Books on the topic 'Material Characterization'
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Schroder, Dieter K. Semiconductor Material and Device Characterization. John Wiley & Sons, Ltd., 2006.
Find full textOrtiz Ortega, Euth, Hamed Hosseinian, Ingrid Berenice Aguilar Meza, María José Rosales López, Andrea Rodríguez Vera, and Samira Hosseini. Material Characterization Techniques and Applications. Springer Singapore, 2022. http://dx.doi.org/10.1007/978-981-16-9569-8.
Full textSchroder, Dieter K. Semiconductor Material and Device Characterization. John Wiley & Sons, Inc., 2005. http://dx.doi.org/10.1002/0471749095.
Full textSchroder, Dieter K. Semiconductor material and device characterization. John Wiley, 2005.
Find full textOmar, Abbas. Electromagnetic scattering and material characterization. Artech House, 2011.
Find full textNair, Raveendranath U., Maumita Dutta, Mohammed Yazeen P.S., and K. S. Venu. EM Material Characterization Techniques for Metamaterials. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6517-0.
Full textCenter, Lewis Research, ed. Noncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.
Find full textCenter, Lewis Research, ed. Noncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.
Find full text1952-, Carlsson Leif A., and Pipes R. Byron, eds. Experimental characterization of advanced composite materials. 3rd ed. CRC Press, 2003.
Find full textBrandon, D. G. Microstructural characterization of materials. 2nd ed. John Wiley, 2008.
Find full textWaseda, Yoshio. Anomalous X-Ray Scattering for Material Characterization. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/3-540-46008-x.
Full textChen, Dapeng, Chengtian Lin, Andrey Maljuk, and Fang Zhou. Growth and Characterization of Bulk Superconductor Material. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-31548-5.
Full textCanada Mortgage and Housing Corporation., ed. Initial material characterization of straw light clay. Canada Mortgage and Housing Corporation, 2005.
Find full textD, Kaplan Wayne, ed. Microstructural characterization of materials. J. Wiley, 1999.
Find full textGraybeal, Benjamin A. Material property characterization of ultra-high performance concrete. Federal Highway Administration, Office of Research, Development and Technology, Turner-Fairbank Highway Research Center, 2006.
Find full textKundu, T. Ultrasonic nondestructive evaluation: Engineering and biological material characterization. CRC Press, 2004.
Find full textAresta, M., and Angela Dibenedetto. Inorganic micro- and nanomaterials: Synthesis and characterization. Walter de Gruyter GmbH & Co. KG, 2013.
Find full textCarpinteri, Alberto, and Anthony R. Ingraffea. Fracture Mechanics of Concrete : Material Characterization and Testing: Material Characterization and Testing. Springer Netherlands, 2011.
Find full textFracture mechanics of concrete : Material characterization and testing: Material Characterization and Testing. Springer, 2011.
Find full textSchroder, Dieter K. Semiconductor Material and Device Characterization. Wiley & Sons, Incorporated, John, 2008.
Find full textMaterial Characterization Techniques and Applications. Springer Singapore Pte. Limited, 2022.
Find full textStaff, Berger Lev I. Material and Device Characterization Measurements. Taylor & Francis Group, 2004.
Find full textShindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Incorporated, John, 2022.
Find full textShindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Limited, John, 2022.
Find full textThomas, Sabu, Seiko Jose, and Akira Otsuki. Non-Destructive Material Characterization Methods. Elsevier, 2023.
Find full textShindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Incorporated, John, 2022.
Find full textShindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Incorporated, John, 2022.
Find full textBerger, Lev I. Material and Device Characterization Measurements. Taylor & Francis Group, 2004.
Find full textSemiconductor Material and Device Characterization. Wiley & Sons, Incorporated, John, 2006.
Find full textSemiconductor Material and Device Characterization. Wiley & Sons Canada, Limited, John, 2006.
Find full textAnalytical Techniques for Material Characterization. World Scientific Pub Co Inc, 1987.
Find full textKaplan, Wayne D., and David Brandon. Microstructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2013.
Find full textUltrasound for Material Characterization and Processing. MDPI, 2021. http://dx.doi.org/10.3390/books978-3-0365-1709-4.
Full textNair, Raveendranath U. U., Maumita Dutta, Mohammed Yazeen P. S, and K. S. Venu. EM Material Characterization Techniques for Metamaterials. Springer, 2017.
Find full textNoncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.
Find full textNoncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.
Find full textLionetto, Francesca. Ultrasound for Material Characterization and Processing. Mdpi AG, 2021.
Find full textStepped Waveguide Electromagnetic Material Characterization Technique. Storming Media, 2004.
Find full textNational Aeronautics and Space Administration (NASA) Staff. Material Characterization for Ductile Fracture Prediction. Independently Published, 2018.
Find full textNanomaterials: An Introduction to Synthesis, Characterization and Processing. Wiley-VCH, 2008.
Find full textNew way to see Materials: Advanced Characterization techniques Material Science. Eklavya and Sangharsh, 2015.
Find full textDavim, J. Paulo, Chander Prakash, and Sunpreet Singh. Characterization, Testing, Measurement, and Metrology. Taylor & Francis Group, 2020.
Find full textNanomaterials: Synthesis, characterization, and applications. Apple Academic Press, 2013.
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