Relevant bibliographies by topics / Scanning Tunneling Microscopy [Tool]

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Scanning Tunneling Microscopy [Tool]'

Author: Grafiati
Published: 7 September 2023
Last updated: 31 July 2025

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Journal articles on the topic "Scanning Tunneling Microscopy [Tool]"

1

Chiang, Shirley, and Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool." Analytical Chemistry 59, no. 21 (1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.

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Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of informatio
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Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demons
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Denley, D. R. "Practical applications of scanning tunneling microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.

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Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement
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van de Walle, G. F. A., B. J. Nelissen, L. L. Soethout, and H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis." Fresenius' Zeitschrift für analytische Chemie 329, no. 2-3 (1987): 108–12. http://dx.doi.org/10.1007/bf00469119.

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Rohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond." Surface Science 299-300 (January 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.

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7

Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and oth
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Edel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (1991): 618. http://dx.doi.org/10.1116/1.585471.

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Elings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (1990): 959. http://dx.doi.org/10.1017/s0424820100162363.

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With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM h
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XIE, XIAN NING, HONG JING CHUNG, and ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION." COSMOS 03, no. 01 (2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.

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Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typica
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Dissertations / Theses on the topic "Scanning Tunneling Microscopy [Tool]"

1

Kulawik, Maria. "Low temperature scanning tunneling microscopy." Doctoral thesis, [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=979718848.

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Ding, Haifeng. "Spin-polarized scanning tunneling microscopy." [S.l. : s.n.], 2001. http://deposit.ddb.de/cgi-bin/dokserv?idn=963217186.

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Gustafsson, Alexander. "Theoretical modeling of scanning tunneling microscopy." Doctoral thesis, Linnéuniversitetet, Institutionen för fysik och elektroteknik (IFE), 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-69012.

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The main body of this thesis describes how to calculate scanning tunneling microscopy (STM) images from first-principles methods. The theory is based on localized orbital density functional theory (DFT), whose limitations for large-vacuum STM models are resolved by propagating localized-basis wave functions close to the surface into the vacuum region in real space. A finite difference approximation is used to define the vacuum Hamiltonian, from which accurate vacuum wave functions are calculated using equations based on standard single-particle Green’s function techniques, and ultimately used
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Blackham, Ian George. "Scanning tunneling microscopy of electrode surfaces." Thesis, University of Oxford, 1992. https://ora.ox.ac.uk/objects/uuid:f9d27595-1177-406f-89a2-1448ac654dd3.

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A scanning tunneling microscope (STM) suitable for the in-situ study of electrode surfaces under electrochemical control has been developed. The system consists of commercially available software and feedback electronics, with a custom-built stage and electrochemical control. The stage incorporates an automatic coarse approach mechanism for ease of operation. Gold single crystal spheres (SCS) and gold on mica thin films have been studied as surfaces potentially suitable for samples in in-situ electrochemical STM experiments. Characteristic features of each surface have been identified. High re
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Heben, Michael J. Lewis Nathan Saul Lewis Nathan Saul. "Scanning tunneling microscopy in electrochemical environments /." Diss., Pasadena, Calif. : California Institute of Technology, 1990. http://resolver.caltech.edu/CaltechETD:etd-06122007-104233.

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Weeks, Brandon Lea. "Applications of high-pressure scanning tunneling microscopy." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621999.

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Salazar, Enríquez Christian David. "Scanning tunneling microscopy on low dimensional systems." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2016. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-211572.

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This thesis contains experimental studies on low dimensional systems by means of scanning tunneling microscopy (STM). These studies include investigations on dinickel molecular complexes and experiments on iron nanostructures used for the implementation of the spin-polarized scanning tunneling microscopy technique at the IFW-Dresden. Additionally, this work provides detailed information of the experimental technique (STM), from the theoretical background to the STM-construction, which was part of this doctoral work. Molecular anchoring and electronic properties of macrocyclic magnetic complex
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DiLullo, Andrew R. "Manipulative Scanning Tunneling Microscopy and Molecular Spintronics." Ohio University / OhioLINK, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1363821351.

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Kersell, Heath R. "Alternative Excitation Methods in Scanning Tunneling Microscopy." Ohio University / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1449074449.

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Gambrel, Grady A. "Scanning Tunneling Microscopy of Two-Dimensional Materials." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu149424786854182.

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Books on the topic "Scanning Tunneling Microscopy [Tool]"

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Neddermeyer, H., ed. Scanning Tunneling Microscopy. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1812-5.

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1956-, Stroscio Joseph A., and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. Academic Press, 1993.

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H, Neddermeyer, ed. Scanning tunneling microscopy. Kluwer Academic Publishers, 1993.

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1956-, Stroscio Joseph Anthony, and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. Academic Press, 1993.

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1956-, Stroscio Joseph Anthony, and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. Academic Press, 1993.

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Güntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Springer Berlin Heidelberg, 1994. http://dx.doi.org/10.1007/978-3-642-79255-7.

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Güntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97343-7.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-97470-0.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1996. http://dx.doi.org/10.1007/978-3-642-80118-1.

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Book chapters on the topic "Scanning Tunneling Microscopy [Tool]"

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Howland, Rebecca S. "The Scanning Probe Microscope as a Metrology Tool." In Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_35.

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Della Pia, Ada, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Surface Science Techniques. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-34243-1_19.

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Feenstra, R. M. "Scanning Tunneling Microscopy." In Interaction of Atoms and Molecules with Solid Surfaces. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4684-8777-0_11.

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Binning, G., and H. Rohrer. "Scanning tunneling microscopy." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_3.

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Ng, Kwok-Wai. "SCANNING TUNNELING MICROSCOPY." In Handbook of Measurement in Science and Engineering. John Wiley & Sons, Inc., 2016. http://dx.doi.org/10.1002/9781119244752.ch56.

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Pia, Ada Della, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Encyclopedia of Nanotechnology. Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-94-017-9780-1_45.

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Voigtländer, Bert. "Scanning Tunneling Microscopy." In Scanning Probe Microscopy. Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0_20.

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Niehus, Horst. "Scanning Tunneling Microscopy." In Equilibrium Structure and Properties of Surfaces and Interfaces. Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3394-8_2.

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Tomitori, Masahiko. "Scanning Tunneling Microscopy." In Roadmap of Scanning Probe Microscopy. Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_2.

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Hasegawa, Yukio. "Scanning Tunneling Microscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_97.

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Conference papers on the topic "Scanning Tunneling Microscopy [Tool]"

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Pickering, Howard W., and Toshio Sakurai. "Scanning Tunneling Microscopy and Its Applications in Corrosion Science." In CORROSION 1991. NACE International, 1991. https://doi.org/10.5006/c1991-91081.

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Abstract Scanning tunneling microscopy (STM) is described with a view to its application for the study of corrosion reactions. The principles of STM are presented in terms of the theory, construction of the microscope including field ion capability for characterizing the probe tip, and its applications for characterizing surfaces. Recent results will be presented to illustrate its versatility for the study of surface structure, chemisorption and surface reactions, including the study of atomic hydrogen adsorption on the Si(111)-7 x 7 surface and real time (in-situ) studies of anodic copper dis
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Zaitsev, Boris. "Atomic Force Microscopy as a Tool for Applied Virology and Microbiology." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639726.

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Ohtsu, Motoichi. "Photon Scanning Tunneling Microscope." In Spectral Hole-Burning and Related Spectroscopies: Science and Applications. Optica Publishing Group, 1994. http://dx.doi.org/10.1364/shbs.1994.fc1.

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A photon scanning tunneling microscope (PSTM) is an optical microscope with super-resolution beyond the diffraction-limit based on the near field optics, which has been intensively studied in these years[1]. Since it can be used not only as a microscope but also as a nanometric fabrication tool and a manipulator of nanometric particles, a variety of applications have been proposed[2]. This paper reviews the recent progress of our study on PSTM.
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de Pablos, P. F. "Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639790.

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Courjon, D. "Near Field Optical Microscopy." In The European Conference on Lasers and Electro-Optics. Optica Publishing Group, 1996. http://dx.doi.org/10.1364/cleo_europe.1996.tutc.

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Near field microscopy is about ten years old. Unlike Scanning Tunneling Microscopy, its progress has been slow and somewhat erratic. Today, we can consider that this new tool is mature enough to be used in a few routine surface characterization procedures.
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Clayton, G. M., and S. Devasia. "Image-Based Trajectory Estimation for Scanning Tunneling Microscopy." In ASME 2007 International Mechanical Engineering Congress and Exposition. ASMEDC, 2007. http://dx.doi.org/10.1115/imece2007-42262.

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In this article we present an image-based approach to estimate the probe position trajectory in scanning tunneling microscopes (STMs). STMs are key enabling tools in the experimental investigation and manipulation of nano and sub-nano scale phenomena; however, due to an inability to measure the STM-probe position, typical STMs are limited to low bandwidth operations to ensure positioning accuracy. To overcome sensor deficiencies, thus enabling higher bandwidth STMs, an image-based method which produces discrete samples of the STM-tip trajectory has been developed. In this article we explore ho
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Bennett, Jean M., Jay Jahanmir, John C. Podlesny, Tami L. Balter, and Daniel T. Hobbs. "The Scanning Force Microscope as a Tool for Studying Optical Surfaces." In Optical Fabrication and Testing. Optica Publishing Group, 1994. http://dx.doi.org/10.1364/oft.1994.omd1.

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Traditional instruments that have been used to study optical surfaces include the Nomarski microscope, various types of optical and mechanical profilers, scanning electron microscope, and transmission electron microscope. Although most of these instruments are sensitive to very small height variations, they have limited lateral resolution. Hence, features such as tiny scratches, closely spaced structure of metal and dielectric films, tiny laser damage craters, and impact craters from space debris cannot be seen by the traditional surface characterization instruments. With the advent of the sca
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Cricenti, Antonio, S. Selci, M. Scarselli, Renato Generosi, F. Amaldi, and G. Chiarotti. "Gap-modulated versus constant current mode as a tool to discriminate between DNA and substrate structure in scanning tunneling microscopy." In OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering, edited by Clayton C. Williams. SPIE, 1993. http://dx.doi.org/10.1117/12.146384.

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Avouris, Ph, I. W. Lyo, F. Bozso, B. Schubert, and R. Hoffmann. "The Elucidation of the Mechanism of the Initial Stages of Si(111)-7x7 Oxidation Using Scanning Tunneling Microscopy." In The Microphysics of Surfaces: Beam-Induced Processes. Optica Publishing Group, 1991. http://dx.doi.org/10.1364/msbip.1991.mb2.

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The capability of the scanning tunneling microscopy (STM) and spectroscopy (STS) to probe the topography and electronic structure of surfaces and adsorbate layers with atomic resolution makes it a powerful tool in the study of surface chemistry (1). Here we use STM, STS, ultraviolet photocmission spectroscopy (UPS) and electronic structure calculations to study the long-standing problem involving the nature of the initial stages of the oxidation of silicon. There have been a large number of studies on this issue utilizing a great variety of techniques. However, not only is the mechanism of oxi
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Jalili, Nader, Mohsen Dadfarnia, and Darren M. Dawson. "Distributed-Parameters Base Modeling and Vibration Analysis of Micro-Cantilevers Used in Atomic Force Microscopy." In ASME 2003 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/detc2003/vib-48502.

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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications such as electronics, semi-conductors, materials, manufacturing, polymers, biological analysis, and biomaterials. The noncontact AFM offers unique advantages over other contemporary scanning probe techniques such as contact AFM and scanning tunneling microscopy. Current AFM imaging techniques are often based on a lumped-parameters model and ordinary differential equation (ODE) rep
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Reports on the topic "Scanning Tunneling Microscopy [Tool]"

1

Bartels, Ludwig. Towards the Assembly and Characterization of Individual Molecules by Use of the Scanning Tunneling Microscope as a Nanoscopic Tool. Defense Technical Information Center, 2002. http://dx.doi.org/10.21236/ada408395.

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Dow, John D. Scanning Tunneling Microscopy. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada249262.

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Botkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/270266.

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Quate, C. F. Scanning Tunneling Microscopy of Semiconductor Surfaces. Defense Technical Information Center, 1988. http://dx.doi.org/10.21236/ada199836.

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Lyding, Joseph W. Cryogenic Ultrahigh Vacuum Scanning Tunneling Microscopy. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada262264.

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Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada246852.

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Heben, M. J., T. L. Longin, R. Pyllki, R. M. Penner, R. Blumenthal, and N. S. Lewis. Applications of Scanning Tunneling Microscopy to Electrochemistry. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada263326.

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Lewis, Nathan S. Applications of Scanning Tunneling Microscopy to Electrochemistry. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada269129.

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Williams, Ellen D. Scanning Tunneling Microscopy as a Surface Chemical Probe. Defense Technical Information Center, 1988. http://dx.doi.org/10.21236/ada192710.

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Coleman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/6017304.

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