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1

Schroder, Dieter K. Semiconductor Material and Device Characterization. John Wiley & Sons, Ltd., 2006.

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2

Ortiz Ortega, Euth, Hamed Hosseinian, Ingrid Berenice Aguilar Meza, María José Rosales López, Andrea Rodríguez Vera, and Samira Hosseini. Material Characterization Techniques and Applications. Springer Singapore, 2022. http://dx.doi.org/10.1007/978-981-16-9569-8.

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3

Schroder, Dieter K. Semiconductor Material and Device Characterization. John Wiley & Sons, Inc., 2005. http://dx.doi.org/10.1002/0471749095.

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4

Schroder, Dieter K. Semiconductor material and device characterization. John Wiley, 2005.

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5

Omar, Abbas. Electromagnetic scattering and material characterization. Artech House, 2011.

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6

Nair, Raveendranath U., Maumita Dutta, Mohammed Yazeen P.S., and K. S. Venu. EM Material Characterization Techniques for Metamaterials. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6517-0.

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7

Center, Lewis Research, ed. Noncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.

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8

Center, Lewis Research, ed. Noncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.

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9

1952-, Carlsson Leif A., and Pipes R. Byron, eds. Experimental characterization of advanced composite materials. 3rd ed. CRC Press, 2003.

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10

Brandon, D. G. Microstructural characterization of materials. 2nd ed. John Wiley, 2008.

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11

Waseda, Yoshio. Anomalous X-Ray Scattering for Material Characterization. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/3-540-46008-x.

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12

Chen, Dapeng, Chengtian Lin, Andrey Maljuk, and Fang Zhou. Growth and Characterization of Bulk Superconductor Material. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-31548-5.

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13

Canada Mortgage and Housing Corporation., ed. Initial material characterization of straw light clay. Canada Mortgage and Housing Corporation, 2005.

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14

D, Kaplan Wayne, ed. Microstructural characterization of materials. J. Wiley, 1999.

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15

Graybeal, Benjamin A. Material property characterization of ultra-high performance concrete. Federal Highway Administration, Office of Research, Development and Technology, Turner-Fairbank Highway Research Center, 2006.

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16

Kundu, T. Ultrasonic nondestructive evaluation: Engineering and biological material characterization. CRC Press, 2004.

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17

Aresta, M., and Angela Dibenedetto. Inorganic micro- and nanomaterials: Synthesis and characterization. Walter de Gruyter GmbH & Co. KG, 2013.

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18

Carpinteri, Alberto, and Anthony R. Ingraffea. Fracture Mechanics of Concrete : Material Characterization and Testing: Material Characterization and Testing. Springer Netherlands, 2011.

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19

Fracture mechanics of concrete : Material characterization and testing: Material Characterization and Testing. Springer, 2011.

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20

Characterization of materials. John Wiley & Sons, Inc., 2012.

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21

Schroder, Dieter K. Semiconductor Material and Device Characterization. Wiley & Sons, Incorporated, John, 2008.

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22

Semiconductor material and device characterization. Wiley, 1990.

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23

Material Characterization Techniques and Applications. Springer Singapore Pte. Limited, 2022.

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24

Semiconductor material and device characterization. 2nd ed. Wiley, 1998.

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25

Semiconductor material and device characterization. 3rd ed. IEEE Press, 2006.

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26

Staff, Berger Lev I. Material and Device Characterization Measurements. Taylor & Francis Group, 2004.

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27

Shindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Incorporated, John, 2022.

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28

Shindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Limited, John, 2022.

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29

Thomas, Sabu, Seiko Jose, and Akira Otsuki. Non-Destructive Material Characterization Methods. Elsevier, 2023.

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30

J, Thomas. Material Characterization Using Ion Beams. Springer, 2012.

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31

Shindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Incorporated, John, 2022.

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32

Shindo, Daisuke, and Takeshi Tomita. Material Characterization Using Electron Holography. Wiley & Sons, Incorporated, John, 2022.

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33

Berger, Lev I. Material and Device Characterization Measurements. Taylor & Francis Group, 2004.

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34

Semiconductor Material and Device Characterization. Wiley & Sons, Incorporated, John, 2006.

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35

Mohan, Manasa. Non-Destructive Material Characterization Methods. Elsevier, 2023.

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36

Semiconductor Material and Device Characterization. Wiley & Sons Canada, Limited, John, 2006.

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37

Analytical Techniques for Material Characterization. World Scientific Pub Co Inc, 1987.

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38

Material Characterization Techniques and Applications. Springer, 2023.

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39

Kaplan, Wayne D., and David Brandon. Microstructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2013.

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40

Ultrasound for Material Characterization and Processing. MDPI, 2021. http://dx.doi.org/10.3390/books978-3-0365-1709-4.

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41

Nair, Raveendranath U. U., Maumita Dutta, Mohammed Yazeen P. S, and K. S. Venu. EM Material Characterization Techniques for Metamaterials. Springer, 2017.

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42

Noncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.

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43

Noncontact acousto-ultrasonics for material characterization. National Aeronautics and Space Administration, Lewis Research Center, 1998.

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44

Lionetto, Francesca. Ultrasound for Material Characterization and Processing. Mdpi AG, 2021.

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45

Stepped Waveguide Electromagnetic Material Characterization Technique. Storming Media, 2004.

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46

National Aeronautics and Space Administration (NASA) Staff. Material Characterization for Ductile Fracture Prediction. Independently Published, 2018.

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47

Nanomaterials: An Introduction to Synthesis, Characterization and Processing. Wiley-VCH, 2008.

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48

New way to see Materials: Advanced Characterization techniques Material Science. Eklavya and Sangharsh, 2015.

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49

Davim, J. Paulo, Chander Prakash, and Sunpreet Singh. Characterization, Testing, Measurement, and Metrology. Taylor & Francis Group, 2020.

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50

Nanomaterials: Synthesis, characterization, and applications. Apple Academic Press, 2013.

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