Academic literature on the topic 'Total leakage current'

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Journal articles on the topic "Total leakage current"

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Amir, Hesam Khavari, Munir Abdullah, and Abdul-Malek Zulkurnain. "Circuit-based method for extracting the resistive leakage current of metal oxide surge arrester." Bulletin of Electrical Engineering and Informatics 9, no. 6 (2020): 2213–21. https://doi.org/10.11591/eei.v9i6.2258.

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Resistive leakage current based condition assessment of metal oxide surge arrester (MOSA) is one of the most extensively employed technique to monitor its degradation. An extraction method is customarily required to extract the resistive component from the total leakage current. The existing methods to extract the resistive current are complex and less accurate. Therefore, this paper describes a simple and accurate circuit-based method to extract the resistive current using equivalent model and measured leakage current of the arrester. The accuracy of the proposed method is validated through e
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A., Din, A. M. Piah M., R. Abdullah A., Norddin N., and S. Abdullah F. "Leakage current signal parameter of various surface roughness conditions of field-aged polymer insulators." Indonesian Journal of Electrical Engineering and Computer Science 20, no. 2 (2020): 638–45. https://doi.org/10.11591/ijeecs.v20.i2.pp638-645.

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This paper presents the signal parameter of leakage current based on various surface roughness degradation conditions for field-aged high voltage polymer insulators. The arithmetical mean of surface roughness is measured accordingly, and also the surface leakage current signal is captured effectively using data acquisition device via the electrical stress test. With the variation of fieldaged insulators ages which include 6-year, 12-year and 18-year, they have been mechanically tested using a surface roughness tester along with electrical testing by using the standard method of inclined plane
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Kim, Hyung Chul, Moon Seob Han, Hyun June Park, Dong Uk Jang, Gyung Suk Kil, and Nirmal Kumar Nair. "Consideration of Uncertainty in Diagnosis for Railway Arrester." Key Engineering Materials 321-323 (October 2006): 1507–12. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1507.

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This paper presents a method for diagnosis of railway arrester considering uncertainty. Arresters, a protective device that prevents damage due to transient voltages, deteriorate due to the absorption of moisture, repetitive operation during over-voltages and manufacturing defects. Various diagnostic techniques are available for monitoring deterioration of arresters. The technique based on the amplitude of leakage current measures the root mean square or peak values of leakage current components. After measuring the total leakage current, harmonics of leakage current components are analyzed by
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Agrawal, Pankaj, and Nikhil Saxena. "Leakage current analysis for stack based Nano CMOS Digital Circuits." International Journal of Electrical and Electronics Research 2, no. 2 (2014): 5–11. http://dx.doi.org/10.37391/ijeer.020202.

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Due to the growing impact of subthreshold and gate leakage, static leakage is contributing more and more towards the power dissipation in deep submicron Nano CMOS technology. There have been many works on subthreshold leakage and techniques to reduce it, such as controlling the input vector to the circuit in standby mode, forcing stack and body bias control. In this tutorial paper we have reviewed the leakage current with change in drain source, gate and bulk voltages for 4 different submicron technologies using the latest PTM models. Simulation result shows the effect of gate leakage and subt
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Anil, S. Khopkar, and S. Pandya Katik. "Online Condition Monitoring Technique for Metal Oxide Surge Arresters Based on Leakage Current Components." Engineering and Technology Journal 10, no. 03 (2025): 4095–98. https://doi.org/10.5281/zenodo.15031429.

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Metal Oxide Surge Arresters (MOSA) are connected in the system for protection of power system against over voltages. MOSA behaves as an insulator under normal working condition and offers conductive path under over voltage condition.  Zinc oxide elements (ZnO Blocks) having non-linear voltage-current characteristics is used in construction of MOSA. Ageing effect under various operating conditions such as pollution, moisture ingress caused degradation of MOSA. Degradation of zinc oxide elements increase the leakage current flowing through it which can create thermal runaway conditions for
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Lira, George R. S., and Edson G. Costa. "MOSA Monitoring Technique Based on Analysis of Total Leakage Current." IEEE Transactions on Power Delivery 28, no. 2 (2013): 1057–62. http://dx.doi.org/10.1109/tpwrd.2013.2242496.

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Mohd, Azhar Aina Suhailah, Maaspaliza Azri, Halim Wahidah Abd, Md Hairul Nizam Talib, Zulhani Rasin, and Mohd Fayzul Mohammed. "Hysteresis current control for single-phase transformerless inverter." International Journal of Applied Power Engineering (IJAPE) 14, no. 1 (2025): 1–10. https://doi.org/10.11591/ijape.v14.i1.pp1-10.

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The total harmonic distortion (THD) of grid current and leakage current are significant for transformerless inverters, as they impact power quality, efficiency, and compliance with grid codes. Monitoring and minimizing these currents ensure safe and reliable grid integration of photovoltaic (PV) systems while reducing electromagnetic interference. Therefore, in this paper, the analysis THD of grid current and leakage current is described. The bipolar pulse width modulation (BPWM) technology provides a stable common-mode voltage (200 V), fewer leakage currents (< 30 mA), and better system ef
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Mohd Azhar, Aina Suhailah, Maaspaliza Azri, Wahidah Abd Halim, Md Hairul Nizam Talib, Zulhani Rasin, and Mohd Fayzul Mohammed. "Hysteresis current control for single-phase transformerless inverter." International Journal of Applied Power Engineering (IJAPE) 14, no. 1 (2025): 1. https://doi.org/10.11591/ijape.v14.i1.pp1-10.

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The total harmonic distortion (THD) of grid current and leakage current are significant for transformerless inverters, as they impact power quality, efficiency, and compliance with grid codes. Monitoring and minimizing these currents ensure safe and reliable grid integration of photovoltaic (PV) systems while reducing electromagnetic interference. Therefore, in this paper, the analysis THD of grid current and leakage current is described. The bipolar pulse width modulation (BPWM) technology provides a stable common-mode voltage (200 V), fewer leakage currents (< 30 mA), and better syste
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Md, Aftab Alam, V. A. V. Prasad S, and Asim Mohammed. "Design of Photovoltaic H6 -Type Transformerless Inverter Topology to Minimize Leakage Current." Indian Journal of Science and Technology 16, no. 27 (2023): 2068–75. https://doi.org/10.17485/IJST/v16i27.1051.

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Abstract <strong>Objectives:</strong>&nbsp;A leakage current issue that was mitigated by isolation transformers in a grid-connected photovoltaic system must now be addressed by the converters themselves. The paper presents the H6 inverter topology that solved the leakage current problem at the same time as maintaining a high efficiency and a low total harmonic distortion [THD].&nbsp;<strong>Methods:</strong>&nbsp;Inverter topology H6 has been designed to reduce leakage current. A comparison of performance has been done using MATLAB/SIMULINK software. Efficiency, leakage currents, and common mo
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Xia, Xing-Yu, Feng Zhang, Shu Pan, et al. "Research on Leakage Current Waveform Spectrum Characteristics of Artificial Pollution Composite Insulator." Journal of Nanoelectronics and Optoelectronics 19, no. 5 (2024): 465–71. http://dx.doi.org/10.1166/jno.2024.3596.

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In order to know about the change features of leakage current during the pollution flashover process of composite insulators, the study of the pollution flashover test on composite insulator under the pollutional condition is presented in the artificial fog cabinet. The characteristics of leakage current waveforms in time-domain and frequency-domain are measured and analyzed during the test. The analysis results show that there is a strong correlation among the fundamental harmonic, the third harmonic and fifth harmonic. The characteristics of leakage current spectrum are represented by the ma
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Dissertations / Theses on the topic "Total leakage current"

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Paniz, Vitor. "Simulação elétrica do efeito de dose total em células de memória estática (SRAM)." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2010. http://hdl.handle.net/10183/27264.

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Nesta dissertação é apresentado o estudo da célula SRAM estática de 6 transistores, com tecnologia CMOS, sendo utilizada em ambiente exposto à radiação. Foi verificado, através de simulação com o Hspice (HSPICE, 2009; KIME, 1998) e com a análise de Monte Carlo, o seu comportamento com relação à dose de ionização total (Total Ionization Dose, TID), a qual altera a tensão de limiar (threshold voltage, Vth) e a corrente de fuga, não sendo utilizada nenhuma técnica de fabricação especial para tolerância à radiação. Na simulação foi observado o comportamento da célula com relação ao tempo de atraso
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LIMA, JÚNIOR Geraldo Bezerra. "Monitoramento de Para-raios de Óxido de Zinco em campo." Universidade Federal de Campina Grande, 2014. http://dspace.sti.ufcg.edu.br:8080/jspui/handle/riufcg/448.

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Submitted by Johnny Rodrigues (johnnyrodrigues@ufcg.edu.br) on 2018-04-21T14:21:51Z No. of bitstreams: 1 GERALDO BEZERRA LIMA JÚNIOR - DISSERTAÇÃO PPGEE 2014..pdf: 4130681 bytes, checksum: 7aa2b6dbcd9d18892be46ec5c14536b6 (MD5)<br>Made available in DSpace on 2018-04-21T14:21:51Z (GMT). No. of bitstreams: 1 GERALDO BEZERRA LIMA JÚNIOR - DISSERTAÇÃO PPGEE 2014..pdf: 4130681 bytes, checksum: 7aa2b6dbcd9d18892be46ec5c14536b6 (MD5) Previous issue date: 2014-09-02<br>Nos dias atuais a confiabilidade e a continuidade no fornecimento de energia elétrica são cada vez mais exigidos. Os para-raios tem
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Book chapters on the topic "Total leakage current"

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Preethi, Sapna R., and Mohammed Mujeer Ulla. "Low-Power Methodologies and Strategies in VLSI Circuits." In Advances in Computer and Electrical Engineering. IGI Global, 2022. http://dx.doi.org/10.4018/978-1-6684-4974-5.ch001.

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Due to the fact that low-power gadgets are currently dominating the electronics sectors, researchers are studying their design. Power management is a crucial parameter for designing VLSI circuits since it is essential for estimating the performance of devices, especially those utilized in biomedical and IoT applications. To achieve greater performance, designing a low-power system on a IC is becoming increasingly challenging due to the reduction in size of chip, increases in chip density, and rise in device complexity. Furthermore, for the less than 90 nm node, due to its increasingly complica
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Awwad Talal and Al-Asali Bader Eddin. "Efficiency of improving the specifications of soil lenses, that are formed near the tunnel during the stages of its investment." In Advances in Soil Mechanics and Geotechnical Engineering. IOS Press, 2014. https://doi.org/10.3233/978-1-61499-464-0-111.

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The surrounding conditions of tunnel lining may be changed during the investment period, which lead to a redistribution of forces acting on the tunnel lining, and perhaps generate new forces that are not taken into account during the design. In this paper, a case study of Alsafkon tunnel is regarded, which is one of the Syrian Railway deep tunnels. The lining of this tunnel suffers from cracks, leakage, and other defects. The results of numerical analysis are conformed to the current situation of the tunnel in terms of distributed cracks places in the concrete lining. The study showed also the
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Zhou, Xiu, Yukun Ma, Tian Tian, et al. "Analysis of Short Circuit Strength of Single-Phase Four-Column Transformer Windings." In Studies in Applied Electromagnetics and Mechanics. IOS Press, 2025. https://doi.org/10.3233/saem250040.

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According to statistics, short circuit faults in transformer windings account for 70% to 80% of the total faults. Therefore, the study of the short circuit withstand capability of transformers holds significant importance. This paper focuses on investigating the winding deformation and short circuit strength of a ODFPS-700000/750 single-phase four-column transformer during high-medium voltage operation and low-voltage side short circuit conditions. The influence of pads and struts offset on various aspects of windings is considered during the implementation. The paper presents the distribution
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Kelly, M. J. "Tunnelling phenomena." In Low-Dimensional Semiconductors. Oxford University PressOxford, 1995. http://dx.doi.org/10.1093/oso/9780198517818.003.0008.

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Abstract This is the first of three chapters devoted to the new physics that has been made accessible with the advent of semiconductor multilayers. We shall be concerned with the quantum-mechanical phenomenon that an electron of total energy less than that of a thin potential barrier might not be reflected, as would always happen classically, but rather might pass through the barrier with an exponentially small but finite probability. Tunnelling has been an exploitable phenomenon in solid state physics for some time, and Josephson junction technology makes intimate use of superconducting tunne
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"Investigating total ionizing dose effects on LVDS receivers with impedance spectroscopy." In Book of Abstracts - RAD 2025 Conference. RAD Centre, Niš, Serbia, 2025. https://doi.org/10.21175/rad.abstr.book.2025.34.1.

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Low-Voltage Differential Signaling (LVDS) receivers are widely used in high-speed serial links in several environments with radiation, including nuclear and high-energy physics experiments, spacecraft and satellites, and medical physics. In this work, we studied Total Ionizing Dose (TID) effects induced by 60Co gamma rays on LVDS receivers (part number DS90LV048A, from Texas Instruments) exposed to a high dose of 15.4 kGy at a dose rate of 364 Gy/h. TID tests have been performed at the CERN CC60 facility, that hosts a ~ 3 TBq 60Co radioactive source. Radiation effects were studied using both c
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Kumar, Anand, and M. Gayathri. "Design of Power Optimized Microcontroller Systems for Battery Operated Signal Processing Devices." In Smart Microcontrollers and FPGA Based Architectures for Advanced Computing and Signal Processing, 2025th ed. RADemics Research Institute, 2025. https://doi.org/10.71443/9789349552425-14.

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The rapid expansion of battery-operated signal processing systems across domains such as biomedical monitoring, environmental sensing, and portable instrumentation necessitates the development of microcontroller-based architectures optimized for power efficiency. This chapter presents a comprehensive exploration of design methodologies and architectural techniques aimed at minimizing energy consumption while maintaining real-time computational performance. The focus is placed on system-level co-design strategies, including intelligent power gating, dynamic voltage and frequency scaling, low-le
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Conference papers on the topic "Total leakage current"

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Bergman, Gunnar. "Unexpected Stress Corrosion Failures of High Quality FRP Process Equipment." In CORROSION 2004. NACE International, 2004. https://doi.org/10.5006/c2004-04611.

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Abstract Three unexpected failures of FRP components used in different environments have been investigated. The results showed that all the failures had occurred because of glass-fiber-related stress-corrosion cracking. The first occurred in a PVDF-lined FRP piping located between the mixer and the inlet to a chlorine-dioxide-stage bleach tower in a pulp mill. The line broke in a catastrophic manner after only about six years of service. The second case refers to FRP piping for hydrochloric acid in a chemical plant. In total, about 12 km of FRP piping is used for hydrochloric acid services in
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Al-Hertani, H., D. Al-Khalili, and C. Rozon. "Accurate Total Static Leakage Current Estimation in Transistor Stacks." In IEEE International Conference on Computer Systems and Applications, 2006. IEEE, 2006. http://dx.doi.org/10.1109/aiccsa.2006.205099.

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Deb, Suhas, Riddhi Ghosh, Santu Dutta, Sovan Dalai, and Biswendu Chatterjee. "Condition monitoring of 11kV porcelain pin insulator extracting surface current from total leakage current." In 2017 3rd International Conference on Condition Assessment Techniques in Electrical Systems (CATCON). IEEE, 2017. http://dx.doi.org/10.1109/catcon.2017.8280253.

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Feilat, Eyad A., Dalia Abu-Eideh, and Ibrahim A. Metwally. "Total Leakage Current Decomposition of Surge Arresters Using Discrete Fourier Transform." In 2019 International Conference on Electrical and Computing Technologies and Applications (ICECTA). IEEE, 2019. http://dx.doi.org/10.1109/icecta48151.2019.8959674.

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Copeland, David, and Albert Chan. "Total Power Requirements for Near-Future Refrigerated Systems." In ASME 2003 International Mechanical Engineering Congress and Exposition. ASMEDC, 2003. http://dx.doi.org/10.1115/imece2003-42344.

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As feature dimensions of processors shrink to 100 nanometers and smaller, leakage current becomes a significant part of total power dissipation. The magnitude of power dissipated as leakage current can approach half that of the active current at higher junction temperatures. Leakage current exhibits a strong exponential relationship with temperature. Reduction of junction temperatures from a traditional value of 85 C to a near-ambient value of 25 C can reduce leakage current to a fraction of its usual value, and total power by nearly one-third. To date, refrigeration has been used to increase
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Mukhopadhyay, Saibal, Arijit Raychowdhury, and Kaushik Roy. "Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling." In the 40th conference. ACM Press, 2003. http://dx.doi.org/10.1145/775832.775877.

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Della Casa, Giovanni, Francesco Ceraudo, Walter Bonvicini, et al. "Exploring the impact of total ionizing dose on the LAD detectors leakage current." In Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray, edited by Jan-Willem A. den Herder, Kazuhiro Nakazawa, and Shouleh Nikzad. SPIE, 2024. http://dx.doi.org/10.1117/12.3020057.

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Liao, Joy Y., Somayyeh Rahimi, Christian Schmidt, and Howard Lee Marks. "Failure Analysis of Total-Dose Radiation-Induced Degradation on FinFET Logic ICs." In ISTFA 2020. ASM International, 2020. http://dx.doi.org/10.31399/asm.cp.istfa2020p0341.

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Abstract X-ray imaging for both Failure Analysis and In-line Inspection has been utilized widely in the semiconductor industry, especially for surface mount device applications. During the investigation of total ionizing dose (TID) induced degradation of logic ICs with bulk FinFET technology, we observed that the degradation is mainly in the form of an increase in I/O leakage and IDDQ. Using filters during radiation was shown to impact TID. Failure Analysis was performed to localize the excessive current in both I/O leakage and IDDQ.
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Luo, Ping, Rongxun Ling, Xiao Zhou, Pengkai Jiang, and Yucao Wu. "A Total Ionizing Dose Detecting Circuit Based on Off-state Leakage Current of NLDMOS in Power IC." In 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD). IEEE, 2019. http://dx.doi.org/10.1109/ispsd.2019.8757653.

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Garafolo, Nicholas G., and Christopher C. Daniels. "The Quantification of Seal-Interface Leakage of an Elastomer Face Seal." In ASME 2011 International Mechanical Engineering Congress and Exposition. ASMEDC, 2011. http://dx.doi.org/10.1115/imece2011-63620.

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Current gas leak rate prediction methods for elastomeric face seals rely heavily on the assumption that all leakage is permeation, rather than leakage across the seal interface [1–3]. To date, there has been no definitive evidence that this is indeed the case. It is essential to investigate the magnitude of interface leakage to facilitate the validation of the current compressible permeation model and to quantify the interfacial leakage for the design of future state-of-the-art face seals. To this end, a series of leak rate experiments is presented on a square-ring seal, manufactured from sili
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Reports on the topic "Total leakage current"

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Ting, Wang, and Jeff Sutherland. PR-469-143708-R02 In-line Inspection and Assessment for Pipeline Girth Weld Defects. Pipeline Research Council International, Inc. (PRCI), 2018. http://dx.doi.org/10.55274/r0011487.

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During 2010 to 2012, the United States reported a total of eight girth weld failures and economic loss amounted to $4,382,000 [Summarized from data provided by PHMSA, http://www.phmsa.dot.gov/pipeline/library/data-stats/flagged-data-files]. PRCI has several projects (current and historic) that investigate various integrity concerns of vintage girth weld defects. Globally, the integrity of girth welds of oil and gas pipelines has increased as a concern due to failures with high consequences. A primary integrity issue to pipelines that has been the motivation of this project, considers defects o
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