Academic literature on the topic '(Sem) Scanning'

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Journal articles on the topic "(Sem) Scanning"

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Ichinokawa, Takeo. "Scanning Low-Energy Electron Diffraction Microscopy Combined with Scanning Tunnling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 302–3. http://dx.doi.org/10.1017/s0424820100180264.

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A ultra-high vacuum scanning electron microscope (UHV-SEM) with a field emission gun (FEG) has been operated in an energy range of from 100 eV to 3 keV. A new technique of scanning low energy electron diffraction (LEED) microscopy has been added to the other techniques: scanning Auger microscopy (SAM), secondary electron microscopy, electron energy loss microscopy and the others available for the UHV-SEM. In addition to scanning LEED microscopy, a scanning tunneling microscope (STM) has been installed in the UHV-SEM-.The combination of STM with SEM covers a wide magnification range from 105 to
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Sweet, Walter C. "Scanning electron microscopy and photomicrography." Paleontological Society Special Publications 4 (1989): 351–55. http://dx.doi.org/10.1017/s2475262200005347.

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In the last two decades, scanning electron miocroscopy has come to be the technique of choice in studies of microfossil structure and morphology. Scanning electron microscope (SEM) photomicrographs are easy to produce, have great depth of field, and resolve minute details over a wide range of magnifications. Hence photomicrographs of images produced in a SEM are now more widely used than ordinary photographs in the illustration of microfossils. Techniques for preparation, mounting and manipulation of specimens in the SEM vary with the instrument available, aims of the study, and skill of the o
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Collins, George J. "A Scanning Probe Microscope in My Scanning Electron Microscope?" Microscopy Today 3, no. 2 (1995): 22–23. http://dx.doi.org/10.1017/s1551929500063112.

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Scanning probe microscopes (SPMs) designed to fit into scanning elec- tron microscopes (SEMs) are now becoming commercially available and you might ask, "Why would I want to put an SPM in my SEM"? The primary reason is that the too forms of microscope are very complimentary. Each microscope extends the power of the other. The SEM can do things that are hard to do with an SPM, and vice versa.Not long after the introduction of the STM and the AFM, a few re- searchers built custom SPMs and installed them in their SEMs. The reports of these projects to build hybrid microscopes and examples of the
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Balk, Ludwig Josef. "Thermal- and acoustic-wave techniques in scanning electron microscopy." Canadian Journal of Physics 64, no. 9 (1986): 1238–46. http://dx.doi.org/10.1139/p86-216.

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Since their introduction in 1980, thermal- and acoustic-wave techniques utilizing electron-beam excitation, denoted in the following as scanning electron acoustic microscopy (SEAM), have developed to include methods in the realm of scanning electron microscopy (SEM), giving additional and important information on material parameters compared with other SEM techniques. However, the SEAM method still has shortcomings, both theoretically and experimentally. New theories have to consider various principal sound-generation mechanisms, especially for semiconductors, ceramics, and ferromagnets. Furth
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Müllerová, Ilona, Kenji Matsuda, Petr Hrnčiřík, and Luděk Frank. "Enhancement of SEM to scanning LEEM." Surface Science 601, no. 20 (2007): 4768–73. http://dx.doi.org/10.1016/j.susc.2007.05.042.

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LI, Y. L., Z. R. HUANG, Q. D. ZHONG, C. CHEN, and Y. X. XU. "SECM APPLIED FOR RESEARCHING THE MICROSCOPIC MORPHOLOGY AND CORROSION BEHAVIOR OF ENAMEL COATING ON MILD STEEL IN AQUEOUS CHLORIDE SOLUTIONS." Surface Review and Letters 25, no. 05 (2018): 1850094. http://dx.doi.org/10.1142/s0218625x18500944.

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The microstructures, morphology features and the corrosion resistance of the different particle diameters of enamel coating were investigated in this paper. All enamel coating samples were immersed in 5[Formula: see text]wt.% NaCl solution. The effects of the diameter of micron-dimension enamel particles on the mild steel were discussed and the corrosion resistance of the different coatings were characterized by potentiodynamic polarization curves, scanning electron microscopy (SEM) and scanning electrochemical microscopy (SECM), the SECM was employed to identify the local reactivity and then
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Holm, Jason. "A Brief Overview of Scanning Transmission Electron Microscopy in a Scanning Electron Microscope." EDFA Technical Articles 23, no. 4 (2021): 18–26. http://dx.doi.org/10.31399/asm.edfa.2021-4.p018.

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Abstract This article provides a brief overview of STEM-in-SEM, discussing the pros and cons, recent advancements in detector technology, and the emergence of 4D STEM-in-SEM, a relatively new method that uses diffraction patterns recorded at different raster positions to enhance images offline in selected regions of interest.
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Wyler, A., and G. Golan. "Scanning acoustic microscopy investigation of melted collagen in thermoplastic leather." Journal of Materials Research 14, no. 6 (1999): 2446–48. http://dx.doi.org/10.1557/jmr.1999.0328.

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A scanning acoustic microscope (SAM) has been used to investigate the structure of thermoplastic leather. This material is formed by pressing fibers of leather under high pressure and moderate temperature. The result is a matrix from transformed, melted fibers in which leftover fibers act as reinforcement. Unlike the scanning electron microscope (SEM), the SAM is able to distinguish between completely and incompletely transformed fibers and also to penetrate the material beneath the surface. The results show that the matrix is built as a domain structure. The advantages of the SAM over the SEM
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Sawyer, Linda C. "SEM of polymer materials." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 426–29. http://dx.doi.org/10.1017/s0424820100126913.

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Scanning electron microscopy (SEM) has become an analytical tool widely used in universities, industrial laboratories and modern plants in applications ranging from fundamental research and applied research to quality control. The SEM provides important and insightful observations, in the form of three dimensional images of bulk materials and surfaces, which provide input to conduct process-structure-properties studies of polymer materials. SEM analysis requires knowledge of the instruments, image formation and specimen preparation methods.Consideration must be given to the interaction of the
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Wang, Zhi Gang, Lei Shi, Yong Xu, and Qi Lei Sun. "Scanning Electron Microscope in Metallurgical Experiment." Applied Mechanics and Materials 556-562 (May 2014): 275–77. http://dx.doi.org/10.4028/www.scientific.net/amm.556-562.275.

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The precipitated carbides amount change after quenching and tempering the steel can be clearly observed by scanning electron microscope (SEM). The hidden needle martensite in high speed steels can be also clearly showed. Compared with the optical differential microscopy, the result of SEM shows significant differentiation. The application of SEM in metallurgical experimental teaching is feasible and necessary, with excellent experimental teaching effect.
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Dissertations / Theses on the topic "(Sem) Scanning"

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McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.

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Electron impact excitation collisions are important processes for spectral line formation of plasmas. The work undertaken in this thesis focuses on such collisions involving Li-like ions, important in both astrophysical and magnetically confined plasmas. By having reliable atomic and collisional data, such as energy levels, radiative rates and excitation rate coefficients, it is possible to generate models to describe such plasmas. The atomic data were calculated using the General-Purpose Relativistic Structure Program (GRASP; Dyall et al 1989), for several Li-like ions, namely S XIV, Ar XVI,
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Liu, Yangmingyue. "Scanning Electron Microscopy To Probe Working Nanowire Gas Sensors." OpenSIUC, 2013. https://opensiuc.lib.siu.edu/theses/1256.

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This study is dedicated to the implementing of Electron-Beam-Induced Current (EBIC) microscopy to study the behavior of metal oxide semiconducting (MOS) nanowire (NW) gas sensor in situ under exposure to different environment. First, we reported the development of a single nanowire gas sensor compatible with an environmental cell. The major component of the device we use in this study is a single SnO2 nanowire attached to an electron transparent SiN membrane (50-100 nm thick), which was used for mounting nanowire working electrodes and surface imaging of NW. First the NW's conductivity is inve
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ʿAẓīm, Muḥammad. "Ultra high vacuum-scanning electron microscope studies of Cs/Si(100)-2x1." Thesis, University of Sussex, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.385984.

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Farley, A. N. "An environmental control stage for the scanning electron microscope." Thesis, University of Bristol, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379674.

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Jenei, István Zoltán. "Scanning electron microscopy (SEM) analysis of tribofilms enhanced by fullerene-like nanoparticles." Licentiate thesis, Stockholms universitet, Fysikum, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-82153.

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The beneficiary effects of WS2 inorganic fullerene-like nanoparticles in the lubrication industry were shown in recent years. The incorporation of the nanoparticles into lubricants (oils, greases) is however not straightforward. When two surfaces are sliding against each other and a lubricant is used, a thin layer (tribofilm) is formed on the contact area, which effects the friction process. Lubricants usually contain several additives. These additives can impair the friction reducing behaviour of the WS2 inorganic fullerene-like nanoparticles. This thesis investigates the effects of several a
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MacDonald, Kinsey Elizabeth. "Analysis of Frozen Desserts Using Low-Temperature Scanning Electron Microscopy (LT-SEM)." Thesis, Clemson University, 2019. http://pqdtopen.proquest.com/#viewpdf?dispub=10982077.

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<p> Commercial vanilla ice cream and other frozen desserts from the United States were analyzed for ice crystal length using low-temperature scanning electron microscopy (LT-SEM). Average ice crystal length was determined using multiple micrographs of each sample/product. Out of the products tested, 11 out of 15 samples had an average ice crystal length above the consumer sensory threshold limit of 55 &micro;m. Products containing stabilizers tended to have smaller average ice crystal lengths than products without stabilizers. With a few exceptions, lower fat products tended to have larger ice
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Hrubanová, Kamila. "Scanning Electron Microscopy and its Applications for Sensitive Samples." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-409082.

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Předložená dizertační práce s názvem “Rastrovací elektronová mikroskopie a její aplikace pro senzitivní vzorky” pojednává o problematice rastrovací elektronové mikroskopie v kontextu instrumentálního a metodologického vývoje vedoucího k inovativnímu řešení, které je dobře aplikovatelné zejména v mikrobiologickém výzkumu. Součástí práce je rozprava o historii a současném stavu elektronové mikroskopie (EM) jakožto vědecké zobrazovací a analytické techniky, tato část se nachází v úvodních kapitolách. Nepopiratelný přínos EM v biologických a lékařských oborech je dokazován mnoha citovanými vědecký
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Kothari, Anuja. "SEM Assessment of the Enamel Surface After Debonding of Ceramic Brackets." Thesis, NSUWorks, 2015. https://nsuworks.nova.edu/hpd_cdm_stuetd/72.

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Objective: This study was conducted to compare the shear bond strengths, patterns of bond failure and enamel surfaces after debonding two ceramic brackets (ClearVu and Radiance Plus) and one standard metal bracket (Mini Uni-Twin). Background: Ceramic brackets are an esthetic alternative to metal brackets. The mean shear bond strength of ceramic brackets is significantly greater than for metal brackets. Excessive bond strength can result in pain upon debonding, damage to the bracket or permanent damage to the enamel including flaking, cracks or tooth fracture. Numerous studies have evaluated te
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Skoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.

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Tato práce se zabývá možnostmi kvantitativního zobrazování ve skenovacím (transmisním) elektronovém mikroskopu (S|T|EM) společně s jejich korelativní aplikací. Práce začíná popisem metody kvantitativního STEM (qSTEM), kde lze stanovenou lokální tloušťku vzorku dát do spojitosti s ozářenou dávkou, a vytvořit tak studii úbytku hmoty. Tato metoda byla použita při studiu ultratenkých řezů zalévací epoxidové pryskyřice za různých podmínek (stáří, teplota, kontrastování, čištění pomocí plazmy, pokrytí uhlíkem, proud ve svazku). V rámci této části jsou diskutovány a demonstrovány možnosti kalibračníh
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Kawano, Kayoko. "Application of the ultra high resolution, low voltage scanning electron microscopy in the materials science." Thesis, University of Manchester, 2012. https://www.research.manchester.ac.uk/portal/en/theses/application-of-the-ultra-high-resolution-low-voltage-scanning-electron-microscopy-in-the-materials-science(341c7955-1da7-49be-9dd3-a3f3248bae05).html.

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The efficiency of low voltage scanning electron microscopy, which presents near-surface information, has been well known for a long time. However, it is not widely known that the high resolution capability can only be achieved when the surface reveals the original characteristics of the materials without any deterioration due contamination. Therefore, initial attention in this study is directed at clarifying the efficient use of the ultra high resolution, low voltage SEM (UHRLV SEM), (Ultra55, Zeiss). The SEM images and the selected electrons for detection, and damage that occurs through UHRVL
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Books on the topic "(Sem) Scanning"

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Christensen, Knud Ib. SEM-studies of epidermal patterns of petals in the angiosperms. Council for Nordic Publications in Botany, 1998.

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Amerom, H. W. J. van. and Lagaaij Robert 1924-, eds. Sem atlas of type and figured material from Robert Lagaaij's "The pliocene bryozoa of the Low Countries", (1952). s.n.], 1989.

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Centre, Bhabha Atomic Research, ed. Sem measurement of stretched zone width (szw) for determination of initiation fracture toughness in ductile materials. Bhabha Atomic Research Centre, 2005.

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DeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. USDA, Forest Service, Forest Products Laboratory, 1986.

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DeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. USDA, Forest Service, Forest Products Laboratory, 1986.

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DeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. USDA, Forest Service, Forest Products Laboratory, 1986.

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DeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. USDA, Forest Service, Forest Products Laboratory, 1986.

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DeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. USDA, Forest Service, Forest Products Laboratory, 1986.

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DeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. USDA, Forest Service, Forest Products Laboratory, 1986.

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Egon, Marx, and National Institute of Standards and Technology (U.S.), eds. User's manual for the program MONSEL-1: Monte Carlo simulation of SEM signals for linewidth metrology. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1994.

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Book chapters on the topic "(Sem) Scanning"

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Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. "Low Voltage SEM." In Field Emission Scanning Electron Microscopy. Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-4433-5_4.

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Frahm, Ellery. "Scanning Electron Microscopy (SEM)." In Encyclopedia of Geoarchaeology. Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-1-4020-4409-0_25.

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Cimmino, S., E. Martuscelli, and C. Silvestre. "Scanning Electron Microscopy (SEM)." In Test Procedures for the Blood Compatibility of Biomaterials. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1640-4_24.

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Ni, Chaoying. "Scanning Electron Microscopy (SEM)." In Encyclopedia of Tribology. Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_1217.

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Datye, Abhaya, and Andrew DeLaRiva. "Scanning Electron Microscopy (SEM)." In Springer Handbook of Advanced Catalyst Characterization. Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-07125-6_18.

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Sateesh Kumar, Ch, M. Muralidhar Singh, and Ram Krishna. "Scanning Electron Microscope (SEM)." In Advanced Materials Characterization. CRC Press, 2023. http://dx.doi.org/10.1201/9781003340546-6.

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Gooch, Jan W. "Scanning Electron Microscope (SEM)." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_14743.

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Ul-Hamid, Anwar. "Specialized SEM Techniques." In A Beginners' Guide to Scanning Electron Microscopy. Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-98482-7_5.

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Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. "SEM Imaging Checklist." In Scanning Electron Microscopy and X-Ray Microanalysis. Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6676-9_14.

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Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. "SEM Case Studies." In Scanning Electron Microscopy and X-Ray Microanalysis. Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6676-9_15.

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Conference papers on the topic "(Sem) Scanning"

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Bialas, Marcin. "Portable Scanning and Acquisition System for Miniature SEM." In 2024 37th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2024. http://dx.doi.org/10.1109/ivnc63480.2024.10652447.

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Howell, Andrew G. "Application of Scanning Electron Microscopy in Conducting Boiler Tube Failure Investigations." In CORROSION 1990. NACE International, 1990. https://doi.org/10.5006/c1990-90188.

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Abstract Scanning Electron Microscopy (SEM) is a valuable tool for boiler tube failure analysis, supplying information not available by more conventional analytical techniques. An overview of the operating theory of the SEM is described, including the formation of secondary electron images, backscattered electron images and characteristic x-rays. Case histories are discussed to show how SEM documentation of cross-sectional elemental distribution in a deposit, or corrosion layer, can provide key insights concerning the mode of failure. Potential errors in sample collection and preparation, whic
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Stegmann, Heiko, and Flavio Cognigni. "Few-Shot AI Segmentation of Semiconductor Device FIB-SEM Tomography Data." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0013.

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Abstract Image segmentation is a valuable tool for visual image data inspection of semiconductor device structures. For the large amounts of data provided by recent advancements in automated scanning electron microscope (SEM) and focused ion beam-scanning electron microscope (FIB-SEM) data acquisition, automatic segmentation becomes indispensable to fully exploit the information contained in the data in automated characterization workflows. Using two exemplary FIB-SEM tomography datasets, we explored artificial intelligence based image segmentation using only a minimum amount of training image
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Gostin, Irina Neta. "USING SCANNING ELECTRON MICROSCOPY TECHNIQUES IN THE ANALYSIS OF STRUCTURAL DIVERSITY OF VARIOUS PLANTS ORGANS." In 24th SGEM International Multidisciplinary Scientific GeoConference 2024. STEF92 Technology, 2024. https://doi.org/10.5593/sgem2024v/4.2/s19.51.

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In this paper, the applications of Scanning Electron Microscopy (SEM) in plant histology and anatomy research are highlighted. Traditionally, SEM is used in plant biology to analyze the surfaces of various vegetative and reproductive organs in order to investigate micromorphological aspects. Vegetative and reproductive organs from 12 species of angiosperms from various habitats in Romania were analyzed (Adonis vernalis L., Primula halleri J.F.Gmel., Oxytropis halleri Bunge et. Koch, Oxytropis campestris (L.) DC, Pulsatilla alpina (L.) Chaz., Gentiana acaulis L., Ranunculus montanus Willd., Dry
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Horacek, Gary. "Biocorrosion in the Oilfield I. Experimental Methods Development; Scanning Electron Microscopy Technique." In CORROSION 1988. NACE International, 1988. https://doi.org/10.5006/c1988-88086.

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Abstract Biocorrosion is routinely encountered, but not always recognized, in the oilfield. Biocorrosion results primarily from the activities of sessile (adherent) bacteria growing in biofilms on metal surfaces. Classical microbiological methods are not appropriate for detecting or monitoring sessile bacteria. In the work reported here, biofilming bacteria, their associated exopolymer, and the early time-course events of biofilm development on steel were visualized by use of the scanning electron microscope (SEM). Scanning electron photomicrographs also show that corrosion occurred directly u
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Van Leer, Brandon, Cedric Bouchet-Marquis, and Huikai Cheng. "Three-dimensional characterization of Gd nanoparticles using STEM-in-SEM tomography in a dual-beam FIB-SEM." In SPIE Scanning Microscopies, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and Tim K. Maugel. SPIE, 2015. http://dx.doi.org/10.1117/12.2195530.

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Nadeau, Jay, Randall Mielke, and Samuel Clarke. "Quantum dot conjugates for SEM of bacterial communities." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824201.

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Young, Richard, Sander Henstra, Jarda Chmelik, et al. "XHR SEM: enabling extreme high resolution scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824749.

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Milani, Marziale, Claudia Brundu, Grazia Santisi, Claudio Savoia, and Francesco Tatti. "FIB/SEM cell sectioning for intracellular metal granules characterization." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821796.

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Ghosh, Nabarun, and Don W. Smith. "Characterization of some biological specimens using TEM and SEM." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821825.

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Reports on the topic "(Sem) Scanning"

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Hadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388472.

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Sickafus, Kurt. History of Scanning Electron Microscopy (SEM). Office of Scientific and Technical Information (OSTI), 2024. http://dx.doi.org/10.2172/2372668.

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Zaka, F. Scanning Electron Microscopy (SEM) Procedure for HE Powders on a Zeiss Sigma HD VP SEM. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1335762.

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Zaka, Fowzia. Scanning Electron Microscopy (SEM) Procedure for HE Powders on a LEO 438VP System. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1259748.

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Zaka, Fowzia. Scanning Electron Microscopy (SEM) Procedure for HE Powders on a LEO 438VP System. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1259775.

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สุขวัฒนาสินิทธิ์, มงคล. การเตรียมและการศึกษาสมบัติของของเกลือของไคโตซานกับสารกำจัดวัชพืชที่เป็นกรด : รายงานฉบับสมบูรณ์. จุฬาลงกรณ์มหาวิทยาลัย, 2001. https://doi.org/10.58837/chula.res.2001.42.

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ได้ทำการเตรียมฟิล์มของของผสมที่มีอัตราส่วนต่าง ๆ ของไคโตซานต่อ 2,4-ไคคลอโรฟีนอกซีอะซิติกแอซิด (2,4-D) จากสารละลายของของผสมที่มีอัตราส่วนเดียวกัน เปอร์เซ็นต์การปลดปล่อยของ 2,4-D จากฟิล์มของผสมที่มีอัตราส่วนไคโตซานต่อ 2,4-D ต่าง ๆ ฟิล์มที่มีอัตราส่วนของ ไคโตซานต่อ 2,4-D สูงกว่าปลดปล่อย 2,4-D ได้ช้ากว่าฟิล์มที่มีอัตราส่วนไคโตซานต่อ 2,4-D ต่ำกว่า โดยฟิล์มที่เตรียมจากสารละลายที่มีอัตราส่วนของ ไคโตซานต่อ 2,4-D เป็น 20:1 สามารถควบคุมการปลดปล่อยได้นาน 7 วัน Scanning electron microscope (SEM) แสดงให้เห็นว่าฟิล์มที่มีอัตราส่วนของไคโตซานสูงกว่ามีปริมาณของ 2,4-D บนพื้นผิวน้อยกว่า ฟิล์มของผสมที่เตรียมได้ทั
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รุจิรวนิช, รัตนา. การเตรียมแผ่นเส้นใยเซลลูโลสที่สังเคราะห์จากแบคทีเรียโดยมีอนุภาคระดับนาโนเมตรของโลหะเงินและผงแม่เหล็กเพื่อประยุกต์ใช้เป็นวัสดุป้องกันการรบกวนจากคลื่นแม่เหล็กไฟฟ้า : รายงานผลการวิจัย. จุฬาลงกรณ์มหาวิทยาลัย, 2012. https://doi.org/10.58837/chula.res.2012.72.

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ปัจจุบัน วัสดุที่สามารถตอบสนองต่อทั้งสนามแม่เหล็กและสนามไฟฟ้า ได้รับความสนใจเพิ่มขึ้นอย่างมาก เนื่องจากความหลากหลายในการประยุกต์ใช้งาน เช่น กล้ามเนื้อเทียม เซ็นเซอร์ วัสดุเก็บข้อมูล และวัสดุ กำบังคลื่นแม่เหล็กไฟฟ้า และงานวิจัยนี้ ผู้วิจัยประสบความสำเร็จในการเตรียมวัสดุที่สามารถตอบสนองต่อทั้งสนามแม่เหล็กและสนามไฟฟ้า โดยทำการสังเคราะห์อนุภาคแม่เหล็กและอนุภาคเงินลงในเส้นใยแบคทีเรียเซลลูโลส ตามลำดับ โดยที่อนุภาคแม่เหล็กสามารถสังเคราะห์ลงในเส้นใยแบคทีเรียเซลลูโลส โดยผ่าน วิธี Ammonia Gas-Enhancing in situ Co-Precipitation Method โดยทำการแช่ แผ่นไฮโดรเจลบริสุทธิ์ของแบคทีเรียเซลลูโลสลงใน สารละลายเหล็
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Wendelberger, James. Pixel Interrogation for Scanning Electron Microscope (SEM) Data of Features Betelgeuse, Acrux, and Others on Samples of the Interior Surface of 3013 Containers. Office of Scientific and Technical Information (OSTI), 2023. http://dx.doi.org/10.2172/1958961.

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สิริภัทราวรรณ, อุบลรัตน์, นุชจรินทร์ เหลืองสอาด та หทัยกานต์ มนัสปิยะ. การพัฒนากระดาษเคลือบดินเหนียวนาโนสำหรับยืดอายุผลิตผลทางการเกษตร : รายงานการวิจัย. จุฬาลงกรณ์มหาวิทยาลัย, 2013. https://doi.org/10.58837/chula.res.2013.51.

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งานวิจัยนี้พัฒนาบรรจุภัณฑ์แอคทีฟเพื่อใช้ยืดอายุผลิตผลทางการเกษตร โดยใช้ดินเหนียวนาโนแบบมีรูพรุนที่ผ่านการดัดแปร (porous nanoclay, NC) เคลือบบนกระดาษคราฟต์ขาว (Kraft paper, KP) และใช้พอลิไวนิล แอลกอฮอล์ (PVOH) เป็น binder โดยแปรอัตราส่วนของน้ำต่อ PVOH เป็ น100:20 และ 120:20 พบว่าที่ 120:20 เป็น อัตราส่วนที่เหมาะสม เนื่องจากให้สารเคลือบที่มีลักษณะเป็นชั้นฟิล์มที่มีความสม่ำเสมอ จากนั้นเคลือบ กระดาษด้วยดินเหนียวนาโนแบบมีรูพรุน (Paper+ porous nanoclay, KP+NC) โดยแปรปริมาณ NC เป็นร้อยละ 20, 40 และ 60 ของน้ำหนักกระดาษ วัดประสิทธิภาพในการดูดซับก๊าชเอทิลีนด้วย gas chromatography พบว่าปริมาณของ NC ที่เห
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Abdul Rahim, Nor Azura, Noor Syazril Jafri, and Muna'amirah Mohamad. DEVELOPMENT OF OIL ABSORBENT MAT FROM WASTE NBR GLOVES. Penerbit Universiti Malaysia Perlis, 2023. http://dx.doi.org/10.58915/techrpt2023.003.

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Waste NBR rubber gloves have become an environmental burden because the chemically cross-linked NBR gloves can’t be recycled. In this particular research, an initiative was made to turn the NBR waste glove into an oil absorbent mat by using the amount of chemical cross-linking inside the NBR waste glove triggered by solvents and with the help of epoxy resin as a binding agent. The absorption test used two types of oil: cooking oil and engine oil. To justify the relationship between the developed oil absorbent mat and its absorption behaviour, various tests, namely the Fourier transform infrare
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