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1

Poulsen, Henning. Three-Dimensional X-Ray Diffraction Microscopy. Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/b97884.

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2

Poulsen, Henning Friis. Three-dimensional X-ray diffraction microscopy: Mapping polycrystals and their dynamics. Springer, 2004.

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3

Mitra, Sachinath. Fundamentals of optical, spectroscopic, and X-ray mineralogy. Wiley, 1989.

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4

Satdarova, Faina. DIFFRACTION ANALYSIS OF DEFORMED METALS: Theory, Methods, Programs. Academus Publishing, 2019. http://dx.doi.org/10.31519/monography_1598.

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General analysis of the distribution of crystals orientation and dislocation density in the polycrystalline system is presented. 
 Recovered information in diffraction of X-rays adopting is new to structure states of polycrystal. Shear phase transformations in metals — at the macroscopic and microscopic levels — become a clear process. 
 Visualizing the advances is produced by program included in package delivered. Mathematical models developing, experimental design, optimal statistical estimation, simulation the system under study and evolution process on loading serves as instrumen
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5

Miyoshi, Kazuhisa. Surface diagnostics in tribology technology and advanced coatings development. National Aeronautics and Space Administration, Lewis Research Center, 1999.

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6

Eiichiro, Matsubara, Shinoda Kozo, and SpringerLink (Online service), eds. X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems. Springer-Verlag Berlin Heidelberg, 2011.

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7

United States. National Aeronautics and Space Administration., ed. Design and analysis of multilayer x-ray/XUV microscope: Final report. University of Alabama at Birmingham, Dept. of Physics ; [Washington, D.C., 1990.

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8

Dat͡senko, L. I. Dinamicheskoe rassei͡anie rentgenovskikh lucheĭ realʹnymi kristallami. Nauk. dumka, 1988.

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9

Symposium B on Epitaxial Thin Film Growth and Nanostructures (1997 Strasbourg, France). Recent developments in thin film research: Epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997. Edited by Ritter G and Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures (1997 : Strasbourg, France). Elsevier, 1997.

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10

Sayre, David. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Springer Berlin Heidelberg, 1988.

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11

Light and X-Ray Optics: Refraction, Reflection, Diffraction, Optical Devices, Microscopic Imaging. de Gruyter GmbH, Walter, 2023.

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12

Light and X-Ray Optics: Refraction, Reflection, Diffraction, Optical Devices, Microscopic Imaging. de Gruyter GmbH, Walter, 2023.

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13

Light and X-Ray Optics: Refraction, Reflection, Diffraction, Optical Devices, Microscopic Imaging. de Gruyter GmbH, Walter, 2023.

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14

Krishnan, Kannan M. Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.001.0001.

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Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behavior (Engineering). With this focus, the book presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-
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15

Bi, J. F., and K. L. Teo. Nanoscale Ge1−xMnxTe ferromagnetic semiconductors. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.013.17.

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This article discusses the structure characterizations, magnetic and transport behaviors of the nanoscale ferromagnetic semiconductors Ge1-xMnxTe grown by molecular beam epitaxy with various manganese compositions x ranging from 0.14 to 0.98. After providing an overview of the growth procedure and characterization, the article analyzes the structures of the Ge1-xMnxTe system using X-ray diffraction and high-resolution transmission electron microscopy. It then considers the optical, magnetic and transport properties of the semiconductors and shows that the crystal quality is degraded and the pr
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16

Shih, Kaimin. X-Ray Diffraction: Structure, Principles and Applications. Nova Science Publishers, Incorporated, 2013.

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17

(Editor), G. Morrison, and C. H. Buckley (Editor), eds. X-ray Microscopy (Series in Optical Sciences). Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1992.

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18

Poulsen, Henning Friis. Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and Their Dynamics. Springer Berlin / Heidelberg, 2013.

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19

Poulsen, Henning Friis. Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics. Springer, 2014.

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20

Mitra, Sachinath. Fundamentals of Optical, Spectroscopic and X-ray Mineralogy. New Age International (P) Ltd., 1996.

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21

Mitra, Sachinath. Fundamentals of optical, spectroscopic and x-ray mineralogy. Wiley, 1989.

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22

Morrison, G. R., and A. G. Michette. X-Ray Microscopy III: Proceedings (Springer Series in Optical Sciences). Springer, 1992.

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23

Structural and chemical analysis of materials: X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy. Wiley, 1991.

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24

Neutron and X-Ray Optics. Elsevier Science & Technology Books, 2013.

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25

Waseda, Yoshio, Eiichiro Matsubara, and Kozo Shinoda. X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems. Springer, 2014.

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26

Waseda, Yoshio, Eiichiro Matsubara, and Kozo Shinoda. X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems. Springer, 2011.

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27

Uniting Electron Crystallography And Powder Diffraction. Springer, 2013.

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28

ZhiLi, Dong. Fundamentals of Crystallography, Powder X-Ray Diffraction, and Transmission Electron Microscopy for Materials Scientists. Taylor & Francis Group, 2022.

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29

ZhiLi, Dong. Fundamentals of Crystallography, Powder X-Ray Diffraction, and Transmission Electron Microscopy for Materials Scientists. Taylor & Francis Group, 2022.

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30

Fundamentals of Crystallography, Powder X-Ray Diffraction, and Transmission Electron Microscopy for Materials Scientists. Taylor & Francis Group, 2022.

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31

Dong, ZhiLi. Fundamentals of Crystallography, Powder X-Ray Diffraction, and Transmission Electron Microscopy for Materials Scientists. CRC Press LLC, 2022.

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32

Dong, ZhiLi. Fundamentals of Crystallography Powder X-Ray Diffraction and Transmission Electron Microscopy for Materials Scientists. CRC Press LLC, 2022.

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33

Holy, Vaclav, Tilo Baumbach, and Ulrich Pietsch. High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics). Springer, 2004.

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34

Transmission Electron Microscopy and Diffractometry of Materials Graduate Texts in Physics. Springer-Verlag Berlin and Heidelberg GmbH &, 2012.

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35

Structure Determination from Powder Diffraction Data (International Union of Crystallography Monographs on Crystallography, 13.). Oxford University Press, USA, 2002.

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36

Ranganathan, S., G. Ritter, C. Matthai, et al. Recent Developments in Thin Film Research: Epitaxial Growth and Nanostructures, Electron Microscopy and X-Ray Diffraction (European Materials Research Society Symposia Proceedings). Elsevier Science, 1998.

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37

Sayre, David, Malcolm Howells, and Janos Kirz. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Springer, 2014.

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38

Sayre, David. X-Ray Microscopy II: "Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987". Springer, 2013.

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39

Zavalij, Peter, and Vitalij Pecharsky. Fundamentals of Powder Diffraction and Structural Characterization of Materials. Springer, 2008.

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40

Gilbertson, Lea A. Geochemical, optical, and x-ray diffraction studies of tourmalines in Washington and Oregon: Discrimination between mineralized and barren occurrences. 1994.

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41

Zavalij, Peter, and Vitalij Pecharsky. Fundamentals of Powder Diffraction and Structural Characterization of Materials, 2nd Ed. Springer, 2003.

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42

Introduction to the theory of x-ray and electronic spectra of free atoms. Plenum Press, 1996.

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43

Welsh, W. Robert, and Romas Karazija. Introduction to the Theory of X-Ray and Electronic Spectra of Free Atoms. Springer London, Limited, 2013.

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44

Introduction to the Theory of X-Ray and Electronic Spectra of Free Atoms. Springer, 2013.

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45

Gratings, mirrors, and slits: Beamline design for soft X-ray synchrotron radiation sources. Gordon and Breach Science Publishers, 1997.

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46

Fultz, Brent, and James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. 2nd ed. Springer, 2005.

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47

Das, Robert P. The stroma of benign and malignant neoplasia in the human breast and uterus: Changes in stromal composition of breastand uterine tissues induced by benign and malignant neoplastic processes as shown by light microscopy, X-ray diffraction and energy dispersive x-ray microanalysis. 1985.

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48

Applications of synchrotron radiation: Micro beams in cell micro biology and medicine. Springer, 2007.

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49

Ide-Ektessabi, Ari. Applications of Synchrotron Radiation: Micro Beams in Cell Micro Biology and Medicine (Biological and Medical Physics, Biomedical Engineering). Springer, 2007.

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50

Dierking, Ingo, and Antônio Martins Figueiredo Neto. Lyotropic Liquid Crystals. Oxford University PressOxford, 2024. http://dx.doi.org/10.1093/9780191924927.001.0001.

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Abstract This book on Lyotropic Liquid Crystals covers the current state of the art of materials forming liquid crystals as a function of concentration in an isotropic solvent. After a short introduction to liquid crystals in general, we discuss the basic aspects of phase transitions, Onsager’s theory, and the Landau–de Gennes approach. Phase diagrams are introduced, together with a range of experimental techniques to determine the latter, such as polarizing microscopy, calorimetry, X-ray diffraction, and neutron scattering. Computer simulation approaches are discussed to demonstrate current p
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