Journal articles on the topic 'Semiconductor Manufacturer'
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Jun, Hannah, Wonseok Woo, and Hyoung-goo Kang. "Hynix Semiconductor: Global Pioneer." Asian Case Research Journal 17, no. 01 (2013): 145–60. http://dx.doi.org/10.1142/s0218927513500065.
Full textStreet, Alan. "The Integrated Fabless Manufacturer." EDFA Technical Articles 10, no. 3 (2008): 46–48. http://dx.doi.org/10.31399/asm.edfa.2008-3.p046.
Full textHan, Guang Hua, and Ming Dong. "Semiconductor Manufacturer’s Capacity Reservation with Substitution." Applied Mechanics and Materials 182-183 (June 2012): 571–75. http://dx.doi.org/10.4028/www.scientific.net/amm.182-183.571.
Full textLiu, J. C., and C. Y. Lien. "Dissolved air flotation of polishing wastewater from semiconductor manufacturer." Water Science and Technology 53, no. 7 (2006): 133–40. http://dx.doi.org/10.2166/wst.2006.217.
Full textYang, Yi-Hsuan, and Chen-Yang Cheng. "Tool Planning Model with Calibration for Semiconductor Equipment Manufacturer." Procedia Manufacturing 11 (2017): 2001–8. http://dx.doi.org/10.1016/j.promfg.2017.07.351.
Full textHuang, C. "Precipitate flotation of fluoride-containing wastewater from a semiconductor manufacturer." Water Research 33, no. 16 (1999): 3403–12. http://dx.doi.org/10.1016/s0043-1354(99)00065-2.
Full textCHIANG, Min-Hua. "Taiwan Semiconductor Manufacturing Company: A Key Chip in the Global Political Economy." East Asian Policy 15, no. 01 (2023): 36–46. http://dx.doi.org/10.1142/s179393052300003x.
Full textFrieske, Benjamin, and Sylvia Stieler. "The “Semiconductor Crisis” as a Result of the COVID-19 Pandemic and Impacts on the Automotive Industry and Its Supply Chains." World Electric Vehicle Journal 13, no. 10 (2022): 189. http://dx.doi.org/10.3390/wevj13100189.
Full textGall, Harald, Martin Knaipp, Georg Roehrer, and Wolfgang Reinprecht. "14/48 V Vehicle Electronic System Perspective of a semiconductor manufacturer." ATZelektronik worldwide 8, no. 6 (2013): 40–44. http://dx.doi.org/10.1365/s38314-013-0211-9.
Full textLien, C. Y., and J. C. Liu. "Treatment of Polishing Wastewater from Semiconductor Manufacturer by Dispersed Air Flotation." Journal of Environmental Engineering 132, no. 1 (2006): 51–57. http://dx.doi.org/10.1061/(asce)0733-9372(2006)132:1(51).
Full textWang, Yaqiang, Qunfang Wu, Qin Wang, et al. "An analytical switching model of SiC MOSFET considering the junction temperature characteristics." Digital Twin 2 (December 16, 2022): 19. http://dx.doi.org/10.12688/digitaltwin.17774.1.
Full textLingkai, Kong, Shu Runyang, Lu Hao, Xiong Qiaozhi, Wu Peng, and Xue Rui. "The Fleeting Possibility of Merging the World’s Largest Chip Manufacturer in 2017: The Pain of Chinese Chip Industry." American Journal of Economics and Business Innovation 1, no. 3 (2022): 24–35. http://dx.doi.org/10.54536/ajebi.v1i3.561.
Full textChen, Toly. "Strengthening the Competitiveness and Sustainability of a Semiconductor Manufacturer with Cloud Manufacturing." Sustainability 6, no. 1 (2014): 251–66. http://dx.doi.org/10.3390/su6010251.
Full textHe, Min, Allan Chasey, and Sachin Patel. "Benchmarking Time and Cost of Semiconductor Fabrication Facilities." Journal of the IEST 45, no. 1 (2002): 61–64. http://dx.doi.org/10.17764/jiet.45.1.b34587k473744743.
Full textZabloudilová, P., J. Pecen, and M. Češpiva. "Some causes of differences in the NH3 concentration measured with the semiconductor sensors by one manufacturer." Research in Agricultural Engineering 62, No. 4 (2016): 190–97. http://dx.doi.org/10.17221/80/2015-rae.
Full textLi, Zhe, and Feng Hai. "Virtual Operation Strategy and IFOT Model Based on TSMC." Applied Mechanics and Materials 401-403 (September 2013): 2333–36. http://dx.doi.org/10.4028/www.scientific.net/amm.401-403.2333.
Full textRodriguez, Jose A., Tsz Tsoi, David Graves, and Stephen B. Bayne. "Evaluation of GaN HEMTs in H3TRB Reliability Testing." Electronics 11, no. 10 (2022): 1532. http://dx.doi.org/10.3390/electronics11101532.
Full textSánchez-Vergara, Guevara-Martínez, Arreola-Castillo, and Mendoza-Sevilla. "Fabrication of Hybrid Membranes Containing Nylon-11 and Organic Semiconductor Particles with Potential Applications in Molecular Electronics." Polymers 12, no. 1 (2019): 9. http://dx.doi.org/10.3390/polym12010009.
Full textde Luna, Mark Daniel G., Warmadewanthi, and J. C. Liu. "Combined treatment of polishing wastewater and fluoride-containing wastewater from a semiconductor manufacturer." Colloids and Surfaces A: Physicochemical and Engineering Aspects 347, no. 1-3 (2009): 64–68. http://dx.doi.org/10.1016/j.colsurfa.2008.12.006.
Full textJoy, David C. "Electron Beam Testing and Characterization – Past, Present, and Future." EDFA Technical Articles 2, no. 2 (2000): 4–6. http://dx.doi.org/10.31399/asm.edfa.2000-2.p004.
Full textCheong, Hee-Woon. "Management of Technology Strategies Required for Major Semiconductor Manufacturer to Survive in Future Market." Procedia Computer Science 91 (2016): 1116–18. http://dx.doi.org/10.1016/j.procs.2016.07.163.
Full textLingitz, Lukas, Viola Gallina, Fazel Ansari, et al. "Lead time prediction using machine learning algorithms: A case study by a semiconductor manufacturer." Procedia CIRP 72 (2018): 1051–56. http://dx.doi.org/10.1016/j.procir.2018.03.148.
Full textGrgić, Ivan, Dinko Vukadinović, Mateo Bašić, and Matija Bubalo. "Semiconductor Losses Calculation of a Quasi-Z-Source Inverter with Dead-Time." International journal of electrical and computer engineering systems 13, no. 6 (2022): 467–75. http://dx.doi.org/10.32985/ijeces.13.6.6.
Full textCorea, Rick, Dean Kashiwagi, Dhaval Gajjar, and Sylvia Romero. "Use of Best Value Model to Achieve Sustainability: A Case Study on a Semiconductor Manufacturer." Procedia Engineering 145 (2016): 746–51. http://dx.doi.org/10.1016/j.proeng.2016.04.096.
Full textPavelek, Miroslav, Michal Frivaldsky, Peter Sojka, and Jan Morgos. "Electro-Thermal Modelling and Experimental Verification of Power Semiconductor Diode." Elektronika ir Elektrotechnika 26, no. 2 (2020): 48–53. http://dx.doi.org/10.5755/j01.eie.26.2.25783.
Full textChen, Toly. "A Systematic Cycle Time Reduction Procedure for Enhancing the Competitiveness and Sustainability of a Semiconductor Manufacturer." Sustainability 5, no. 11 (2013): 4637–52. http://dx.doi.org/10.3390/su5114637.
Full textKeum, Yeonwook, and Euiseok Kim. "A Study on Innovation Attributes and Impact of Technological Knowledge by Type of Semiconductor Equipment Manufacturer." Journal of the Korea Academia-Industrial cooperation Society 24, no. 7 (2023): 176–88. http://dx.doi.org/10.5762/kais.2023.24.7.176.
Full textZygmanowski, Marcin. "Detailed Power Loss Analysis of T-Type Neutral Point Clamped Converter for Reactive Power Compensation." Electronics 11, no. 14 (2022): 2129. http://dx.doi.org/10.3390/electronics11142129.
Full textChen, Toly. "A PCA-FBPN Approach for Job Cycle Time Estimation in a Wafer Fabrication Factory." International Journal of Fuzzy System Applications 2, no. 2 (2012): 50–67. http://dx.doi.org/10.4018/ijfsa.2012040103.
Full textTurner, D. Clark. "More Than One Ever Wanted To Know About X-Ray Detectors Part VIII: If I Know It's There, Why Can't I See it?" Microscopy Today 3, no. 7 (1995): 18–19. http://dx.doi.org/10.1017/s1551929500062775.
Full textPark, Jun, Sang Kook, Hyeonu Im, Soomin Eum, and Chulung Lee. "Fabless Semiconductor Firms’ Financial Performance Determinant Factors: Product Platform Efficiency and Technological Capability." Sustainability 10, no. 10 (2018): 3373. http://dx.doi.org/10.3390/su10103373.
Full textChaturvedi, Mayank, Sima Dimitrijev, Daniel Haasmann, Hamid Amini Moghadam, Peyush Pande, and Utkarsh Jadli. "Comparison of the Performance-Degrading Near-Interface Traps in Commercial SiC MOSFETs." Materials Science Forum 1091 (June 5, 2023): 25–29. http://dx.doi.org/10.4028/p-258768.
Full textAmirul, Abdullah Rashid, Saad Nor Hayati, and Bulan Abdullah. "Assessment on Copper C194 Mechanical Properties Variations in Typical Semiconductor Assembly Production Line." Advanced Materials Research 576 (October 2012): 523–26. http://dx.doi.org/10.4028/www.scientific.net/amr.576.523.
Full textContreras, Jorge L. "Is Biopharma Ready for the Standard Wars?" Texas A&M Journal of Property Law 7, no. 1 (2021): 43–80. http://dx.doi.org/10.37419/jpl.v7.i1.2.
Full textGrgić, Ivan, Dinko Vukadinović, Mateo Bašić, and Matija Bubalo. "Calculation of Semiconductor Power Losses of a Three-Phase Quasi-Z-Source Inverter." Electronics 9, no. 10 (2020): 1642. http://dx.doi.org/10.3390/electronics9101642.
Full textRastayesh, Sima, Sajjad Bahrebar, Amir Sajjad Bahman, John Dalsgaard Sørensen, and Frede Blaabjerg. "Lifetime Estimation and Failure Risk Analysis in a Power Stage Used in Wind-Fuel Cell Hybrid Energy Systems." Electronics 8, no. 12 (2019): 1412. http://dx.doi.org/10.3390/electronics8121412.
Full textTengku Putri Nurain, Marwan Abdullah Hasan Al-Kubati, and Nur Azaliah Abu Bakar. "Enterprise Architecture for Equipment Performance Analysis Based on Internet of Things (IoT) Technology in the Semiconductor Manufacturing Industry." Open International Journal of Informatics 11, no. 1 (2023): 53–66. http://dx.doi.org/10.11113/oiji2023.11n1.247.
Full textShade, Gary F., and Brian Wilson. "Response to Counterfeit Integrated Circuit Components in the Supply Chain: Part I." EDFA Technical Articles 10, no. 4 (2008): 16–22. http://dx.doi.org/10.31399/asm.edfa.2008-4.p016.
Full textChandani, Himansh, Mayank Tyagi, Rajiv Chaudhary, and Ranganath Singari. "Predicting Production Cycle Time in a Real Disposable Medical Device Manufacturing System Using Semi-Supervised Deep Learning." INTERNATIONAL JOURNAL OF ADVANCED PRODUCTION AND INDUSTRIAL ENGINEERING 5, no. 3 (2020): 01–10. http://dx.doi.org/10.35121/ijapie202007341.
Full textChen, Siyuan, Mingyu Zhang, Yihua Zhang, et al. "Influence of relationship conflicts with leaders and coworkers on employees' voice." Social Behavior and Personality: an international journal 48, no. 11 (2020): 1–16. http://dx.doi.org/10.2224/sbp.9120.
Full textKim, Dongil, and Seokho Kang. "Effect of Irrelevant Variables on Faulty Wafer Detection in Semiconductor Manufacturing." Energies 12, no. 13 (2019): 2530. http://dx.doi.org/10.3390/en12132530.
Full textKempf, Tristan, Vito Bobek, and Tatjana Horvat. "The Impacts of the American-Chinese Trade War and COVID-19 Pandemic on Taiwan’s Sales in Semiconductor Industry." International Journal of Economics and Finance 13, no. 4 (2021): 62. http://dx.doi.org/10.5539/ijef.v13n4p62.
Full textIrmansyah, Muhammad. "PENGIMPLEMENTASIAN TEKNOLOGI PROGRAMMABLE LOGIC DEVICE (PLD) SEBAGAI BINER CODE DECIMAL (BCD) UNTUK SCANNING KEYPAD." Elektron : Jurnal Ilmiah 5, no. 1 (2018): 9–18. http://dx.doi.org/10.30630/eji.5.1.38.
Full textWoltmann, Lucas, Peter Volk, Michael Dinzinger, et al. "Data Science Meets High-Tech Manufacturing – The BTW 2021 Data Science Challenge." Datenbank-Spektrum 22, no. 1 (2021): 5–10. http://dx.doi.org/10.1007/s13222-021-00398-4.
Full textZaluzec, Nestor. "Plasma Cleaning EM Stages, Specimens, and Columns." Microscopy Today 5, no. 4 (1997): 8–9. http://dx.doi.org/10.1017/s1551929500061356.
Full textKumar, Anoop. "PRESENT STATUS OF SEMICONDUCTOR INDUSTRY IN INDIA and IT’S FUTURE PROSPECTS." SCHOLARLY RESEARCH JOURNAL FOR INTERDISCIPLINARY STUDIES 9, no. 68 (2021): 16095–100. http://dx.doi.org/10.21922/srjis.v9i68.10004.
Full textKulchitsky, Nikolay A., Arkady V. Naumov, and Vadim V. Startsev. "Photonic and Terahertz applications as the next gallium arsenide market driver." Modern Electronic Materials 6, no. 3 (2020): 77–84. http://dx.doi.org/10.3897/j.moem.6.3.63224.
Full textKulchitskiy, N. A., A. V. Naumov, and V. V. Startsev. "Photonic and terahertz applications as a next driver of gallium arsenide market." Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 23, no. 3 (2020): 167–76. http://dx.doi.org/10.17073/1609-3577-2020-3-167-176.
Full textLee, Amy H. I., Tzu Ning Liu, Jian Shun Chen, and Chun Yu Lin. "New Product Development Model for Solar Cells." Applied Mechanics and Materials 543-547 (March 2014): 737–40. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.737.
Full textPapanu, Victor. "Comparative Test Data for TIM Materials for LED Applications." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2012, DPC (2012): 000655–83. http://dx.doi.org/10.4071/2012dpc-ta41.
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