory epithelium organization of the grass carp (Ctenopharyngodon idella) at the ultrastructural level: SEM and TEM observations." Journal of Advanced Veterinary Research 14, no. 5 (2024): 793–98. https://doi.org/10.5281/zenodo.15571067.

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 Olfaction is the major sense of smell in teleost involved in many physiological response and habitat acclimatization including food searching, migration for spawning, predator avoidance, reproduction behavior, as well as identification of fish of the same species. Our study illustrates the ultrastructure of the olfactory rosette of the grass carp Ctenopharyngodon idella (Cuvier and Valenciennes, 1844) by using Scanning Electron Microscope (SEM) and transmission Electron Microscope (TEM). Herein, the peripheral olfactory organs are represented by two olfactory rosettes lying in two nasal

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Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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Dvorachek, Michael, Amnon Rosenfeld, and Avraham Honigstein. "Contaminations of geological samples in scanning electron microscopy." Neues Jahrbuch für Geologie und Paläontologie - Monatshefte 1990, no. 12 (1991): 707–16. http://dx.doi.org/10.1127/njgpm/1990/1991/707.

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Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.

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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l

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Vidyavati and G. Sathaiah. "Cell division in desmids under scanning electron microscope." Archiv für Hydrobiologie 105, no. 2 (1989): 239–49. http://dx.doi.org/10.1127/archiv-hydrobiol/105/1989/239.

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Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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Dissertations / Theses on the topic "Scanning electron microscoppy"

1

Harland, C. J. "Detector and electronic developments for scanning electron microscopy." Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.

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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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Davies, D. G. "Scanning electron acoustic microscopy." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304042.

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Snella, Michael T. "Drift correction for scanning-electron microscopy." Thesis, Massachusetts Institute of Technology, 2010. http://hdl.handle.net/1721.1/62605.

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Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.<br>This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.<br>Cataloged from student submitted PDF version of thesis.<br>Includes bibliographical references (p. 91-92).<br>Scanning electron micrographs at high magnification (100,000x and up) are distorted by motion of the sample during image acquisition, a phenomenon called drift. We propose a method for correcting drift distortion in imag

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McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.

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Electron impact excitation collisions are important processes for spectral line formation of plasmas. The work undertaken in this thesis focuses on such collisions involving Li-like ions, important in both astrophysical and magnetically confined plasmas. By having reliable atomic and collisional data, such as energy levels, radiative rates and excitation rate coefficients, it is possible to generate models to describe such plasmas. The atomic data were calculated using the General-Purpose Relativistic Structure Program (GRASP; Dyall et al 1989), for several Li-like ions, namely S XIV, Ar XVI,

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William, Gerald Martin. "The study of electronic materials for light emitting devices using scanning cathodoluminescence electron microscopy." Thesis, University of Birmingham, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.289377.

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Martin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.

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Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.

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Electron vortex beams (EVBs) are electron beams with a doughnut-like intensity profile, carrying orbital angular momentum due to their helical phase shift distribution. When employed in an electron microscope, they are expected to be efficient for the detection of magnetic signals. In this report I have investigated high angle annular dark field (HAADF) images obtained using EVBs. This was done for 300 K and 5K. For 5 K, I also compared HAADF images from an ordinary electron beam with HAADF images from an electron vortex beam. What was found was that EVBs produced doughnuts around the atomic

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Skoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.

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Tato práce se zabývá možnostmi kvantitativního zobrazování ve skenovacím (transmisním) elektronovém mikroskopu (S|T|EM) společně s jejich korelativní aplikací. Práce začíná popisem metody kvantitativního STEM (qSTEM), kde lze stanovenou lokální tloušťku vzorku dát do spojitosti s ozářenou dávkou, a vytvořit tak studii úbytku hmoty. Tato metoda byla použita při studiu ultratenkých řezů zalévací epoxidové pryskyřice za různých podmínek (stáří, teplota, kontrastování, čištění pomocí plazmy, pokrytí uhlíkem, proud ve svazku). V rámci této části jsou diskutovány a demonstrovány možnosti kalibračníh

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Findlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /." Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.

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Books on the topic "Scanning electron microscoppy"

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Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Springer, 1998.

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Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5.

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Shimizu, Kenichi. New horizons of applied scanning electron microscopy. Springer-Verlag, 2010.

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J, Schwartz Adam, Kumar Mukul, and Adams B. L, eds. Electron backscatter diffraction in materials science. Kluwer Academic, 2000.

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Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Published on behalf of ACOL by Wiley, 1987.

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Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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M, Prutton, and El Gomati Mohamed M, eds. Scanning Auger electron microscopy. Wiley, 2006.

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9

Chescoe, Dawn. The operation of transmission and scanning electron microscopes. Oxford University Press, 1990.

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1963-, Zhang Xiao-Feng, and Zhang Ze 1953-, eds. Progress in transmission electron microscopy. Springer, 2001.

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Book chapters on the topic "Scanning electron microscoppy"

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Reimer, Ludwig. "Electron Optics of a Scanning Electron Microscope." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_2.

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Reimer, Ludwig. "Introduction." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_1.

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Reimer, Ludwig. "Electron Scattering and Diffusion." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_3.

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Reimer, Ludwig. "Emission of Electrons and X-Ray Quanta." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_4.

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Reimer, Ludwig. "Detectors and Signal Processing." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_5.

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Reimer, Ludwig. "Imaging with Secondary and Backscattered Electrons." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_6.

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Reimer, Ludwig. "Electron-Beam-Induced Current, Cathodoluminescence and Special Techniques." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_7.

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Reimer, Ludwig. "Crystal Structure Analysis by Diffraction." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_8.

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Reimer, Ludwig. "Elemental Analysis and Imaging with X-Rays." In Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_9.

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Baumeister, Martin, and Thomas Kohnen. "Scanning Electron Microscopy." In Encyclopedia of Ophthalmology. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35951-4_420-3.

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Conference papers on the topic "Scanning electron microscoppy"

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Little, Brenda, Robert Pope, and Richard Ray. "Localized Corrosion and Bacterial Attraction Determined by Surface Analytical Techniques." In CORROSION 2000. NACE International, 2000. https://doi.org/10.5006/c2000-00395.

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Abstract Used in combination, surface analytical techniques can be used to resolve spatial relationships between bacteria and localized corrosion, determine specific corrosion mechanisms and to differentiate between abiotic and biotic processes. Confocal laser scanning microscopy and scanning vibrating electrode microscopy were used to demonstrate marine bacteria and anodic sites are co-located. Environmental scanning electron microscopy coupled with energy dispersive x-ray spectroscopy was used to demonstrate dealloying of nickel from copper:nickel alloys. X-ray absorption spectroscopy and tr

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Milner, R., and M. W. Phaneuf. "Comparative Carburization of Heat Resistant Alloys." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98431.

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Abstract Two high strength, centrifugally cast heat resistant materials were examined under near identical pack carburizing conditions. The first material represented an alloy class which is becoming the most popular for replacement coils in ethylene pyrolysis furnaces due to its large improvement in carburization resistance over HP based alloys. The second material represented the next generation of alloys to be used for this purpose. Additionally, several investigative techniques were employed to illustrate some of the strengths and weaknesses of each technique. A recent advance in microscop

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Clark, Ronald N., Robert Burrows, Tomas Martin, et al. "Examination of a Ferritic-Martensitic Steel Following Irradiation and High Temperature Water Corrosion." In CONFERENCE 2022. AMPP, 2022. https://doi.org/10.5006/c2022-18127.

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Abstract This paper focuses on the characterization of an advanced steel which has been developed for use as a structural material within future nuclear fusion reactors, including in irradiated water coolant-facing locations. In the paper an experimental plan is described which would allow both the corrosion and stress corrosion cracking susceptibility of irradiated Eurofer-97 to be studied. Also included are early results from characterization of self-ion irradiated (using Fe ions) Eurofer-97 following high temperature corrosion experiments using electron microscopy techniques. Field emission

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Wegscheider, S., A. Georgi, V. Sandoghdar, G. Krausch, and J. Mlynek. "Scanning near-field optical lithography." In The European Conference on Lasers and Electro-Optics. Optica Publishing Group, 1996. http://dx.doi.org/10.1364/cleo_europe.1996.cfa4.

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The resolution of various scanning probe microscopy methods can be applied to the fabrication of nanostructures. Various methods of local material modification based on different microscopic mechanisms have been proposed, examples of which are : material transfer between a scanning tunneling microscope (STM) tip and a substrate, local oxidation of silicon using atomic force microscope (AFM). Scanning near-field optical microscopy (SNOM) is also an attractive candidate for nanofabrication. Here the optical spot size in the near-field is given by the resolution of the SNOM which in turn is deter

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Galand, R., L. Clément, P. Waltz, and Y. Wouters. "Microstructure and texture analysis of advanced copper using electron backscattered diffraction and scanning transmission electron microscopy." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.852908.

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Burnett, Bryan R. "An electro-conductive organic coating for scanning electron microscopy (déjà vu)." In SPIE Scanning Microscopies, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and Tim K. Maugel. SPIE, 2014. http://dx.doi.org/10.1117/12.2065553.

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Campo, E. M., H. Campanella, Y. Y. Huang, et al. "Electron microscopy of polymer-carbon nanotubes composites." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.867718.

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Young, Richard, Sander Henstra, Jarda Chmelik, et al. "XHR SEM: enabling extreme high resolution scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824749.

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Babin, S., S. Borisov, and A. Ivanchikov. "Modeling of charge and discharge in scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.828575.

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Pfeiffer, Hans C. "New prospects for electron beams as tools for semiconductor lithography." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822771.

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Reports on the topic "Scanning electron microscoppy"

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Weber, Peter M. Time-Resolved Scanning Electron Microscopy. Defense Technical Information Center, 2006. http://dx.doi.org/10.21236/ada455461.

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Sickafus, Kurt. History of Scanning Electron Microscopy (SEM). Office of Scientific and Technical Information (OSTI), 2024. http://dx.doi.org/10.2172/2372668.

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รุจิรวนิช, รัตนา. การศึกษาผลการเติมพอลิไวนิลแอลกอฮอล์ พอลิแลคติก แอซิดและพอลิคาโพรแลคโทนที่มีต่อการปรับปรุงสมบัติทางกลและความสามารถในการต้านทานความชื้นของคอมพอสิตโฟมที่มีแป้งมันสำปะหลังเป็นส่วนประกอบหลัก : รายงานผลการวิจัย. จุฬาลงกรณ์มหาวิทยาลัย, 2004. https://doi.org/10.58837/chula.res.2004.95.

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งานวิจัยนี้เป็นการเตรียมคอมพอสิตโฟมโดยวิธีการอบจากแป้งมันสำปะหลังและพอลิเมอร์สังเคราะห์ที่ย่อยสลายได้แก่ พอลิไวนิลแอลกอฮอล์ พอลิแลคติก แอซิด และพอลิคาโพรแลคโทน จากการศึกษาโดยใช้กล้องสแกนนิ่งอิเล็กตรอนไมโครสโคป (Scanning electron microscope) พบว่าขอบบนและล่างของโฟมจะมีความหนาแน่นสูงในขณะที่ส่วนกลางของโฟมจะมีความหนาแน่นต่ำ ในงานวิจัยนี้ได้ศึกษาผลกระทบของความชื้นสัมพัทธ์เวลาในการเก็บโฟม การเติมพอลิเมอร์สังเคราะห์ที่ย่อยสลายได้และการเติมพลาสติไซเซอร์ที่มีผลต่อสมบัติเชิงกล ผลการศึกษาสมบัติเชิงกลพบว่า ค่าการทนต่อแรงดึงและค่าการทนต่อแรงโค้งงอจะให้ค่าสูงที่สุดที่สภาวะความชื้นสัมพัทธ์ 42 เปอร์เซ็นต์นาน

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Hadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388472.

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Pennycook, S. J., and A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2008. http://dx.doi.org/10.2172/939888.

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Marder, A., K. Barmak, and D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/676882.

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Collins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler, and Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1331925.

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Ruggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/6854553.

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Bertness, K. A. Dimensional measurement of nanostructures with scanning electron microscopy. National Institute of Standards and Technology, 2017. http://dx.doi.org/10.6028/nist.sp.250-96.

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Nakakura, Craig Y., and Kimberlee Chiyoko Celio. Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM). Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1564040.

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