Books on the topic 'Photomath'
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1976-, Taschereau Marie-Stéfanie, ed. Collection Photomaton: Série Flash. Flic flac, 2011.
Find full textMusée de l'Elysée (Lausanne, Switzerland), Centre culturel de la communauté française Wallonie-Bruxelles-Le Botanique. Musée, and Kunst Haus Wien, eds. Derrière le rideau: L'esthétique photomaton. Musée de l'Élysée, 2012.
Find full text1819-1889, Disdéri André-Adolphe-Eugène, Frizot Michel, and Centre national de la photographie (France), eds. Identités: De Disdéri au photomaton. Centre national de la photographie, 1985.
Find full textMuzzarelli, Federica. Formato tessera: Storia, arte e idee in photomatic. B. Mondadori, 2003.
Find full textHelder, Herberto. Photomaton & vox ; Flash ; El cap entre les mans. Gregal Llibres, 1988.
Find full textPoland) Miesiąc Fotografii w Krakowie (Exhibition) (12th 2014 Kraków. Miesiąc Fotografii w Krakowie 2014: Krakow Photomonth Festival 2014. Fundacja Sztuk Wizualnych, 2014.
Find full textYōichi, Takehana, and Hōga Morihisa, eds. Fotomasuku: Denshi buhin seizō no kikan gijutsu = Photomask technology. Tōkyō Denki Daigaku Shuppankyoku, 2011.
Find full textPoland) Miesiąc Fotografii w Krakowie (Exhibition) (2013 Kraków. Miesiąc Fotografii w Krakowie 2013: Krakow Photomonth Festival 2013. Fundacja Sztuk Wizualnych, 2013.
Find full textNaber, Robert J., and Hiroichi Kawahira. Photomask technology 2007: 18-21 September, 2007, Monterey, California, USA. SPIE, 2007.
Find full textSymposium, on Photomask Technology (26th 2006 Monterey Calif ). Photomask technology 2006: 19-22 September, 2006, Monterey, California, USA. SPIE, 2005.
Find full textJ, Evans C., and National Institute of Standards and Technology (U.S.), eds. Interferometric metrology of photomask blanks: Approaches using 633 nm wavelength. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.
Find full textM, Martin Patrick, Naber Robert J, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask technology 2006: 19-22 September, 2006, Monterey, California, USA. SPIE, 2006.
Find full textSymposium on Photomask Technology (28th 2008 Monterey, Calif.). Photomask technology 2008: 7-10 October 2008, Monterey, California, USA. Edited by Kawahira Hiroichi, Zurbrick Larry S, BACUS (Technical group), and SPIE (Society). SPIE, 2008.
Find full textMaurer, Wilhelm, and M. Warren Montgomery. Photomask technology 2010: 13-16 September 2010, Monterey, California, United States. Society of Photo-optical Instrumentation Engineers, 2010.
Find full textSymposium, on Photomask Technology (29th 2009 Monterey Calif ). Photomask technology 2009: 14-17 September 2009, Monterey, California, United States. SPIE, 2009.
Find full textMaurer, Wilhelm, and Frank E. Abboud. Photomask technology 2011: 19-22 September 2011, Monterey, California, United States. Edited by BACUS (Technical group) and SPIE (Society). SPIE, 2011.
Find full textKonishi, Toshio. Photomask and next-generation lithography mask technology XVIII: 13-15 April 2011. SPIE, 2011.
Find full textE, Abboud Frank, Grenon Brian J, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 19th Annual Symposium on Photomask Technology: 15-17 September 1999, Monterey, California. SPIE, 1999.
Find full textHideo, Yoshihara, Society of Photo-optical Instrumentation Engineers. Japan Chapter., and BACUS (Technical group), eds. Photomask and X-ray mask technology: 22 April 1994, Kawasaki City, Kanagawa, Japan. SPIE, 1994.
Find full textNaoaki, Aizaki, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and X-ray mask technology V: 9-10 April, 1998, Kawasaki, Japan. SPIE, 1998.
Find full textNaoaki, Aizaki, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, and Society of Photo-optical Instrumentation Engineers. Japan Chapter., eds. Photomask and X-ray mask technology IV: 17-18 April, 1997, Kawasaki, Japan. SPIE, 1997.
Find full textHiraoki, Morimoto, Photomask Japan, BACUS (Technical group), and Ōyō Butsuri Gakkai, eds. Photomask and X-ray mask technology VI: 13-14 April, 1999, Yokohama, Japan. SPIE, 1999.
Find full textgroup), BACUS (Technical, ed. 11th annual Symposium on Photomask Technology: Proceedings : September 25-27, 1991, Sunnyvale, California. SPIE--the International Society for Optical Engineering, 1992.
Find full textHosono, Kunihiro. Photomask and next-generation lithography mask technology XVII: 13-15 April 2010, Yokohama, Japan. SPIE, 2010.
Find full textHiroichi, Kawahira, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology IX: 23-25 April, 2002, Yokohama, Japan. SPIE, 2002.
Find full textHosono, Kunihiro. Photomask and next-generation lithography mask technology XVI: 8-10 April 2009, Yokohama, Japan. Edited by Photomask Japan, BACUS (Technical group), and SPIE (Society). SPIE, 2009.
Find full textHosono, Kunihiro. Photomask and next-generation lithography mask technology XVII: 13-15 April 2010, Yokohama, Japan. Edited by SPIE (Society) and Photomask Japan. SPIE, 2010.
Find full textHidehiro, Watanabe, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XIV: 17-19 April 2007, Yokohama, Japan. SPIE, 2007.
Find full textMorihisa, Hoga, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XIII: 18-20 April, 2006, Yokohama, Japan. SPIE, 2006.
Find full textWolfgang, Staud, Weed J. Tracy, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 24th Annual BACUS Symposium on Photomask Technology: 14-17 September, 2004, Monterey, California, USA. SPIE, 2004.
Find full textHiroichi, Kawahira, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology VIII: 25-27 April 2001, Yokohama, Japan. SPIE, 2001.
Find full textHiroyoshi, Tanabe, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology X: 16-18 April, 2003, Yokohama, Japan. SPIE, 2003.
Find full textHiraoki, Morimoto, Photomask Japan, BACUS (Technical group), et al., eds. Photomask and next-generation lithography mask technology VII: 12-13 April 2000, Yokohama, Japan. SPIE, 2000.
Find full textJ, Grenon Brian, Dao Giang T, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 20th Annual BACUS Symposium on Photomask Technology: 13-15 September, 2000, Monterey, [California] USA. SPIE, 2001.
Find full textJ, Grenon Brian, Kimmel Kurt R, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 22nd Annual BACUS Symposium on Photomask Technology: 1-4 October, 2002, Monterey, California, USA. SPIE, 2002.
Find full textT, Dao Giang, Grenon Brian J, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 21st Annual BACUS Symposium on Photomask Technology: 3-5 October 2001, Monterey, [California] USA. SPIE, 2002.
Find full textRudolf, Kimmel Kurt, Staud Wolfgang, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 23rd Annual BACUS Symposium on Photomask Technology: 9-12 September, 2003, Monterey, California, USA. SPIE, 2003.
Find full textJapan, Photomask, BACUS (Technical group), Institute of Electrical and Electronics Engineers. Japan Section., Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XI: 14-16 April, 2004, Yokohama, Japan. SPIE, 2004.
Find full textSymposium on Photomask Technology and Management (15th 1995 Santa Clara, Calif.). 15th Annual Symposium on Photomask Technology and Management: 20-22 September 1995, Santa Clara, California. Edited by Shelden Gilbert V and Wiley James N. SPIE, 1996.
Find full textHideo, Yoshihara, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers. Japan Chapter., eds. Photomask and X-ray mask technology III: 18-19 April, 1996, Kawasaki City, Kanagawa, Japan. SPIE, 1996.
Find full textgroup), BACUS (Technical, ed. 12th Annual Symposium on Photomask Technology and Management: Proceedings : 23-24 September 1992, Sunnyvale, California. SPIE--the International Society for Optical Engineering, 1992.
Find full textHideo, Yoshihara, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and X-ray mask technology II: 20-21 April 1995, Kawasaki City, Kanagawa, Japan. SPIE, 1995.
Find full text1930-, Reynolds James A., Grenon Brian J, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 17th Annual Symposium on Photomask Technology and Management: [proceedings] : 17-19 September, 1997, Redwood City, California. SPIE, 1998.
Find full textJ, Grenon Brian, Abboud Frank E, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 18th Annual Symposium on Photomask Technology and Management: [proceedings] : 16-18 September, 1998, Redwood City, California. SPIE, 1998.
Find full textgroup), BACUS (Technical, ed. 13th Annual Symposium on Photomask Technology and Management: Proceedings : 22-23 September 1993, Santa Clara, California. SPIE--the International Society for Optical Engineering, 1994.
Find full textL, Brodsky William, Shelden Gilbert V, and BACUS (Technical group), eds. 14th annual Symposium on Photomask Technology and Management: Proceedings : 14-16 September 1994, Santa Clara, California. SPIE, 1994.
Find full textUnited States. National Aeronautics and Space Administration., ed. Geological-morphological description of the Lakshmi planum (photomap of the Venusian surface sheet B-4). National Aeronautics and Space Administration, 1987.
Find full textPronin, Anatoliĭ Andreevich. Geological-morphological description of the Lakshmi planum (photomap of the Venusian surface sheet B-4). National Aeronautics and Space Administration, 1987.
Find full textPronin, Anatoliĭ Andreevich. Geological-morphological description of the Lakshmi planum (photomap of the Venusian surface sheet B-4). National Aeronautics and Space Administration, 1987.
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